Lightweight Architectures for Reliable and Fault Detection Simon and Speck Cryptographic Algorithms on FPGA

The widespread use of sensitive and constrained applications necessitates lightweight (lowpower and low-area) algorithms developed for constrained nano-devices. However, nearly all of such algorithms are optimized for platform-based performance and may not be useful for diverse and flexible applications. The National Security Agency (NSA) has proposed two relatively-recent families of lightweight ciphers, i.e., Simon and Speck, designed as efficient ciphers on both hardware and software platforms. This paper proposes concurrent error detection schemes to provide reliable architectures for these two families of lightweight block ciphers. The research work on analyzing the reliability of these algorithms and providing fault diagnosis approaches has not been undertaken to date to the best of our knowledge. The main aim of the proposed reliable architectures is to provide high error coverage while maintaining acceptable area and power consumption overheads. To achieve this, we propose a variant of recomputing with encoded operands. These low-complexity schemes are suited for lowresource applications such as sensitive, constrained implantable and wearable medical devices. We perform fault simulations for the proposed architectures by developing a fault model framework. The architectures are simulated and analyzed on recent field-programmable grate array (FPGA) platforms, and it is shown that the proposed schemes provide high error coverage. The proposed low-complexity concurrent error detection schemes are a step forward towards more reliable architectures for Simon and Speck algorithms in lightweight, secure applications

Efficient Error detection Architectures for Low-Energy Block Ciphers with the Case Study of Midori Benchmarked on FPGA

Achieving secure, high performance implementations for constrained applications such as implantable and wearable medical devices is a priority in efficient block ciphers. However, security of these algorithms is not guaranteed in presence of malicious and natural faults. Recently, a new lightweight block cipher, Midori, has been proposed which optimizes the energy consumption besides having low latency and hardware complexity. This algorithm is proposed in two energy-efficient varients, i.e., Midori64 and Midori128, with block sizes equal to 64 and 128 bits. In this thesis, fault diagnosis schemes for variants of Midori are proposed. To the best of the our knowledge, there has been no fault diagnosis scheme presented in the literature for Midori to date. The fault diagnosis schemes are provided for the nonlinear S-box layer and for the round structures with both 64-bit and 128-bit Midori symmetric key ciphers. The proposed schemes are benchmarked on field-programmable gate array (FPGA) and their error coverage is assessed with fault-injection simulations. These proposed error detection architectures make the implementations of this new low-energy lightweight block cipher more reliable

HARDWARE ATTACK DETECTION AND PREVENTION FOR CHIP SECURITY

Hardware security is a serious emerging concern in chip designs and applications. Due to the globalization of the semiconductor design and fabrication process, integrated circuits (ICs, a.k.a. chips) are becoming increasingly vulnerable to passive and active hardware attacks. Passive attacks on chips result in secret information leaking while active attacks cause IC malfunction and catastrophic system failures. This thesis focuses on detection and prevention methods against active attacks, in particular, hardware Trojan (HT). Existing HT detection methods have limited capability to detect small-scale HTs and are further challenged by the increased process variation. We propose to use differential Cascade Voltage Switch Logic (DCVSL) method to detect small HTs and achieve a success rate of 66% to 98%. This work also presents different fault tolerant methods to handle the active attacks on symmetric-key cipher SIMON, which is a recent lightweight cipher. Simulation results show that our Even Parity Code SIMON consumes less area and power than double modular redundancy SIMON and Reversed-SIMON, but yields a higher fault -detection-failure rate as the number of concurrent faults increases. In addition, the emerging technology, memristor, is explored to protect SIMON from passive attacks. Simulation results indicate that the memristor-based SIMON has a unique power characteristic that adds new challenges on secrete key extraction

ASSESSING AND IMPROVING THE RELIABILITY AND SECURITY OF CIRCUITS AFFECTED BY NATURAL AND INTENTIONAL FAULTS

The reliability and security vulnerability of modern electronic systems have emerged as concerns due to the increasing natural and intentional interferences. Radiation of high-energy charged particles generated from space environment or packaging materials on the substrate of integrated circuits results in natural faults. As the technology scales down, factors such as critical charge, voltage supply, and frequency change tremendously that increase the sensitivity of integrated circuits to natural faults even for systems operating at sea level. An attacker is able to simulate the impact of natural faults and compromise the circuit or cause denial of service. Therefore, instead of utilizing different approaches to counteract the effect of natural and intentional faults, a unified countermeasure is introduced. The unified countermeasure thwarts the impact of both reliability and security threats without paying the price of more area overhead, power consumption, and required time. This thesis first proposes a systematic analysis method to assess the probability of natural faults propagating the circuit and eventually being latched. The second part of this work focuses on the methods to thwart the impact of intentional faults in cryptosystems. We exploit a power-based side-channel analysis method to analyze the effect of the existing fault detection methods for natural faults on fault attack. Countermeasures for different security threats on cryptosystems are investigated separately. Furthermore, a new micro-architecture is proposed to thwart the combination of fault attacks and side-channel attacks, reducing the fault bypass rate and slowing down the key retrieval speed. The third contribution of this thesis is a unified countermeasure to thwart the impact of both natural faults and attacks. The unified countermeasure utilizes dynamically alternated multiple generator polynomials for the cyclic redundancy check (CRC) codec to resist the reverse engineering attack

Conception et test des circuits et systèmes numériques à haute fiabilité et sécurité

Research activities I carried on after my nomination as Chargé de Recherche deal with the definition of methodologies and tools for the design, the test and the reliability of secure digital circuits and trustworthy manufacturing. More recently, we have started a new research activity on the test of 3D stacked Integrated CIrcuits, based on the use of Through Silicon Vias. Moreover, thanks to the relationships I have maintained after my post-doc in Italy, I have kept on cooperating with Politecnico di Torino on the topics related to test and reliability of memories and microprocessors.Secure and Trusted DevicesSecurity is a critical part of information and communication technologies and it is the necessary basis for obtaining confidentiality, authentication, and integrity of data. The importance of security is confirmed by the extremely high growth of the smart-card market in the last 20 years. It is reported in "Le monde Informatique" in the article "Computer Crime and Security Survey" in 2007 that financial losses due to attacks on "secure objects" in the digital world are greater than $11 Billions. Since the race among developers of these secure devices and attackers accelerates, also due to the heterogeneity of new systems and their number, the improvement of the resistance of such components becomes today’s major challenge.Concerning all the possible security threats, the vulnerability of electronic devices that implement cryptography functions (including smart cards, electronic passports) has become the Achille’s heel in the last decade. Indeed, even though recent crypto-algorithms have been proven resistant to cryptanalysis, certain fraudulent manipulations on the hardware implementing such algorithms can allow extracting confidential information. So-called Side-Channel Attacks have been the first type of attacks that target the physical device. They are based on information gathered from the physical implementation of a cryptosystem. For instance, by correlating the power consumed and the data manipulated by the device, it is possible to discover the secret encryption key. Nevertheless, this point is widely addressed and integrated circuit (IC) manufacturers have already developed different kinds of countermeasures.More recently, new threats have menaced secure devices and the security of the manufacturing process. A first issue is the trustworthiness of the manufacturing process. From one side, secure devices must assure a very high production quality in order not to leak confidential information due to a malfunctioning of the device. Therefore, possible defects due to manufacturing imperfections must be detected. This requires high-quality test procedures that rely on the use of test features that increases the controllability and the observability of inner points of the circuit. Unfortunately, this is harmful from a security point of view, and therefore the access to these test features must be protected from unauthorized users. Another harm is related to the possibility for an untrusted manufacturer to do malicious alterations to the design (for instance to bypass or to disable the security fence of the system). Nowadays, many steps of the production cycle of a circuit are outsourced. For economic reasons, the manufacturing process is often carried out by foundries located in foreign countries. The threat brought by so-called Hardware Trojan Horses, which was long considered theoretical, begins to materialize.A second issue is the hazard of faults that can appear during the circuit’s lifetime and that may affect the circuit behavior by way of soft errors or deliberate manipulations, called Fault Attacks. They can be based on the intentional modification of the circuit’s environment (e.g., applying extreme temperature, exposing the IC to radiation, X-rays, ultra-violet or visible light, or tampering with clock frequency) in such a way that the function implemented by the device generates an erroneous result. The attacker can discover secret information by comparing the erroneous result with the correct one. In-the-field detection of any failing behavior is therefore of prime interest for taking further action, such as discontinuing operation or triggering an alarm. In addition, today’s smart cards use 90nm technology and according to the various suppliers of chip, 65nm technology will be effective on the horizon 2013-2014. Since the energy required to force a transistor to switch is reduced for these new technologies, next-generation secure systems will become even more sensitive to various classes of fault attacks.Based on these considerations, within the group I work with, we have proposed new methods, architectures and tools to solve the following problems:• Test of secure devices: unfortunately, classical techniques for digital circuit testing cannot be easily used in this context. Indeed, classical testing solutions are based on the use of Design-For-Testability techniques that add hardware components to the circuit, aiming to provide full controllability and observability of internal states. Because crypto‐ processors and others cores in a secure system must pass through high‐quality test procedures to ensure that data are correctly processed, testing of crypto chips faces a dilemma. In fact design‐for‐testability schemes want to provide high controllability and observability of the device while security wants minimal controllability and observability in order to hide the secret. We have therefore proposed, form one side, the use of enhanced scan-based test techniques that exploit compaction schemes to reduce the observability of internal information while preserving the high level of testability. From the other side, we have proposed the use of Built-In Self-Test for such devices in order to avoid scan chain based test.• Reliability of secure devices: we proposed an on-line self-test architecture for hardware implementation of the Advanced Encryption Standard (AES). The solution exploits the inherent spatial replications of a parallel architecture for implementing functional redundancy at low cost.• Fault Attacks: one of the most powerful types of attack for secure devices is based on the intentional injection of faults (for instance by using a laser beam) into the system while an encryption occurs. By comparing the outputs of the circuits with and without the injection of the fault, it is possible to identify the secret key. To face this problem we have analyzed how to use error detection and correction codes as counter measure against this type of attack, and we have proposed a new code-based architecture. Moreover, we have proposed a bulk built-in current-sensor that allows detecting the presence of undesired current in the substrate of the CMOS device.• Fault simulation: to evaluate the effectiveness of countermeasures against fault attacks, we developed an open source fault simulator able to perform fault simulation for the most classical fault models as well as user-defined electrical level fault models, to accurately model the effect of laser injections on CMOS circuits.• Side-Channel attacks: they exploit physical data-related information leaking from the device (e.g. current consumption or electro-magnetic emission). One of the most intensively studied attacks is the Differential Power Analysis (DPA) that relies on the observation of the chip power fluctuations during data processing. I studied this type of attack in order to evaluate the influence of the countermeasures against fault attack on the power consumption of the device. Indeed, the introduction of countermeasures for one type of attack could lead to the insertion of some circuitry whose power consumption is related to the secret key, thus allowing another type of attack more easily. We have developed a flexible integrated simulation-based environment that allows validating a digital circuit when the device is attacked by means of this attack. All architectures we designed have been validated through this tool. Moreover, we developed a methodology that allows to drastically reduce the time required to validate countermeasures against this type of attack.TSV- based 3D Stacked Integrated Circuits TestThe stacking process of integrated circuits using TSVs (Through Silicon Via) is a promising technology that keeps the development of the integration more than Moore’s law, where TSVs enable to tightly integrate various dies in a 3D fashion. Nevertheless, 3D integrated circuits present many test challenges including the test at different levels of the 3D fabrication process: pre-, mid-, and post- bond tests. Pre-bond test targets the individual dies at wafer level, by testing not only classical logic (digital logic, IOs, RAM, etc) but also unbounded TSVs. Mid-bond test targets the test of partially assembled 3D stacks, whereas finally post-bond test targets the final circuit.The activities carried out within this topic cover 2 main issues:• Pre-bond test of TSVs: the electrical model of a TSV buried within the substrate of a CMOS circuit is a capacitance connected to ground (when the substrate is connected to ground). The main assumption is that a defect may affect the value of that capacitance. By measuring the variation of the capacitance’s value it is possible to check whether the TSV is correctly fabricated or not. We have proposed a method to measure the value of the capacitance based on the charge/ discharge delay of the RC network containing the TSV.• Test infrastructures for 3D stacked Integrated Circuits: testing a die before stacking to another die introduces the problem of a dynamic test infrastructure, where test data must be routed to a specific die based on the reached fabrication step. New solutions are proposed in literature that allow reconfiguring the test paths within the circuit, based on on-the-fly requirements. We have started working on an extension of the IEEE P1687 test standard that makes use of an automatic die-detection based on pull-up resistors.Memory and Microprocessor Test and ReliabilityThanks to device shrinking and miniaturization of fabrication technology, performances of microprocessors and of memories have grown of more than 5 magnitude order in the last 30 years. With this technology trend, it is necessary to face new problems and challenges, such as reliability, transient errors, variability and aging.In the last five years I’ve worked in cooperation with the Testgroup of Politecnico di Torino (Italy) to propose a new method to on-line validate the correctness of the program execution of a microprocessor. The main idea is to monitor a small set of control signals of the processors in order to identify incorrect activation sequences. This approach can detect both permanent and transient errors of the internal logic of the processor.Concerning the test of memories, we have proposed a new approach to automatically generate test programs starting from a functional description of the possible faults in the memory.Moreover, we proposed a new methodology, based on microprocessor error probability profiling, that aims at estimating fault injection results without the need of a typical fault injection setup. The proposed methodology is based on two main ideas: a one-time fault-injection analysis of the microprocessor architecture to characterize the probability of successful execution of each of its instructions in presence of a soft-error, and a static and very fast analysis of the control and data flow of the target software application to compute its probability of success

Soft Error Resistant Design of the AES Cipher Using SRAM-based FPGA

This thesis presents a new architecture for the reliable implementation of the symmetric-key algorithm Advanced Encryption Standard (AES) in Field Programmable Gate Arrays (FPGAs). Since FPGAs are prone to soft errors caused by radiation, and AES is highly sensitive to errors, reliable architectures are of significant concern. Energetic particles hitting a device can flip bits in FPGA SRAM cells controlling all aspects of the implementation. Unlike previous research, heterogeneous error detection techniques based on properties of the circuit and functionality are used to provide adequate reliability at the lowest possible cost. The use of dual ported block memory for SubBytes, duplication for the control circuitry, and a new enhanced parity technique for MixColumns is proposed. Previous parity techniques cover single errors in datapath registers, however, soft errors can occur in the control circuitry as well as in SRAM cells forming the combinational logic and routing. In this research, propagation of single errors is investigated in the routed netlist. Weaknesses of the previous parity techniques are identified. Architectural redesign at the register-transfer level is introduced to resolve undetected single errors in both the routing and the combinational logic. Reliability of the AES implementation is not only a critical issue in large scale FPGA-based systems but also at both higher altitudes and in space applications where there are a larger number of energetic particles. Thus, this research is important for providing efficient soft error resistant design in many current and future secure applications

Sequential Circuit Design for Embedded Cryptographic Applications Resilient to Adversarial Faults

In the relatively young field of fault-tolerant cryptography, the main research effort has focused exclusively on the protection of the data path of cryptographic circuits. To date, however, we have not found any work that aims at protecting the control logic of these circuits against fault attacks, which thus remains the proverbial Achilles’ heel. Motivated by a hypothetical yet realistic fault analysis attack that, in principle, could be mounted against any modular exponentiation engine, even one with appropriate data path protection, we set out to close this remaining gap. In this paper, we present guidelines for the design of multifault-resilient sequential control logic based on standard Error-Detecting Codes (EDCs) with large minimum distance. We introduce a metric that measures the effectiveness of the error detection technique in terms of the effort the attacker has to make in relation to the area overhead spent in implementing the EDC. Our comparison shows that the proposed EDC-based technique provides superior performance when compared against regular N-modular redundancy techniques. Furthermore, our technique scales well and does not affect the critical path delay

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Tamper-Resistant Arithmetic for Public-Key Cryptography

Cryptographic hardware has found many uses in many ubiquitous and pervasive security devices with a small form factor, e.g. SIM cards, smart cards, electronic security tokens, and soon even RFIDs. With applications in banking, telecommunication, healthcare, e-commerce and entertainment, these devices use cryptography to provide security services like authentication, identification and confidentiality to the user. However, the widespread adoption of these devices into the mass market, and the lack of a physical security perimeter have increased the risk of theft, reverse engineering, and cloning. Despite the use of strong cryptographic algorithms, these devices often succumb to powerful side-channel attacks. These attacks provide a motivated third party with access to the inner workings of the device and therefore the opportunity to circumvent the protection of the cryptographic envelope. Apart from passive side-channel analysis, which has been the subject of intense research for over a decade, active tampering attacks like fault analysis have recently gained increased attention from the academic and industrial research community. In this dissertation we address the question of how to protect cryptographic devices against this kind of attacks. More specifically, we focus our attention on public key algorithms like elliptic curve cryptography and their underlying arithmetic structure. In our research we address challenges such as the cost of implementation, the level of protection, and the error model in an adversarial situation. The approaches that we investigated all apply concepts from coding theory, in particular the theory of cyclic codes. This seems intuitive, since both public key cryptography and cyclic codes share finite field arithmetic as a common foundation. The major contributions of our research are (a) a generalization of cyclic codes that allow embedding of finite fields into redundant rings under a ring homomorphism, (b) a new family of non-linear arithmetic residue codes with very high error detection probability, (c) a set of new low-cost arithmetic primitives for optimal extension field arithmetic based on robust codes, and (d) design techniques for tamper resilient finite state machines

A Network-based Asynchronous Architecture for Cryptographic Devices

Institute for Computing Systems ArchitectureThe traditional model of cryptography examines the security of the cipher as a mathematical function. However, ciphers that are secure when specified as mathematical functions are not necessarily secure in real-world implementations. The physical implementations of ciphers can be extremely difficult to control and often leak socalled side-channel information. Side-channel cryptanalysis attacks have shown to be especially effective as a practical means for attacking implementations of cryptographic algorithms on simple hardware platforms, such as smart-cards. Adversaries can obtain sensitive information from side-channels, such as the timing of operations, power consumption and electromagnetic emissions. Some of the attack techniques require surprisingly little side-channel information to break some of the best known ciphers. In constrained devices, such as smart-cards, straightforward implementations of cryptographic algorithms can be broken with minimal work. Preventing these attacks has become an active and a challenging area of research. Power analysis is a successful cryptanalytic technique that extracts secret information from cryptographic devices by analysing the power consumed during their operation. A particularly dangerous class of power analysis, differential power analysis (DPA), relies on the correlation of power consumption measurements. It has been proposed that adding non-determinism to the execution of the cryptographic device would reduce the danger of these attacks. It has also been demonstrated that asynchronous logic has advantages for security-sensitive applications. This thesis investigates the security and performance advantages of using a network-based asynchronous architecture, in which the functional units of the datapath form a network. Non-deterministic execution is achieved by exploiting concurrent execution of instructions both with and without data-dependencies; and by forwarding register values between instructions with data-dependencies using randomised routing over the network. The executions of cryptographic algorithms on different architectural configurations are simulated, and the obtained power traces are subjected to DPA attacks. The results show that the proposed architecture introduces a level of non-determinism in the execution that significantly raises the threshold for DPA attacks to succeed. In addition, the performance analysis shows that the improved security does not degrade performance