448 research outputs found

    The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs

    Full text link
    The final publication is available at Springer via http://dx.doi.org/10.1007/978-3-642-38789-0_7Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output of systems, whereas little research has targeted those faults being logically, electrically or temporally masked -which we have named fugacious. A fast detection and precise diagnosis of faults occurrence, even if the provided service is unaffected, could be of invaluable help to determine, for instance, that systems are currently under the influence of environmental disturbances like radiation, suffering from wear-out, or being affected by an intermittent fault. Upon detection, systems may react to adapt the deployed fault tolerance mechanisms to the diagnosed problem. This paper explores these ideas evaluating challenges and requirements involved, and provides an outline of potential techniques to be applied.This work has been funded by Spanish Ministry of Economy ARENES project (TIN2012-38308-C02-01)Espinosa García, J.; Andrés Martínez, DD.; Ruiz, JC.; Gil, P. (2013). The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs. En Dependable Computing. Springer. 76-87. https://doi.org/10.1007/978-3-642-38789-0_7S7687Narayanan, V., Xie, Y.: Reliability concerns in embedded systems design. IEEE Computer 1(39), 118–120 (2006)Hannius, O., Karlsson, J.: Impact of soft errors in a jet engine controller. In: Ortmeier, F., Daniel, P. (eds.) SAFECOMP 2012. LNCS, vol. 7612, pp. 223–234. Springer, Heidelberg (2012)Borkar, S.: Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro 25(6), 10–16 (2005)JEDEC: Measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices. JEDEC Standard JESD89A. JEDEC (2006)Gracia-Moran, J., Gil-Tomas, D., Saiz-Adalid, L.J., Baraza, J.C., Gil-Vicente, P.J.: Experimental validation of a fault tolerant microcomputer system against intermittent faults. In: DSN, pp. 413–418 (2010)Constantinescu, C.: Intermittent faults and effects on reliability of integrated circuits. In: Proceedings of the 2008 Annual Reliability and Maintainability Symposium, pp. 370–374. IEEE Computer Society, Washington, DC (2008)Avizienis, A., Laprie, J.C., Randell, B., Landwehr, C.: Basic concepts and taxonomy of dependable and secure computing. IEEE Trans. Dependable Secur. Comput. 1, 11–33 (2004)Johnson, C., Holloway, C.: The dangers of failure masking in fault-tolerant software: Aspects of a recent in-flight upset event. In: 2007 2nd Institution of Engineering and Technology International Conference on System Safety, pp. 60–65 (October 2007)Bolchini, C., Salice, F., Sciuto, D.: Fault analysis for networks with concurrent error detection. IEEE Des. Test 15(4), 66–74 (1998)Goessel, M., Ocheretny, V., Sogomonyan, E., Marienfeld, D.: New Methods of Concurrent Checking (Frontiers in Electronic Testing), 1st edn. Springer Publishing Company, Incorporated (2008)Iyer, R.K., Rossetti, D.J.: A statistical load dependency model for cpu errors at slac. In: Twenty-Fifth International Symposium on Fault-Tolerant Computing, ‘Highlights from Twenty-Five Years’, p. 373 (June 1995)Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R.: Production and propagation of single-event transients in high-speed digital logic ics. IEEE Transactions on Nuclear Science 51, 3278–3284 (2004)Nightingale, E.B., Douceur, J.R., Orgovan, V.: Cycles, cells and platters: an empirical analysisof hardware failures on a million consumer pcs. In: Proceedings of the Sixth Conference on Computer Systems, EuroSys 2011, pp. 343–356. ACM, New York (2011)Kimseng, K., Hoit, M., Tiwari, N., Pecht, M.: Physics-of-failure assessment of a cruise control module. Microelectronics Reliability 39(10), 1423–1444 (1999)Savir, J.: Detection of single intermittent faults in sequential circuits. IEEE Trans. Comput. 29(7), 673–678 (1980)Correcher, A., Garcia, E., Morant, F., Quiles, E., Rodriguez, L.: Intermittent failure dynamics characterization. IEEE Transactions on Reliability 61(3), 649–658 (2012)Sorensen, B., Kelly, G., Sajecki, A., Sorensen, P.: An analyzer for detecting intermittent faults in electronic devices. In: AUTOTESTCON 1994. IEEE Systems Readiness Technology Conference. ‘Cost Effective Support Into the Next Century’, Conference Proceedings, pp. 417–421 (September 1994)Sosnowski, J.: Transient fault tolerance in digital systems. IEEE Micro 14(1), 24–35 (1994)Bondavalli, A., Chiaradonna, S., Di Giandomenico, F., Grandoni, F.: Threshold-based mechanisms to discriminate transient from intermittent faults. IEEE Trans. Comput. 49(3), 230–245 (2000)Rashid, L., Pattabiraman, K., Gopalakrishnan, S.: Intermittent hardware errors and recovery: modelling and evaluation. In: International Conference on Quantitative Evaluation of Systems, QEST (2012)Touba, N.A., McCluskey, E.J.: Logic synthesis of multilevel circuits with concurrent error detection. IEEE Trans. CAD 16(7), 783–789 (1997)Nicolaidis, M., Manich, S., Figueras, J.: Achieving fault secureness in parity prediction arithmetic operators: General conditions and implementations. In: Proceedings of the 1996 European conference on Design and Test, EDTC 1996, pp. 186–193. IEEE Computer Society, Washington, DC (1996)Ko, S.B., Lo, J.C.: Efficient realization of parity prediction functions in fpgas. J. Electron. Test. 20(5), 489–499 (2004)D’Angelo, S., Sechi, G.R., Metra, C.: Transient and permanent fault diagnosis for fpga-based tmr systems. In: Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 1999, pp. 330–338. IEEE Computer Society, Washington, DC (1999)Kim, C.: Detection and location of intermittent faults by monitoring carrier signal channel behavior of electrical interconnection system. In: Electric Ship Technologies Symposium, ESTS 2009, pp. 449–455. IEEE (April 2009

    High-Speed Single-Event Current Transient Measurements in SiGe HBTs

    Get PDF
    Time-resolved ion beam induced charge reveals heavy ion response of IBM 5AM SiGe HBT: 1) Position correlation. 2) Unique response for different bias schemes. 3) Similarities to TPA pulsed-laser data. Heavy ion broad-beam transients provide more realistic device response: 1) Feedback using microbeam data 2) Overcome existing issues of LET and ion range with microbeam Both micro- and broad-beam data sets yield valuable input for TCAD simulations. Uncover detailed mechanisms for SiGe HBTs and other devices fabricated on lightly-doped substrates

    Search for displaced vertices arising from decays of new heavy particles in 7 TeV pp collisions at ATLAS

    Get PDF
    We present the results of a search for new, heavy particles that decay at a significant distance from their production point into a final state containing charged hadrons in association with a high-momentum muon. The search is conducted in a pp-collision data sample with a center-of-mass energy of 7 TeV and an integrated luminosity of 33 pb^-1 collected in 2010 by the ATLAS detector operating at the Large Hadron Collider. Production of such particles is expected in various scenarios of physics beyond the standard model. We observe no signal and place limits on the production cross-section of supersymmetric particles in an R-parity-violating scenario as a function of the neutralino lifetime. Limits are presented for different squark and neutralino masses, enabling extension of the limits to a variety of other models.Comment: 8 pages plus author list (20 pages total), 8 figures, 1 table, final version to appear in Physics Letters

    Measurement of the polarisation of W bosons produced with large transverse momentum in pp collisions at sqrt(s) = 7 TeV with the ATLAS experiment

    Get PDF
    This paper describes an analysis of the angular distribution of W->enu and W->munu decays, using data from pp collisions at sqrt(s) = 7 TeV recorded with the ATLAS detector at the LHC in 2010, corresponding to an integrated luminosity of about 35 pb^-1. Using the decay lepton transverse momentum and the missing transverse energy, the W decay angular distribution projected onto the transverse plane is obtained and analysed in terms of helicity fractions f0, fL and fR over two ranges of W transverse momentum (ptw): 35 < ptw < 50 GeV and ptw > 50 GeV. Good agreement is found with theoretical predictions. For ptw > 50 GeV, the values of f0 and fL-fR, averaged over charge and lepton flavour, are measured to be : f0 = 0.127 +/- 0.030 +/- 0.108 and fL-fR = 0.252 +/- 0.017 +/- 0.030, where the first uncertainties are statistical, and the second include all systematic effects.Comment: 19 pages plus author list (34 pages total), 9 figures, 11 tables, revised author list, matches European Journal of Physics C versio

    Observation of a new chi_b state in radiative transitions to Upsilon(1S) and Upsilon(2S) at ATLAS

    Get PDF
    The chi_b(nP) quarkonium states are produced in proton-proton collisions at the Large Hadron Collider (LHC) at sqrt(s) = 7 TeV and recorded by the ATLAS detector. Using a data sample corresponding to an integrated luminosity of 4.4 fb^-1, these states are reconstructed through their radiative decays to Upsilon(1S,2S) with Upsilon->mu+mu-. In addition to the mass peaks corresponding to the decay modes chi_b(1P,2P)->Upsilon(1S)gamma, a new structure centered at a mass of 10.530+/-0.005 (stat.)+/-0.009 (syst.) GeV is also observed, in both the Upsilon(1S)gamma and Upsilon(2S)gamma decay modes. This is interpreted as the chi_b(3P) system.Comment: 5 pages plus author list (18 pages total), 2 figures, 1 table, corrected author list, matches final version in Physical Review Letter

    Measurement of the inclusive isolated prompt photon cross-section in pp collisions at sqrt(s)= 7 TeV using 35 pb-1 of ATLAS data

    Get PDF
    A measurement of the differential cross-section for the inclusive production of isolated prompt photons in pp collisions at a center-of-mass energy sqrt(s) = 7 TeV is presented. The measurement covers the pseudorapidity ranges |eta|<1.37 and 1.52<=|eta|<2.37 in the transverse energy range 45<=E_T<400GeV. The results are based on an integrated luminosity of 35 pb-1, collected with the ATLAS detector at the LHC. The yields of the signal photons are measured using a data-driven technique, based on the observed distribution of the hadronic energy in a narrow cone around the photon candidate and the photon selection criteria. The results are compared with next-to-leading order perturbative QCD calculations and found to be in good agreement over four orders of magnitude in cross-section.Comment: 7 pages plus author list (18 pages total), 2 figures, 4 tables, final version published in Physics Letters

    Measurement of D*+/- meson production in jets from pp collisions at sqrt(s) = 7 TeV with the ATLAS detector

    Get PDF
    This paper reports a measurement of D*+/- meson production in jets from proton-proton collisions at a center-of-mass energy of sqrt(s) = 7 TeV at the CERN Large Hadron Collider. The measurement is based on a data sample recorded with the ATLAS detector with an integrated luminosity of 0.30 pb^-1 for jets with transverse momentum between 25 and 70 GeV in the pseudorapidity range |eta| < 2.5. D*+/- mesons found in jets are fully reconstructed in the decay chain: D*+ -> D0pi+, D0 -> K-pi+, and its charge conjugate. The production rate is found to be N(D*+/-)/N(jet) = 0.025 +/- 0.001(stat.) +/- 0.004(syst.) for D*+/- mesons that carry a fraction z of the jet momentum in the range 0.3 < z < 1. Monte Carlo predictions fail to describe the data at small values of z, and this is most marked at low jet transverse momentum.Comment: 10 pages plus author list (22 pages total), 5 figures, 1 table, matches published version in Physical Review
    corecore