Scalable algorithms for software based self test using formal methods

textTransistor scaling has kept up with Moore's law with a doubling of the number of transistors on a chip. More logic on a chip means more opportunities for manufacturing defects to slip in. This, in turn, has made processor testing after manufacturing a significant challenge. At-speed functional testing, being completely non-intrusive, has been seen as the ideal way of testing chips. However for processor testing, generating instruction level tests for covering all faults is a challenge given the issue of scalability. Data-path faults are relatively easier to control and observe compared to control-path faults. In this research we present a novel method to generate instruction level tests for hard to detect control-path faults in a processor. We initially map the gate level stuck-at fault to the Register Transfer Level (RTL) and build an equivalent faulty RTL model. The fault activation and propagation constraints are captured using Control and Data Flow Graphs of the RTL as a Liner Temporal Logic (LTL) property. This LTL property is then negated and given to a Bounded Model Checker based on a Bit-Vector Satisfiability Module Theories (SMT) solver. From the counter-example to the property we can extract a sequence of instructions that activates the gate level fault and propagates the fault effect to one of the observable points in the design. Other than the user supplying instruction constraints, this approach is completely automatic and does not require any manual intervention. Not all the design behaviors are required to generate a test for a fault. We use this insight to scale our previous methodology further. Underapproximations are design abstractions that only capture a subset of the original design behaviors. The use of RTL for test generation affords us two types of under-approximations: bit-width reduction and operator approximation. These are abstractions that perform reductions based on semantics of the RTL design. We also explore structural reductions of the RTL, called path based search, where we search through error propagation paths incrementally. This approach increases the size of the test generation problem step by step. In this way the SMT solver searches through the state space piecewise rather than doing the entire search at once. Experimental results show that our methods are robust and scalable for generating functional tests for hard to detect faults.Electrical and Computer Engineerin

Function Verification of Combinational Arithmetic Circuits

Hardware design verification is the most challenging part in overall hardware design process. It is because design size and complexity are growing very fast while the requirement for performance is ever higher. Conventional simulation-based verification method cannot keep up with the rapid increase in the design size, since it is impossible to exhaustively test all input vectors of a complex design. An important part of hardware verification is combinational arithmetic circuit verification. It draws a lot of attention because flattening the design into bit-level, known as the bit-blasting problem, hinders the efficiency of many current formal techniques. The goal of this thesis is to introduce a robust and efficient formal verification method for combinational integer arithmetic circuit based on an in-depth analysis of recent advances in computer algebra. The method proposed here solves the verification problem at bit level, while avoiding bit-blasting problem. It also avoids the expensive Groebner basis computation, typically employed by symbolic computer algebra methods. The proposed method verifies the gate-level implementation of the design by representing the design components (logic gates and arithmetic modules) by polynomials in Z2n . It then transforms the polynomial representing the output bits (called “output signature”) into a unique polynomial in input signals (called “input signature”) using gate-level information of the design. The computed input signature is then compared with the reference input signature (golden model) to determine whether the circuit behaves as anticipated. If the reference input signature is not given, our method can be used to compute (or extract) the arithmetic function of the design by computing its input signature. Additional tools, based on canonical word-level design representations (such as TED or BMD) can be used to determine the function of the computed input signature represents. We demonstrate the applicability of the proposed method to arithmetic circuit verification on a large number of designs

Synthesis for circuit reliability

textElectrical and Computer Engineerin

A Survey of Fault-Injection Methodologies for Soft Error Rate Modeling in Systems-on-Chips

The development of process technology has increased system performance, but the system failure probability has also significantly increased. It is important to consider the system reliability in addition to the cost, performance, and power consumption. In this paper, we describe the types of faults that occur in a system and where these faults originate. Then, fault-injection techniques, which are used to characterize the fault rate of a system-on-chip (SoC), are investigated to provide a guideline to SoC designers for the realization of resilient SoCs

로직 및 피지컬 합성에서의 타이밍 분석과 최적화

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2020. 8. 김태환.Timing analysis is one of the necessary steps in the development of a semiconductor circuit. In addition, it is increasingly important in the advanced process technologies due to various factors, including the increase of process–voltage–temperature variation. This dissertation addresses three problems related to timing analysis and optimization in logic and physical synthesis. Firstly, most static timing analysis today are based on conventional fixed flip-flop timing models, in which every flip-flop is assumed to have a fixed clock-to-Q delay. However, setup and hold skews affect the clock-to-Q delay in reality. In this dissertation, I propose a mathematical formulation to solve the problem and apply it to the clock skew scheduling problems as well as to the analysis of a given circuit, with a scalable speedup technique. Secondly, near-threshold computing is one of the promising concepts for energy-efficient operation of VLSI systems, but wide performance variation and nonlinearity to process variations block the proliferation. To cope with this, I propose a holistic hardware performance monitoring methodology for accurate timing prediction in a near-threshold voltage regime and advanced process technology. Lastly, an asynchronous circuit is one of the alternatives to the conventional synchronous style, and asynchronous pipeline circuit especially attractive because of its small design effort. This dissertation addresses the synthesis problem of lightening two-phase bundled-data asynchronous pipeline controllers, in which delay buffers are essential for guaranteeing the correct handshaking operation but incurs considerable area increase.타이밍 분석은 반도체 회로 개발 필수 과정 중 하나로, 최신 공정일수록 공정-전압-온도 변이 증가를 포함한 다양한 요인으로 하여금 그 중요성이 커지고 있다. 본 논문에서는 로직 및 피지컬 합성과 관련하여 세 가지 타이밍 분석 및 최적화 문제에 대해 다룬다. 첫째로, 오늘날 대부분의 정적 타이밍 분석은 모든 플립-플롭의 클럭-출력 딜레이가 고정된 값이라는 가정을 바탕으로 이루어졌다. 하지만 실제 클럭-출력 딜레이는 해당 플립-플롭의 셋업 및 홀드 스큐에 영향을 받는다. 본 논문에서는 이러한 특성을 수학적으로 정리하였으며, 이를 확장 가능한 속도 향상 기법과 더불어 주어진 회로의 타이밍 분석 및 클럭 스큐 스케쥴링 문제에 적용하였다. 둘째로, 유사 문턱 연산은 초고집적 회로 동작의 에너지 효율을 끌어 올릴 수 있다는 점에서 각광받지만, 큰 폭의 성능 변이 및 비선형성 때문에 널리 활용되고 있지 않다. 이를 해결하기 위해 유사 문턱 전압 영역 및 최신 공정 노드에서 보다 정확한 타이밍 예측을 위한 하드웨어 성능 모니터링 방법론 전반을 제안하였다. 마지막으로, 비동기 회로는 기존 동기 회로의 대안 중 하나로, 그 중에서도 비동기 파이프라인 회로는 비교적 적은 설계 노력만으로도 구현 가능하다는 장점이 있다. 본 논문에서는 2위상 묶음 데이터 프로토콜 기반 비동기 파이프라인 컨트롤러 상에서, 정확한 핸드셰이킹 통신을 위해 삽입된 딜레이 버퍼에 의한 면적 증가를 완화할 수 있는 합성 기법을 제시하였다.1 INTRODUCTION 1 1.1 Flexible Flip-Flop Timing Model 1 1.2 Hardware Performance Monitoring Methodology 4 1.3 Asynchronous Pipeline Controller 10 1.4 Contributions of this Dissertation 15 2 ANALYSIS AND OPTIMIZATION CONSIDERING FLEXIBLE FLIP-FLOP TIMING MODEL 17 2.1 Preliminaries 17 2.1.1 Terminologies 17 2.1.2 Timing Analysis 20 2.1.3 Clock-to-Q Delay Surface Modeling 21 2.2 Clock-to-Q Delay Interval Analysis 22 2.2.1 Derivation 23 2.2.2 Additional Constraints 26 2.2.3 Analysis: Finding Minimum Clock Period 28 2.2.4 Optimization: Clock Skew Scheduling 30 2.2.5 Scalable Speedup Technique 33 2.3 Experimental Results 37 2.3.1 Application to Minimum Clock Period Finding 37 2.3.2 Application to Clock Skew Scheduling 39 2.3.3 Efficacy of Scalable Speedup Technique 43 2.4 Summary 44 3 HARDWARE PERFORMANCE MONITORING METHODOLOGY AT NTC AND ADVANCED TECHNOLOGY NODE 45 3.1 Overall Flow of Proposed HPM Methodology 45 3.2 Prerequisites to HPM Methodology 47 3.2.1 BEOL Process Variation Modeling 47 3.2.2 Surrogate Model Preparation 49 3.3 HPM Methodology: Design Phase 52 3.3.1 HPM2PV Model Construction 52 3.3.2 Optimization of Monitoring Circuits Configuration 54 3.3.3 PV2CPT Model Construction 58 3.4 HPM Methodology: Post-Silicon Phase 60 3.4.1 Transfer Learning in Silicon Characterization Step 60 3.4.2 Procedures in Volume Production Phase 61 3.5 Experimental Results 62 3.5.1 Experimental Setup 62 3.5.2 Exploration of Monitoring Circuits Configuration 64 3.5.3 Effectiveness of Monitoring Circuits Optimization 66 3.5.4 Considering BEOL PVs and Uncertainty Learning 68 3.5.5 Comparison among Different Prediction Flows 69 3.5.6 Effectiveness of Prediction Model Calibration 71 3.6 Summary 73 4 LIGHTENING ASYNCHRONOUS PIPELINE CONTROLLER 75 4.1 Preliminaries and State-of-the-Art Work 75 4.1.1 Bundled-data vs. Dual-rail Asynchronous Circuits 75 4.1.2 Two-phase vs. Four-phase Bundled-data Protocol 76 4.1.3 Conventional State-of-the-Art Pipeline Controller Template 77 4.2 Delay Path Sharing for Lightening Pipeline Controller Template 78 4.2.1 Synthesizing Sharable Delay Paths 78 4.2.2 Validating Logical Correctness for Sharable Delay Paths 80 4.2.3 Reformulating Timing Constraints of Controller Template 81 4.2.4 Minimally Allocating Delay Buffers 87 4.3 In-depth Pipeline Controller Template Synthesis with Delay Path Reusing 88 4.3.1 Synthesizing Delay Path Units 88 4.3.2 Validating Logical Correctness of Delay Path Units 89 4.3.3 Updating Timing Constraints for Delay Path Units 91 4.3.4 In-depth Synthesis Flow Utilizing Delay Path Units 95 4.4 Experimental Results 99 4.4.1 Environment Setup 99 4.4.2 Piecewise Linear Modeling of Delay Path Unit Area 99 4.4.3 Comparison of Power, Performance, and Area 102 4.5 Summary 107 5 CONCLUSION 109 5.1 Chapter 2 109 5.2 Chapter 3 110 5.3 Chapter 4 110 Abstract (In Korean) 127Docto

Large substitution boxes with efficient combinational implementations

At a fundamental level, the security of symmetric key cryptosystems ties back to Claude Shannon\u27s properties of confusion and diffusion. Confusion can be defined as the complexity of the relationship between the secret key and ciphertext, and diffusion can be defined as the degree to which the influence of a single input plaintext bit is spread throughout the resulting ciphertext. In constructions of symmetric key cryptographic primitives, confusion and diffusion are commonly realized with the application of nonlinear and linear operations, respectively. The Substitution-Permutation Network design is one such popular construction adopted by the Advanced Encryption Standard, among other block ciphers, which employs substitution boxes, or S-boxes, for nonlinear behavior. As a result, much research has been devoted to improving the cryptographic strength and implementation efficiency of S-boxes so as to prohibit cryptanalysis attacks that exploit weak constructions and enable fast and area-efficient hardware implementations on a variety of platforms. To date, most published and standardized S-boxes are bijective functions on elements of 4 or 8 bits. In this work, we explore the cryptographic properties and implementations of 8 and 16 bit S-boxes. We study the strength of these S-boxes in the context of Boolean functions and investigate area-optimized combinational hardware implementations. We then present a variety of new 8 and 16 bit S-boxes that have ideal cryptographic properties and enable low-area combinational implementations

Anti-Tamper Method for Field Programmable Gate Arrays Through Dynamic Reconfiguration and Decoy Circuits

As Field Programmable Gate Arrays (FPGAs) become more widely used, security concerns have been raised regarding FPGA use for cryptographic, sensitive, or proprietary data. Storing or implementing proprietary code and designs on FPGAs could result in the compromise of sensitive information if the FPGA device was physically relinquished or remotely accessible to adversaries seeking to obtain the information. Although multiple defensive measures have been implemented (and overcome), the possibility exists to create a secure design through the implementation of polymorphic Dynamically Reconfigurable FPGA (DRFPGA) circuits. Using polymorphic DRFPGAs removes the static attributes from their design; thus, substantially increasing the difficulty of successful adversarial reverse-engineering attacks. A variety of dynamically reconfigurable methodologies exist for implementation that challenge designers in the reconfigurable technology field. A Hardware Description Language (HDL) DRFPGA model is presented for use in security applications. The Very High Speed Integrated Circuit HDL (VHSIC) language was chosen to take advantage of its capabilities, which are well suited to the current research. Additionally, algorithms that explicitly support granular autonomous reconfiguration have been developed and implemented on the DRFPGA as a means of protecting its designs. Documented testing validates the reconfiguration results and compares power usage, timing, and area estimates from a conventional and DRFPGA model

Measurements, Models, Systems and Design

531 s.

Decomposition and encoding of finite state machines for FPGA implementation

xii+187hlm.;24c

Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures

abstract: Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used for error detection and correction respectively in such architectures. Multiple node charge collection (MNCC) causes domain crossing errors (DCE) which can render the redundancy ineffectual. This dissertation describes techniques to ensure DCE mitigation with statistical confidence for various designs. Both sequential and combinatorial logic are separated using these custom and computer aided design (CAD) methodologies. Radiation vulnerability and design overhead are studied on VLSI sub-systems including an advanced encryption standard (AES) which is DCE mitigated using module level coarse separation on a 90-nm process with 99.999% DCE mitigation. A radiation hardened microprocessor (HERMES2) is implemented in both 90-nm and 55-nm technologies with an interleaved separation methodology with 99.99% DCE mitigation while achieving 4.9% increased cell density, 28.5 % reduced routing and 5.6% reduced power dissipation over the module fences implementation. A DMR register-file (RF) is implemented in 55 nm process and used in the HERMES2 microprocessor. The RF array custom design and the decoders APR designed are explored with a focus on design cycle time. Quality of results (QOR) is studied from power, performance, area and reliability (PPAR) perspective to ascertain the improvement over other design techniques. A radiation hardened all-digital multiplying pulsed digital delay line (DDL) is designed for double data rate (DDR2/3) applications for data eye centering during high speed off-chip data transfer. The effect of noise, radiation particle strikes and statistical variation on the designed DDL are studied in detail. The design achieves the best in class 22.4 ps peak-to-peak jitter, 100-850 MHz range at 14 pJ/cycle energy consumption. Vulnerability of the non-hardened design is characterized and portions of the redundant DDL are separated in custom and auto-place and route (APR). Thus, a range of designs for mission critical applications are implemented using methodologies proposed in this work and their potential PPAR benefits explored in detail.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201