6 research outputs found
In-Process Inspection
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textPerformance evaluation of non contact measuring systems considering bias
- Author
- Publication venue
- CRC PRESS-TAYLOR & FRANCIS GROUP
- Publication date
- 01/01/2010
- Field of study
No full textNovel multi-feature bar design for machine tools geometric errors identification
- Author
- Abbaszadeh-Mir
- Acko
- Aguado
- ANSI/ASME
- Birch
- Bourdet
- Bringmann
- Bryan
- Busch
- C. Tournier
- Castro
- Cauchick-Miguel
- Choi
- de Aquino Silva
- Evans
- F. Viprey
- H. Nouira
- Ibaraki
- ISO 10360-2
- ISO 10791-6
- ISO 230-1
- ISO 230-7
- ISO 5459
- JCGM 101
- JCGM 200
- Jouy
- Knapp
- Kunzmann
- Liebrich
- Lim
- Mayer
- N
- N
- Nouira
- Osawa
- Ouyang
- Pahk
- Peggs
- Pezeshki
- Ramesh
- S. Lavernhe
- Schwenke
- Trapet
- Zhang
- Publication venue
- 'Elsevier BV'
- Publication date
- Field of study
No full textOn the influence of scanning factors on the laser scanner-based 3D inspection process
- Author
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- Field of study
No full textThe lattice parameter of silicon: a secondary realisation of the metre
- Author
- Andrew Yacoot
- Bartl G
- Becker P
- BIPM
- BIPM
- BIPM
- BIPM
- BIPM
- BIPM
- Buhr E
- Campbell A C
- Carmignato S
- Celik M
- Chaikool P
- Dai G
- Dai G
- Dai G
- Durand M
- Editor’s Note
- Feynman R P
- Fu J
- Garnes J
- Harald Bosse
- Hart M
- Homma Y
- ISO 10360 7
- ISO 5436-1:2000
- Leach R K
- Luther W
- Martin J
- Massa E
- Melis C
- Nečas D
- Pisani M
- Rerucha S
- Roco M C
- Ron Dixson
- Tortonese M
- Tsai V W
- Weichert C
- WGDM-7 Preliminary Comparison on nanometrology according to the rules of CCL key comparisons
- Yacoot A
- Yacoot A
- Yacoot A
- Yacoot A
- Yacoot A
- Publication venue
- 'IOP Publishing'
- Publication date
- Field of study
No full textX-ray computed tomography: from medical imaging to dimensional metrology
- Author
- Alexander
- Aloisi
- Aloisi
- Aloisi
- Als-Nielsen
- Alvarez
- Ambrose
- Ambrose
- Ambrose
- Ambrose
- Amirkhanov
- Andreu
- Angel
- Angel
- Angel
- Angel
- Arenhart
- Arenhart
- Arenhart
- Arenhart
- Arenhart
- Arns
- ASME
- ASTM E1441-11
- ASTM E1570-11
- ASTM E1695-95
- ASTM E1814-14
- Baker
- Banta
- Barker
- Barkla
- Barrett
- Barrett
- Bartscher
- Bartscher
- Bartscher
- Bartscher
- Bartscher
- Bartscher
- Bartscher
- Bartscher
- Bates
- Bautz
- Beckmann
- Bergmann
- Bich
- Blum
- Blume
- Bocage
- Borges de Oliveira
- Borges de Oliveira
- Borges de Oliveira
- Borges de Oliveira
- Borges de Oliveira
- Bos
- Bossi
- Bossi
- Bracewell
- Bracewell
- Bracewell
- Bracewell
- Bragg
- Brooks
- Buratti
- Bushberg
- Buzug
- Canny
- Carmignato
- Carmignato
- Carmignato
- Carmignato
- Carmignato
- Carmignato
- Carmignato
- Chan
- Christoph
- Cierniak
- Cnudde
- Cnudde
- Compton
- Compton
- Coolidge
- Copley
- Cormack
- Cormack
- Cormack
- Cormack
- Cormack
- Crookes
- DaoDang
- De Chiffre
- De Courtenay
- De Man
- Deans
- DeKosky
- Deriche
- Dewulf
- Dewulf
- Dewulf
- Di Chiro
- Dierick
- Dobbins
- Dobbins
- Doi
- du Plessis
- Easton
- Eisenberg
- Elbakri
- Elbakri
- Elghali
- EN 16016-1:2011-12
- EN 16016-2:2012-01
- EN 16016-3:2012-12
- EN 16016-4:2012-01
- Ericka L. Herazo
- Farrance
- Feldkamp
- Feldkamp
- Ferrucci
- Ferrucci
- Ferrucci
- Ferrucci
- Ferrucci
- Fisher
- Flay
- Flessner
- Franco
- Frank
- Franks
- Freund
- Friedland
- Frost & Sullivan
- Frost & Sullivan
- Frost & Sullivan
- Fu
- Gao
- Gapinski
- Garcea
- Gary
- Gelijns
- Georgeson
- Gholizadeh
- Gilboy
- Gilboy
- Giordani
- Giudiceandrea
- Glasser
- Goebbels
- Gondrom
- Goodman
- Gordon
- Grangeat
- Grant
- Grigg
- Gundelach
- Hanke
- Hassen
- Heinzl
- Heinzl
- Heinzl
- Heinzl
- Heinzl
- Hellier
- Hendee
- Hennessy
- Herman
- Herman
- Hermanek
- Hermann
- Herminso Villarraga-Gómez
- Hertz
- Hiller
- Hiller
- Hiller
- Hiller
- Hiller
- Hillman
- Hirakimoto
- Hittorf
- Hounsfield
- Hounsfield
- Hounsfield
- Hsieh
- Hsieh
- Ice
- Illemann
- ISO 10360-2
- ISO 10360-5
- ISO 10360-7
- ISO 10360-8
- ISO 14253-1
- ISO 14253-2
- ISO 14660-1
- ISO 9001
- ISO/IEC 17025
- ISO/IEC Guide 98-3
- ISO/TS 15530-3
- ISO/TS 15530-3
- ISO/TS 15530-3
- Jaszczak
- JCGM 200
- Jimenez
- Jiménez
- Jiménez
- Jiménez
- Jiménez-Pacheco
- Joseph
- Kaczmarz
- Kak
- Kak
- Kalender
- Kalender
- Kalender
- Kasperl
- Kasperl
- Kastner
- Katsevich
- Katsevich
- Kevles
- Kharfi
- Kiekens
- Kiekens
- Kiekens
- Kijewski
- Kim
- Knutsson
- Korenblyum
- Kowaluk
- Kraemer
- Kress
- Kruth
- Kuhl
- Kuhn
- Kumar
- Kunzmann
- Küng
- La Rivière
- Lakshminarayanan
- Leach
- Leach
- Leach
- Lenard
- Leroy
- Lettenbauer
- Lettenbauer
- Levakhina
- Lifton
- Lifton
- Lifton
- Lifton
- Lou
- Léonard
- Maire
- Maizlin
- Mari
- Mari
- Mari
- Mari
- Mari
- MarketsandMarkets
- Marr
- Martin
- Martz
- Matsunaga
- Matsuzaki
- Mercier
- Mertens
- Mishra
- Mitchell
- Mix
- Moore
- Moroni G
- Mould
- Muders
- Muthukrishnan
- Müller
- Müller
- Müller
- Müller
- Müller
- Müller
- Müller
- Müller
- Müller
- Nalcioglu
- Nardelli
- Nardelli
- Nascimento
- Natterer
- Natterer
- Natterer
- Neel
- Neel
- Neel
- Niki
- O'Brien
- Office of Technology Assessment (OTA)
- Office of Technology Assessment (OTA)
- Oldendorf
- Ontiveros
- Ontiveros
- Opris
- Oster
- Otsu
- Pan
- Paxton
- Peschmann
- Pierobon
- Podgoršak
- Radon
- Raj
- Ralf
- Ramakrishnan
- Ramsey
- Redgrave
- Reimers
- Reimers
- Reinhart
- Reinhart
- Rosén
- Roth
- Rubin
- Rueckel
- Röntgen
- Saewert
- Savio
- Scherer
- Schmitt
- Schwenke
- Seeram
- Senin
- Shah
- Shammaa
- Shepp
- Shepp
- Shepp
- Shi
- Siewerdsen
- Sosman
- Spender
- Sprawls
- Staude
- Staude
- Stedman
- Stedman
- Stolfi
- Stolfi
- Stolfi
- Stolfi
- Stolfi
- Stuart T. Smith
- Stuewer
- Sukovic
- Sun
- Swornowski
- Süsskind
- Sładek
- Takahashi
- Takatsuji
- Tan
- Tan
- Tan
- Tan
- Teece
- TetelBaum
- Thomas
- Thomas
- Thompson
- Thompson
- Thompson
- Thompson
- Thompson
- Thomson
- Thomson
- Thousand
- Torralba
- Townsend
- Townsend
- Townsend
- Trajtenberg
- Tóth
- Van de Casteele
- Van de Casteele
- Van Gompel
- Van Tiggelen
- VDI/VDE 2630-1.2
- VDI/VDE 2630-1.3
- VDI/VDE 2630-2.1
- Villarraga-Gomez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Villarraga-Gómez
- Voet
- von Laue
- Watson
- Webb
- Weckenmann
- Weckenmann
- Weckenmann
- Weckenmann
- Weiß
- Welkenhuyzen
- Welkenhuyzen
- Wevers
- Whitehouse
- Wilhelm
- Withers
- Withers
- Wloka
- Woźniak
- Xu
- Yagüe-Fabra
- Zanini
- Zanini
- Zhang
- Zhao
- Zhu
- Ziedses des Plantes
- Ziedses des Plantes
- Publication venue
- 'Elsevier BV'
- Publication date
- Field of study
No full text
