53 research outputs found

    Aging prediction methodology for digital circuits

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    Dissertação de mest., Engenharia Eléctrica e Electrónica (Tecnologias de Informação e Telecomunicações), Instituto Superior de Engenharia, Univ. do Algarve, 2012Com a constante miniaturização da tecnologia de circuitos integrados CMOS, diversos problemas de fiabilidade e performance estão a tornar-se críticos à medida que a escala continua a ser reduzida. Efeitos a longo prazo, como o NBTI, TDDB, HCI, MS, etc, degradam os parâmetros físicos dos transístores CMOS e com consequências nas propriedades eléctricas dos semicondutores. O fenómeno NBTI é considerado o efeito dominante no processo de degradação por envelhecimento dos CMOS e influencia a operação dos transístores PMOS. Os efeitos degradantes do NBTI são manifestados na degradação da corrente de dreno, nas capacidades, na transcondutância e na tensão limiar de condução (Vth) dos transístores PMOS, mas pode ser representada simplesmente como um incremento no |Vth| ao longo do tempo. Esta degradação é chamada de envelhecimento e estes efeitos cumulativos têm um grande impacto na performance do circuito, especialmente se ocorrerem outras variações paramétricas, como as variações de processo, tensão de alimentação e temperatura. O trabalho apresentado nesta dissertação tem por objectivo desenvolver uma metodologia para prever a degradação na performance dos circuitos digitais CMOS na presença de efeitos de envelhecimento por NBTI. Uma biblioteca genérica SPICE de CMOS foi também definida de forma a usar vários modelos preditivos de tecnologias (PTM). A previsão do envelhecimento é baseada em cálculos das probabilidades dos transístores PMOS terem uma polarização negativa em VGS, na modelação das correspondentes variações em Vth para cada transístor e nas simulações SPICE para medir a degradação na performance. A automatização da metodologia é materializada numa nova ferramenta de software chamada AgingCalc, desenvolvida no âmbito desta tese de mestrado. A metodologia de previsão de envelhecimento proposta é demonstrada através de simulações em circuitos de referência em tecnologias de 130nm a 16nm, usando modelos PTM

    Phase Noise in CMOS Phase-Locked Loop Circuits

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    Phase-locked loops (PLLs) have been widely used in mixed-signal integrated circuits. With the continuously increasing demand of market for high speed, low noise devices, PLLs are playing a more important role in communications. In this dissertation, phase noise and jitter performances are investigated in different types of PLL designs. Hot carrier and negative bias temperature instability effects are analyzed from simulations and experiments. Phase noise of a CMOS phase-locked loop as a frequency synthesizer circuit is modeled from the superposition of noises from its building blocks: voltage-controlled oscillator, frequency divider, phase-frequency detector, loop filter and auxiliary input reference clock. A linear time invariant model with additive noise sources in frequency domain is presented to analyze the phase noise. The modeled phase noise results are compared with the corresponding experimentally measured results on phase-locked loop chips fabricated in 0.5 m n-well CMOS process. With the scaling of CMOS technology and the increase of electrical field, MOS transistors have become very sensitive to hot carrier effect (HCE) and negative bias temperature instability (NBTI). These two reliability issues pose challenges to designers for designing of chips in deep submicron CMOS technologies. A new strategy of switchable CMOS phase-locked loop frequency synthesizer is proposed to increase its tuning range. The switchable PLL which integrates two phase-locked loops with different tuning frequencies are designed and fabricated in 0.5 µm CMOS process to analyze the effects under HCE and NBTI. A 3V 1.2 GHz programmable phase-locked loop frequency synthesizer is designed in 0.5 μm CMOS technology. The frequency synthesizer is implemented using LC voltage-controlled oscillator (VCO) and a low power dual-modulus prescaler. The LC VCO working range is from 900MHz to 1.4GHz. Current mode logic (CML) is used in designing high speed D flip-flop in the dual-modulus prescaler circuits for low power consumption. The power consumption of the PLL chip is under 30mW. Fully differential LC VCO is used to provide high oscillation frequency. A new design of LC VCO using carbon nanotube (CNT) wire inductor has been proposed. The PLL design using CNT-LC VCO shows significant improvement in phase noise due to high-Q LC circuit

    On the Design of Real-Time Systems on Multi-Core Platforms under Uncertainty

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    Real-time systems are computing systems that demand the assurance of not only the logical correctness of computational results but also the timing of these results. To ensure timing constraints, traditional real-time system designs usually adopt a worst-case based deterministic approach. However, such an approach is becoming out of sync with the continuous evolution of IC technology and increased complexity of real-time applications. As IC technology continues to evolve into the deep sub-micron domain, process variation causes processor performance to vary from die to die, chip to chip, and even core to core. The extensive resource sharing on multi-core platforms also significantly increases the uncertainty when executing real-time tasks. The traditional approach can only lead to extremely pessimistic, and thus, unpractical design of real-time systems. Our research seeks to address the uncertainty problem when designing real-time systems on multi-core platforms. We first attacked the uncertainty problem caused by process variation. We proposed a virtualization framework and developed techniques to optimize the system\u27s performance under process variation. We further studied the problem on peak temperature minimization for real-time applications on multi-core platforms. Three heuristics were developed to reduce the peak temperature for real-time systems. Next, we sought to address the uncertainty problem in real-time task execution times by developing statistical real-time scheduling techniques. We studied the problem of fixed-priority real-time scheduling of implicit periodic tasks with probabilistic execution times on multi-core platforms. We further extended our research for tasks with explicit deadlines. We introduced the concept of harmonic to a more general task set, i.e. tasks with explicit deadlines, and developed new task partitioning techniques. Throughout our research, we have conducted extensive simulations to study the effectiveness and efficiency of our developed techniques. The increasing process variation and the ever-increasing scale and complexity of real-time systems both demand a paradigm shift in the design of real-time applications. Effectively dealing with the uncertainty in design of real-time applications is a challenging but also critical problem. Our research is such an effort in this endeavor, and we conclude this dissertation with discussions of potential future work

    An IoT Endpoint System-on-Chip for Secure and Energy-Efficient Near-Sensor Analytics

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    Near-sensor data analytics is a promising direction for IoT endpoints, as it minimizes energy spent on communication and reduces network load - but it also poses security concerns, as valuable data is stored or sent over the network at various stages of the analytics pipeline. Using encryption to protect sensitive data at the boundary of the on-chip analytics engine is a way to address data security issues. To cope with the combined workload of analytics and encryption in a tight power envelope, we propose Fulmine, a System-on-Chip based on a tightly-coupled multi-core cluster augmented with specialized blocks for compute-intensive data processing and encryption functions, supporting software programmability for regular computing tasks. The Fulmine SoC, fabricated in 65nm technology, consumes less than 20mW on average at 0.8V achieving an efficiency of up to 70pJ/B in encryption, 50pJ/px in convolution, or up to 25MIPS/mW in software. As a strong argument for real-life flexible application of our platform, we show experimental results for three secure analytics use cases: secure autonomous aerial surveillance with a state-of-the-art deep CNN consuming 3.16pJ per equivalent RISC op; local CNN-based face detection with secured remote recognition in 5.74pJ/op; and seizure detection with encrypted data collection from EEG within 12.7pJ/op.Comment: 15 pages, 12 figures, accepted for publication to the IEEE Transactions on Circuits and Systems - I: Regular Paper

    Modeling, design, and characterization of through vias in silicon and glass interposers

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    Advancements in very large scale integration (VLSI) technology have led to unprecedented transistor and interconnect scaling. Further miniaturization by traditional IC scaling in future planar CMOS technology faces significant challenges. Stacking of ICs (3D IC) using three dimensional (3D) integration technology helps in significantly reducing wiring lengths, interconnect latency and power dissipation while reducing the size of the chip and enhancing performance. Interposer technology with ultra-fine pitch interconnections needs to be developed to support the huge I/O connection requirement for packaging 3D ICs. Through vias in stacked silicon ICs and interposers are the key components of a 3D system. The objective of this dissertation is to model through vias in 3D silicon and glass interposers and, to address power and high-speed signal integrity issues in 3D interposers considering silicon biasing effects. An equivalent circuit model of the through via in silicon interposer (Si TPV) has been proposed considering the bias voltage dependent Metal-Oxide-Semiconductor (MOS) capacitance effect. Important design guidelines and optimizations are proposed for Si TPVs used in the signal delivery network, power delivery network (PDN), and as variable capacitors. Through vias in glass interposers (Glass TPVs) are modeled, designed and simulated by using electromagnetic field solvers. Signal and power integrity analyses are performed for silicon and glass interposers. PDN design is proposed by utilizing the MOS capacitance of the Si TPVs for decoupling.PhDCommittee Chair: Tummala, Rao; Committee Co-Chair: Swaminathan, Madhavan; Committee Member: Lim, Sung Kyu; Committee Member: Mukhopadhyay, Saibal; Committee Member: Sitaraman, Suresh; Committee Member: Sundaram, Venk

    Modeling the Interdependences between Voltage Fluctuation and BTI Aging

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    With technology scaling, the susceptibility of circuits to different reliability degradations is steadily increasing. Aging in transistors due to bias temperature instability (BTI) and voltage fluctuation in the power delivery network of circuits due to IR-drops are the most prominent. In this paper, we are reporting for the first time that there are interdependences between voltage fluctuation and BTI aging that are nonnegligible. Modeling and investigating the joint impact of voltage fluctuation and BTI aging on the delay of circuits, while remaining compatible with the existing standard design flow, is indispensable in order to answer the vital question, “what is an efficient (i.e., small, yet sufficient) timing guardband to sustain the reliability of circuit for the projected lifetime?” This is, concisely, the key goal of this paper. Achieving that would not be possible without employing a physics-based BTI model that precisely describes the underlying generation and recovery mechanisms of defects under arbitrary stress waveforms. For this purpose, our model is validated against varied semiconductor measurements covering a wide range of voltage, temperature, frequency, and duty cycle conditions. To bring reliability awareness to existing EDA tool flows, we create standard cell libraries that contain the delay information of cells under the joint impact of aging and IR-drop. Our libraries can be directly deployed within the standard design flow because they are compatible with existing commercial tools (e.g., Synopsys and Cadence). Hence, designers can leverage the mature algorithms of these tools to accurately estimate the required timing guardbands for any circuit despite its complexity. Our investigation demonstrates that considering aging and IR-drop effects independently, as done in the state of the art, leads to employing insufficient and thus unreliable guardbands because of the nonnegligible (on average 15% and up to 25%) underestimations. Importantly, considering interdependences between aging and IR-drop does not only allow correct guardband estimations, but it also results in employing more efficient guardbands

    Configurable pseudo noise radar imaging system enabling synchronous MIMO channel extension

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    In this article, we propose an evolved system design approach to ultra-wideband (UWB) radar based on pseudo-random noise (PRN) sequences, the key features of which are its user-adaptability to meet the demands provided by desired microwave imaging applications and its multichannel scalability. In light of providing a fully synchronized multichannel radar imaging system for short-range imaging as mine detection, non-destructive testing (NDT) or medical imaging, the advanced system architecture is presented with a special focus put on the implemented synchronization mechanism and clocking scheme. The core of the targeted adaptivity is provided by means of hardware, such as variable clock generators and dividers as well as programmable PRN generators. In addition to adaptive hardware, the customization of signal processing is feasible within an extensive open-source framework using the Red Pitaya ® data acquisition platform. A system benchmark in terms of signal-to-noise ratio (SNR), jitter, and synchronization stability is conducted to determine the achievable performance of the prototype system put into practice. Furthermore, an outlook on the planned future development and performance improvement is provided
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