Exploring the capabilities of support vector machines in detecting silent data corruptions

As the exascale era approaches, the increasing capacity of high-performance computing (HPC) systems with targeted power and energy budget goals introduces significant challenges in reliability. Silent data corruptions (SDCs), or silent errors, are one of the major sources that corrupt the execution results of HPC applications without being detected. In this work, we explore a set of novel SDC detectors – by leveraging epsilon-insensitive support vector machine regression – to detect SDCs that occur in HPC applications. The key contributions are threefold. (1) Our exploration takes temporal, spatial, and spatiotemporal features into account and analyzes different detectors based on different features. (2) We provide an in-depth study on the detection ability and performance with different parameters, and we optimize the detection range carefully. (3) Experiments with eight real-world HPC applications show that support-vector-machine-based detectors can achieve detection sensitivity (i.e., recall) up to 99% yet suffer a less than 1% false positive rate for most cases. Our detectors incur low performance overhead, 5% on average, for all benchmarks studied in this work.This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research under Award Number 66905, program manager Lucy Nowell. Pacific Northwest National Laboratory is operated by Battelle for DOE under Contract DE-AC05-76RL01830. In addition, this material is based upon work supported by the National Science Foundation under Grant No. 1619253, and also by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, program manager Lucy Nowell, under contract number DE-AC02-06CH11357 (DOE Catalog project) and in part by the European Union FEDER funds under contract TIN2015-65316-P.Peer ReviewedPostprint (author's final draft

Doctor of Philosophy

dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts and improving power efficiency, are making the hardware increasingly less reliable. Due to extreme transistor miniaturization, it is becoming easier to flip a bit stored in memory elements built using these transistors. Given that soft errors can cause transient bit-flips in memory elements, caused due to alpha particles and cosmic rays striking those elements, soft errors have become one of the major impediments in system resilience as we move towards exascale computing. Soft errors escaping the hardware-layer may silently corrupt the runtime application data of a program, causing silent data corruption in the output. Also, given that soft errors are transient in nature, it is notoriously hard to trace back their origins. Therefore, techniques to enhance system resilience hinge on the availability of efficient error detectors that have high detection rates, low false positive rates, and lower computational overhead. It is equally important to have a flexible infrastructure capable of simulating realistic soft error models to promote an effective evaluation of newly developed error detectors. In this work, we present a set of techniques for efficiently detecting soft errors affecting control-flow, data, and structured address computations in an application. We evaluate the efficacy of the proposed techniques by evaluating them on a collection of benchmarks through fault-injection driven studies. As an important requirement, we also introduce two new LLVM-based fault injectors, KULFI and VULFI, which are geared towards scalar and vector architectures, respectively. Through this work, we aim to make contributions to the system resilience community by making our research tools (in the form of error detectors and fault injectors) publicly available

Predictive Reliability and Fault Management in Exascale Systems: State of the Art and Perspectives

© ACM, 2020. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in ACM Computing Surveys, Vol. 53, No. 5, Article 95. Publication date: September 2020. https://doi.org/10.1145/3403956[EN] Performance and power constraints come together with Complementary Metal Oxide Semiconductor technology scaling in future Exascale systems. Technology scaling makes each individual transistor more prone to faults and, due to the exponential increase in the number of devices per chip, to higher system fault rates. Consequently, High-performance Computing (HPC) systems need to integrate prediction, detection, and recovery mechanisms to cope with faults efficiently. This article reviews fault detection, fault prediction, and recovery techniques in HPC systems, from electronics to system level. We analyze their strengths and limitations. Finally, we identify the promising paths to meet the reliability levels of Exascale systems.This work has received funding from the European Union's Horizon 2020 (H2020) research and innovation program under the FET-HPC Grant Agreement No. 801137 (RECIPE). Jaume Abella was also partially supported by the Ministry of Economy and Competitiveness of Spain under Contract No. TIN2015-65316-P and under Ramon y Cajal Postdoctoral Fellowship No. RYC-2013-14717, as well as by the HiPEAC Network of Excellence. Ramon Canal is partially supported by the Generalitat de Catalunya under Contract No. 2017SGR0962.Canal, R.; Hernández Luz, C.; Tornero-Gavilá, R.; Cilardo, A.; Massari, G.; Reghenzani, F.; Fornaciari, W.... (2020). Predictive Reliability and Fault Management in Exascale Systems: State of the Art and Perspectives. ACM Computing Surveys. 53(5):1-32. https://doi.org/10.1145/3403956S132535Abella, J., Hernandez, C., Quinones, E., Cazorla, F. J., Conmy, P. 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IEEE Internet Com

Ground-truth prediction to accelerate soft-error impact analysis for iterative methods

Understanding the impact of soft errors on applications can be expensive. Often, it requires an extensive error injection campaign involving numerous runs of the full application in the presence of errors. In this paper, we present a novel approach to arriving at the ground truth-the true impact of an error on the final output-for iterative methods by observing a small number of iterations to learn deviations between normal and error-impacted execution. We develop a machine learning based predictor for three iterative methods to generate ground-truth results without running them to completion for every error injected. We demonstrate that this approach achieves greater accuracy than alternative prediction strategies, including three existing soft error detection strategies. We demonstrate the effectiveness of the ground truth prediction model in evaluating vulnerability and the effectiveness of soft error detection strategies in the context of iterative methods.This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research under Award Number 66905, program manager Lucy Nowell. Pacific Northwest National Laboratory is operated by Battelle for DOE under Contract DE-AC05-76RL01830.Peer ReviewedPostprint (author's final draft

An extensive study on iterative solver resilience : characterization, detection and prediction

Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's behavior. This has motivated the design of an array of techniques to detect, isolate, and correct soft errors using microarchitectural, architectural, compilation­based, or application-level techniques to minimize their impact on the executing application. The first step toward the design of good error detection/correction techniques involves an understanding of an application's vulnerability to soft errors. This work focuses on silent data e orruption's effects on iterative solvers and efforts to mitigate those effects. In this thesis, we first present the first comprehensive characterizalion of !he impact of soft errors on !he convergen ce characteris tics of six iterative methods using application-level fault injection. We analyze the impact of soft errors In terms of the type of error (single-vs multi-bit), the distribution and location of bits affected, the data structure and statement impacted, and varialion with time. We create a public access database with more than 1.5 million fault injection results. We then analyze the performance of soft error detection mechanisms and present the comparalive results. Molivated by our observations, we evaluate a machine-learning based detector that takes as features that are the runtime features observed by the individual detectors to arrive al their conclusions. Our evalualion demonstrates improved results over individual detectors. We then propase amachine learning based method to predict a program's error behavior to make fault injection studies more efficient. We demonstrate this method on asse ssing the performance of soft error detectors. We show that our method maintains 84% accuracy on average with up to 53% less cost. We also show, once a model is trained further fault injection tests would cost 10% of the expected full fault injection runs.“Soft errors” causados por cambios de estado transitorios en bits, tienen el potencial de impactar significativamente el comportamiento de una aplicación. Esto, ha motivado el diseño de una variedad de técnicas para detectar, aislar y corregir soft errors aplicadas a micro-arquitecturas, arquitecturas, tiempo de compilación y a nivel de aplicación para minimizar su impacto en la ejecución de una aplicación. El primer paso para diseñar una buna técnica de detección/corrección de errores, implica el conocimiento de las vulnerabilidades de la aplicación ante posibles soft errors. Este trabajo se centra en los efectos de la corrupción silenciosa de datos en soluciones iterativas, así como en los esfuerzos para mitigar esos efectos. En esta tesis, primeramente, presentamos la primera caracterización extensiva del impacto de soft errors sobre las características convergentes de seis métodos iterativos usando inyección de fallos a nivel de aplicación. Analizamos el impacto de los soft errors en términos del tipo de error (único vs múltiples-bits), de la distribución y posición de los bits afectados, las estructuras de datos, instrucciones afectadas y de las variaciones en el tiempo. Creamos una base de datos pública con más de 1.5 millones de resultados de inyección de fallos. Después, analizamos el desempeño de mecanismos de detección de soft errors actuales y presentamos los resultados de su comparación. Motivados por las observaciones de los resultados presentados, evaluamos un detector de soft errors basado en técnicas de machine learning que toma como entrada las características observadas en el tiempo de ejecución individual de los detectores anteriores al llegar a su conclusión. La evaluación de los resultados obtenidos muestra una mejora por sobre los detectores individualmente. Basados en estos resultados propusimos un método basado en machine learning para predecir el comportamiento de los errores en un programa con el fin de hacer el estudio de inyección de errores mas eficiente. Presentamos este método para evaluar el rendimiento de los detectores de soft errors. Demostramos que nuestro método mantiene una precisión del 84% en promedio con hasta un 53% de mejora en el tiempo de ejecución. También mostramos que una vez que un modelo ha sido entrenado, las pruebas de inyección de errores siguientes costarían 10% del tiempo esperado de ejecución.Postprint (published version

Mitigation of failures in high performance computing via runtime techniques

As machines increase in scale, it is predicted that failure rates of supercomputers will correspondingly increase. Even though the mean time to failure (MTTF) of individual component is high, the large number of components significantly decreases the system MTTF. Meanwhile, the decreasing size of transistors has been critical to the increase in capacity of supercomputers. The smaller the transistors are, silent data corruptions (SDC) are likely to occur more frequently. SDCs do not inhibit execution, but may silently lead to incorrect results. In this thesis, we leverage runtime system and compiler techniques to mitigate a significant fraction of failures automatically with low overhead. The main goals of various system-level fault tolerance strategies designed in this thesis are: reducing the extra cost added to application execution while improving system reliability; automatically adjusting fault tolerance decisions without user intervention based on environmental changes; protecting applications not only from fail-stop failures but also from silent data corruptions. The main contributions of this thesis are development of a semi-blocking checkpoint protocol that overlaps application execution with fault tolerance operation to reduce the overhead of checkpointing, a runtime system technique for automatic checkpoint and restart without user intervention, a holistic framework (ACR) for automatically detecting and recovering from silent data corruptions and a framework called FlipBack that provides targeted protection against silent data corruption with low cost

Adaptive Distributed Architectures for Future Semiconductor Technologies.

Year after year semiconductor manufacturing has been able to integrate more components in a single computer chip. These improvements have been possible through systematic shrinking in the size of its basic computational element, the transistor. This trend has allowed computers to progressively become faster, more efficient and less expensive. As this trend continues, experts foresee that current computer designs will face new challenges, in utilizing the minuscule devices made available by future semiconductor technologies. Today's microprocessor designs are not fit to overcome these challenges, since they are constrained by their inability to handle component failures by their lack of adaptability to a wide range of custom modules optimized for specific applications and by their limited design modularity. The focus of this thesis is to develop original computer architectures, that can not only survive these new challenges, but also leverage the vast number of transistors available to unlock better performance and efficiency. The work explores and evaluates new software and hardware techniques to enable the development of novel adaptive and modular computer designs. The thesis first explores an infrastructure to quantitatively assess the fallacies of current systems and their inadequacy to operate on unreliable silicon. In light of these findings, specific solutions are then proposed to strengthen digital system architectures, both through hardware and software techniques. The thesis culminates with the proposal of a radically new architecture design that can fully adapt dynamically to operate on the hardware resources available on chip, however limited or abundant those may be.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/102405/1/apellegr_1.pd