Error control for reliable digital data transmission and storage systems

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. In this paper we present some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative alorithm to find the error locator polynomial. Two codes are considered: (1) a d sub min = 4 single-byte-error-correcting (SBEC), double-byte-error-detecting (DBED) RS code; and (2) a d sub min = 6 double-byte-error-correcting (DBEC), triple-byte-error-detecting (TBED) RS code

Design of a fault tolerant airborne digital computer. Volume 1: Architecture

This volume is concerned with the architecture of a fault tolerant digital computer for an advanced commercial aircraft. All of the computations of the aircraft, including those presently carried out by analogue techniques, are to be carried out in this digital computer. Among the important qualities of the computer are the following: (1) The capacity is to be matched to the aircraft environment. (2) The reliability is to be selectively matched to the criticality and deadline requirements of each of the computations. (3) The system is to be readily expandable. contractible, and (4) The design is to appropriate to post 1975 technology. Three candidate architectures are discussed and assessed in terms of the above qualities. Of the three candidates, a newly conceived architecture, Software Implemented Fault Tolerance (SIFT), provides the best match to the above qualities. In addition SIFT is particularly simple and believable. The other candidates, Bus Checker System (BUCS), also newly conceived in this project, and the Hopkins multiprocessor are potentially more efficient than SIFT in the use of redundancy, but otherwise are not as attractive

Fault-tolerance techniques for hybrid CMOS/nanoarchitecture

The authors propose two fault-tolerance techniques for hybrid CMOS/nanoarchitecture implementing logic functions as look-up tables. The authors compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, the authors implement a combined two-dimensional coding scheme using Hamming and Bose-Chaudhuri-Hocquenghem (BCH) codes to address fault rates greater than 5. In the second technique, Hamming coding is complemented with bad line exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20). The authors have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don-t Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain

Modifying Hamming code and using the replication method to protect memory against triple soft errors

As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semiconductors, the number of soft errors due to radiation induced single event upsets (SEU) and multi-bit upsets (MBU) also increases. To address this, error-correcting codes (ECC) can be used to detect and correct soft errors, while x-modular-redundancy improves fault tolerance. This paper presents a technique that provides high error-correction performance, high speed, and low complexity. The proposed technique ensures that only correct values get passed to the system output or are processed in spite of the presence of up to three-bit errors. The Hamming code is modified in order to provide a high probability of MBU detection. In addition, the paper describes the new technique and associated analysis scheme for its implementation. The new technique has been simulated, evaluated, and compared to error correction codes with similar decoding complexity to better understand the overheads required, the gained capabilities to protect data against three-bit errors, and to reduce the misdetection probability and false-detection probability of four-bit errors

Error correction for deep space network teletype circuits

Error detection codes and correction devices for Deep Space Network /DSN/ teletypewriter system