230 research outputs found

    Self-testing and repairing computer Patent

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    Self testing and repairing computer comprising control and diagnostic unit and rollback points for error correctio

    A Survey on the Best Choice for Modulus of Residue Code

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    Nowadays, the development of technology and the growing need for dense and complex chips have led chip industries to increase their attention on the circuit testability. Also, using the electronic chips in certain industries, such as the space industry, makes the design of fault tolerant circuits a challenging issue. Coding is one of the most suitable methods for error detection and correction. The residue code, as one of the best choices for error detection aims, is wildly used in large arithmetic circuits such as multiplier and also finds a wide range of applications in processors and digital filters. The modulus value in this technique directly effect on the area overhead parameter. A large area overhead is one of the most important disadvantages especially for testing the small circuits. The purpose of this paper is to study and investigate the best choice for residue code check base that is used for simple and small circuits such as a simple ripple carry adder. The performances are evaluated by applying stuck-at-faults and transition-faults by simulators. The efficiency is defined based on fault coverage and normalized area overhead. The results show that the modulus 3 with 95% efficiency provided the best result. Residue code with this modulus for checking a ripple carry adder, in comparison with duplex circuit, 30% improves the efficiency

    Efficient modular arithmetic units for low power cryptographic applications

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    The demand for high security in energy constrained devices such as mobiles and PDAs is growing rapidly. This leads to the need for efficient design of cryptographic algorithms which offer data integrity, authentication, non-repudiation and confidentiality of the encrypted data and communication channels. The public key cryptography is an ideal choice for data integrity, authentication and non-repudiation whereas the private key cryptography ensures the confidentiality of the data transmitted. The latter has an extremely high encryption speed but it has certain limitations which make it unsuitable for use in certain applications. Numerous public key cryptographic algorithms are available in the literature which comprise modular arithmetic modules such as modular addition, multiplication, inversion and exponentiation. Recently, numerous cryptographic algorithms have been proposed based on modular arithmetic which are scalable, do word based operations and efficient in various aspects. The modular arithmetic modules play a crucial role in the overall performance of the cryptographic processor. Hence, better results can be obtained by designing efficient arithmetic modules such as modular addition, multiplication, exponentiation and squaring. This thesis is organized into three papers, describes the efficient implementation of modular arithmetic units, application of these modules in International Data Encryption Algorithm (IDEA). Second paper describes the IDEA algorithm implementation using the existing techniques and using the proposed efficient modular units. The third paper describes the fault tolerant design of a modular unit which has online self-checking capability --Abstract, page iv

    Investigations into the feasibility of an on-line test methodology

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    This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

    Secure pseudo-random linear binary sequences generators based on arithmetic polynoms

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    We present a new approach to constructing of pseudo-random binary sequences (PRS) generators for the purpose of cryptographic data protection, secured from the perpetrator's attacks, caused by generation of masses of hardware errors and faults. The new method is based on use of linear polynomial arithmetic for the realization of systems of boolean characteristic functions of PRS' generators. "Arithmetizatio" of systems of logic formulas has allowed to apply mathematical apparatus of residue systems for multisequencing of the process of PRS generation and organizing control of computing errors, caused by hardware faults. This has guaranteed high security of PRS generator's functioning and, consequently, security of tools for cryptographic data protection based on those PRSs

    DFT and BIST of a multichip module for high-energy physics experiments

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    Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

    Design of fault-tolerant computers

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    Causes and symptoms of logic faults in digital systems. Reliable performance of hardware has been a require-ment for digital systems since the construction of the first digital computer. Improper functioning of the logic circuits in a digital system is manifested by logic faults, which are defined for this paper as "permanent or transient deviations of logic variables from the values specified in design." Permanent faults are caused by physical changes in the components of a logic circuit which permanently alter the logic function specified by the designer. The most common permanent faults are the determinate faults of "stuck on zero " and "stuck on one " types. Less frequent is the indeterminate or "stuck on X " fault
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