13 research outputs found

    Multistage Packet-Switching Fabrics for Data Center Networks

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    Recent applications have imposed stringent requirements within the Data Center Network (DCN) switches in terms of scalability, throughput and latency. In this thesis, the architectural design of the packet-switches is tackled in different ways to enable the expansion in both the number of connected endpoints and traffic volume. A cost-effective Clos-network switch with partially buffered units is proposed and two packet scheduling algorithms are described. The first algorithm adopts many simple and distributed arbiters, while the second approach relies on a central arbiter to guarantee an ordered packet delivery. For an improved scalability, the Clos switch is build using a Network-on-Chip (NoC) fabric instead of the common crossbar units. The Clos-UDN architecture made with Input-Queued (IQ) Uni-Directional NoC modules (UDNs) simplifies the input line cards and obviates the need for the costly Virtual Output Queues (VOQs). It also avoids the need for complex, and synchronized scheduling processes, and offers speedup, load balancing, and good path diversity. Under skewed traffic, a reliable micro load-balancing contributes to boosting the overall network performance. Taking advantage of the NoC paradigm, a wrapped-around multistage switch with fully interconnected Central Modules (CMs) is proposed. The architecture operates with a congestion-aware routing algorithm that proactively distributes the traffic load across the switching modules, and enhances the switch performance under critical packet arrivals. The implementation of small on-chip buffers has been made perfectly feasible using the current technology. This motivated the implementation of a large switching architecture with an Output-Queued (OQ) NoC fabric. The design merges assets of the output queuing, and NoCs to provide high throughput, and smooth latency variations. An approximate analytical model of the switch performance is also proposed. To further exploit the potential of the NoC fabrics and their modularity features, a high capacity Clos switch with Multi-Directional NoC (MDN) modules is presented. The Clos-MDN switching architecture exhibits a more compact layout than the Clos-UDN switch. It scales better and faster in port count and traffic load. Results achieved in this thesis demonstrate the high performance, expandability and programmability features of the proposed packet-switches which makes them promising candidates for the next-generation data center networking infrastructure

    Control of sectioned on-chip communication

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    On Fault Tolerance Methods for Networks-on-Chip

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    Technology scaling has proceeded into dimensions in which the reliability of manufactured devices is becoming endangered. The reliability decrease is a consequence of physical limitations, relative increase of variations, and decreasing noise margins, among others. A promising solution for bringing the reliability of circuits back to a desired level is the use of design methods which introduce tolerance against possible faults in an integrated circuit. This thesis studies and presents fault tolerance methods for network-onchip (NoC) which is a design paradigm targeted for very large systems-onchip. In a NoC resources, such as processors and memories, are connected to a communication network; comparable to the Internet. Fault tolerance in such a system can be achieved at many abstraction levels. The thesis studies the origin of faults in modern technologies and explains the classification to transient, intermittent and permanent faults. A survey of fault tolerance methods is presented to demonstrate the diversity of available methods. Networks-on-chip are approached by exploring their main design choices: the selection of a topology, routing protocol, and flow control method. Fault tolerance methods for NoCs are studied at different layers of the OSI reference model. The data link layer provides a reliable communication link over a physical channel. Error control coding is an efficient fault tolerance method especially against transient faults at this abstraction level. Error control coding methods suitable for on-chip communication are studied and their implementations presented. Error control coding loses its effectiveness in the presence of intermittent and permanent faults. Therefore, other solutions against them are presented. The introduction of spare wires and split transmissions are shown to provide good tolerance against intermittent and permanent errors and their combination to error control coding is illustrated. At the network layer positioned above the data link layer, fault tolerance can be achieved with the design of fault tolerant network topologies and routing algorithms. Both of these approaches are presented in the thesis together with realizations in the both categories. The thesis concludes that an optimal fault tolerance solution contains carefully co-designed elements from different abstraction levelsSiirretty Doriast

    Développement d'architectures HW/SW tolérantes aux fautes et auto-calibrantes pour les technologies Intégrées 3D

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    Malgré les avantages de l'intégration 3D, le test, le rendement et la fiabilité des Through-Silicon-Vias (TSVs) restent parmi les plus grands défis pour les systèmes 3D à base de Réseaux-sur-Puce (Network-on-Chip - NoC). Dans cette thèse, une stratégie de test hors-ligne a été proposé pour les interconnections TSV des liens inter-die des NoCs 3D. Pour le TSV Interconnect Built-In Self-Test (TSV-IBIST) on propose une nouvelle stratégie pour générer des vecteurs de test qui permet la détection des fautes structuraux (open et short) et paramétriques (fautes de délaye). Des stratégies de correction des fautes transitoires et permanents sur les TSV sont aussi proposées aux plusieurs niveaux d'abstraction: data link et network. Au niveau data link, des techniques qui utilisent des codes de correction (ECC) et retransmission sont utilisées pour protégé les liens verticales. Des codes de correction sont aussi utilisés pour la protection au niveau network. Les défauts de fabrication ou vieillissement des TSVs sont réparé au niveau data link avec des stratégies à base de redondance et sérialisation. Dans le réseau, les liens inter-die défaillante ne sont pas utilisables et un algorithme de routage tolérant aux fautes est proposé. On peut implémenter des techniques de tolérance aux fautes sur plusieurs niveaux. Les résultats ont montré qu'une stratégie multi-level atteint des très hauts niveaux de fiabilité avec un cout plus bas. Malheureusement, il n'y as pas une solution unique et chaque stratégie a ses avantages et limitations. C'est très difficile d'évaluer tôt dans le design flow les couts et l'impact sur la performance. Donc, une méthodologie d'exploration de la résilience aux fautes est proposée pour les NoC 3D mesh.3D technology promises energy-efficient heterogeneous integrated systems, which may open the way to thousands cores chips. Silicon dies containing processing elements are stacked and connected by vertical wires called Through-Silicon-Vias. In 3D chips, interconnecting an increasing number of processing elements requires a scalable high-performance interconnect solution: the 3D Network-on-Chip. Despite the advantages of 3D integration, testing, reliability and yield remain the major challenges for 3D NoC-based systems. In this thesis, the TSV interconnect test issue is addressed by an off-line Interconnect Built-In Self-Test (IBIST) strategy that detects both structural (i.e. opens, shorts) and parametric faults (i.e. delays and delay due to crosstalk). The IBIST circuitry implements a novel algorithm based on the aggressor-victim scenario and alleviates limitations of existing strategies. The proposed Kth-aggressor fault (KAF) model assumes that the aggressors of a victim TSV are neighboring wires within a distance given by the aggressor order K. Using this model, TSV interconnect tests of inter-die 3D NoC links may be performed for different aggressor order, reducing test times and circuitry complexity. In 3D NoCs, TSV permanent and transient faults can be mitigated at different abstraction levels. In this thesis, several error resilience schemes are proposed at data link and network levels. For transient faults, 3D NoC links can be protected using error correction codes (ECC) and retransmission schemes using error detection (Automatic Retransmission Query) and correction codes (i.e. Hybrid error correction and retransmission).For transients along a source-destination path, ECC codes can be implemented at network level (i.e. Network-level Forward Error Correction). Data link solutions also include TSV repair schemes for faults due to fabrication processes (i.e. TSV-Spare-and-Replace and Configurable Serial Links) and aging (i.e. Interconnect Built-In Self-Repair and Adaptive Serialization) defects. At network-level, the faulty inter-die links of 3D mesh NoCs are repaired by implementing a TSV fault-tolerant routing algorithm. Although single-level solutions can achieve the desired yield / reliability targets, error mitigation can be realized by a combination of approaches at several abstraction levels. To this end, multi-level error resilience strategies have been proposed. Experimental results show that there are cases where this multi-layer strategy pays-off both in terms of cost and performance. Unfortunately, one-fits-all solution does not exist, as each strategy has its advantages and limitations. For system designers, it is very difficult to assess early in the design stages the costs and the impact on performance of error resilience. Therefore, an error resilience exploration (ERX) methodology is proposed for 3D NoCs.SAVOIE-SCD - Bib.électronique (730659901) / SudocGRENOBLE1/INP-Bib.électronique (384210012) / SudocGRENOBLE2/3-Bib.électronique (384219901) / SudocSudocFranceF

    Design Space Exploration and Resource Management of Multi/Many-Core Systems

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    The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

    Addressing Manufacturing Challenges in NoC-based ULSI Designs

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    Hernández Luz, C. (2012). Addressing Manufacturing Challenges in NoC-based ULSI Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/1669

    Customer premise service study for 30/20 GHz satellite system

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    Satellite systems in which the space segment operates in the 30/20 GHz frequency band are defined and compared as to their potential for providing various types of communications services to customer premises and the economic and technical feasibility of doing so. Technical tasks performed include: market postulation, definition of the ground segment, definition of the space segment, definition of the integrated satellite system, service costs for satellite systems, sensitivity analysis, and critical technology. Based on an analysis of market data, a sufficiently large market for services is projected so as to make the system economically viable. A large market, and hence a high capacity satellite system, is found to be necessary to minimize service costs, i.e., economy of scale is found to hold. The wide bandwidth expected to be available in the 30/20 GHz band, along with frequency reuse which further increases the effective system bandwidth, makes possible the high capacity system. Extensive ground networking is required in most systems to both connect users into the system and to interconnect Earth stations to provide spatial diversity. Earth station spatial diversity is found to be a cost effective means of compensating the large fading encountered in the 30/20 GHz operating band

    POF 2016: 25th International Conference on Plastic Optical Fibres - proceedings

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