Parametric, Secure and Compact Implementation of RSA on FPGA

We present a fast, efficient, and parameterized modular multiplier and a secure exponentiation circuit especially intended for FPGAs on the low end of the price range. The design utilizes dedicated block multipliers as the main functional unit and Block-RAM as storage unit for the operands. The adopted design methodology allows adjusting the number of multipliers, the radix used in the multipliers, and number of words to meet the system requirements such as available resources, precision and timing constraints. The architecture, based on the Montgomery modular multiplication algorithm, utilizes a pipelining technique that allows concurrent operation of hardwired multipliers. Our design completes 1020-bit and 2040-bit modular multiplications in 7.62 μs and 27.0 μs, respectively. The multiplier uses a moderate amount of system resources while achieving the best area-time product in literature. 2040-bit modular exponentiation engine can easily fit into Xilinx Spartan-3E 500; moreover the exponentiation circuit withstands known side channel attacks

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked

Optimizing soft error reliability through scheduling on heterogeneous multicore processors

Reliability to soft errors is an increasingly important issue as technology continues to shrink. In this paper, we show that applications exhibit different reliability characteristics on big, high-performance cores versus small, power-efficient cores, and that there is significant opportunity to improve system reliability through reliability-aware scheduling on heterogeneous multicore processors. We monitor the reliability characteristics of all running applications, and dynamically schedule applications to the different core types in a heterogeneous multicore to maximize system reliability. Reliability-aware scheduling improves reliability by 25.4 percent on average (and up to 60.2 percent) compared to performance-optimized scheduling on a heterogeneous multicore processor with two big cores and two small cores, while degrading performance by 6.3 percent only. We also introduce a novel system-level reliability metric for multiprogram workloads on (heterogeneous) multicores. We provide a trade-off analysis among reliability-, power- and performance-optimized scheduling, and evaluate reliability-aware scheduling under performance constraints and for unprotected L1 caches. In addition, we also extend our scheduling mechanisms to multithreaded programs. The hardware cost in support of our reliability-aware scheduler is limited to 296 bytes per core

NOVEL RESOURCE EFFICIENT CIRCUIT DESIGNS FOR REBOOTING COMPUTING

CMOS based computing is reaching its limits. To take computation beyond Moores law (the number of transistors and hence processing power on a chip doubles every 18 months to 3 years) requires research explorations in (i) new materials, devices, and processes, (ii) new architectures and algorithms, (iii) new paradigm of logic bit representation. The focus is on fundamental new ways to compute under the umbrella of rebooting computing such as spintronics, quantum computing, adiabatic and reversible computing. Therefore, this thesis highlights explicitly Quantum computing and Adiabatic logic, two new computing paradigms that come under the umbrella of rebooting computing. Quantum computing is investigated for its promising application in high-performance computing. The first contribution of this thesis is the design of two resource-efficient designs for quantum integer division. The first design is based on non-restoring division algorithm and the second one is based on restoring division algorithm. Both the designs are compared and shown to be superior to the existing work in terms of T-count and T-depth. The proliferation of IoT devices which work on low-power also has drawn interests to the rebooting computing. Hence, the second contribution of this thesis is proving that Adiabatic Logic is a promising candidate for implementation in IoT devices. The adiabatic logic family called Symmetric Pass Gate Adiabatic Logic (SPGAL) is implemented in PRESENT-80 lightweight algorithm. Adiabatic Logic is extended to emerging transistor devices

Conception de systèmes embarqués fiables et auto-réglables : applications sur les systèmes de transport ferroviaire

During the last few decades, a tremendous progress in the performance of semiconductor devices has been accomplished. In this emerging era of high performance applications, machines need not only to be efficient but also need to be dependable at circuit and system levels. Several works have been proposed to increase embedded systems efficiency by reducing the gap between software flexibility and hardware high-performance. Due to their reconfigurable aspect, Field Programmable Gate Arrays (FPGAs) represented a relevant step towards bridging this performance/flexibility gap. Nevertheless, Dynamic Reconfiguration (DR) has been continuously suffering from a bottleneck corresponding to a long reconfiguration time.In this thesis, we propose a novel medium-grained high-speed dynamic reconfiguration technique for DSP48E1-based circuits. The idea is to take advantage of the DSP48E1 slices runtime reprogrammability coupled with a re-routable interconnection block to change the overall circuit functionality in one clock cycle. In addition to the embedded systems efficiency, this thesis deals with the reliability chanllenges in new sub-micron electronic systems. In fact, as new technologies rely on reduced transistor size and lower supply voltages to improve performance, electronic circuits are becoming remarkably sensitive and increasingly susceptible to transient errors. The system-level impact of these errors can be far-reaching and Single Event Transients (SETs) have become a serious threat to embedded systems reliability, especially for especially for safety critical applications such as transportation systems. The reliability enhancement techniques that are based on overestimated soft error rates (SERs) can lead to unnecessary resource overheads as well as high power consumption. Considering error masking phenomena is a fundamental element for an accurate estimation of SERs.This thesis proposes a new cross-layer model of circuits vulnerability based on a combined modeling of Transistor Level (TLM) and System Level Masking (SLM) mechanisms. We then use this model to build a self adaptive fault tolerant architecture that evaluates the circuit’s effective vulnerability at runtime. Accordingly, the reliability enhancement strategy is adapted to protect only vulnerable parts of the system leading to a reliable circuit with optimized overheads. Experimentations performed on a radar-based obstacle detection system for railway transportation show that the proposed approach allows relevant reliability/resource utilization tradeoffs.Un énorme progrès dans les performances des semiconducteurs a été accompli ces dernières années. Avec l’´émergence d’applications complexes, les systèmes embarqués doivent être à la fois performants et fiables. Une multitude de travaux ont été proposés pour améliorer l’efficacité des systèmes embarqués en réduisant le décalage entre la flexibilité des solutions logicielles et la haute performance des solutions matérielles. En vertu de leur nature reconfigurable, les FPGAs (Field Programmable Gate Arrays) représentent un pas considérable pour réduire ce décalage performance/flexibilité. Cependant, la reconfiguration dynamique a toujours souffert d’une limitation liée à la latence de reconfiguration.Dans cette thèse, une nouvelle technique de reconfiguration dynamiqueau niveau ”grain-moyen” pour les circuits à base de blocks DSP48E1 est proposée. L’idée est de profiter de la reprogrammabilité des blocks DSP48E1 couplée avec un circuit d’interconnection reconfigurable afin de changer la fonction implémentée par le circuit en un cycle horloge. D’autre part, comme les nouvelles technologies s’appuient sur la réduction des dimensions des transistors ainsi que les tensions d’alimentation, les circuits électroniques sont devenus de plus en plus susceptibles aux fautes transitoires. L’impact de ces erreurs au niveau système peut être catastrophique et les SETs (Single Event Transients) sont devenus une menace tangible à la fiabilité des systèmes embarqués, en l’occurrence pour les applications critiques comme les systèmes de transport. Les techniques de fiabilité qui se basent sur des taux d’erreurs (SERs) surestimés peuvent conduire à un gaspillage de ressources et par conséquent un cout en consommation de puissance électrique. Il est primordial de prendre en compte le phénomène de masquage d’erreur pour une estimation précise des SERs.Cette thèse propose une nouvelle modélisation inter-couches de la vulnérabilité des circuits qui combine les mécanismes de masquage au niveau transistor (TLM) et le masquage au niveau Système (SLM). Ce modèle est ensuite utilisé afin de construire une architecture adaptative tolérante aux fautes qui évalue la vulnérabilité effective du circuit en runtime. La stratégie d’amélioration de fiabilité est adaptée pour ne protéger que les parties vulnérables du système, ce qui engendre un circuit fiable avec un cout optimisé. Les expérimentations effectuées sur un système de détection d’obstacles à base de radar pour le transport ferroviaire montre que l’approche proposée permet d’´établir un compromis fiabilité/ressources utilisées

Anti-Tamper Method for Field Programmable Gate Arrays Through Dynamic Reconfiguration and Decoy Circuits

As Field Programmable Gate Arrays (FPGAs) become more widely used, security concerns have been raised regarding FPGA use for cryptographic, sensitive, or proprietary data. Storing or implementing proprietary code and designs on FPGAs could result in the compromise of sensitive information if the FPGA device was physically relinquished or remotely accessible to adversaries seeking to obtain the information. Although multiple defensive measures have been implemented (and overcome), the possibility exists to create a secure design through the implementation of polymorphic Dynamically Reconfigurable FPGA (DRFPGA) circuits. Using polymorphic DRFPGAs removes the static attributes from their design; thus, substantially increasing the difficulty of successful adversarial reverse-engineering attacks. A variety of dynamically reconfigurable methodologies exist for implementation that challenge designers in the reconfigurable technology field. A Hardware Description Language (HDL) DRFPGA model is presented for use in security applications. The Very High Speed Integrated Circuit HDL (VHSIC) language was chosen to take advantage of its capabilities, which are well suited to the current research. Additionally, algorithms that explicitly support granular autonomous reconfiguration have been developed and implemented on the DRFPGA as a means of protecting its designs. Documented testing validates the reconfiguration results and compares power usage, timing, and area estimates from a conventional and DRFPGA model

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

An approach to quantifying hardware diversity against common cause failures

In this thesis, we cover the gapof quantifying diversity by introducing DIMP, a low-cost diversity metric based on analyzing the paths of the circuits and relating it to the particular case of automotive microcontrollers that implement lockstep cores

Applications in Electronics Pervading Industry, Environment and Society

This book features the manuscripts accepted for the Special Issue “Applications in Electronics Pervading Industry, Environment and Society—Sensing Systems and Pervasive Intelligence” of the MDPI journal Sensors. Most of the papers come from a selection of the best papers of the 2019 edition of the “Applications in Electronics Pervading Industry, Environment and Society” (APPLEPIES) Conference, which was held in November 2019. All these papers have been significantly enhanced with novel experimental results. The papers give an overview of the trends in research and development activities concerning the pervasive application of electronics in industry, the environment, and society. The focus of these papers is on cyber physical systems (CPS), with research proposals for new sensor acquisition and ADC (analog to digital converter) methods, high-speed communication systems, cybersecurity, big data management, and data processing including emerging machine learning techniques. Physical implementation aspects are discussed as well as the trade-off found between functional performance and hardware/system costs