1,542 research outputs found

    A Multi-Context FPGA Using a Floating-Gate-MOS Functional Pass-Gate and Its CAD Environment

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    科研費報告書収録論文(課題番号:17300009/研究代表者:亀山充隆/システムインテグレーション理論に基づく高安全知能自動車用VLSIの最適設計

    Iddq testing of a CMOS 10-bit charge scaling digital-to-analog converter

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    This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no performance degradation of the CUT. In the testing mode, our BICS detects the abnormal current caused by permanent manufacturing defects. Further more our BICS can also distinguish the type of defect induced (Gate-source short, source-drain short and drain-gate short). Our BICS requires neither an external voltage source nor current source. Hence the BICS requires less area and is more efficient than the conventional current sensors. The circuit under test is a 10-bit digital to analog converter using charge-scaling architecture

    Investigation of charge coupled device correlation techniques

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    Analog Charge Transfer Devices (CTD's) offer unique advantages to signal processing systems, which often have large development costs, making it desirable to define those devices which can be developed for general system's use. Such devices are best identified and developed early to give system's designers some interchangeable subsystem blocks, not requiring additional individual development for each new signal processing system. The objective of this work is to describe a discrete analog signal processing device with a reasonably broad system use and to implement its design, fabrication, and testing

    Product assurance technology for custom LSI/VLSI electronics

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    The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

    Data Conversion Within Energy Constrained Environments

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    Within scientific research, engineering, and consumer electronics, there is a multitude of new discrete sensor-interfaced devices. Maintaining high accuracy in signal quantization while staying within the strict power-budget of these devices is a very challenging problem. Traditional paths to solving this problem include researching more energy-efficient digital topologies as well as digital scaling.;This work offers an alternative path to lower-energy expenditure in the quantization stage --- content-dependent sampling of a signal. Instead of sampling at a constant rate, this work explores techniques which allow sampling based upon features of the signal itself through the use of application-dependent analog processing. This work presents an asynchronous sampling paradigm, based off the use of floating-gate-enabled analog circuitry. The basis of this work is developed through the mathematical models necessary for asynchronous sampling, as well the SPICE-compatible models necessary for simulating floating-gate enabled analog circuitry. These base techniques and circuitry are then extended to systems and applications utilizing novel analog-to-digital converter topologies capable of leveraging the non-constant sampling rates for significant sample and power savings

    CMOS VLSI circuits for imaging

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    Advances in Solid State Circuit Technologies

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    This book brings together contributions from experts in the fields to describe the current status of important topics in solid-state circuit technologies. It consists of 20 chapters which are grouped under the following categories: general information, circuits and devices, materials, and characterization techniques. These chapters have been written by renowned experts in the respective fields making this book valuable to the integrated circuits and materials science communities. It is intended for a diverse readership including electrical engineers and material scientists in the industry and academic institutions. Readers will be able to familiarize themselves with the latest technologies in the various fields
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