73 research outputs found

    Characterization of Spatial Coherence of Synchrotron Radiation with Non-Redundant Arrays of Apertures

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    We present a method to characterize the spatial coherence of soft X-ray radiation from a single diffraction pattern. The technique is based on scattering from non-redundant arrays (NRA) of slits and records the degree of spatial coherence at several relative separations from one to 15 microns, simultaneously. Using NRAs we measured the transverse coherence of the X-ray beam at the XUV X-ray beamline P04 of the PETRA III synchrotron storage ring as a function of different beam parameters. To verify the results obtained with the NRAs additional Young's double pinhole experiments were conducted and show good agreement.Comment: 15 pages, 6 figures, 2 tables, 42 reference

    Fractal Generalized Zone Plates

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    The construction of fractal generalized zone plates (FraGZPs) from a set of periodic diffractive optical elements with circular symmetry is proposed. This allows us to increase the number of foci of a conventional fractal zone plate (FraZP), keeping the self-similarity property within the axial irradiance. The focusing properties of these fractal diffractive optical elements for points not only along but also in the close vicinity of the optical axis are investigated. In both cases analytical expressions for the irradiance are derived. Numerical simulations of the energetic efficiency of FraGZPs under plane wave illumination are carried out. In addition, some effects on the axial irradiance caused by the variation in area of their transparent rings are shown.Comment: Submitted to Optics Express, 200

    Combining scanning probe microscopy and x-ray spectroscopy

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    A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented

    Elemental and chemically specific x-ray fluorescence imaging of biological systems

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    PERSPECTIVAS DEL PROCESO DE GLOBALIZACIÓN Y SU INFLUENCIA SOBRE LOS DERECHOS HUMANOS ECONÓMICOS, SOCIALES Y CULTURALES

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    El escenario internacional se encuentra en constante transformación debido a lo que se ha denominado el proceso de “globalización”. Este afecta las relaciones internaciones interestatales e influye en la vida cotidiana de los individuos. El Derecho Internacional y más específicamente el Derecho Internacional de los Derechos Humanos no es ajeno a este proceso. La investigación afirma que nos encontramos frente a una etapa de transnacionalización de los Derechos Humanos, que permite que los individuos cuenten con mayor protección en ámbitos supranacionales. También hace especial mención a los derechos Económicos Sociales y Culturales, analiza el debate sobre el pluralismo jurídico y la eficacia diferencial. En la metodología empleada se revisan fuentes documentales y se realiza un análisis de algunos derechos particulares previstos en el Pacto de Derechos Económicos, Sociales y Culturales. Los planteamientos permiten afirmar que el proceso de globalización ha determinado la transnacionalización de los Derechos Humanos, surgiendo de dicho fenómeno consecuencias positivas y negativas en cuanto a su cumplimiento

    Structural dynamics of GaN microcrystals in evolutionary selection selective area growth probed by X-ray microdiffraction

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    A method to grow high quality, single crystalline semiconductor material irrespective of the substrate would allow a cost-effective improvement to functionality and performance of optoelectronic devices. Recently, a novel type of substrate-insensitive growth process called Evolutionary Selection Selective Area Growth (ES-SAG) has been proposed. Here we report the use of X-ray microdiffraction to study the structural properties of GaN microcrystals grown by ES-SAG. Utilizing high resolution in both direct and reciprocal spaces, we have unraveled structural dynamics of GaN microcrystals in growth structures of different dimensions. It has been found that the geometric proportions of the growth constrictions play an important role: 2.6â.Î 1/4m and 4.5â.Î 1/4m wide growth tunnels favor the evolutionary selection mechanism, contrary to the case of 8.6â.Î 1/4m growth tunnels. It was also found that GaN microcrystal ensembles are dominated by slight tensile strain irrespective of growth tunnel shape
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