Exchange bias in GeMn nanocolumns: the role of surface oxidation

We report on the exchange biasing of self-assembled ferromagnetic GeMn nanocolumns by GeMn-oxide caps. The x-ray absorption spectroscopy analysis of this surface oxide shows a multiplet fine structure that is typical of the Mn2+ valence state in MnO. A magnetization hysteresis shift |HE|~100 Oe and a coercivity enhancement of about 70 Oe have been obtained upon cooling (300-5 K) in a magnetic field as low as 0.25 T. This exchange bias is attributed to the interface coupling between the ferromagnetic nanocolumns and the antiferromagnetic MnO-like caps. The effect enhancement is achieved by depositing a MnO layer on the GeMn nanocolumns.Comment: 7 pages, 5 figure

“Supposing that truth is a woman, what then?” The Lie Detector, The Love Machine and the Logic of Fantasy

One of the consequences of the public outcry over the 1929 St Valentine’s Day massacre was the establishment of a Scientific Crime Detection Laboratory at Northwestern University. The photogenic “Lie Detector Man”, Leonarde Keeler, was the Laboratory’s poster boy and his instrument the jewel in the crown of forensic science. The press often depicted Keeler gazing at a female suspect attached to his “sweat box”; a galvanometer electrode in her hand, a sphygmomanometer cuff on her arm and a rubber pneumograph tube strapped across her breasts. Keeler’s fascination with the deceptive charms of the female body was one he shared with his fellow lie detector pioneers, all of whom met their wives – and in William Marston’s case his mistress too – through their engagement with the instrument. Marston employed his own “Love Meter”, as the press dubbed it, to prove that “brunettes react far more violently to amatory stimuli than blondes”. In this paper I draw on the psychoanalytic concepts of fantasy and pleasure to argue that the female body played a pivotal role in establishing the lie detector’s reputation as an infallible and benign mechanical technology of truth

The Influence of Manga on the Graphic Novel

This material has been published in The Cambridge History of the Graphic Novel edited by Jan Baetens, Hugo Frey, Stephen E. Tabachnick. This version is free to view and download for personal use only. Not for re-distribution, re-sale or use in derivative works. © Cambridge University PressProviding a range of cogent examples, this chapter describes the influences of the Manga genre of comics strip on the Graphic Novel genre, over the last 35 years, considering the functions of domestication, foreignisation and transmedia on readers, markets and forms

The growth and structure of titanium dioxide films on a Re 10 10 surface Rutile 011 2x1

Titanium dioxid films were grown on Re 10 10 by Ti vapor deposition in oxygen at T 830 K and studied by means of low energy electron diffraction LEED , X ray photoelectron spectroscopy XPS , low energy ion scattering LEIS and X ray diffraction XRD . The Ti oxid stoichiometry was determined by XPS as Ti O 1 2, with the Ti oxidation state 4 . The TiO2 growth was monitored by means of LEED as a function of film thickness. Extending the coverage from the submonolayer into the multilayer regime gives rise to a p 2x2 pattern, a poorly ordered 1x1 , and, finally, a stable 2x2 structure, the latter being associated with a homogeneous TiO2 phase. For normal electron incidence, the 2x2 LEED pattern exibits systematically extinguished beams at n 1 2,0 positions, indicating a glide mirror plane. The pg 2x2 structure could be explained by both a rutile 011 2x1 reconstructed surface and a bulk truncated brookite 001 surface. Faceting phenomena, i.e. running LEED spots, observed with thin TiO2 films point to the formation of a rutile 011 2x1 surface with two domains and 011 2x1 facets and rule out the brookite alternative. Confirmation of this assignment was obtained by an XRD analysis perfomed at the Berlin synchrotron facility BESS

In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays

The depth dependent strain relaxation in photolithographically defined and reactive ion etched Si/SiGe quantum wire and dot arrays is determined by high resolution grazing incidence x-ray diffraction. The laterally periodic structures were aligned along two orthogonal [110] and [1̄10] directions on the (001) surface. By recording reciprocal space maps around the (220) and (2̄20) reciprocal lattice points, the shape and in-plane strain could be determined independently of each other. Using triple axis diffractometry and changing the effective penetration depth of the x-ray radiation between 5 and 300 nm the strain relaxation in the wires and dots could be determined depth resolved