6,419 research outputs found

    Design and Development of an Optical Chip Interferometer For High Precision On-Line Surface Measurement

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    Advances in manufacturing and with the demand of achieving faster throughput at a lower cost in any industrial setting have put forward the need for embedded metrology. Embedded metrology is the provision of metrology on the manufacturing platform, enabling measurement without the removal of the workpiece. Providing closer integration of metrology upon the manufacturing platform will improve material processing and reliability of manufacture for high added value products in ultra-high-precision engineering. Currently, almost all available metrology instrumentation is either too bulky, slow, destructive in terms of damaging the surfaces with a contacting stylus or is carried out off-line. One technology that holds promise for improving the current state-of-the-art in the online measurement of surfaces is hybrid photonic integration. This technique provides for the integration of individual optoelectronic components onto silicon daughter boards which are then incorporated on a silica motherboard containing waveguides to produce a complete photonic circuit. This thesis presents first of its kind a novel chip interferometer sensor based on hybrid integration technology for online surface and dimensional metrology applications. The complete metrology sensor system is structured into two parts; hybrid photonic chip and optical probe. The hybrid photonic chip interferometer is based on a silica-on-silicon etched integrated-optic motherboard containing waveguide structures and evanescent couplers. Upon the motherboard, electro-optic components such as photodiodes and a semiconductor gain block are mounted and bonded to provide the required functionality. Optical probe is a separate entity attached to the integrated optic module which serves as optical stylus for surface scanning in two measurement modes a) A single-point for measuring distance and thus form/surface topography through movement of the device or workpiece, b) Profiling (lateral scanning where assessment of 2D surface parameters may be determined in a single shot. Wavelength scanning and phase shifting inteferometry implemented for the retrival of phase information eventually providing the surface height measurement. The signal analysis methodology for the two measurement modes is described as well as a theoretical and experimental appraisal of the metrology capabilities in terms of range and resolution. The incremetal development of various hybrid photonic modules such as wavelength encoder unit, signal detection unit etc. of the chip interferometer are presented. Initial measurement results from various componets of metrology sensor and the surface measurement results in two measurement modes validate the applicability of the described sensor system as a potential metrology tool for online surface measurement applications

    On-chip spectro-detection for fully integrated coherent beam combiners

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    This paper presents how photonics associated with new arising detection technologies is able to provide fully integrated instrument for coherent beam combination applied to astrophysical interferometry. The feasibility and operation of on-chip coherent beam combiners has been already demonstrated using various interferometric combination schemes. More recently we proposed a new detection principle aimed at directly sampling and extracting the spectral information of an input signal together with its flux level measurement. The so-called SWIFTS demonstrated concept that stands for Stationary-Wave Integrated Fourier Transform Spectrometer, provides full spectral and spatial information recorded simultaneously thanks to a motionless detecting device. Due to some newly available detection principles considered for the implementation of the SWIFTS concept, some technologies can even provide photo-counting operation that brought a significant extension of the interferometry domain of investigation in astrophysics . The proposed concept is applicable to most of the interferometric instrumental modes including fringe tracking, fast and sensitive detection, Fourier spectral reconstruction and also to manage a large number of incoming beams. The paper presents three practical implementations, two dealing with pair-wise integrated optics beam combinations and the third one with an all-in-one 8 beam combination. In all cases the principles turned into a pair wise baseline coding after proper data processing.Comment: 12 pages, 6 figures, part of the Optics Express special issue dedicated to Astrophotonic

    High-performance 3D waveguide architecture for astronomical pupil-remapping interferometry

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    The detection and characterisation of extra-solar planets is a major theme driving modern astronomy, with the vast majority of such measurements being achieved by Doppler radial-velocity and transit observations. Another technique -- direct imaging -- can access a parameter space that complements these methods, and paves the way for future technologies capable of detailed characterization of exoplanetary atmospheres and surfaces. However achieving the required levels of performance with direct imaging, particularly from ground-based telescopes which must contend with the Earth's turbulent atmosphere, requires considerable sophistication in the instrument and detection strategy. Here we demonstrate a new generation of photonic pupil-remapping devices which build upon the interferometric framework developed for the {\it Dragonfly} instrument: a high contrast waveguide-based device which recovers robust complex visibility observables. New generation Dragonfly devices overcome problems caused by interference from unguided light and low throughput, promising unprecedented on-sky performance. Closure phase measurement scatter of only 0.2\sim 0.2^\circ has been achieved, with waveguide throughputs of >70%> 70\%. This translates to a maximum contrast-ratio sensitivity (between the host star and its orbiting planet) at 1λ/D1 \lambda/D (1σ\sigma detection) of 5.3×1045.3 \times 10^{-4} (when a conventional adaptive-optics (AO) system is used) or 1.8×1041.8 \times 10^{-4} (for typical `extreme-AO' performance), improving even further when random error is minimised by averaging over multiple exposures. This is an order of magnitude beyond conventional pupil-segmenting interferometry techniques (such as aperture masking), allowing a previously inaccessible part of the star to planet contrast-separation parameter space to be explored

    Atom Interferometers

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    Interference with atomic and molecular matter waves is a rich branch of atomic physics and quantum optics. It started with atom diffraction from crystal surfaces and the separated oscillatory fields technique used in atomic clocks. Atom interferometry is now reaching maturity as a powerful art with many applications in modern science. In this review we first describe the basic tools for coherent atom optics including diffraction by nanostructures and laser light, three-grating interferometers, and double wells on AtomChips. Then we review scientific advances in a broad range of fields that have resulted from the application of atom interferometers. These are grouped in three categories: (1) fundamental quantum science, (2) precision metrology and (3) atomic and molecular physics. Although some experiments with Bose Einstein condensates are included, the focus of the review is on linear matter wave optics, i.e. phenomena where each single atom interferes with itself.Comment: submitted to Reviews of Modern Physic

    Atom lasers: production, properties and prospects for precision inertial measurement

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    We review experimental progress on atom lasers out-coupled from Bose-Einstein condensates, and consider the properties of such beams in the context of precision inertial sensing. The atom laser is the matter-wave analog of the optical laser. Both devices rely on Bose-enhanced scattering to produce a macroscopically populated trapped mode that is output-coupled to produce an intense beam. In both cases, the beams often display highly desirable properties such as low divergence, high spectral flux and a simple spatial mode that make them useful in practical applications, as well as the potential to perform measurements at or below the quantum projection noise limit. Both devices display similar second-order correlations that differ from thermal sources. Because of these properties, atom lasers are a promising source for application to precision inertial measurements.Comment: This is a review paper. It contains 40 pages, including references and figure
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