Impact of ultrafast electronic damage in single particle x-ray imaging experiments

In single particle coherent x-ray diffraction imaging experiments, performed at x-ray free-electron lasers (XFELs), samples are exposed to intense x-ray pulses to obtain single-shot diffraction patterns. The high intensity induces electronic dynamics on the femtosecond time scale in the system, which can reduce the contrast of the obtained diffraction patterns and adds an isotropic background. We quantify the degradation of the diffraction pattern from ultrafast electronic damage by performing simulations on a biological sample exposed to x-ray pulses with different parameters. We find that the contrast is substantially reduced and the background is considerably strong only if almost all electrons are removed from their parent atoms. This happens at fluences of at least one order of magnitude larger than provided at currently available XFEL sources.Comment: 15 pages, 3 figures submitted to PR

Ion-Size Effect at the Surface of a Silica Hydrosol

The author used synchrotron x-ray reflectivity to study the ion-size effect for alkali ions (Na$^+$, K$^+$, Rb$^+$, and Cs$^+$), with densities as high as $4 \times 10^{18}- 7 \times 10^{18}$ m$^{-2}$, suspended above the surface of a colloidal solution of silica nanoparticles in the field generated by the surface electric-double layer. According to the data, large alkali ions preferentially accumulate at the sol's surface replacing smaller ions, a finding that qualitatively agrees with the dependence of the Kharkats-Ulstrup single-ion electrostatic free energy on the ion's radius.Comment: 17 pages, 4 figure