18 research outputs found

    PIXL: Planetary Instrument for X-Ray Lithochemistry

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    Planetary Instrument for X-ray Lithochemistry (PIXL) is a micro-focus X-ray fluorescence spectrometer mounted on the robotic arm of NASA’s Perseverance rover. PIXL will acquire high spatial resolution observations of rock and soil chemistry, rapidly analyzing the elemental chemistry of a target surface. In 10 seconds, PIXL can use its powerful 120 μm-diameter X-ray beam to analyze a single, sand-sized grain with enough sensitivity to detect major and minor rock-forming elements, as well as many trace elements. Over a period of several hours, PIXL can autonomously raster-scan an area of the rock surface and acquire a hyperspectral map comprised of several thousand individual measured points. When correlated to a visual image acquired by PIXL’s camera, these maps reveal the distribution and abundance variations of chemical elements making up the rock, tied accurately to the physical texture and structure of the rock, at a scale comparable to a 10X magnifying geological hand lens. The many thousands of spectra in these postage stamp-sized elemental maps may be analyzed individually or summed together to create a bulk rock analysis, or subsets of spectra may be summed, quantified, analyzed, and compared using PIXLISE data analysis software. This hand lens-scale view of the petrology and geochemistry of materials at the Perseverance landing site will provide a valuable link between the larger, centimeter- to meter-scale observations by Mastcam-Z, RIMFAX and Supercam, and the much smaller (micron-scale) measurements that would be made on returned samples in terrestrial laboratories.</p

    PIXL: Planetary Instrument for X-Ray Lithochemistry

    No full text
    Planetary Instrument for X-ray Lithochemistry (PIXL) is a micro-focus X-ray fluorescence spectrometer mounted on the robotic arm of NASA’s Perseverance rover. PIXL will acquire high spatial resolution observations of rock and soil chemistry, rapidly analyzing the elemental chemistry of a target surface. In 10 seconds, PIXL can use its powerful 120 μm-diameter X-ray beam to analyze a single, sand-sized grain with enough sensitivity to detect major and minor rock-forming elements, as well as many trace elements. Over a period of several hours, PIXL can autonomously raster-scan an area of the rock surface and acquire a hyperspectral map comprised of several thousand individual measured points. When correlated to a visual image acquired by PIXL’s camera, these maps reveal the distribution and abundance variations of chemical elements making up the rock, tied accurately to the physical texture and structure of the rock, at a scale comparable to a 10X magnifying geological hand lens. The many thousands of spectra in these postage stamp-sized elemental maps may be analyzed individually or summed together to create a bulk rock analysis, or subsets of spectra may be summed, quantified, analyzed, and compared using PIXLISE data analysis software. This hand lens-scale view of the petrology and geochemistry of materials at the Perseverance landing site will provide a valuable link between the larger, centimeter- to meter-scale observations by Mastcam-Z, RIMFAX and Supercam, and the much smaller (micron-scale) measurements that would be made on returned samples in terrestrial laboratories

    Correction to: PIXL: Planetary Instrument for X-Ray Lithochemistry (Space Science Reviews, (2020), 216, 8, (134), 10.1007/s11214-020-00767-7)

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    In section: 3 X-Ray Source 3.1 X-Ray Source Overview The following text should not be present: “The X-ray source combines components from multiple organizations. The high-voltage power supply (HVPS), which includes the LVCM, HVMM, and connecting cables, was designed and built by Battel Engineering and the University of Michigan Space Physics Research Laboratory (SPRL). The X-ray tube was designed and built by Moxtek Inc., and the X-ray optic was designed and built by XOS Inc. XOS aligned and integrated the X-ray tube and optic, while SPRL integrated this tube/optic assembly into the XRSA.” Please also find the corrected: Appendix A: Parameters This is a complete list of parameters that are in place when a scan is initiated that are returned in data products. All of these can be changed by uplink (Table presented.).</p
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