Improved Limits on B0B^{0} decays to invisible (+γ)(+\gamma) final states

We establish improved upper limits on branching fractions for B0 decays to final States 10 where the decay products are purely invisible (i.e., no observable final state particles) and for final states where the only visible product is a photon. Within the Standard Model, these decays have branching fractions that are below the current experimental sensitivity, but various models of physics beyond the Standard Model predict significant contributions for these channels. Using 471 million BB pairs collected at the Y(4S) resonance by the BABAR experiment at the PEP-II e+e- storage ring at the SLAC National Accelerator Laboratory, we establish upper limits at the 90% confidence level of 2.4x10^-5 for the branching fraction of B0-->Invisible and 1.7x10^-5 for the branching fraction of B0-->Invisible+gammaComment: 8 pages, 3 postscript figures, submitted to Phys. Rev. D (Rapid Communications

Exclusive Measurements of b -> s gamma Transition Rate and Photon Energy Spectrum

We use 429 fb$^{-1}$ of $e^+e^-$ collision data collected at the $\Upsilon(4S)$ resonance with the BABAR detector to measure the radiative transition rate of $b\rightarrow s\gamma$ with a sum of 38 exclusive final states. The inclusive branching fraction with a minimum photon energy of 1.9 GeV is found to be $\mathcal{B}(\bar B \rightarrow X_{s}\gamma)=(3.29\pm 0.19\pm 0.48)\times 10^{-4}$ where the first uncertainty is statistical and the second is systematic. We also measure the first and second moments of the photon energy spectrum and extract the best fit values for the heavy-quark parameters, $m_{b}$ and $\mu_{\pi}^{2}$, in the kinetic and shape function models.Comment: 18 pages, 14 pdf figures, submitted to Phys. Rev.

The QCD transition temperature: results with physical masses in the continuum limit II.

We extend our previous study [Phys. Lett. B643 (2006) 46] of the cross-over temperatures (T_c) of QCD. We improve our zero temperature analysis by using physical quark masses and finer lattices. In addition to the kaon decay constant used for scale setting we determine four quantities (masses of the \Omega baryon, K^*(892) and \phi(1020) mesons and the pion decay constant) which are found to agree with experiment. This implies that --independently of which of these quantities is used to set the overall scale-- the same results are obtained within a few percent. At finite temperature we use finer lattices down to a <= 0.1 fm (N_t=12 and N_t=16 at one point). Our new results confirm completely our previous findings. We compare the results with those of the 'hotQCD' collaboration.Comment: 19 pages, 8 figures, 3 table

COURANTS NEUTRES ET CHARME DANS LES INTERACTIONS DE NEUTRINOS

Depuis quatre ans, la Physique du Neutrino a connu deux développements importants : l'étude des processus dus aux courants neutres faibles et l'étude de la production de particules charmées par des neutrinos. Pour illustrer les progrès expérimentaux accomplis dans ces domaines jusqu'en juin 1977, nous présentons dans cet article quelques résultats choisis parmi les plus marquants

Measurement of the spectral function for the τ- →k-KSντ decay

open238siThe decay tau(-) -> K- K(S)v(tau) has been studied using 430 x 10(6) e(+) e(-) -> tau(+) tau(-) events produced at a center-of-mass energy around 10.6 GeV at the PEP-II collider and studied with the BABAR detector. The mass spectrum of the K- K-S system has been measured and the spectral function has been obtained. The measured branching fraction B(tau(-) -> K- K(S)v(tau)) = (0.739 +/- 0.011 (stat) +/- 0.020 (syst)) x 10(-3) is found to be in agreement with earlier measurements.openLees, J.P.; Poireau, V.; Tisserand, V.; Grauges, E.; Palano, A.; Eigen, G.; Brown, D.N.; Kolomensky, Yu.G.; Fritsch, M.; Koch, H.; Schroeder, T.; Hearty, C.; Mattison, T.S.; McKenna, J.A.; So, R.Y.; Blinov, V.E.; Buzykaev, A.R.; Druzhinin, V.P.; Golubev, V.B.; Kozyrev, E.A.; Kravchenko, E.A.; Onuchin, A.P.; Serednyakov, S.I.; Skovpen, Yu.I.; Solodov, E.P.; Todyshev, K.Yu.; Lankford, A.J.; Gary, J.W.; Long, O.; Eisner, A.M.; Lockman, W.S.; Panduro Vazquez, W.; Chao, D.S.; Cheng, C.H.; Echenard, B.; Flood, K.T.; Hitlin, D.G.; Kim, J.; Li, Y.; Miyashita, T.S.; Ongmongkolkul, P.; Porter, F.C.; Röhrken, M.; Huard, Z.; Meadows, B.T.; Pushpawela, B.G.; Sokoloff, M.D.; Sun, L.; Smith, J.G.; Wagner, S.R.; Bernard, D.; Verderi, M.; Bettoni, D.; Bozzi, C.; Calabrese, R.; Cibinetto, G.; Fioravanti, E.; Garzia, I.; Luppi, E.; Santoro, V.; Calcaterra, A.; De Sangro, R.; Finocchiaro, G.; Martellotti, S.; Patteri, P.; Peruzzi, I.M.; Piccolo, M.; Rotondo, M.; Zallo, A.; Passaggio, S.; Patrignani, C.; Lacker, H.M.; Bhuyan, B.; Mallik, U.; Chen, C.; Cochran, J.; Prell, S.; Gritsan, A.V.; Arnaud, N.; Davier, M.; Le Diberder, F.; Lutz, A.M.; Wormser, G.; Lange, D.J.; Wright, D.M.; Coleman, J.P.; Gabathuler, E.; Hutchcroft, D.E.; Payne, D.J.; Touramanis, C.; Bevan, A.J.; Di Lodovico, F.; Sacco, R.; Cowan, G.; Banerjee, Sw.; Brown, D.N.; Davis, C.L.; Denig, A.G.; Gradl, W.; Griessinger, K.; Hafner, A.; Schubert, K.R.; Barlow, R.J.; Lafferty, G.D.; Cenci, R.; Jawahery, A.; Roberts, D.A.; Cowan, R.; Robertson, S.H.; Seddon, R.M.; Dey, B.; Neri, N.; Palombo, F.; Cheaib, R.; Cremaldi, L.; Godang, R.; Summers, D.J.; Taras, P.; De Nardo, G.; Sciacca, C.; Raven, G.; Jessop, C.P.; Losecco, J.M.; Honscheid, K.; Kass, R.; Gaz, A.; Margoni, M.; Posocco, M.; Simi, G.; Simonetto, F.; Stroili, R.; Akar, S.; Ben-Haim, E.; Bomben, M.; Bonneaud, G.R.; Calderini, G.; Chauveau, J.; Marchiori, G.; Ocariz, J.; Biasini, M.; Manoni, E.; Rossi, A.; Batignani, G.; Bettarini, S.; Carpinelli, M.; Casarosa, G.; Chrzaszcz, M.; Forti, F.; Giorgi, M.A.; Lusiani, A.; Oberhof, B.; Paoloni, E.; Rama, M.; Rizzo, G.; Walsh, J.J.; Zani, L.; Smith, A.J.S.; Anulli, F.; Faccini, R.; Ferrarotto, F.; Ferroni, F.; Pilloni, A.; Piredda, G.; Bünger, C.; Dittrich, S.; Grünberg, O.; Heß, M.; Leddig, T.; Voß, C.; Waldi, R.; Adye, T.; Wilson, F.F.; Emery, S.; Vasseur, G.; Aston, D.; Cartaro, C.; Convery, M.R.; Dorfan, J.; Dunwoodie, W.; Ebert, M.; Field, R.C.; Fulsom, B.G.; Graham, M.T.; Hast, C.; Innes, W.R.; Kim, P.; Leith, D.W.G.S.; Luitz, S.; Macfarlane, D.B.; Muller, D.R.; Neal, H.; Ratcliff, B.N.; Roodman, A.; Sullivan, M.K.; Va'Vra, J.; Wisniewski, W.J.; Purohit, M.V.; Wilson, J.R.; Randle-Conde, A.; Sekula, S.J.; Ahmed, H.; Bellis, M.; Burchat, P.R.; Puccio, E.M.T.; Alam, M.S.; Ernst, J.A.; Gorodeisky, R.; Guttman, N.; Peimer, D.R.; Soffer, A.; Spanier, S.M.; Ritchie, J.L.; Schwitters, R.F.; Izen, J.M.; Lou, X.C.; Bianchi, F.; De Mori, F.; Filippi, A.; Gamba, D.; Lanceri, L.; Vitale, L.; Martinez-Vidal, F.; Oyanguren, A.; Albert, J.; Beaulieu, A.; Bernlochner, F.U.; King, G.J.; Kowalewski, R.; Lueck, T.; Nugent, I.M.; Roney, J.M.; Sobie, R.J.; Tasneem, N.; Gershon, T.J.; Harrison, P.F.; Latham, T.E.; Prepost, R.; Wu, S.L.Lees, J. P.; Poireau, V.; Tisserand, V.; Grauges, E.; Palano, A.; Eigen, G.; Brown, D. N.; Kolomensky, Yu. G.; Fritsch, M.; Koch, H.; Schroeder, T.; Hearty, C.; Mattison, T. S.; Mckenna, J. A.; So, R. Y.; Blinov, V. E.; Buzykaev, A. R.; Druzhinin, V. P.; Golubev, V. B.; Kozyrev, E. A.; Kravchenko, E. A.; Onuchin, A. P.; Serednyakov, S. I.; Skovpen, Yu. I.; Solodov, E. P.; Todyshev, K. Yu.; Lankford, A. J.; Gary, J. W.; Long, O.; Eisner, A. M.; Lockman, W. S.; Panduro Vazquez, W.; Chao, D. S.; Cheng, C. H.; Echenard, B.; Flood, K. T.; Hitlin, D. G.; Kim, J.; Li, Y.; Miyashita, T. S.; Ongmongkolkul, P.; Porter, F. C.; Röhrken, M.; Huard, Z.; Meadows, B. T.; Pushpawela, B. G.; Sokoloff, M. D.; Sun, L.; Smith, J. G.; Wagner, S. R.; Bernard, D.; Verderi, M.; Bettoni, D.; Bozzi, C.; Calabrese, R.; Cibinetto, G.; Fioravanti, E.; Garzia, I.; Luppi, E.; Santoro, V.; Calcaterra, A.; De Sangro, R.; Finocchiaro, G.; Martellotti, S.; Patteri, P.; Peruzzi, I. M.; Piccolo, M.; Rotondo, M.; Zallo, A.; Passaggio, S.; Patrignani, C.; Lacker, H. M.; Bhuyan, B.; Mallik, U.; Chen, C.; Cochran, J.; Prell, S.; Gritsan, A. V.; Arnaud, N.; Davier, M.; Le Diberder, F.; Lutz, A. M.; Wormser, G.; Lange, D. J.; Wright, D. M.; Coleman, J. P.; Gabathuler, E.; Hutchcroft, D. E.; Payne, D. J.; Touramanis, C.; Bevan, A. J.; Di Lodovico, F.; Sacco, R.; Cowan, G.; Banerjee, Sw.; Brown, D. N.; Davis, C. L.; Denig, A. G.; Gradl, W.; Griessinger, K.; Hafner, A.; Schubert, K. R.; Barlow, R. J.; Lafferty, G. D.; Cenci, R.; Jawahery, A.; Roberts, D. A.; Cowan, R.; Robertson, S. H.; Seddon, R. M.; Dey, B.; Neri, N.; Palombo, F.; Cheaib, R.; Cremaldi, L.; Godang, R.; Summers, D. J.; Taras, P.; De Nardo, G.; Sciacca, C.; Raven, G.; Jessop, C. P.; Losecco, J. M.; Honscheid, K.; Kass, R.; Gaz, A.; Margoni, M.; Posocco, M.; Simi, G.; Simonetto, F.; Stroili, R.; Akar, S.; Ben-Haim, E.; Bomben, M.; Bonneaud, G. R.; Calderini, G.; Chauveau, J.; Marchiori, G.; Ocariz, J.; Biasini, M.; Manoni, E.; Rossi, A.; Batignani, G.; Bettarini, S.; Carpinelli, M.; Casarosa, G.; Chrzaszcz, M.; Forti, F.; Giorgi, M. A.; Lusiani, A.; Oberhof, B.; Paoloni, E.; Rama, M.; Rizzo, G.; Walsh, J. J.; Zani, L.; Smith, A. J. S.; Anulli, F.; Faccini, R.; Ferrarotto, F.; Ferroni, F.; Pilloni, A.; Piredda, G.; Bünger, C.; Dittrich, S.; Grünberg, O.; Heß, M.; Leddig, T.; Voß, C.; Waldi, R.; Adye, T.; Wilson, F. F.; Emery, S.; Vasseur, G.; Aston, D.; Cartaro, C.; Convery, M. R.; Dorfan, J.; Dunwoodie, W.; Ebert, M.; Field, R. C.; Fulsom, B. G.; Graham, M. T.; Hast, C.; Innes, W. R.; Kim, P.; Leith, D. W. G. S.; Luitz, S.; Macfarlane, D. B.; Muller, D. R.; Neal, H.; Ratcliff, B. N.; Roodman, A.; Sullivan, M. K.; Va'Vra, J.; Wisniewski, W. J.; Purohit, M. V.; Wilson, J. R.; Randle-Conde, A.; Sekula, S. J.; Ahmed, H.; Bellis, M.; Burchat, P. R.; Puccio, E. M. T.; Alam, M. S.; Ernst, J. A.; Gorodeisky, R.; Guttman, N.; Peimer, D. R.; Soffer, A.; Spanier, S. M.; Ritchie, J. L.; Schwitters, R. F.; Izen, J. M.; Lou, X. C.; Bianchi, F.; De Mori, F.; Filippi, A.; Gamba, D.; Lanceri, L.; Vitale, L.; Martinez-Vidal, F.; Oyanguren, A.; Albert, J.; Beaulieu, A.; Bernlochner, F. U.; King, G. J.; Kowalewski, R.; Lueck, T.; Nugent, I. M.; Roney, J. M.; Sobie, R. J.; Tasneem, N.; Gershon, T. J.; Harrison, P. F.; Latham, T. E.; Prepost, R.; Wu, S. L