We present a method to characterize the spatial coherence of soft X-ray
radiation from a single diffraction pattern. The technique is based on
scattering from non-redundant arrays (NRA) of slits and records the degree of
spatial coherence at several relative separations from one to 15 microns,
simultaneously. Using NRAs we measured the transverse coherence of the X-ray
beam at the XUV X-ray beamline P04 of the PETRA III synchrotron storage ring as
a function of different beam parameters. To verify the results obtained with
the NRAs additional Young's double pinhole experiments were conducted and show
good agreement.Comment: 15 pages, 6 figures, 2 tables, 42 reference