23 research outputs found

    Design of Frequency divider with voltage vontrolled oscillator for 60 GHz low power phase-locked loops in 65 nm RF CMOS

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    Increasing memory capacity in mobile devices, is driving the need of high-data rates equipment. The 7 GHz band around 60 GHz provides the opportunity for multi-gigabit/sec wireless communication. It is a real opportunity for developing next generation of High-Definition (HD) devices. In the last two decades there was a great proliferation of Voltage Controlled Oscillator (VCO) and Frequency Divider (FD) topologies in RF ICs on silicon, but reaching high performance VCOs and FDs operating at 60 GHz is in today's technology a great challenge. A key reason is the inaccuracy of CMOS active and passive device models at mm-W. Three critical issues still constitute research objectives at 60 GHz in CMOS: generation of the Local Oscillator (LO) signal (1), division of the LO signal for the Phase-Locked Loop (PLL) closed loop (2) and distribution of the LO signal (3). In this Thesis, all those three critical issues are addressed and experimentally faced-up: a divide-by-2 FD for a PLL of a direct-conversion transceiver operating at mm-W frequencies in 65 nm RF CMOS technology has been designed. Critical issues such as Process, Voltage and Temperature (PVT) variations, Electromagnetic (EM) simulations and power consumption are addressed to select and design a FD with high frequency dividing range. A 60 GHz VCO is co-designed and integrated in the same die, in order to provide the FD with mm-W input signal. VCOs and FDs play critical roles in the PLL. Both of them constitute the PLL core components and they would need co-design, having a big impact in the overall performance especially because they work at the highest frequency in the PLL. Injection Locking FD (ILFD) has been chosen as the optimum FD topology to be inserted in the control loop of mm-W PLL for direct-conversion transceiver, due to the high speed requirements and the power consumption constraint. The drawback of such topology is the limited bandwidth, resulting in narrow Locking Range (LR) for WirelessHDTM applications considering the impact of PVT variations. A simulation methodology is presented in order to analyze the ILFD locking state, proposing a first divide-by-2 ILFD design with continuous tuning. In order to design a wide LR, low power consumption ILFD, the impacts of various alternatives of low/high Q tank and injection scheme are deeply analysed, since the ILFD locking range depends on the Q of the tank and injection efficiency. The proposed 3-bit dual-mixing 60 GHz divide-by-2 LC-ILFD is designed with an accumulation of switching varactors binary scaled to compensate PVT variations. It is integrated in the same die with a 4-bit 60 GHz LC-VCO. The overall circuit is designed to allow measurements of the singles blocks stand-alone and working together. The co-layout is carried on with the EM modelling process of passives devices, parasitics and transmission lines extracted from the layout. The inductors models provided by the foundry are qualified up to 40 GHz, therefore the EM analysis is a must for post-layout simulation. The PVT variations have been simulated before manufacturing and, based on the results achieved, a PLL scheme PVT robust, considering frequency calibration, has been patented. The test chip has been measured in the CEA-Leti (Grenoble) during a stay of one week. The operation principle and the optimization trade-offs among power consumption, and locking ranges of the final selected ILFD topology have been demonstrated. Even if the experimental results are not completely in agreement with the simulations, due to modelling error and inaccuracy, the proposed technique has been validated with post-measurement simulations. As demonstrated, the locking range of a low-power, discrete tuned divide-by-2 ILFD can be enhanced by increasing the injection efficiency, without the drawbacks of higher power consumption and chip area. A 4-bits wide tuning range LC-VCO for mm-W applications has been co-designed using the selected 65 nm CMOS process.Postprint (published version

    Radiation Tolerant Electronics, Volume II

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    Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade.After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects

    Research and design of high-speed advanced analogue front-ends for fibre-optic transmission systems

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    In the last decade, we have witnessed the emergence of large, warehouse-scale data centres which have enabled new internet-based software applications such as cloud computing, search engines, social media, e-government etc. Such data centres consist of large collections of servers interconnected using short-reach (reach up to a few hundred meters) optical interconnect. Today, transceivers for these applications achieve up to 100Gb/s by multiplexing 10x 10Gb/s or 4x 25Gb/s channels. In the near future however, data centre operators have expressed a need for optical links which can support 400Gb/s up to 1Tb/s. The crucial challenge is to achieve this in the same footprint (same transceiver module) and with similar power consumption as today’s technology. Straightforward scaling of the currently used space or wavelength division multiplexing may be difficult to achieve: indeed a 1Tb/s transceiver would require integration of 40 VCSELs (vertical cavity surface emitting laser diode, widely used for short‐reach optical interconnect), 40 photodiodes and the electronics operating at 25Gb/s in the same module as today’s 100Gb/s transceiver. Pushing the bit rate on such links beyond today’s commercially available 100Gb/s/fibre will require new generations of VCSELs and their driver and receiver electronics. This work looks into a number of state‐of-the-art technologies and investigates their performance restraints and recommends different set of designs, specifically targeting multilevel modulation formats. Several methods to extend the bandwidth using deep submicron (65nm and 28nm) CMOS technology are explored in this work, while also maintaining a focus upon reducing power consumption and chip area. The techniques used were pre-emphasis in rising and falling edges of the signal and bandwidth extensions by inductive peaking and different local feedback techniques. These techniques have been applied to a transmitter and receiver developed for advanced modulation formats such as PAM-4 (4 level pulse amplitude modulation). Such modulation format can increase the throughput per individual channel, which helps to overcome the challenges mentioned above to realize 400Gb/s to 1Tb/s transceivers

    The 1992 4th NASA SERC Symposium on VLSI Design

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    Papers from the fourth annual NASA Symposium on VLSI Design, co-sponsored by the IEEE, are presented. Each year this symposium is organized by the NASA Space Engineering Research Center (SERC) at the University of Idaho and is held in conjunction with a quarterly meeting of the NASA Data System Technology Working Group (DSTWG). One task of the DSTWG is to develop new electronic technologies that will meet next generation electronic data system needs. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The NASA SERC is proud to offer, at its fourth symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories, the electronics industry, and universities. These speakers share insights into next generation advances that will serve as a basis for future VLSI design

    Topical Workshop on Electronics for Particle Physics

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    Solid State Circuits Technologies

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    The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book

    Belle II Technical Design Report

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    The Belle detector at the KEKB electron-positron collider has collected almost 1 billion Y(4S) events in its decade of operation. Super-KEKB, an upgrade of KEKB is under construction, to increase the luminosity by two orders of magnitude during a three-year shutdown, with an ultimate goal of 8E35 /cm^2 /s luminosity. To exploit the increased luminosity, an upgrade of the Belle detector has been proposed. A new international collaboration Belle-II, is being formed. The Technical Design Report presents physics motivation, basic methods of the accelerator upgrade, as well as key improvements of the detector.Comment: Edited by: Z. Dole\v{z}al and S. Un

    Haute-vitesse faible-puissance 0.5V 28nm FD-SOI 5T cellule SRAM

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    L'objectif de cette thĂšse est d'atteindre 0,5 V haute vitesse faible puissance SRAM. Pour ce faire, les cellules SRAM de pointe, des tableaux et des architectures de bus sont examinĂ©es. Les questions difficiles sont alors prĂ©cisĂ©es. Pour rĂ©pondre aux exigences, une cellule de 5T d'alimentation statique de puissance boostĂ©e, combinĂ© avec WL boostĂ© et milieu point de dĂ©tection et d'un tableau de multi divisĂ© BL ouvert sont proposĂ©es et Ă©valuĂ©es. Pour encore accĂ©lĂ©rer l'opĂ©ration d'Ă©criture, un tableau de 4Kb sĂ©lectivement stimulĂ© puissance alimentation 5T cell est proposĂ© et Ă©valuĂ© par simulation. Nous dĂ©couvrons que le point milieu de dĂ©tection avec moitiĂ© VDD BL precharge est plus stable lors de lire que la VDD complet conventionnelle precharge. En outre, pour atteindre un bus robuste Ă  grande vitesse de faible puissance 0,5-V,une architecture de bus dynamique avec un bus factice, qui se compose d'un pilote de dynamique et d'un rĂ©cepteur dynamique, est proposĂ©e. Le pilote dynamique permeten particulier de grande vitesse mĂȘme Ă  0,5 V avec overdrive porte accrue enchangeant les lignes Ă©lectriques de VDD/2 en mode veille avec VDD en mode actif. IlaccĂ©lĂšre encore avec l'aide du bus factice cette impulsion gena pour suivre le point dedĂ©tection tension du bus pour rĂ©duire l'oscillation de l'autobus. Ensuite, unearchitecture de bus 0,5-V 28 nm FD-SOI 32 bits Ă  l'aide de la proposition estevaluaevaluated par simulation. Il s'avĂšre que l'architecture a un potentiel Ă  exploiterun bus 1-pF Ă  50-mV swing, 1,2 GHz et un courant de veille de 1,1 ”A, avec x3-5 plus rapidement et plus de deux ordre plus faible courant de veille que l'architecture statique conventionnelle.The goal of the thesis is to achieve 0.5-V high-speed low-power SRAMs. To do so, state-of-the-art SRAM cells, arrays, and bus-architectures are reviewed. The challenging issues are then clarified as 1) reduction of the minimum operating voltage VDD (Vmin) of the cell, 2) reducing bitline (BL)-active power, and 3) achieving low-power bus architecture. To meet the requirements, a static boosted-power-supply 5T cell, combined with boosted-WL and mid-point-sensing, and an open-BL multi-divided-array are proposed and evaluated. Layout and post-layout simulation with a 28-nm fully-depleted planar-logic SOI MOSFET reveal that a 0.5-V 5T-cell 4-kb array in a 128-kb SRAM core is able to achieve x2-3 faster cycle time and x11 lower power than the counterpart 6T-cell array, suggesting a possibility of a 730-ps cycle time at 0.5 V.To further speed up the write operation, a selectively-boosted-power-supply 5T-cell 4-kb array is proposed and evaluated by simulation, showing that the 4-kb array operates at 350-ps cycle with x6 faster cycle time and x13 lower power than the 6T-cell array, while maintaining a small leakage current. We find out that the mid-point-sensing with half-VDD BL-precharging is more stable during read than the conventional full-VDD precharging. Furthermore, to achieve a 0.5-V low-power high-speed robust bus, a dynamic bus architecture with a dummy bus, which consists of a dynamic driver and a dynamic receiver, is proposed. In particular, the dynamic driver enables high speed even at 0.5 V with increased gate-over-drive by changing the power lines from VDD/2 in the standby mode to VDD in the active mode. It further speeds up with the help of the dummy bus that generates a pulse to track the bus-voltage detecting point for reducing the bus swing. Then, a 0.5-V 28-nm-FD-SOI 32-bit bus architecture using the proposal is evaluated by simulation. It turns out that the architecture has a potential to operate a 1-pF bus at about 50-mV swing, 1.2 GHz, and a standby current of 1.1 ”A, with x3-5 faster and more than two-order lower standby current than the conventional static architecture. Based on the results, further challenges to 0.5-V and sub-0.5-V SRAMs are described
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