A 0.3-1.2V Schottky-Based CMOS ZTC Voltage Reference

A voltage reference based on MOSFETs operated under Zero Temperature Coefficient (ZTC) bias is proposed. The circuit operates in a power supply voltage range from 0.3V up to 1.2V and outputs three different reference voltages using Standard-VT (SVT), Low-VT (LVT), and Zero-VT (ZVT) MOS transistors biased near their ZTC point by a single PTAT current reference. Measurements on 15 circuit samples fabricated in a standard 0.13-µm CMOS process show a worst-case normalized standard deviation (σ/µ) of 3% (SVT), 5.1% (LVT) and 10.8% (ZVT) respectively with a 75% of confidence level. At the nominal supply voltage of 0.45 V, the measured effective temperature coefficients (TCeff) range from 140 to 200 ppm/oC over the full commercial temperature range. At room temperature (25oC), line sensitivity in the ZVT VR is just 1.3%/100mV, over the whole supply range. The proposed reference draws around 5 µW and occupies 0.014 mm2 of silicon area

Ultralow power voltage reference circuit for implantable devices in standard CMOS technology

This is the peer reviewed version of the following article: Óscar Pereira-Rial, Paula López, Juan M. Carrillo, Victor M. Brea and Diego Cabello (2019) Ultralow power voltage reference circuit for implantable devices in standard CMOS technology. International journal of circuit theory and applications, 47 (7), 991-1005, which has been published in final form at https://doi.org/10.1002/cta.2643. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived VersionsAn ultralow power CMOS voltage reference for body implantable devices is presented in this paper. The circuit core consists of only regular threshold voltage PMOS transistors, thus leading to a very reduced output voltage dispersion, defined as σ/μ, and extremely low power consumption. A mathematical model of the generated reference voltage was obtained by solving circuit equations, and its numerical solution has been validated by extensive electrical simulations using a commercial circuit simulator. The proposed solution incorporates a passive RC low‐pass filter, to enhance power supply rejection (PSR) over a wide frequency range, and a speed‐up section, to accelerate the switching‐on of the circuit. The prototype was implemented in 0.18 μm standard CMOS technology and is able to operate with supply voltages ranging from 0.7 to 1.8 V providing a measured output voltage value of 584.2 mV at the target temperature of 36° C. The measured σ/μ dispersion of the reference voltage generated is 0.65% without the need of trimming. At the minimum supply of 0.7 V, the experimental power consumption is 64.5 pW, while the measured PSR is kept below –60 dB from DC up to the MHz frequency rangeThis work has been partially funded by the Spanish government projects TEC2015‐66878‐C3‐3‐R (MINECO/FEDER) and RTI2018‐097088‐B‐C32 (FEDER), by the Xunta de Galicia under project ED431C2017/69, by the Consellería de Cultura, Educación e Ordenación Universitaria (accreditation 2016‐2019, ED431G/08 and reference competitive group 2017‐2020, ED431C 2017/69), by the Junta de Extremadura R&D Plan, and the European Fund for Regional Development (EFRD) under Grant IB18079S

A low-power native NMOS-based bandgap reference operating from −55°C to 125°C with Li-Ion battery compatibility

Summary The paper describes the implementation of a bandgap reference based on native-MOSFET transistors for low-power sensor node applications. The circuit can operate from −55°C to 125°C and with a supply voltage ranging from 1.5 to 4.2 V. Therefore, it is compatible with the temperature range of automotive and military-aerospace applications, and for direct Li-Ion battery attach. Moreover, the circuit can operate without any dedicated start-up circuit, thanks to its inherent single operating point. A mathematical model of the reference circuit is presented, allowing simple portability across technology nodes, with current consumption and silicon area as design parameters. Implemented in a 55-nm CMOS technology, the voltage reference achieves a measured average (maximum) temperature coefficient of 28 ppm/°C (43 ppm/°C) and a measured sample-to-sample variation within 57 mV, with a current consumption of 420 nA at 27°C

In Situ Automatic Analog Circuit Calibration and Optimization

As semiconductor technology scales down, the variations of active/passive device characteristics after fabrication are getting more and more significant. As a result, many circuits need more accuracy margin to meet minimum accuracy specifications over huge process-voltage-temperature (PVT) variations. Although, overdesigning a circuit is sometimes not a feasible option because of excessive accuracy margin that requires high power consumption and large area. Consequently, calibration/tuning circuits that can automatically detect and compensate the variations have been researched for analog circuits to make better trade-offs among accuracy, power consumption, and area. The first part of this dissertation shows that a newly proposed in situ calibration circuit for a current reference can relax the sharp trade-off between the temperature coefficient accuracy and the power consumption of the current reference. Prototype chips fabricated in a 180 nm CMOS technology generate 1 nA and achieve an average temperature coefficient of 289 ppm/°C and an average line sensitivity of 1.4 %/V with no help from a multiple-temperature trimming. Compared with other state-of-the-art current references that do not need a multiple-temperature trimming, the proposed circuit consumes at least 74% less power, while maintaining similar or higher accuracy. The second part of this dissertation proves that a newly proposed multidimensional in situ analog circuit optimization platform can optimize a Tow-Thomas bandpass biquad. Unlike conventional calibration/tuning approaches, which only handle one or two frequency-domain characteristics, the proposed platform optimizes the power consumption, frequency-, and time-domain characteristics of the biquad to make a better trade-off between the accuracy and the power consumption of the biquad. Simulation results show that this platform reduces the gain-bandwidth product of op-amps in the biquad by 80% while reducing the standard deviations of frequency- and time-domain characteristics by 82%. Measurement results of a prototype chip fabricated in a 180 nm CMOS technology also show that this platform can save maximum 71% of the power consumption of the biquad while the biquad maintains its frequency-domain characteristics: Q, ωO and the gain at ωO

Referências de tensão integradas CMOS : testes, medidas e caracterização térmica

Este trabalho descreve o setup de medidas e os resultados experimentais de uma Referência de Tensão somente com transistores NMOS baseada no ponto ZTC. Os transistores Zero- VT são usados como cargas ativas no circuito aberto e de feedback do circuito. Os resultados de medição de 10 amostras (processo 130 nm CMOS) do mesmo lote mostram que o circuito pode operar em 0,6 V de tensão mínima de alimentação, produz um Vref 0,372 V com 3 mV de desvio padrão, em comparação com 0,450 V e 29,2 mV respectivamente da simulação pós-layout. Além disso, o circuito ocupa uma área de apenas 0,006 mm 2. O coeficiente de temperatura medido de -55 oC a 75 oC é 76 ppm / oC para alimentação nominal de 1,2 V. O consumo de energia à temperatura ambiente e a alimentação de 1,2 V é de cerca de 0,9 μW. O circuito atinge um line sensitivity de apenas 0.177 % / V. O PSR foi medido em 500 Hz, 1 Khz, 10Khz e 100Khz e os resultados foram -27,5 dB, -23,5, -11,5 e -9,42 respectivamente.This work describes the measurement setup and results of NMOS-Only Voltage Reference based on the Zero Temperature Coefficient (ZTC) transistor point. Zero-VT transistors are used as active loads in the open and feedback loop of the circuit. Measurement results from 10 samples (130 nm CMOS process) of the same batch shows that circuit can operate at 0.6 minimum supply voltage, produces a Vref of 0.372 V with 3 mV of standard deviation, in comparison of 0.450 V and 29.2 mV respectively for post-layout simulation. Also the circuit occupy a 0.006 mm2 area. Measured temperature coefficient from -55 oC to 75 oC is 76 ppm/oC for nominal 1.2 V supply. Power consumption at room temperature and 1.2 V supply is around 0.9 μW. The circuit achieve a line sensitivity of only 0.177 %/V. The PSR was measured in 500 Hz, 1 Khz, 10Khz and 100Khz and the results was -27.5 dB, -23.5, -11.5 and -9.42 respectively

Variability-aware design of CMOS nanopower reference circuits

Questo lavoro è inserito nell'ambito della progettazione di circuiti microelettronici analogici con l'uso di tecnologie scalate, per le quali ha sempre maggiore importanza il problema della sensibilità delle grandezze alle variazioni di processo. Viene affrontata la progettazione di generatori di quantità di riferimento molto precisi, basati sull’uso di dispositivi che sono disponibili anche in tecnologie CMOS standard e che sono “intrinsecamente” più robusti rispetto alle variazioni di processo. Questo ha permesso di ottenere una bassa sensibilità al processo insieme ad un consumo di potenza estremamente ridotto, con il principale svantaggio di una elevata occupazione di area. Tutti i risultati sono stati ottenuti in una tecnologia 0.18μm CMOS. In particolare, abbiamo progettato un riferimento di tensione, ottenendo una deviazione standard relativa della tensione di riferimento dello 0.18% e un consumo di potenza inferiore a 70 nW, sulla base di misure su un set di 20 campioni di un singolo batch. Sono anche disponibili risultati relativi alla variabilità inter batch, che mostrano una deviazione standard relativa cumulativa della tensione di riferimento dello 0.35%. Abbiamo quindi progettato un riferimento di corrente, ottenendo anche in questo caso una sensibilità al processo della corrente di riferimento dell’1.4% con un consumo di potenza inferiore a 300 nW (questi sono risultati sperimentali ottenuti dalle misure su 20 campioni di un singolo batch). I riferimenti di tensione e di corrente proposti sono stati quindi utilizzati per la progettazione di un oscillatore a rilassamento a bassa frequenza, che unisce una ridotta sensibilità al processo, inferiore al 2%, con un basso consumo di potenza, circa 300 nW, ottenuto sulla base di simulazioni circuitali. Infine, nella progettazione dei blocchi sopra menzionati, abbiamo applicato un metodo per la determinazione della stabilità dei punti di riposo, basato sull’uso dei CAD standard utilizzati per la progettazione microelettronica. Questo approccio ci ha permesso di determinare la stabilità dei punti di riposo desiderati, e ci ha anche permesso di stabilire che i circuiti di start up spesso non sono necessari

Integrated Circuits for Programming Flash Memories in Portable Applications

Smart devices such as smart grids, smart home devices, etc. are infrastructure systems that connect the world around us more than before. These devices can communicate with each other and help us manage our environment. This concept is called the Internet of Things (IoT). Not many smart nodes exist that are both low-power and programmable. Floating-gate (FG) transistors could be used to create adaptive sensor nodes by providing programmable bias currents. FG transistors are mostly used in digital applications like Flash memories. However, FG transistors can be used in analog applications, too. Unfortunately, due to the expensive infrastructure required for programming these transistors, they have not been economical to be used in portable applications. In this work, we present low-power approaches to programming FG transistors which make them a good candidate to be employed in future wireless sensor nodes and portable systems. First, we focus on the design of low-power circuits which can be used in programming the FG transistors such as high-voltage charge pumps, low-drop-out regulators, and voltage reference cells. Then, to achieve the goal of reducing the power consumption in programmable sensor nodes and reducing the programming infrastructure, we present a method to program FG transistors using negative voltages. We also present charge-pump structures to generate the necessary negative voltages for programming in this new configuration

Ultra-Low-Power Sensors and Receivers for IoT Applications

The combination of ultra-low power analog front-ends and CMOS-compatible transducers enable new applications, such as environmental monitors, household appliances, health trackers, etc. that are seamlessly integrated into our daily lives. Furthermore, wireless connectivity allows many of these sensors to operate both independently and collectively. These techniques collectively fulfil the recent surge of internet-of-things (IoT) applications that have the potential to fundamentally change daily life for millions of people.In this dissertation, the circuit and system design of wireless receivers and sensors is presented that explores the challenges of implementing long lifespan, high accuracy, and large coverage range IoT sensor networks. The first is a wake-up receiver (WuRX), which continuously monitors the RF environment to wake up a higher-power radio upon detection of a predetermined RF signature. This work both improves sensitivity and reduces power over prior art through a multi-faceted design featuring an impedance transformation network with large passive voltage gain, an active envelope detector with high input impedance to facilitate large passive voltage gain, a low-power precision comparator, and a low-leakage digital baseband correlator.Although pushing the prior WuRX performance boundary by orders of magnitude, the first work shows moderate sensitivity, inferior temperature robustness, and large area with external lumped components. Thus, the second work shows a miniaturized WuRX that is temperature-compensated, yet still consumes only nano-watt power and millimeter area while operating at 9 GHz. To further reduce the area, a global common-mode feedback is utilized across the envelope detector and baseband amplifier that eliminates the need for off-chip ac-coupling components. Multiple temperature-compensation techniques are proposed to maintain constant bandwidth of the signal path and constant clock frequency. Both WuRXs operate at 0.4 V supply, consume near-zero power and achieve ~-70 dBm sensitivity.Lastly, the first reported CMOS 2-in-1 relative humidity and temperature sensor is presented. A unified analog front-end interfaces on-chip transducers and converts the inputs into a frequency vis a high-linearity frequency-locked loop. An incomplete-settling switched-capacitor-based Wheatstone bridge is proposed to sense the inputs in a power-efficient fashion

Low Power, High PSR CMOS Voltage References

With integration of various functional modules such as radio frequency (RF) circuits, power management, and high frequency digital and analog circuits into one system on chip (SoC) in recent applications, power supply noise can cause significant system performance deterioration. This makes supply noise rejection of the embedded voltage reference crucial in modern SoC applications. Also the use of resistors in bandgap voltage references makes them less suitable for modern low power and portable applications. This thesis introduces two resistorless sub-1 V, all MOSFET references. The goal is to achieve a high power supply rejection (PSR) over a wide bandwidth not achieved in previous works. This high PSR over wide bandwidth is achieved by using a combination of a feedback technique and an innovative compact MOSFET low pass filter. The two references were fabricated in a standard 0.18 µm CMOS process. The first reference uses a composite transistor in subthreshold to produce a proportional-to-absolute temperature (PTAT) voltage which is converted to a current used to thermally compensate the threshold voltage of a MOSFET in saturation. The second references uses dynamic-threshold voltage MOSFET (DTMOS) to produce a PTAT voltage which is converted to a current used to thermally compensate the threshold voltage of a MOSFET in saturation. The measurement shows that both references consumes a sub-1 µW power across their entire operating temperatures. The first reference achieves a PSR better than 50 dB for frequencies of up to 70 MHz and a 20 ppm/°C temperature coefficient (TC) for temperatures from -35 °C — 80 °C. It has a compact area of 0.0180 mm2 and operates on a supply of 1.2 V — 2.3 V. The second reference achieves a PSR better than 50 dB for frequencies of up to 60 MHz. This reference achieves a TC of 9.33 ppm/°C after trimming for temperatures from -30 °C — 110 °C and a line regulation of 0.076 %/V for a step from 0.8 V to 2 V supply voltage with 360 nW power consumption at room temperature. It has a compact area of 0.0143 mm^2

Design and Implementation of Low Power SRAM Using Highly Effective Lever Shifters

The explosive growth of battery-operated devices has made low-power design a priority in recent years. In high-performance Systems-on-Chip, leakage power consumption has become comparable to the dynamic component, and its relevance increases as technology scales. These trends are even more evident for SRAM memory devices since they are a dominant source of standby power consumption in low-power application processors. The on-die SRAM power consumption is particularly important for increasingly pervasive mobile and handheld applications where battery life is a key design and technology attribute. In the SRAM-memory design, SRAM cells also comprise the most significant portion of the total chip. Moreover, the increasing number of transistors in the SRAM memories and the MOSs\u27 increasing leakage current in the scaled technologies have turned the SRAM unit into a power-hungry block for both dynamic and static viewpoints. Although the scaling of the supply voltage enables low-power consumption, the SRAM cells\u27 data stability becomes a major concern. Thus, the reduction of SRAM leakage power has become a critical research concern. To address the leakage power consumption in high-performance cache memories, a stream of novel integrated circuit and architectural level techniques are proposed by researchers including leakage-current management techniques, cell array leakage reduction techniques, bitline leakage reduction techniques, and leakage current compensation techniques. The main goal of this work was to improve the cell array leakage reduction techniques in order to minimize the leakage power for SRAM memory design in low-power applications. This study performs the body biasing application to reduce leakage current as well. To adjust the NMOSs\u27 threshold voltage and consequently leakage current, a negative DC voltage could be applied to their body terminal as a second gate. As a result, in order to generate a negative DC voltage, this study proposes a negative voltage reference that includes a trimming circuit and a negative level shifter. These enhancements are employed to a 10kb SRAM memory operating at 0.3V in a 65nm CMOS process