Resiliency Mechanisms for In-Memory Column Stores

The key objective of database systems is to reliably manage data, while high query throughput and low query latency are core requirements. To date, database research activities mostly concentrated on the second part. However, due to the constant shrinking of transistor feature sizes, integrated circuits become more and more unreliable and transient hardware errors in the form of multi-bit flips become more and more prominent. In a more recent study (2013), in a large high-performance cluster with around 8500 nodes, a failure rate of 40 FIT per DRAM device was measured. For their system, this means that every 10 hours there occurs a single- or multi-bit flip, which is unacceptably high for enterprise and HPC scenarios. Causes can be cosmic rays, heat, or electrical crosstalk, with the latter being exploited actively through the RowHammer attack. It was shown that memory cells are more prone to bit flips than logic gates and several surveys found multi-bit flip events in main memory modules of today's data centers. Due to the shift towards in-memory data management systems, where all business related data and query intermediate results are kept solely in fast main memory, such systems are in great danger to deliver corrupt results to their users. Hardware techniques can not be scaled to compensate the exponentially increasing error rates. In other domains, there is an increasing interest in software-based solutions to this problem, but these proposed methods come along with huge runtime and/or storage overheads. These are unacceptable for in-memory data management systems. In this thesis, we investigate how to integrate bit flip detection mechanisms into in-memory data management systems. To achieve this goal, we first build an understanding of bit flip detection techniques and select two error codes, AN codes and XOR checksums, suitable to the requirements of in-memory data management systems. The most important requirement is effectiveness of the codes to detect bit flips. We meet this goal through AN codes, which exhibit better and adaptable error detection capabilities than those found in today's hardware. The second most important goal is efficiency in terms of coding latency. We meet this by introducing a fundamental performance improvements to AN codes, and by vectorizing both chosen codes' operations. We integrate bit flip detection mechanisms into the lowest storage layer and the query processing layer in such a way that the remaining data management system and the user can stay oblivious of any error detection. This includes both base columns and pointer-heavy index structures such as the ubiquitous B-Tree. Additionally, our approach allows adaptable, on-the-fly bit flip detection during query processing, with only very little impact on query latency. AN coding allows to recode intermediate results with virtually no performance penalty. We support our claims by providing exhaustive runtime and throughput measurements throughout the whole thesis and with an end-to-end evaluation using the Star Schema Benchmark. To the best of our knowledge, we are the first to present such holistic and fast bit flip detection in a large software infrastructure such as in-memory data management systems. Finally, most of the source code fragments used to obtain the results in this thesis are open source and freely available.:1 INTRODUCTION 1.1 Contributions of this Thesis 1.2 Outline 2 PROBLEM DESCRIPTION AND RELATED WORK 2.1 Reliable Data Management on Reliable Hardware 2.2 The Shift Towards Unreliable Hardware 2.3 Hardware-Based Mitigation of Bit Flips 2.4 Data Management System Requirements 2.5 Software-Based Techniques For Handling Bit Flips 2.5.1 Operating System-Level Techniques 2.5.2 Compiler-Level Techniques 2.5.3 Application-Level Techniques 2.6 Summary and Conclusions 3 ANALYSIS OF CODING TECHNIQUES 3.1 Selection of Error Codes 3.1.1 Hamming Coding 3.1.2 XOR Checksums 3.1.3 AN Coding 3.1.4 Summary and Conclusions 3.2 Probabilities of Silent Data Corruption 3.2.1 Probabilities of Hamming Codes 3.2.2 Probabilities of XOR Checksums 3.2.3 Probabilities of AN Codes 3.2.4 Concrete Error Models 3.2.5 Summary and Conclusions 3.3 Throughput Considerations 3.3.1 Test Systems Descriptions 3.3.2 Vectorizing Hamming Coding 3.3.3 Vectorizing XOR Checksums 3.3.4 Vectorizing AN Coding 3.3.5 Summary and Conclusions 3.4 Comparison of Error Codes 3.4.1 Effectiveness 3.4.2 Efficiency 3.4.3 Runtime Adaptability 3.5 Performance Optimizations for AN Coding 3.5.1 The Modular Multiplicative Inverse 3.5.2 Faster Softening 3.5.3 Faster Error Detection 3.5.4 Comparison to Original AN Coding 3.5.5 The Multiplicative Inverse Anomaly 3.6 Summary 4 BIT FLIP DETECTING STORAGE 4.1 Column Store Architecture 4.1.1 Logical Data Types 4.1.2 Storage Model 4.1.3 Data Representation 4.1.4 Data Layout 4.1.5 Tree Index Structures 4.1.6 Summary 4.2 Hardened Data Storage 4.2.1 Hardened Physical Data Types 4.2.2 Hardened Lightweight Compression 4.2.3 Hardened Data Layout 4.2.4 UDI Operations 4.2.5 Summary and Conclusions 4.3 Hardened Tree Index Structures 4.3.1 B-Tree Verification Techniques 4.3.2 Justification For Further Techniques 4.3.3 The Error Detecting B-Tree 4.4 Summary 5 BIT FLIP DETECTING QUERY PROCESSING 5.1 Column Store Query Processing 5.2 Bit Flip Detection Opportunities 5.2.1 Early Onetime Detection 5.2.2 Late Onetime Detection 5.2.3 Continuous Detection 5.2.4 Miscellaneous Processing Aspects 5.2.5 Summary and Conclusions 5.3 Hardened Intermediate Results 5.3.1 Materialization of Hardened Intermediates 5.3.2 Hardened Bitmaps 5.4 Summary 6 END-TO-END EVALUATION 6.1 Prototype Implementation 6.1.1 AHEAD Architecture 6.1.2 Diversity of Physical Operators 6.1.3 One Concrete Operator Realization 6.1.4 Summary and Conclusions 6.2 Performance of Individual Operators 6.2.1 Selection on One Predicate 6.2.2 Selection on Two Predicates 6.2.3 Join Operators 6.2.4 Grouping and Aggregation 6.2.5 Delta Operator 6.2.6 Summary and Conclusions 6.3 Star Schema Benchmark Queries 6.3.1 Query Runtimes 6.3.2 Improvements Through Vectorization 6.3.3 Storage Overhead 6.3.4 Summary and Conclusions 6.4 Error Detecting B-Tree 6.4.1 Single Key Lookup 6.4.2 Key Value-Pair Insertion 6.5 Summary 7 SUMMARY AND CONCLUSIONS 7.1 Future Work A APPENDIX A.1 List of Golden As A.2 More on Hamming Coding A.2.1 Code examples A.2.2 Vectorization BIBLIOGRAPHY LIST OF FIGURES LIST OF TABLES LIST OF LISTINGS LIST OF ACRONYMS LIST OF SYMBOLS LIST OF DEFINITION

Light-Weight Techniques for Improving the Controllability and Efficiency of ISA-Level Fault Injection Tools

ISA-level fault injection, i.e. the injection of bit-flip faults in Instruction Set Architecture (ISA) registers and main memory words, is widely used for studying the impact of transient and intermittent hardware faults. ISA-level fault injection tools can be characterized by different properties such as repeatability, observability, reachability, intrusiveness, efficiency and controllability. This paper presents two pre-injection analysis techniques that improve controllability and efficiency using object code analysis. To improve controllability, we propose a technique for identifying the type of data that is stored in a potential target location. This allows the user to selectively direct fault injections to addresses, data and/or control information. Experimental results show that the data type of 84-100% of the targets locations in 8 programs were successfully identified by this technique. The second technique improves efficiency by fault pruning, i.e., by avoiding injection of faults that is known a priori to be detected by the tested system. This technique leverage the fact that faults in certain bits in the program counter and the stack pointer are always detected by machine exceptions. We show that exclusion of these bits from the fault space could significantly prune the fault space and reduce the time it takes to conduct a fault injection campaign

Resilient gossip-inspired all-reduce algorithms for high-performance computing - Potential, limitations, and open questions

We investigate the usefulness of gossip-based reduction algorithms in a high-performance computing (HPC) context. We compare them to state-of-the-art deterministic parallel reduction algorithms in terms of fault tolerance and resilience against silent data corruption (SDC) as well as in terms of performance and scalability. New gossip-based reduction algorithms are proposed, which significantly improve the state-of-the-art in terms of resilience against SDC. Moreover, a new gossip-inspired reduction algorithm is proposed, which promises a much more competitive runtime performance in an HPC context than classical gossip-based algorithms, in particular for low accuracy requirements.This work has been partially funded by the Spanish Ministry of Science and Innovation [contract TIN2015-65316]; by the Government of Catalonia [contracts 2014-SGR-1051, 2014-SGR-1272]; by the RoMoL ERC Advanced Grant [grant number GA 321253] and by the Vienna Science and Technology Fund (WWTF) through project ICT15-113.Peer ReviewedPostprint (author's final draft

Towards Accurate Estimation of Error Sensitivity in Computer Systems

Fault injection is an increasingly important method for assessing, measuringand observing the system-level impact of hardware and software faults in computer systems. This thesis presents the results of a series of experimental studies in which fault injection was used to investigate the impact of bit-flip errors on program execution. The studies were motivated by the fact that transient hardware faults in microprocessors can cause bit-flip errors that can propagate to the microprocessors instruction set architecture registers and main memory. As the rate of such hardware faults is expected to increase with technology scaling, there is a need to better understand how these errors (known as ‘soft errors’) influence program execution, especially in safety-critical systems.Using ISA-level fault injection, we investigate how five aspects, or factors, influence the error sensitivity of a program. We define error sensitivity as the conditional probability that a bit-flip error in live data in an ISA-register or main-memory word will cause a program to produce silent data corruption (SDC; i.e., an erroneous result). We also consider the estimation of a measure called SDC count, which represents the number of ISA-level bit flips that cause an SDC.The five factors addressed are (a) the inputs processed by a program, (b) the level of compiler optimization, (c) the implementation of the program in the source code, (d) the fault model (single bit flips vs double bit flips) and (e)the fault-injection technique (inject-on-write vs inject-on-read). Our results show that these factors affect the error sensitivity in many ways; some factors strongly impact the error sensitivity or SDC count whereas others show a weaker impact. For example, our experiments show that single bit flips tend to cause SDCs more than double bit flips; compiler optimization positively impacts the SDC count but not necessarily the error sensitivity; the error sensitivity varies between 20% and 50% among the programs we tested; and variations in input affect the error sensitivity significantly for most of the tested programs

Resilience for Asynchronous Iterative Methods for Sparse Linear Systems

Large scale simulations are used in a variety of application areas in science and engineering to help forward the progress of innovation. Many spend the vast majority of their computational time attempting to solve large systems of linear equations; typically arising from discretizations of partial differential equations that are used to mathematically model various phenomena. The algorithms used to solve these problems are typically iterative in nature, and making efficient use of computational time on High Performance Computing (HPC) clusters involves constantly improving these iterative algorithms. Future HPC platforms are expected to encounter three main problem areas: scalability of code, reliability of hardware, and energy efficiency of the platform. The HPC resources that are expected to run the large programs are planned to consist of billions of processing units that come from more traditional multicore processors as well as a variety of different hardware accelerators. This growth in parallelism leads to the presence of all three problems. Previously, work on algorithm development has focused primarily on creating fault tolerance mechanisms for traditional iterative solvers. Recent work has begun to revisit using asynchronous methods for solving large scale applications, and this dissertation presents research into fault tolerance for fine-grained methods that are asynchronous in nature. Classical convergence results for asynchronous methods are revisited and modified to account for the possible occurrence of a fault, and a variety of techniques for recovery from the effects of a fault are proposed. Examples of how these techniques can be used are shown for various algorithms, including an analysis of a fine-grained algorithm for computing incomplete factorizations. Lastly, numerous modeling and simulation tools for the further construction of iterative algorithms for HPC applications are developed, including numerical models for simulating faults and a simulation framework that can be used to extrapolate the performance of algorithms towards future HPC systems

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems