91 research outputs found

    The question of intrinsic origin of the metal-insulator transition in i-AlPdRe quasicrystal

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    The icosahedral (i-) AlPdRe is the most resistive quasicrystalline alloy discovered so far. Resistivities (ρ\rho) of 1Ωcm1\Omega cm at 4K and correlated resistance ratios (RRR=ρ4K/ρ300KRRR = \rho_{4K}/\rho_{300K}) of more than 200 are observed in polycrystalline samples. These values are two orders of magnitude larger than for the isomorphous i-AlPdMn phase. We discuss here the controversial microscopic origin of the i-AlPdRe alloy electrical specificity. It has been proposed that the high resistivity values are due to extrinsic parameters, such as secondary phases or oxygen contamination. From comprehensive measurements and data from the literature including electronic transport correlated with micro structural and micro chemical analysis, we show that on the contrary there is mounting evidence in support of an origin intrinsic to the i-phase. Similarly to the other quasicrystalline alloys, the electrical resistivity of the i-AlPdRe samples depends critically on minute changes in the structural quality and chemical composition. The low resistivity in i-AlPdRe single-grains compared to polycrystaline samples can be explained by difference in chemical composition, heterogeneity and thermal treatment.Comment: 19 pages, 17 figure

    Electrical glassy behavior in granular aluminium thin films

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    We present new results obtained by field effect measurements on insulating granular Al thin films. First, reproducible and stable conductance fluctuations are seen in micron size samples as a function of gate voltage. The anomalous field effect and its slow relaxation already known to exist in macroscopic samples are shown to still exist in small samples and to have no influence on the fluctuations pattern. Secondly, "true" aging is demonstrated, i.e. the anomalous field effect relaxation depends on the time elapsed since the cooling, the longer this time the longer it takes for the system to react to a gate voltage change. Interpretations and implications of these findings are discussed.Comment: 5th International Conference on Electronic Crystals (ECRYS), Carg\`ese : France (2008

    Screening and conductance relaxations in insulating granular aluminium thin films

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    We have recently found in insulating granular Al thin film a new experimental feature (Delahaye et al., Phys. Rev. Lett. 106, 186602, 2011), namely the existence of a conductance relaxation that is not sensitive to gate voltage changes. This conductance relaxation is related to the existence of a metallic-like screening in the film and can be used to estimate its characteristic length scale. In the present paper, we give some experimental details on how this feature was measured and present our first results on the screening length temperature dependence.Comment: 14th Transport in interacting disordered systems (TIDS14) conference, September 5-8 2011, Acre (Israel

    Observation of thermally activated glassiness and memory dip in a-NbSi insulating thin films

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    We present electrical conductance measurements on amorphous NbSi insulating thin films. These films display out-of equilibrium electronic features that are markedly different from what has been reported so far in disordered insulators. Like in the most studied systems (indium oxide and granular Al films), a slow relaxation of the conductance is observed after a quench to liquid helium temperature which gives rise to the growth of a memory dip in MOSFET devices. But unlike in these systems, this memory dip and the related conductance relaxations are still visible up to room temperature, with clear signatures of a temperature dependent dynamics

    Mesoscopic Josephson junction as a noise detector

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    Small Josephson junctions are known to be very susceptible to noise. We have utilized this property in developing methods to measure noise as well as environmental resonance modes in mesoscopic systems. We review recent results on tunnel junction systems and show also that higher order moments of shot noise can be addressed with the present method based on the noise-induced modification of incoherent tunneling of Cooper pairs.Peer reviewe

    Low Noise Current Amplifier Based on Mesoscopic Josephson Junction

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    We utilize the band structure of a mesoscopic Josephson junction to construct low noise amplifiers. By taking advantage of the quantum dynamics of a Josephson junction, i.e. the interplay of interlevel transitions and the Coulomb blockade of Cooper pairs, we create transistor-like devices, Bloch oscillating transistors, with considerable current gain and high input impedance. In these transistors, correlated supercurrent of Cooper pairs is controlled by a small base current made of single electrons. Our devices reach current and power gains on the order of 30 and 5, respectively. The noise temperature is estimated to be around 1 Kelvin, but it is realistic to achieve TN < 0.1 Kelvin. These devices provide quantum-electronic building blocks that will be useful in low-noise, intermediate-impedance-level circuit applications at low temperatures.Non Peer reviewe

    Anti-Matter in Cosmic Rays : Backgrounds and Signals

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    Recent PAMELA and ATIC data seem to indicate an excess in positron cosmic rays above approximately 10 GeV which might be due to galactic Dark Matter particle annihilation. However the background of this signal suffers many uncertainties that make our task difficult in constraining Dark Matter or any other astrophysical explanation for these recent surprising data.Comment: Proceedings for XLIVemes rencontres de Moriond, Electroweak Interactions And Unified Theories sessio

    Electronic and physico-chemical properties of nanmetric boron delta-doped diamond structures

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    Heavily boron doped diamond epilayers with thicknesses ranging from 40 to less than 2 nm and buried between nominally undoped thicker layers have been grown in two different reactors. Two types of [100]-oriented single crystal diamond substrates were used after being characterized by X-ray white beam topography. The chemical composition and thickness of these so-called deltadoped structures have been studied by secondary ion mass spectrometry, transmission electron microscopy, and spectroscopic ellipsometry. Temperature-dependent Hall effect and four probe resistivity measurements have been performed on mesa-patterned Hall bars. The temperature dependence of the hole sheet carrier density and mobility has been investigated over a broad temperature range (6K<T<450 K). Depending on the sample, metallic or non-metallic behavior was observed. A hopping conduction mechanism with an anomalous hopping exponent was detected in the non-metallic samples. All metallic delta-doped layers exhibited the same mobility value, around 3.660.8 cm2/Vs, independently of the layer thickness and the substrate type. Comparison with previously published data and theoretical calculations showed that scattering by ionized impurities explained only partially this low common value. None of the delta-layers showed any sign of confinement-induced mobility enhancement, even for thicknesses lower than 2 nm.14 page

    High-resolution laser system for the S3-Low Energy Branch

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    In this paper we present the first high-resolution laser spectroscopy results obtained at the GISELE laser laboratory of the GANIL-SPIRAL2 facility, in preparation for the first experiments with the S3^3-Low Energy Branch. Studies of neutron-deficient radioactive isotopes of erbium and tin represent the first physics cases to be studied at S3^3. The measured isotope-shift and hyperfine structure data are presented for stable isotopes of these elements. The erbium isotopes were studied using the 4f126s24f^{12}6s^2 3H64f12(3H)6s6p^3H_6 \rightarrow 4f^{12}(^3 H)6s6p J=5J = 5 atomic transition (415 nm) and the tin isotopes were studied by the 5s25p2(3P0)5s25p6s(3P1)5s^25p^2 (^3P_0) \rightarrow 5s^25p6s (^3P_1) atomic transition (286.4 nm), and are used as a benchmark of the laser setup. Additionally, the tin isotopes were studied by the 5s25p6s(3P1)5s25p6p(3P2)5s^25p6s (^3P_1) \rightarrow 5s^25p6p (^3P_2) atomic transition (811.6 nm), for which new isotope-shift data was obtained and the corresponding field-shift F812F_{812} and mass-shift M812M_{812} factors are presented
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