3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling

ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight into the three-dimensional (3D) chemical composition of a series of polymer multilayer structures. Depths of more than 15 μm were profiled in these samples while maintaining uniform sputter rates. The 3D chemical images provide information regarding the structure of the multilayer systems that could be used to inform future systems manufacturing and development. This also includes measuring the layer homogeneity, thickness, and interface widths. The systems analyzed were spin-cast multilayers comprising alternating polystyrene (PS) and polyvinylpyrrolidone (PVP) layers. These included samples where the PVP and PS layer thickness values were kept constant throughout and samples where the layer thickness was varied as a function of depth in the multilayer. The depth profile data obtained was observed to be superior to that obtained for the same materials using alternative ion sources such as C60 n+. The data closely reflected the “as manufactured” sample specification, exhibiting good agreement with ellipsometry measurements of layer thickness, while also maintaining secondary ion intensities throughout the profiling regime. The unprecedented quality of the data allowed a detailed analysis of the chemical structure of these systems, revealing some minor imperfections within the polymer layers and demonstrating the enhanced capabilities of the argon cluster depth profiling technique

Proton-Antiproton Pair Production in Two-Photon Collisions at LEP

The reaction e^+e^- -> e^+e^- proton antiproton is studied with the L3 detector at LEP. The analysis is based on data collected at e^+e^- center-of-mass energies from 183 GeV to 209 GeV, corresponding to an integrated luminosity of 667 pb^-1. The gamma gamma -> proton antiproton differential cross section is measured in the range of the two-photon center-of-mass energy from 2.1 GeV to 4.5 GeV. The results are compared to the predictions of the three-quark and quark-diquark models

Ocrelizumab versus Interferon Beta-1a in Relapsing Multiple Sclerosis

Supported by F. Hoffmann–La Roche

Swift Heavy Ion Induced Modifications of Luminescence and Mechanical Properties of Polypropylene/ZnO Nanocomposites

The effect of irradiation with 150 MeV Kr ions at fluencies 1011 and 1012 ions/cm2 on luminescence of PP/ZnO nanocomposites and PP matrix has been studied. In unirradiated composite the luminescence is comparatively weak and is contributed mainly by the excitonic luminescence of ZnO. Irradiation of nanocomposite and PP matrix leads to a strong increase of luminescence intensity in a wide spectral range of 360–600 nm. It follows from the obtained results that the enhancement of luminescence originates mainly from the broken bonds in PP matrix. Ion-induced scission of polymer bonds and fragmentation of polymer chains is deduced also from the nanoindentation tests which show a remarkable reduction of hardness for the irradiated samples

Swift Heavy Ion Induced Modifications of Luminescence and Mechanical Properties of Polypropylene/ZnO Nanocomposites

The effect of irradiation with 150 MeV Kr ions at fluencies 1011 and 1012 ions/cm2 on luminescence of PP/ZnO nanocomposites and PP matrix has been studied. In unirradiated composite the luminescence is comparatively weak and is contributed mainly by the excitonic luminescence of ZnO. Irradiation of nanocomposite and PP matrix leads to a strong increase of luminescence intensity in a wide spectral range of 360–600 nm. It follows from the obtained results that the enhancement of luminescence originates mainly from the broken bonds in PP matrix. Ion-induced scission of polymer bonds and fragmentation of polymer chains is deduced also from the nanoindentation tests which show a remarkable reduction of hardness for the irradiated samples