Applying MILP/Heuristic algorithms to automated job-shop scheduling problems in aircraft-part manufacturing

This work presents efficient algorithms based on Mixed-Integer Linear Programming (MILP) and heuristic strategies for complex job-shop scheduling problems raised in Automated Manufacturing Systems. The aim of this work is to find alternative a solution approach of production and transportation operations in a multi-product multi-stage production system that can be used to solve industrial-scale problems with a reasonable computational effort. The MILP model developed must take into account; heterogeneous recipes, single unit per stage, possible recycle flows, sequence-dependent free transferring times and load transfer movements in a single automated material-handling device. In addition, heuristic-based strategies are proposed to iteratively find and improve the solutions generated over time. These approaches were tested in different real-world problems arising in the surface-treatment process of metal components in the aircraft manufacturing industry.Fil: Aguirre, Adrian Marcelo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Santa Fe. Instituto de Desarrollo Tecnológico Para la Industria Química (i); Argentina. Universidad Nacional del Nordeste; ArgentinaFil: Mendez, Carlos Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Santa Fe. Instituto de Desarrollo Tecnológico Para la Industria Química (i); Argentina. Universidad Nacional del Nordeste; ArgentinaFil: García Sanchez, Alvaro. Universidad Politecnica de Madrid; EspañaFil: Ortega Mier, Miguel. Universidad Politecnica de Madrid; Españ

Optimisation approaches for supply chain planning and scheduling under demand uncertainty

This work presents efficient MILP-based approaches for the planning and scheduling of multiproduct multistage continuous plants with sequence-dependent changeovers in a supply chain network under demand uncertainty and price elasticity of demand. This problem considers multiproduct plants, where several products must be produced and delivered to supply the distribution centres (DCs), while DCs are in charge of storing and delivering these products to the final markets to be sold. A hybrid discrete/continuous model is proposed for this problem by using the ideas of the Travelling Salesman Problem (TSP) and global precedence representation. In order to deal with the uncertainty, we proposed a Hierarchical Model Predictive Control (HMPC) approach for this particular problem. Despite of its efficiency, the final solution reported still could be far from the global optimum. Due to this, Local Search (LS) algorithms are developed to improve the solution of HMPC by rescheduling successive products in the current schedule. The effectiveness of the proposed solution techniques is demonstrated by solving a large-scale instance and comparing the solution with the original MPC and a classic Cutting Plane approach adapted for this work

Predictive Modeling for Intelligent Maintenance in Complex Semiconductor Manufacturing Processes.

Semiconductor fabrication is one of the most complicated manufacturing processes, in which the current prevailing maintenance practices are preventive maintenance, using either time-based or wafer-based scheduling strategies, which may lead to the tools being either “over-maintained” or “under-maintained”. In literature, there rarely exists condition-based maintenance, which utilizes machine conditions to schedule maintenance, and almost no truly predictive maintenance that assesses remaining useful lives of machines and plans maintenance actions proactively. The research presented in this thesis is aimed at developing predictive modeling methods for intelligent maintenance in semiconductor manufacturing processes, using the in-process tool performance as well as the product quality information. In order to achieve an improved maintenance decision-making, a method for integrating data from different domains to predict process yield is proposed. The self-organizing maps have been utilized to discretize continuous data into discrete values, which will tremendously reduce the computational cost of Bayesian network learning process that can discover the stochastic dependences among process parameters and product quality. This method enables one to make more proactive product quality prediction that is different from traditional methods based on solely inspection results. Furthermore, a method of using observable process information to estimate stratified tool degradation levels has been proposed. Single hidden Markov model (HMM) has been employed to represent the tool degradation process under a single recipe; and the concatenation of multiple HMMs can be used to model the tool degradation under multiple recipes. To validate the proposed method, a simulation study has been conducted, which shows that HMMs are able to model the stratified unobservable degradation process under variable operating conditions. This method enables one to estimate the condition of in-chamber particle contamination so that maintenance actions can be initiated accordingly. With these two novel methods, a methodological framework to perform better maintenance in complex manufacturing processes is established. The simulation study shows that the maintenance cost can be reduced by performing predictive maintenance properly while highest possible yield is retained. This framework provides a possibility of using abundant equipment monitoring data and product quality information to coordinate maintenance actions in a complex manufacturing environment.Ph.D.Mechanical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/58530/1/yangliu_1.pd

Space station automation study: Automation requriements derived from space manufacturing concepts,volume 2

Automation reuirements were developed for two manufacturing concepts: (1) Gallium Arsenide Electroepitaxial Crystal Production and Wafer Manufacturing Facility, and (2) Gallium Arsenide VLSI Microelectronics Chip Processing Facility. A functional overview of the ultimate design concept incoporating the two manufacturing facilities on the space station are provided. The concepts were selected to facilitate an in-depth analysis of manufacturing automation requirements in the form of process mechanization, teleoperation and robotics, sensors, and artificial intelligence. While the cost-effectiveness of these facilities was not analyzed, both appear entirely feasible for the year 2000 timeframe

Scheduling of serial multiproduct batch processes

Master'sMASTER OF ENGINEERIN

Statistical Methods for Semiconductor Manufacturing

In this thesis techniques for non-parametric modeling, machine learning, filtering and prediction and run-to-run control for semiconductor manufacturing are described. In particular, algorithms have been developed for two major applications area: - Virtual Metrology (VM) systems; - Predictive Maintenance (PdM) systems. Both technologies have proliferated in the past recent years in the semiconductor industries, called fabs, in order to increment productivity and decrease costs. VM systems aim of predicting quantities on the wafer, the main and basic product of the semiconductor industry, that may be physically measurable or not. These quantities are usually ’costly’ to be measured in economic or temporal terms: the prediction is based on process variables and/or logistic information on the production that, instead, are always available and that can be used for modeling without further costs. PdM systems, on the other hand, aim at predicting when a maintenance action has to be performed. This approach to maintenance management, based like VM on statistical methods and on the availability of process/logistic data, is in contrast with other classical approaches: - Run-to-Failure (R2F), where there are no interventions performed on the machine/process until a new breaking or specification violation happens in the production; - Preventive Maintenance (PvM), where the maintenances are scheduled in advance based on temporal intervals or on production iterations. Both aforementioned approaches are not optimal, because they do not assure that breakings and wasting of wafers will not happen and, in the case of PvM, they may lead to unnecessary maintenances without completely exploiting the lifetime of the machine or of the process. The main goal of this thesis is to prove through several applications and feasibility studies that the use of statistical modeling algorithms and control systems can improve the efficiency, yield and profits of a manufacturing environment like the semiconductor one, where lots of data are recorded and can be employed to build mathematical models. We present several original contributions, both in the form of applications and methods. The introduction of this thesis will be an overview on the semiconductor fabrication process: the most common practices on Advanced Process Control (APC) systems and the major issues for engineers and statisticians working in this area will be presented. Furthermore we will illustrate the methods and mathematical models used in the applications. We will then discuss in details the following applications: - A VM system for the estimation of the thickness deposited on the wafer by the Chemical Vapor Deposition (CVD) process, that exploits Fault Detection and Classification (FDC) data is presented. In this tool a new clustering algorithm based on Information Theory (IT) elements have been proposed. In addition, the Least Angle Regression (LARS) algorithm has been applied for the first time to VM problems. - A new VM module for multi-step (CVD, Etching and Litography) line is proposed, where Multi-Task Learning techniques have been employed. - A new Machine Learning algorithm based on Kernel Methods for the estimation of scalar outputs from time series inputs is illustrated. - Run-to-Run control algorithms that employ both the presence of physical measures and statistical ones (coming from a VM system) is shown; this tool is based on IT elements. - A PdM module based on filtering and prediction techniques (Kalman Filter, Monte Carlo methods) is developed for the prediction of maintenance interventions in the Epitaxy process. - A PdM system based on Elastic Nets for the maintenance predictions in Ion Implantation tool is described. Several of the aforementioned works have been developed in collaborations with major European semiconductor companies in the framework of the European project UE FP7 IMPROVE (Implementing Manufacturing science solutions to increase equiPment pROductiVity and fab pErformance); such collaborations will be specified during the thesis, underlying the practical aspects of the implementation of the proposed technologies in a real industrial environment

Semiconductor process design : representations, tools, and methodologies

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1991.Vita.Includes bibliographical references (p. 267-278).by Duane S. Boning.Ph.D

A review of data mining applications in semiconductor manufacturing

The authors acknowledge Fundacao para a Ciencia e a Tecnologia (FCT-MCTES) for its financial support via the project UIDB/00667/2020 (UNIDEMI).For decades, industrial companies have been collecting and storing high amounts of data with the aim of better controlling and managing their processes. However, this vast amount of information and hidden knowledge implicit in all of this data could be utilized more efficiently. With the help of data mining techniques unknown relationships can be systematically discovered. The production of semiconductors is a highly complex process, which entails several subprocesses that employ a diverse array of equipment. The size of the semiconductors signifies a high number of units can be produced, which require huge amounts of data in order to be able to control and improve the semiconductor manufacturing process. Therefore, in this paper a structured review is made through a sample of 137 papers of the published articles in the scientific community regarding data mining applications in semiconductor manufacturing. A detailed bibliometric analysis is also made. All data mining applications are classified in function of the application area. The results are then analyzed and conclusions are drawn.publishersversionpublishe