Moving Towards Analog Functional Safety

Over the past century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power systems. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The standard ISO 26262 related to functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardizing fault modeling, injection and simulation mainly focused on digital circuits and disregarding analog ones. An initial attempt is being made with the IEEE P2427 standard draft standard that started to give this field a structured and formal organization. In this context, new fault models, injection, and abstraction methodologies for analog circuits are proposed in this thesis to enhance this application field. The faults proposed by the IEEE P2427 standard draft standard are initially evaluated to understand the associated fault behaviors during the simulation. Moreover, a novel approach is presented for modeling realistic stuck-on/off defects based on oxide defects. These new defects proposed are required because digital stuck-at-fault models where a transistor is frozen in on-state or offstate may not apply well on analog circuits because even a slight variation could create deviations of several magnitudes. Then, for validating the proposed defects models, a novel predictive fault grouping based on faulty AC matrices is applied to group faults with equivalent behaviors. The proposed fault grouping method is computationally cheap because it avoids performing DC or transient simulations with faults injected and limits itself to faulty AC simulations. Using AC simulations results in two different methods that allow grouping faults with the same frequency response are presented. The first method is an AC-based grouping method that exploits the potentialities of the S-parameters ports. While the second is a Circle-based grouping based on the circle-fitting method applied to the extracted AC matrices. Finally, an open-source framework is presented for the fault injection and manipulation perspective. This framework relies on the shared semantics for reading, writing, or manipulating transistor-level designs. The ultimate goal of the framework is: reading an input design written in a specific syntax and then allowing to write the same design in another syntax. As a use case for the proposed framework, a process of analog fault injection is discussed. This activity requires adding, removing, or replacing nodes, components, or even entire sub-circuits. The framework is entirely written in C++, and its APIs are also interfaced with Python. The entire framework is open-source and available on GitHub. The last part of the thesis presents abstraction methodologies that can abstract transistor level models into Verilog-AMS models and Verilog- AMS piecewise and nonlinear models into C++. These abstracted models can be integrated into heterogeneous systems. The purpose of integration is the simulation of heterogeneous components embedded in a Virtual Platforms (VP) needs to be fast and accurate

Fault-based Analysis of Industrial Cyber-Physical Systems

The fourth industrial revolution called Industry 4.0 tries to bridge the gap between traditional Electronic Design Automation (EDA) technologies and the necessity of innovating in many indus- trial fields, e.g., automotive, avionic, and manufacturing. This complex digitalization process in- volves every industrial facility and comprises the transformation of methodologies, techniques, and tools to improve the efficiency of every industrial process. The enhancement of functional safety in Industry 4.0 applications needs to exploit the studies related to model-based and data-driven anal- yses of the deployed Industrial Cyber-Physical System (ICPS). Modeling an ICPS is possible at different abstraction levels, relying on the physical details included in the model and necessary to describe specific system behaviors. However, it is extremely complicated because an ICPS is com- posed of heterogeneous components related to different physical domains, e.g., digital, electrical, and mechanical. In addition, it is also necessary to consider not only nominal behaviors but even faulty behaviors to perform more specific analyses, e.g., predictive maintenance of specific assets. Nevertheless, these faulty data are usually not present or not available directly from the industrial machinery. To overcome these limitations, constructing a virtual model of an ICPS extended with different classes of faults enables the characterization of faulty behaviors of the system influenced by different faults. In literature, these topics are addressed with non-uniformly approaches and with the absence of standardized and automatic methodologies for describing and simulating faults in the different domains composing an ICPS. This thesis attempts to overcome these state-of-the-art gaps by proposing novel methodologies, techniques, and tools to: model and simulate analog and multi-domain systems; abstract low-level models to higher-level behavioral models; and monitor industrial systems based on the Industrial Internet of Things (IIOT) paradigm. Specifically, the proposed contributions involve the exten- sion of state-of-the-art fault injection practices to improve the ICPSs safety, the development of frameworks for safety operations automatization, and the definition of a monitoring framework for ICPSs. Overall, fault injection in analog and digital models is the state of the practice to en- sure functional safety, as mentioned in the ISO 26262 standard specific for the automotive field. Starting from state-of-the-art defects defined for analog descriptions, new defects are proposed to enhance the IEEE P2427 draft standard for analog defect modeling and coverage. Moreover, dif- ferent techniques to abstract a transistor-level model to a behavioral model are proposed to speed up the simulation of faulty circuits. Therefore, unlike the electrical domain, there is no extensive use of fault injection techniques in the mechanical one. Thus, extending the fault injection to the mechanical and thermal fields allows for supporting the definition and evaluation of more reliable safety mechanisms. Hence, a taxonomy of mechanical faults is derived from the electrical domain by exploiting the physical analogies. Furthermore, specific tools are built for automatically instru- menting different descriptions with multi-domain faults. The entire work is proposed as a basis for supporting the creation of increasingly resilient and secure ICPS that need to preserve functional safety in any operating context

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

Automated simulation of faults in analog circuits based on parallel paradigm

© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the concept of simulation before test. Catastrophic and parametric faults as well as component tolerances can make strong or weak influence on a correct circuit behavior. Therefore it is necessary to estimate such influence during design stage in order to provide high quality testing and diagnosis for the circuit under test. The number of potential faults in analog circuits is tremendous and the fault simulation requires essential computational resources as well as takes much time. The approach to the fault simulation in analog circuits based on parallel paradigm providing automation of the design-for-testability concept and essential reduction of the fault simulation time is proposed. The decomposition of the fault simulation task according to parallel paradigm is presented. The architecture of parallel simulation system is considered, and FSM for operation of the main host and executive nodes are described. Two scenarios of possible interoperability between the main host and executive nodes based on cascade scheme and deferred scheme are proposed. Experimental results for both scenarios are presented

Standart-konformes Snapshotting für SystemC Virtuelle Plattformen

The steady increase in complexity of high-end embedded systems goes along with an increasingly complex design process. We are currently still in a transition phase from Hardware-Description Language (HDL) based design towards virtual-platform-based design of embedded systems. As design complexity rises faster than developer productivity a gap forms. Restoring productivity while at the same time managing increased design complexity can also be achieved through focussing on the development of new tools and design methodologies. In most application areas, high-level modelling languages such as SystemC are used in early design phases. In modern software development Continuous Integration (CI) is used to automatically test if a submitted piece of code breaks functionality. Application of the CI concept to embedded system design and testing requires fast build and test execution times from the virtual platform framework. For this use case the ability to save a specific state of a virtual platform becomes necessary. The saving and restoring of specific states of a simulation requires the ability to serialize all data structures within the simulation models. Improving the frameworks and establishing better methods will only help to narrow the design gap, if these changes are introduced with the needs of the engineers and developers in mind. Ultimately, it is their productivity that shall be improved. The ability to save the state of a virtual platform enables developers to run longer test campaigns that can even contain randomized test stimuli. If the saved states are modifiable the developers can inject faulty states into the simulation models. This work contributes an extension to the SoCRocket virtual platform framework to enable snapshotting. The snapshotting extension can be considered a reference implementation as the utilization of current SystemC/TLM standards makes it compatible to other frameworkds. Furthermore, integrating the UVM SystemC library into the framework enables test driven development and fast validation of SystemC/TLM models using snapshots. These extensions narrow the design gap by supporting designers, testers and developers to work more efficiently.Die stetige Steigerung der Komplexität eingebetteter Systeme geht einher mit einer ebenso steigenden Komplexität des Entwurfsprozesses. Wir befinden uns momentan in der Übergangsphase vom Entwurf von eingebetteten Systemen basierend auf Hardware-Beschreibungssprachen hin zum Entwurf ebendieser basierend auf virtuellen Plattformen. Da die Entwurfskomplexität rasanter steigt als die Produktivität der Entwickler, entsteht eine Kluft. Die Produktivität wiederherzustellen und gleichzeitig die gesteigerte Entwurfskomplexität zu bewältigen, kann auch erreicht werden, indem der Fokus auf die Entwicklung neuer Werkzeuge und Entwurfsmethoden gelegt wird. In den meisten Anwendungsgebieten werden Modellierungssprachen auf hoher Ebene, wie zum Beispiel SystemC, in den frühen Entwurfsphasen benutzt. In der modernen Software-Entwicklung wird Continuous Integration (CI) benutzt um automatisiert zu überprüfen, ob eine eingespielte Änderung am Quelltext bestehende Funktionalitäten beeinträchtigt. Die Anwendung des CI-Konzepts auf den Entwurf und das Testen von eingebetteten Systemen fordert schnelle Bau- und Test-Ausführungszeiten von dem genutzten Framework für virtuelle Plattformen. Für diesen Anwendungsfall wird auch die Fähigkeit, einen bestimmten Zustand der virtuellen Plattform zu speichern, erforderlich. Das Speichern und Wiederherstellen der Zustände einer Simulation erfordert die Serialisierung aller Datenstrukturen, die sich in den Simulationsmodellen befinden. Das Verbessern von Frameworks und Etablieren besserer Methodiken hilft nur die Entwurfs-Kluft zu verringern, wenn diese Änderungen mit Berücksichtigung der Bedürfnisse der Entwickler und Ingenieure eingeführt werden. Letztendlich ist es ihre Produktivität, die gesteigert werden soll. Die Fähigkeit den Zustand einer virtuellen Plattform zu speichern, ermöglicht es den Entwicklern, längere Testkampagnen laufen zu lassen, die auch zufällig erzeugte Teststimuli beinhalten können oder, falls die gespeicherten Zustände modifizierbar sind, fehlerbehaftete Zustände in die Simulationsmodelle zu injizieren. Mein mit dieser Arbeit geleisteter Beitrag beinhaltet die Erweiterung des SoCRocket Frameworks um Checkpointing Funktionalität im Sinne einer Referenzimplementierung. Weiterhin ermöglicht die Integration der UVM SystemC Bibliothek in das Framework die Umsetzung der testgetriebenen Entwicklung und schnelle Validierung von SystemC/TLM Modellen mit Hilfe von Snapshots

A Sustainable Autonomic Architecture for Organically Reconfigurable Computing Systems

A Sustainable Autonomic Architecture for Organically Reconfigurable Computing System based on SRAM Field Programmable Gate Arrays (FPGAs) is proposed, modeled analytically, simulated, prototyped, and measured. Low-level organic elements are analyzed and designed to achieve novel self-monitoring, self-diagnosis, and self-repair organic properties. The prototype of a 2-D spatial gradient Sobel video edge-detection organic system use-case developed on a XC4VSX35 Xilinx Virtex-4 Video Starter Kit is presented. Experimental results demonstrate the applicability of the proposed architecture and provide the infrastructure to quantify the performance and overcome fault-handling limitations. Dynamic online autonomous functionality restoration after a malfunction or functionality shift due to changing requirements is achieved at a fine granularity by exploiting dynamic Partial Reconfiguration (PR) techniques. A Genetic Algorithm (GA)-based hardware/software platform for intrinsic evolvable hardware is designed and evaluated for digital circuit repair using a variety of well-accepted benchmarks. Dynamic bitstream compilation for enhanced mutation and crossover operators is achieved by directly manipulating the bitstream using a layered toolset. Experimental results on the edge-detector organic system prototype have shown complete organic online refurbishment after a hard fault. In contrast to previous toolsets requiring many milliseconds or seconds, an average of 0.47 microseconds is required to perform the genetic mutation, 4.2 microseconds to perform the single point conventional crossover, 3.1 microseconds to perform Partial Match Crossover (PMX) as well as Order Crossover (OX), 2.8 microseconds to perform Cycle Crossover (CX), and 1.1 milliseconds for one input pattern intrinsic evaluation. These represent a performance advantage of three orders of magnitude over the JBITS software framework and more than seven orders of magnitude over the Xilinx design flow. Combinatorial Group Testing (CGT) technique was combined with the conventional GA in what is called CGT-pruned GA to reduce repair time and increase system availability. Results have shown up to 37.6% convergence advantage using the pruned technique. Lastly, a quantitative stochastic sustainability model for reparable systems is formulated to evaluate the Sustainability of FPGA-based reparable systems. This model computes at design-time the resources required for refurbishment to meet mission availability and lifetime requirements in a given fault-susceptible missions. By applying this model to MCNC benchmark circuits and the Sobel Edge-Detector in a realistic space mission use-case on Xilinx Virtex-4 FPGA, we demonstrate a comprehensive model encompassing the inter-relationships between system sustainability and fault rates, utilized, and redundant hardware resources, repair policy parameters and decaying reparability

FAST : a fault detection and identification software tool

The aim of this work is to improve the reliability and safety of complex critical control systems by contributing to the systematic application of fault diagnosis. In order to ease the utilization of fault detection and isolation (FDI) tools in the industry, a systematic approach is required to allow the process engineers to analyze a system from this perspective. In this way, it should be possible to analyze this system to find if it provides the required fault diagnosis and redundancy according to the process criticality. In addition, it should be possible to evaluate what-if scenarios by slightly modifying the process (f.i. adding sensors or changing their placement) and evaluating the impact in terms of the fault diagnosis and redundancy possibilities. Hence, this work proposes an approach to analyze a process from the FDI perspective and for this purpose provides the tool FAST which covers from the analysis and design phase until the final FDI supervisor implementation in a real process. To synthesize the process information, a very simple format has been defined based on XML. This format provides the needed information to systematically perform the Structural Analysis of that process. Any process can be analyzed, the only restriction is that the models of the process components need to be available in the FAST tool. The processes are described in FAST in terms of process variables, components and relations and the tool performs the structural analysis of the process obtaining: (i) the structural matrix, (ii) the perfect matching, (iii) the analytical redundancy relations (if any) and (iv) the fault signature matrix. To aid in the analysis process, FAST can operate stand alone in simulation mode allowing the process engineer to evaluate the faults, its detectability and implement changes in the process components and topology to improve the diagnosis and redundancy capabilities. On the other hand, FAST can operate on-line connected to the process plant through an OPC interface. The OPC interface enables the possibility to connect to almost any process which features a SCADA system for supervisory control. When running in on-line mode, the process is monitored by a software agent known as the Supervisor Agent. FAST has also the capability of implementing distributed FDI using its multi-agent architecture. The tool is able to partition complex industrial processes into subsystems, identify which process variables need to be shared by each subsystem and instantiate a Supervision Agent for each of the partitioned subsystems. The Supervision Agents once instantiated will start diagnosing their local components and handle the requests to provide the variable values which FAST has identified as shared with other agents to support the distributed FDI process.Per tal de facilitar la utilització d'eines per la detecció i identificació de fallades (FDI) en la indústria, es requereix un enfocament sistemàtic per permetre als enginyers de processos analitzar un sistema des d'aquesta perspectiva. D'aquesta forma, hauria de ser possible analitzar aquest sistema per determinar si proporciona el diagnosi de fallades i la redundància d'acord amb la seva criticitat. A més, hauria de ser possible avaluar escenaris de casos modificant lleugerament el procés (per exemple afegint sensors o canviant la seva localització) i avaluant l'impacte en quant a les possibilitats de diagnosi de fallades i redundància. Per tant, aquest projecte proposa un enfocament per analitzar un procés des de la perspectiva FDI i per tal d'implementar-ho proporciona l'eina FAST la qual cobreix des de la fase d'anàlisi i disseny fins a la implementació final d'un supervisor FDI en un procés real. Per sintetitzar la informació del procés s'ha definit un format simple basat en XML. Aquest format proporciona la informació necessària per realitzar de forma sistemàtica l'Anàlisi Estructural del procés. Qualsevol procés pot ser analitzat, només hi ha la restricció de que els models dels components han d'estar disponibles en l'eina FAST. Els processos es descriuen en termes de variables de procés, components i relacions i l'eina realitza l'anàlisi estructural obtenint: (i) la matriu estructural, (ii) el Perfect Matching, (iii) les relacions de redundància analítica, si n'hi ha, i (iv) la matriu signatura de fallades. Per ajudar durant el procés d'anàlisi, FAST pot operar aïlladament en mode de simulació permetent a l'enginyer de procés avaluar fallades, la seva detectabilitat i implementar canvis en els components del procés i la topologia per tal de millorar les capacitats de diagnosi i redundància. Per altra banda, FAST pot operar en línia connectat al procés de la planta per mitjà d'una interfície OPC. La interfície OPC permet la possibilitat de connectar gairebé a qualsevol procés que inclogui un sistema SCADA per la seva supervisió. Quan funciona en mode en línia, el procés està monitoritzat per un agent software anomenat l'Agent Supervisor. Addicionalment, FAST té la capacitat d'implementar FDI de forma distribuïda utilitzant la seva arquitectura multi-agent. L'eina permet dividir sistemes industrials complexes en subsistemes, identificar quines variables de procés han de ser compartides per cada subsistema i generar una instància d'Agent Supervisor per cadascun dels subsistemes identificats. Els Agents Supervisor un cop activats, començaran diagnosticant els components locals i despatxant les peticions de valors per les variables que FAST ha identificat com compartides amb altres agents, per tal d'implementar el procés FDI de forma distribuïda.Postprint (published version

Design of Multi-Gigabit Network Interconnect Elements and Protocols for a Data Acquisition System in Radiation Environments

Modern High Energy Physics experiments (HEP) explore the fundamental nature of matter in more depth than ever before and thereby benefit greatly from the advances in the field of communication technology. The huge data volumes generated by the increasingly precise detector setups pose severe problems for the Data Acquisition Systems (DAQ), which are used to process and store this information. In addition, detector setups and their read-out electronics need to be synchronized precisely to allow a later correlation of experiment events accurately in time. Moreover, the substantial presence of charged particles from accelerator-generated beams results in strong ionizing radiation levels, which has a severe impact on the electronic systems. This thesis recommends an architecture for unified network protocol IP cores with custom developed physical interfaces for the use of reliable data acquisition systems in strong radiation environments. Special configured serial bidirectional point-to-point interconnects are proposed to realize high speed data transmission, slow control access, synchronization and global clock distribution on unified links to reduce costs and to gain compact and efficient read-out setups. Special features are the developed radiation hardened functional units against single and multiple bit upsets, and the common interface for statistical error and diagnosis information, which integrates well into the protocol capabilities and eases the error handling in large experiment setups. Many innovative designs for several custom FPGA and ASIC platforms have been implemented and are described in detail. Special focus is placed on the physical layers and network interface elements from high-speed serial LVDS interconnects up to 20 Gb/s SSTL links in state-of-the-art process technology. The developed IP cores are fully tested by an adapted verification environment for electronic design automation tools and also by live application. They are available in a global repository allowing a broad usage within further HEP experiments