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4 research outputs found
Experimental investigation of snap-through motion of in-plane MEMS shallow arches under electrostatic excitation
Author
Abdallah Ramini
Cabal A
+12 more
Charlot B
Das K
Hwang I-H
Krylov S
Md Abdullah Al Hafiz
MEMSCAP
Michael A
Mohammad I Younis
Mohammed L F Bellaredj
Polytec Inc.
Tsay J
Zygo Corporation
Publication venue
'IOP Publishing'
Publication date
Field of study
No full text
Crossref
Development of hybrid metallic coatings on carbon fiber-reinforced polymers (CFRPs) by cold spray deposition of copper-assisted copper electroplating process
Author
Affi
André McDonald
+46 more
Arabgol
Archambault
ASTM Standard
Bae
Balaraju
Balaraju
Balaraju
Barletta
Che
Che
Che
Chen
Christoulis
Di
Duguet
FAA
Fujii
Fukumoto
Fukumoto
Ganesan
Ganesan
Huonnic
Katsoulis
Koivuluoto
Lee
Liang
Lopera-Valle
Lupoi
McCune
McDonald
McDonald
Meng
Nikolić
Nikolić
Panteha Fallah
Schlesinger
Schmidt
Smits
Sriraman Rajagopalan
Stephen Yue
Sturgeon
U.S. Department of Transportation Federal Aviation Administration
Webster
Yin
Zhou
Zygo Corporation
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
Crossref
On-machine and in-process surface metrology for precision manufacturing
Author
Abe
Acosta
+271 more
Adachi
Ainsworth
Anderson
Anthony
Aoki
Azzam
Bhuiyan
Biermann
Blaser
Boukebbab
Brinksmeier
Brock
Brown
Bryan
Burge
C.F. Cheung
Carmignato
Chen
Chen
Chen
Chen
Chen
Chen
Chen
Chen
Chen
Chen
Chen
Cheung
Choi
Choi
Danzebrink
Danzl
Davis
De Chiffre
Diez
Du
E. Savio
Edgeworth
Elkott
Elster
Ennos
Estler
Estler
Evans
Evans
Evans
F.Z. Fang
Faber
Faber
Fan
Fan
Fan
Fan
Fang
Fang
Fang
FANUC
Farin
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Gao
Garbini
Ghiotti
Giusti
Glenn
Goch
Gohari
Goto
Grandy
Graves
Groot
Guiassa
H. Haitjema
Haitjema
Haitjema
Haitjema
Haitjema
HEIDENHAIN
HEIDENHAIN
Hocken
Häusler
Ibaraki
IMS
Inasaki
ISO 17450-1
ISO 25178-2
ISO 25178-3
ISO 4287
ISO 4288
Ito
J.M. Linares
Jang
JCGM 200:2012(E/F)
Jeon
Jiang
Jiang
Jiang
Jiang
Jiang
Jokanović
Kakino
Keferstein
Keyence KK
Keyence KK
Keyence KK
Keyence KK
Kim
Kino
Kiyono
Kiyono
Kiyono
Kiyono
Knauer
Kohno
Koike
Kong
Kunzmann
Kwon
Le Goïc
Leach
Leach
Leach
Leach
Leach
Lecompte
Lee
Lee
Lee
Lee
Lei
Li
Li
Li
Li
Li
Li
Linares
Lion Precision
Liu
Liu
Liu
Lowman
Mac Gregor
Mahr GmbH
Mailhe
Makosch
Marsh
Marshall
Martin
Mayr
McKeown
McKeown
Mendikute
Micro-Epsilon
Mikulewitsch
Mitaka Kohki Co. Ltd
Molleda
Moore
Moore Nanotechnology Systems LLC
Muhamedsalih
Murase
Nagaike
Nakamoto
Nasrollahi
Niranjan Prasad
Nishikawa
Noh
Nomura
Nomura
Oh
Osawa
Pairel
Pantzer
Park
Peng
Perard
Persson
Pritschow
R.K. Leach
Rahman
Renishaw plc
Sato
Savio
Savio
Sawabe
Sawano
Schellekens
Schmidt
Schmit
Schmitt
Schnabel
Schwenke
Schöch
Schöch
Shan
Shibuya
Shimizu
Shinno
Shiraishi
Shore
Sims-Waterhouse
Stone
Stöbener
Su
Su
Suh
Suzuki
Takahashi
Takaya
Takaya
Takeda
Tanaka
Thomas
Tian
Tosello
Toshiba Machine Co. Ltd
TRIOPTICS GmbH
Uda
Uekita
Vorburger
W. Gao
Walecki
Wan
Wang
Weckenmann
Weckenmann
Weckenmann
Weichert
Whitehouse
Whitehouse
Whitehouse
Woodward
Wyant
Xi
Xu
Xu
Xu
Yamaguchi
Yamauchi
Yan
Yang
Yang
Yang
Yoshino
Zatarain
Zhang
Zhang
Zhang
Zhang
Zhang
Zhang
Zhang
Zhao
Zhu
Zobrist
Zygo Corporation
Publication venue
'Elsevier BV'
Publication date
01/01/2019
Field of study
No full text
Crossref
No full text
No full textNo full text