Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Low-cost and efficient fault detection and diagnosis schemes for modern cores

Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are challenging the production of cheap yet robust systems. Soft error trends are haunting, especially for combinational logic, and parity and ECC codes are therefore becoming insufficient as combinational logic turns into the dominant source of soft errors. Furthermore, experts are warning about the need to also address intermittent and permanent faults during processor runtime, as increasing temperatures and device variations will accelerate inherent aging phenomena. These challenges specially threaten the commodity segments, which impose requirements that existing fault tolerance mechanisms cannot offer. Current techniques based on redundant execution were devised in a time when high penalties were assumed for the sake of high reliability levels. Novel light-weight techniques are therefore needed to enable fault protection in the mass market segments. The complexity of designs is making post-silicon validation extremely expensive. Validation costs exceed design costs, and the number of discovered bugs is growing, both during validation and once products hit the market. Fault localization and diagnosis are the biggest bottlenecks, magnified by huge detection latencies, limited internal observability, and costly server farms to generate test outputs. This thesis explores two directions to address some of the critical challenges introduced by unreliable technologies and by the limitations of current validation approaches. We first explore mechanisms for comprehensively detecting multiple sources of failures in modern processors during their lifetime (including transient, intermittent, permanent and also design bugs). Our solutions embrace a paradigm where fault tolerance is built based on exploiting high-level microarchitectural invariants that are reusable across designs, rather than relying on re-execution or ad-hoc block-level protection. To do so, we decompose the basic functionalities of processors into high-level tasks and propose three novel runtime verification solutions that combined enable global error detection: a computation/register dataflow checker, a memory dataflow checker, and a control flow checker. The techniques use the concept of end-to-end signatures and allow designers to adjust the fault coverage to their needs, by trading-off area, power and performance. Our fault injection studies reveal that our methods provide high coverage levels while causing significantly lower performance, power and area costs than existing techniques. Then, this thesis extends the applicability of the proposed error detection schemes to the validation phases. We present a fault localization and diagnosis solution for the memory dataflow by combining our error detection mechanism, a new low-cost logging mechanism and a diagnosis program. Selected internal activity is continuously traced and kept in a memory-resident log whose capacity can be expanded to suite validation needs. The solution can catch undiscovered bugs, reducing the dependence on simulation farms that compute golden outputs. Upon error detection, the diagnosis algorithm analyzes the log to automatically locate the bug, and also to determine its root cause. Our evaluations show that very high localization coverage and diagnosis accuracy can be obtained at very low performance and area costs. The net result is a simplification of current debugging practices, which are extremely manual, time consuming and cumbersome. Altogether, the integrated solutions proposed in this thesis capacitate the industry to deliver more reliable and correct processors as technology evolves into more complex designs and more vulnerable transistors.El continuo escalado de los transistores junto con los avances microarquitectónicos han posibilitado la presencia de potentes procesadores en todos los segmentos de mercado. Sin embargo, varios problemas de fiabilidad están desafiando la producción de sistemas robustos. Las predicciones de "soft errors" son inquietantes, especialmente para la lógica combinacional: soluciones como ECC o paridad se están volviendo insuficientes a medida que dicha lógica se convierte en la fuente predominante de soft errors. Además, los expertos están alertando acerca de la necesidad de detectar otras fuentes de fallos (causantes de errores permanentes e intermitentes) durante el tiempo de vida de los procesadores. Los segmentos "commodity" son los más vulnerables, ya que imponen unos requisitos que las técnicas actuales de fiabilidad no ofrecen. Estas soluciones (generalmente basadas en re-ejecución) fueron ideadas en un tiempo en el que con tal de alcanzar altos nivel de fiabilidad se asumían grandes costes. Son por tanto necesarias nuevas técnicas que permitan la protección contra fallos en los segmentos más populares. La complejidad de los diseños está encareciendo la validación "post-silicon". Su coste excede el de diseño, y el número de errores descubiertos está aumentando durante la validación y ya en manos de los clientes. La localización y el diagnóstico de errores son los mayores problemas, empeorados por las altas latencias en la manifestación de errores, por la poca observabilidad interna y por el coste de generar las señales esperadas. Esta tesis explora dos direcciones para tratar algunos de los retos causados por la creciente vulnerabilidad hardware y por las limitaciones de los enfoques de validación. Primero exploramos mecanismos para detectar múltiples fuentes de fallos durante el tiempo de vida de los procesadores (errores transitorios, intermitentes, permanentes y de diseño). Nuestras soluciones son de un paradigma donde la fiabilidad se construye explotando invariantes microarquitectónicos genéricos, en lugar de basarse en re-ejecución o en protección ad-hoc. Para ello descomponemos las funcionalidades básicas de un procesador y proponemos tres soluciones de `runtime verification' que combinadas permiten una detección de errores a nivel global. Estas tres soluciones son: un verificador de flujo de datos de registro y de computación, un verificador de flujo de datos de memoria y un verificador de flujo de control. Nuestras técnicas usan el concepto de firmas y permiten a los diseñadores ajustar los niveles de protección a sus necesidades, mediante compensaciones en área, consumo energético y rendimiento. Nuestros estudios de inyección de errores revelan que los métodos propuestos obtienen altos niveles de protección, a la vez que causan menos costes que las soluciones existentes. A continuación, esta tesis explora la aplicabilidad de estos esquemas a las fases de validación. Proponemos una solución de localización y diagnóstico de errores para el flujo de datos de memoria que combina nuestro mecanismo de detección de errores, junto con un mecanismo de logging de bajo coste y un programa de diagnóstico. Cierta actividad interna es continuamente registrada en una zona de memoria cuya capacidad puede ser expandida para satisfacer las necesidades de validación. La solución permite descubrir bugs, reduciendo la necesidad de calcular los resultados esperados. Al detectar un error, el algoritmo de diagnóstico analiza el registro para automáticamente localizar el bug y determinar su causa. Nuestros estudios muestran un alto grado de localización y de precisión de diagnóstico a un coste muy bajo de rendimiento y área. El resultado es una simplificación de las prácticas actuales de depuración, que son enormemente manuales, incómodas y largas. En conjunto, las soluciones de esta tesis capacitan a la industria a producir procesadores más fiables, a medida que la tecnología evoluciona hacia diseños más complejos y más vulnerables

Dynamic partial reconfiguration management for high performance and reliability in FPGAs

Modern Field-Programmable Gate Arrays (FPGAs) are no longer used to implement small “glue logic” circuitries. The high-density of reconfigurable logic resources in today’s FPGAs enable the implementation of large systems in a single chip. FPGAs are highly flexible devices; their functionality can be altered by simply loading a new binary file in their configuration memory. While the flexibility of FPGAs is comparable to General-Purpose Processors (GPPs), in the sense that different functions can be performed using the same hardware, the performance gain that can be achieved using FPGAs can be orders of magnitudes higher as FPGAs offer the ability for customisation of parallel computational architectures. Dynamic Partial Reconfiguration (DPR) allows for changing the functionality of certain blocks on the chip while the rest of the FPGA is operational. DPR has sparked the interest of researchers to explore new computational platforms where computational tasks are off-loaded from a main CPU to be executed using dedicated reconfigurable hardware accelerators configured on demand at run-time. By having a battery of custom accelerators which can be swapped in and out of the FPGA at runtime, a higher computational density can be achieved compared to static systems where the accelerators are bound to fixed locations within the chip. Furthermore, the ability of relocating these accelerators across several locations on the chip allows for the implementation of adaptive systems which can mitigate emerging faults in the FPGA chip when operating in harsh environments. By porting the appropriate fault mitigation techniques in such computational platforms, the advantages of FPGAs can be harnessed in different applications in space and military electronics where FPGAs are usually seen as unreliable devices due to their sensitivity to radiation and extreme environmental conditions. In light of the above, this thesis investigates the deployment of DPR as: 1) a method for enhancing performance by efficient exploitation of the FPGA resources, and 2) a method for enhancing the reliability of systems intended to operate in harsh environments. Achieving optimal performance in such systems requires an efficient internal configuration management system to manage the reconfiguration and execution of the reconfigurable modules in the FPGA. In addition, the system needs to support “fault-resilience” features by integrating parameterisable fault detection and recovery capabilities to meet the reliability standard of fault-tolerant applications. This thesis addresses all the design and implementation aspects of an Internal Configuration Manger (ICM) which supports a novel bitstream relocation model to enable the placement of relocatable accelerators across several locations on the FPGA chip. In addition to supporting all the configuration capabilities required to implement a Reconfigurable Operating System (ROS), the proposed ICM also supports the novel multiple-clone configuration technique which allows for cloning several instances of the same hardware accelerator at the same time resulting in much shorter configuration time compared to traditional configuration techniques. A faulttolerant (FT) version of the proposed ICM which supports a comprehensive faultrecovery scheme is also introduced in this thesis. The proposed FT-ICM is designed with a much smaller area footprint compared to Triple Modular Redundancy (TMR) hardening techniques while keeping a comparable level of fault-resilience. The capabilities of the proposed ICM system are demonstrated with two novel applications. The first application demonstrates a proof-of-concept reliable FPGA server solution used for executing encryption/decryption queries. The proposed server deploys bitstream relocation and modular redundancy to mitigate both permanent and transient faults in the device. It also deploys a novel Built-In Self- Test (BIST) diagnosis scheme, specifically designed to detect emerging permanent faults in the system at run-time. The second application is a data mining application where DPR is used to increase the computational density of a system used to implement the Frequent Itemset Mining (FIM) problem

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Reliability and Security Assessment of Modern Embedded Devices

L'abstract è presente nell'allegato / the abstract is in the attachmen

Dependable design for low-cost ultra-low-power processors

Emerging applications in the Internet of Things (IoT) domain, such as wearables, implantables, smart tags, and wireless sensor networks put severe power, cost, reliability, and security constraints on hardware system design. This dissertation focuses on the architecture and design of dependable ultra-low power computing systems. Specifically, it proposes architecture and design techniques that exploit the unique application and usage characteristics of future computing systems to deliver low power, while meeting the reliability and security constraints of these systems. First, this dissertation considers the challenge of achieving both low power and high reliability in SRAM memories. It proposes both an architectural technique to reduce the overheads of error correction and a technique that uses the nature of error correcting codes to allow lower voltage operation without sacrificing reliability. Next, this dissertation considers low power and low cost. By leveraging the fact that many IoT systems are embedded in nature and will run the same application for their entire lifetime, fine-grained usage characteristics of the hardware-software system can be determined at design time. This dissertation presents a novel hardware-software co-analysis based on symbolic simulation that can determine the possible states of the processor throughout any execution of a specific application. This enables power-gating where more gates are turned off for longer, bespoke processors customized to specific applications, and stricter determination of peak power bounds. Finally, this dissertation considers achieving secure IoT systems at low cost and power overhead. By leveraging the hardware-software co-analysis, this dissertation shows that gate-level information flow security guarantees can be provided without hardware overheads

Virtual Runtime Application Partitions for Resource Management in Massively Parallel Architectures

This thesis presents a novel design paradigm, called Virtual Runtime Application Partitions (VRAP), to judiciously utilize the on-chip resources. As the dark silicon era approaches, where the power considerations will allow only a fraction chip to be powered on, judicious resource management will become a key consideration in future designs. Most of the works on resource management treat only the physical components (i.e. computation, communication, and memory blocks) as resources and manipulate the component to application mapping to optimize various parameters (e.g. energy efficiency). To further enhance the optimization potential, in addition to the physical resources we propose to manipulate abstract resources (i.e. voltage/frequency operating point, the fault-tolerance strength, the degree of parallelism, and the configuration architecture). The proposed framework (i.e. VRAP) encapsulates methods, algorithms, and hardware blocks to provide each application with the abstract resources tailored to its needs. To test the efficacy of this concept, we have developed three distinct self adaptive environments: (i) Private Operating Environment (POE), (ii) Private Reliability Environment (PRE), and (iii) Private Configuration Environment (PCE) that collectively ensure that each application meets its deadlines using minimal platform resources. In this work several novel architectural enhancements, algorithms and policies are presented to realize the virtual runtime application partitions efficiently. Considering the future design trends, we have chosen Coarse Grained Reconfigurable Architectures (CGRAs) and Network on Chips (NoCs) to test the feasibility of our approach. Specifically, we have chosen Dynamically Reconfigurable Resource Array (DRRA) and McNoC as the representative CGRA and NoC platforms. The proposed techniques are compared and evaluated using a variety of quantitative experiments. Synthesis and simulation results demonstrate VRAP significantly enhances the energy and power efficiency compared to state of the art.Siirretty Doriast

Methods to improve debug flow for intellectual property protection

Abstract. Every company wants to protect their intellectual property and limit customer visibility of confidential information. A company may protect its proprietary information by different ways. This thesis will compare different methods that try to protect intellectual property while maintaining the software debugging capability. Working with binary libraries without debug information makes customer support very difficult. When a company is developing a new product, time to market is important. Usually, the last months are very busy resolving urgent customer issues. Especially during this period, the slow process of debugging customer issues without debug information can cause delays and increase time to market. The goal of this thesis is to compare methods that protects intellectual property by making reverse engineering more difficult. Study of the upcoming GNU Compiler Collection (GCC) features related to debug data formats, such as DWARF5, is also carried out while working with the thesis. The approaches tried were split DWARF, injecting ELF files, stripping debug data, and code obfuscation. Also optimisation and their effect on disassembly was studied. The best solution was to compile the software with debug symbols and strip them to a separate file. This way the symbol data can be loaded separately into GDB. The symbol data layout and addresses are also always correct with the solution.Virheiden etsinnän työnkulun parantaminen immateriaaliomaisuudet huomioiden. Tiivistelmä. Yritykset haluavat suojella immateriaaliomaisuuksiaan ja rajoittaa asiakkaiden näkyvyyttä tietylle tasolle asti. Tämä lopputyö vertailee eri metodeja jotka koittavat suojata immateriaaliomaisuuksia, ilman että ohjelmiston virheidenkorjattavuus kärsii. Binäärikirjastot ilman virheenkorjaustietoja vaikeuttavat asiakkaan tukemista. Uutta tuotetta kehitettäessä, markkinoille tuloaika on yritykselle tärkeää. Yleensä viimeiset kuukaudet ovat kiireisiä asiakkaan ongelmien tutkimuksien kanssa ja kyseiset ongelmat tulisi olla ratkaistuna mahdollisimman nopeasti. Tämän lopputyön tavoitteena on vertailla mahdollisia metodeja, jotka suojaavat immateriaaliomaisuutta takaisinmallinnusta vastaan. Tarkoituksena on myös tutkia tulevia GNU kääntäjä-kokoelman (GCC:n) ominaisuuksia liittyen virheenkorjaustietoformaatteihin, kuten DWARF5. Ongelman ratkaisuun koitettiin pilkottuja virheenkorjaustietoja, ELFtiedoston injektointia, virheenkorjaustiedon riisumista ohjelmistosta ja koodin obfuskointia. Myös optimoinnin vaikutusta konekielestä takaisinmallinnettuun Assembly-muotoon tutkittiin. Paras ratkaisu oli kääntää ohjelmisto virheenkorjaustiedolla ja riisua ne omaan erilliseen tiedostoon. Näin ohjelmiston symbolitieto pystytään latamaan erikseen virheenjäljittemänä käytettyyn GNU Debuggeriin (GDB:hen). Näin symbolitietojen rakenne ja osoitteet ovat myös aina paikkansapitävät

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks