CMS physics technical design report : Addendum on high density QCD with heavy ions

Peer reviewe

One life ends, another begins: Management of a brain-dead pregnant mother - A systematic review -

Background: An accident or a catastrophic disease may occasionally lead to brain death (BD) during pregnancy. Management of brain-dead pregnant patients needs to follow special strategies to support the mother in a way that she can deliver a viable and healthy child and, whenever possible, also be an organ donor. This review discusses the management of brain-dead mothers and gives an overview of recommendations concerning the organ supporting therapy. Methods: To obtain information on brain-dead pregnant women, we performed a systematic review of Medline, EMBASE and the Cochrane Central Register of Controlled Trials (CENTRAL). The collected data included the age of the mother, the cause of brain death, maternal medical complications, gestational age at BD, duration of extended life support, gestational age at delivery, indication of delivery, neonatal outcome, organ donation of the mothers and patient and graft outcome. Results: In our search of the literature, we found 30 cases reported between1982 and 2010. A nontraumatic brain injury was the cause of BD in 26 of 30 mothers. The maternal mean age at the time of BD was 26.5 years. The mean gestational age at the time of BD and the mean gestational age at delivery were 22 and 29.5 weeks, respectively. Twelve viable infants were born and survived the neonatal period. Conclusion: The management of a brain-dead pregnant woman requires a multidisciplinary team which should follow available standards, guidelines and recommendations both for a nontraumatic therapy of the fetus and for an organ-preserving treatment of the potential donor

Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

Transparent layers such as polymers are complex and can contain defects which are not detectable with classical optical inspection techniques. With an interference microscope, tomographic analysis can be used to obtain initial structural information over the depth of the sample by scanning the fringes along the Z axis and performing appropriate signal processing to extract the fringe envelope. By observing the resulting XZ section, low contrast, sub-\ensuremathμm sized defects can be lost in the noise which is present in images acquired with a CCD camera. It is possible to reduce temporal and spatial noise from the camera by applying image processing methods such as image averaging, dark frame subtraction or flat field division. In this paper, we present some first results obtained by this means with a white light scanning interferometer on a Mylar polymer, used currently as an insulator in electronics and micro-electronics. We show that sub-\ensuremathμm sized structures contained in the layer, initially lost in noise and barely observable, can be detected by applying a combination of image processing methods to each of the scanned XY images along the Z-axis. In addition, errors from optical imperfections such as dust particles on the lenses or components of the system can be compensated for with this method. We thus demonstrate that XZ section images of a transparent sample can be denoised by improving each of the XY acquisition images. A quantitative study of the noise reduction is presented in order to validate the performance of this technique