An Effective Verification Solution for Modern Microprocessors.

Over the past four decades microprocessors have come to be a vital and inseparable part of the modern world, becoming the digital brain of numerous electronic devices and gadgets that make today's lifestyle possible. Processors are capable of performing computation at astonishingly high speeds and are extremely integrated, occupying only a few square centimeters of silicon die. However, this computational power comes at a price: the task of verifying a modern microprocessor and guaranteeing correctness of its operation is increasingly challenging, even for most established processor vendors. Always attempting to deliver higher performance to end-users, processor manufacturers are forced to design progressively more complex circuits and employ immense verification teams to eliminate critical design bugs in a timely manner. Unfortunately, too often size doesn't seem to matter in verification, as schedules continue to slip and microprocessors find their way to the marketplace with design errors. This work describes a novel verification framework targeting specifically today's complex microprocessors. The scope of the work spans many levels of verification and different phases of the processor life-cycle, from validation of individual sub-modules to complete multi-core system, and from pre-silicon design verification to in-the-field hardware patching. In particular, our StressTest and MCjammer approaches enable efficient generation of high-quality tests at the pre-silicon level for individual cores and multi-core systems, respectively, using machine learning techniques and making the process as automatic as possible. On the other hand, Reversi and Dacota enable low cost validation in post-silicon, while delivering even higher coverage than pre-silicon techniques. Finally, the Field-repairable control logic (FRCL) and Caspar techniques allow designers to patch different classes of escaped errors in processors that are deployed in the field. The integrated set of solutions that we introduce with this thesis empowers processor vendors to drastically shorten their development timeline and, at the same time, to deliver more reliable and correct systems to their customers at a lower cost. Altogether, this work has the potential to solve the long-standing challenge of guaranteeing the complete functional correctness of modern microprocessors.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61656/1/ivagner_1.pd

Achieving Functional Correctness in Large Interconnect Systems.

In today's semi-conductor industry, large chip-multiprocessors and systems-on-chip are being developed, integrating a large number of components on a single chip. The sheer size of these designs and the intricacy of the communication patterns they exhibit have propelled the development of network-on-chip (NoC) interconnects as the basis for the communication infrastructure in these systems. Faced with the interconnect's growing size and complexity, several challenges hinder its effective validation. During the interconnect's development, the functional verification process relies heavily on the use of emulation and post-silicon validation platforms. However, detecting and debugging errors on these platforms is a difficult endeavour due to the limited observability, and in turn the low verification capabilities, they provide. Additionally, with the inherent incompleteness of design-time validation efforts, the potential of design bugs escaping into the interconnect of a released product is also a concern, as these bugs can threaten the viability of the entire system. This dissertation provides solutions to enable the development of functionally correct interconnect designs. We first address the challenges encountered during design-time verification efforts, by providing two complementary mechanisms that allow emulation and post-silicon verification frameworks to capture a detailed overview of the functional behaviour of the interconnect. Our first solution re-purposes the contents of in-flight traffic to log debug data from the interconnect's execution. This approach enables the validation of the interconnect using synthetic traffic workloads, while attaining over 80% observability of the routes followed by packets and capturing valuable debugging information. We also develop an alternative mechanism that boosts observability by taking periodic snapshots of execution, thus extending the verification capabilities to run both synthetic traffic and real-application workloads. The collected snapshots enhance detection and debugging support, and they provide observability of over 50% of packets and reconstructs at least half of each of their routes. Moreover, we also develop error detection and recovery solutions to address the threat of design bugs escaping into the interconnect's runtime operation. Our runtime techniques can overcome communication errors without needing to store replicate copies of all in-flight packets, thereby achieving correctness at minimal area costsPhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116741/1/rawanak_1.pd

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Validation and optimization of analog circuits using randomized search algorithms

Analog circuits represent a large percentage of the chips used in mobile computing, communication devices, electric vehicles, and portable medical equipment today. Rapid scaling and shrinking chip geometrics introduce new challenging problems in verification, validation, and optimization of analog circuits. These problems include test generation and compression, runtime monitoring and analyzing the worst-case behaviors. State of the art techniques in Monte Carlo are unable to address these problems effectively. Consequently, designing an efficient and scalable CAD algorithm to address such problems is highly desirable.  In this thesis, we introduce Duplex, a methodology for search and optimization. Duplex supports optimizing nonconvex nonlinear functions and functionals. We use duplex to solve problems in analog validation and machine learning. Duplex uses random tree data structures. Duplex is based on partitioning and separating the problem space into multiple smaller spaces such as input, state and the function space. Duplex simultaneously controls, biases and monitors the growth of the random trees in the partitioned spaces. We have used the duplex framework to solve practical problems in analog and mixed signal validation like directed input stimuli generation, compressing analog stress tests, worst-case eye diagram analysis, performance optimization, machine learning, and monitoring runtime behaviors of analog circuits. We used Duplex for validation and optimization of analog circuits. Duplex automatically generates input stimuli that expose bugs and improves coverage. Duplex automatically finds input corners that result in worst-case eye diagrams. Duplex simultaneously explores the parameter and performance spaces of analog circuits to optimize the circuit for best performance. We monitored the random trees and circuit execution against the specification properties described in formal languages. We formulated many challenging problems in the analog circuits, such as test compression and eye diagram analysis, as functional optimization problems. We use Duplex to solve these functional optimization problems.  We propose the Duplex algorithm as an optimization algorithm to posit the framework to other domains. Duplex can address nonlinear and functional optimization problems in continuous and discrete spaces such as design-space exploration and supervised and unsupervised machine learning. The advantages of the duplex framework are efficiency, scalability and versatility. We consistently show orders of magnitude speedup improvements over the state of the art while objectively improving the quality of results. For generating input stimuli, duplex is the first technique that simultaneously does directed input stimulus generation and increases test coverage. We show over two orders of magnitude speedup over Monte Carlo simulations. For runtime monitoring, we check a large scalable circuit against a very expressive set of formal properties that were not possible to monitor before. For generating worst-case eye diagram, we show at least $20\times$ speedup and better quality of results in comparison to the state of the art. Duplex is the first work to provide transient test compression for analog circuits. We compress stress tests up to 96\%. We optimize analog circuits using Duplex and we show speedup and improved results with respect to the state of the art. We use Duplex to train supervised and unsupervised models and show improved accuracy in all cases

Threat Analysis, Countermeaures and Design Strategies for Secure Computation in Nanometer CMOS Regime

Advancements in CMOS technologies have led to an era of Internet Of Things (IOT), where the devices have the ability to communicate with each other apart from their computational power. As more and more sensitive data is processed by embedded devices, the trend towards lightweight and efficient cryptographic primitives has gained significant momentum. Achieving a perfect security in silicon is extremely difficult, as the traditional cryptographic implementations are vulnerable to various active and passive attacks. There is also a threat in the form of hardware Trojans inserted into the supply chain by the untrusted third-party manufacturers for economic incentives. Apart from the threats in various forms, some of the embedded security applications such as random number generators (RNGs) suffer from the impacts of process variations and noise in nanometer CMOS. Despite their disadvantages, the random and unique nature of process variations can be exploited for generating unique identifiers and can be of tremendous use in embedded security. In this dissertation, we explore techniques for precise fault-injection in cryptographic hardware based on voltage/temperature manipulation and hardware Trojan insertion. We demonstrate the effectiveness of these techniques by mounting fault attacks on state-of-the-art ciphers. Physically Unclonable Functions (PUFs) are novel cryptographic primitives for extracting secret keys from complex manufacturing variations in integrated circuits (ICs). We explore the vulnerabilities of some of the popular strong PUF architectures to modeling attacks using Machine Learning (ML) algorithms. The attacks use silicon data from a test chip manufactured in IBM 32nm silicon-on-insulator (SOI) technology. Attack results demonstrate that the majority of strong PUF architectures can be predicted to very high accuracies using limited training data. We also explore the techniques to exploit unreliable data from strong PUF architectures and effectively use them to improve the prediction accuracies of modeling attacks. Motivated by the vulnerabilities of existing PUF architectures, we present a novel modeling attack resistant PUF architecture based on non-linear computing elements. Post-silicon validation results are used to demonstrate the effectiveness of the non-linear PUF architecture against modeling and fault-injection attacks. Apart from the techniques to improve the security of PUF circuits, we also present novel solutions to improve the performance of PUF circuits from the perspectives of IC fabrication and system/protocol design. Finally, we present a statistical benchmark suite to evaluate PUFs in conceptualization phase and also to enable fine-grained security assessments for varying PUF parameters. Data compressibility analyses for validating the statistical benchmark suite are also presented

An FPGA platform for real-time simulation of spiking neuronal networks

In the last years, the idea to dynamically interface biological neurons with artificial ones has become more and more urgent. The reason is essentially due to the design of innovative neuroprostheses where biological cell assemblies of the brain can be substituted by artificial ones. For closed-loop experiments with biological neuronal networks interfaced with in silico modeled networks, several technological challenges need to be faced, from the low-level interfacing between the living tissue and the computational model to the implementation of the latter in a suitable form for real-time processing. Field programmable gate arrays (FPGAs) can improve flexibility when simple neuronal models are required, obtaining good accuracy, real-time performance, and the possibility to create a hybrid system without any custom hardware, just programming the hardware to achieve the required functionality. In this paper, this possibility is explored presenting a modular and efficient FPGA design of an in silico spiking neural network exploiting the Izhikevich model. The proposed system, prototypically implemented on a Xilinx Virtex 6 device, is able to simulate a fully connected network counting up to 1,440 neurons, in real-time, at a sampling rate of 10 kHz, which is reasonable for small to medium scale extra-cellular closed-loop experiments

Architectures for dependable modern microprocessors

Η εξέλιξη των ολοκληρωμένων κυκλωμάτων σε συνδυασμό με τους αυστηρούς χρονικούς περιορισμούς καθιστούν την επαλήθευση της ορθής λειτουργίας των επεξεργαστών μία εξαιρετικά απαιτητική διαδικασία. Με κριτήριο το στάδιο του κύκλου ζωής ενός επεξεργαστή, από την στιγμή κατασκευής των πρωτοτύπων και έπειτα, οι τεχνικές ελέγχου ορθής λειτουργίας διακρίνονται στις ακόλουθες κατηγορίες: (1) Silicon Debug: Τα πρωτότυπα ολοκληρωμένα κυκλώματα ελέγχονται εξονυχιστικά, (2) Manufacturing Testing: ο τελικό ποιοτικός έλεγχος και (3) In-field verification: Περιλαμβάνει τεχνικές, οι οποίες διασφαλίζουν την λειτουργία του επεξεργαστή σύμφωνα με τις προδιαγραφές του. Η διδακτορική διατριβή προτείνει τα ακόλουθα: (1) Silicon Debug: Η εργασία αποσκοπεί στην επιτάχυνση της διαδικασίας ανίχνευσης σφαλμάτων και στον αυτόματο εντοπισμό τυχαίων προγραμμάτων που δεν περιέχουν νέα -χρήσιμη- πληροφορία σχετικά με την αίτια ενός σφάλματος. Η κεντρική ιδέα αυτής της μεθόδου έγκειται στην αξιοποίηση της έμφυτης ποικιλομορφίας των αρχιτεκτονικών συνόλου εντολών και στην δυνατότητα από-διαμόρφωσης τμημάτων του κυκλώματος, (2) Manufacturing Testing: προτείνεται μία μέθοδο για την βελτιστοποίηση του έλεγχου ορθής λειτουργίας των πολυνηματικών και πολυπύρηνων επεξεργαστών μέσω της χρήση λογισμικού αυτοδοκιμής, (3) Ιn-field verification: Αναλύθηκε σε βάθος η επίδραση που έχουν τα μόνιμα σφάλματα σε μηχανισμούς αύξησης της απόδοσης. Επιπρόσθετα, προτάθηκαν τεχνικές για την ανίχνευση και ανοχή μόνιμων σφαλμάτων υλικού σε μηχανισμούς πρόβλεψης διακλάδωσης.Technology scaling, extreme chip integration and the compelling requirement to diminish the time-to-market window, has rendered microprocessors more prone to design bugs and hardware faults. Microprocessor validation is grouped into the following categories, based on where they intervene in a microprocessor’s lifecycle: (a) Silicon debug: the first hardware prototypes are exhaustively validated, (b) Μanufacturing testing: the final quality control during massive production, and (c) In-field verification: runtime error detection techniques to guarantee correct operation. The contributions of this thesis are the following: (1) Silicon debug: We propose the employment of deconfigurable microprocessor architectures along with a technique to generate self-checking random test programs to avoid the simulation step and triage the redundant debug sessions, (2) Manufacturing testing: We propose a self-test optimization strategy for multithreaded, multicore microprocessors to speedup test program execution time and enhance the fault coverage of hard errors; and (3) In-field verification: We measure the effect of permanent faults performance components. Then, we propose a set of low-cost mechanisms for the detection, diagnosis and performance recovery in the front-end speculative structures. This thesis introduces various novel methodologies to address the validation challenges posed throughout the life-cycle of a chip

Neuromorphic Engineering Editors' Pick 2021

This collection showcases well-received spontaneous articles from the past couple of years, which have been specially handpicked by our Chief Editors, Profs. André van Schaik and Bernabé Linares-Barranco. The work presented here highlights the broad diversity of research performed across the section and aims to put a spotlight on the main areas of interest. All research presented here displays strong advances in theory, experiment, and methodology with applications to compelling problems. This collection aims to further support Frontiers’ strong community by recognizing highly deserving authors