From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Efficient hardware debugging using parameterized FPGA reconfiguration

Functional errors and bugs inadvertently introduced at the RTL stage of the design process are responsible for the largest fraction of silicon IC re-spins. Thus, comprehensive func- tional verification is the key to reduce development costs and to deliver a product in time. The increasing demands for verification led to an increase in FPGA-based tools that perform emulation. These tools can run at much higher operating frequencies and achieve higher coverage than simulation. However, an important pitfall of the FPGA tools is that they suffer from limited internal signal observability, as only a small and preselected set of signals is guided towards (embedded) trace buffers and observed. This paper proposes a dynamically reconfigurable network of multiplexers that significantly enhance the visibility of internal signals. It allows the designer to dynamically change the small set of internal signals to be observed, virtually enlarging the set of observed signals significantly. These multiplexers occupy minimal space, as they are implemented by the FPGA’s routing infrastructure

System-on-Chip Design and Test with Embedded Debug Capabilities

In this project, I started with a System-on-Chip platform with embedded test structures. The baseline platform consisted of a Leon2 CPU, AMBA on-chip bus, and an Advanced Encryption Standard decryption module. The basic objective of this thesis was to use the embedded reconfigurable logic blocks for post-silicon debug and verification. The System-on-Chip platform was designed at the register transistor level and implemented in a 180-nm IBM process. Test logic instrumentation was done with DAFCA (Design Automation for Flexible Chip Architecture) Inc. pre-silicon tools. The design was then synthesized using the Synopsys Design Compiler and placed and routed using Cadence SOC Encounter. Total transistor count is about 3 million, including 1400K transistors for the debug module serving as on chip logic analyzer. Core size of the design is about 4.8mm x 4.8mm and the system is working at 151MHz. Design verification was done with Cadence NCSim. The controllability and observability of internal signals of the design is greatly increased with the help of pre-silicon tools which helps locate bugs and later fix them with the help of post-silicon tools. This helps prevent re-spins on several occasions thus saving millions of dollars. Post-silicon tools have been used to program assertions and triggers and inject numerous personalities into the reconfigurable fabric which has greatly increased the versatility of the circuit

Multi Language Interpreter Embedding Tool for Shift Left Pre-Silicon Validation

Throughout the years, digital and analog designs have evolved meaningfully towards performance improvement, cost reduction and new features enablement. As a result, complexity has increased rapidly, demanding the development of better validation techniques in order to meet the time-to-market pressure calls with a bug free device. The primary choice of silicon development companies to validate software before the hardware becomes available, until now, is the FPGA based emulation platform, which leads to a big gap as it loads a register transfer level code that is usually not validated with SW-like flows in the early development stages. SW flows, mainly drivers, are validated in parallel to HW on SW emulation platforms. In order to fill the validation gap and push the finding of certain bugs to an earlier development stage, the idea of running SW tests with no or little modification in simulation environments would represent a big return of investment, rising the reliability of the system before manufacturing it, reducing time to market and development cost of the system on chip. This thesis explains the complete development of a framework able to run python scripts in VCS simulation by implementing the OVM Multi Language capability

Very Large Scale Integration Cell Based Path Extractor For Physical To Layout Mapping In Fault Isolation Work

Debug and diagnosis in post-silicon challenges the technological advancement in Physical-to-Layout Mapping capabilities. Areas that require such innovation are fault isolation work in failure analysis of semiconductor devices, at post-silicon stage. Since fault isolation work begins at Register Transfer Level (RTL) level to form a suspected boundary consisting of multiple logics from one end to the other, layout to schematic mapping automation tool helps to identify fault in design within given boundary. Therefore the development of a path extractor program which is capable of extracting all possible paths from these start to end signals can save engineers time in tracing components involved between a fault line. This feature is extremely significant in Electronic Design Automation (EDA) as it can provide results of net name sequences stored in a database of mapper files. These mapper files can be used in layout design debug as the net sequence represents schematic signals. To be able to retrieve all possible signals involved within a suspected boundary is a popular search computational problem. Therefore the path extractor program proposed incorporates the characteristics of a depth-first search algorithm by considering the specifications of a cell-based design. The objectives achieved in this research are proven reliable with path extraction results consistent even with search depth manipulation. Performance differs an average of 12.6 % (iteration count) with keeping maximum allowable depth of search constant. Paths of net sequences were consistent throughout the verification of the path extractor program. This development and study of the path extract method carries significance in areas of EDA and debug diagnosis work

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present