Design Space Re-Engineering for Power Minimization in Modern Embedded Systems

Power minimization is a critical challenge for modern embedded system design. Recently, due to the rapid increase of system's complexity and the power density, there is a growing need for power control techniques at various design levels. Meanwhile, due to technology scaling, leakage power has become a significant part of power dissipation in the CMOS circuits and new techniques are needed to reduce leakage power. As a result, many new power minimization techniques have been proposed such as voltage island, gate sizing, multiple supply and threshold voltage, power gating and input vector control, etc. These design options further enlarge the design space and make it prohibitively expensive to explore for the most energy efficient design solution. Consequently, heuristic algorithms and randomized algorithms are frequently used to explore the design space, seeking sub-optimal solutions to meet the time-to-market requirements. These algorithms are based on the idea of truncating the design space and restricting the search in a subset of the original design space. While this approach can effectively reduce the runtime of searching, it may also exclude high-quality design solutions and cause design quality degradation. When the solution to one problem is used as the base for another problem, such solution quality degradation will accumulate. In modern electronics system design, when several such algorithms are used in series to solve problems in different design levels, the final solution can be far off the optimal one. In my Ph.D. work, I develop a {\em re-engineering} methodology to facilitate exploring the design space of power efficient embedded systems design. The direct goal is to enhance the performance of existing low power techniques. The methodology is based on the idea that design quality can be improved via iterative ``re-shaping'' the design space based on the ``bad'' structure in the obtained design solutions; the searching run-time can be reduced by the guidance from previous exploration. This approach can be described in three phases: (1) apply the existing techniques to obtain a sub-optimal solution; (2) analyze the solution and expand the design space accordingly; and (3) re-apply the technique to re-explore the enlarged design space. We apply this methodology at different levels of embedded system design to minimize power: (i) switching power reduction in sequential logic synthesis; (ii) gate-level static leakage current reduction; (iii) dual threshold voltage CMOS circuits design; and (iv) system-level energy-efficient detection scheme for wireless sensor networks. An extensive amount of experiments have been conducted and the results have shown that this methodology can effectively enhance the power efficiency of the existing embedded system design flows with very little overhead

Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions

Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the design parameters. These variations and those in the operating environment of VLSI circuits result in unexpected changes in the timing, power, and reliability of the circuits. With scaling transistor dimensions, process and environmental variations become significantly important in the modern VLSI design. A smaller feature size means that the physical characteristics of a device are more prone to these unaccounted-for changes. To achieve a robust design, the random and systematic fluctuations in the manufacturing process and the variations in the environmental parameters should be analyzed and the impact on the parametric yield should be addressed. This thesis studies the challenges and comprises solutions for designing robust VLSI systems in the presence of variations. Initially, to get some insight into the system design under variability, the parametric yield is examined for a small circuit. Understanding the impact of variations on the yield at the circuit level is vital to accurately estimate and optimize the yield at the system granularity. Motivated by the observations and results, found at the circuit level, statistical analyses are performed, and solutions are proposed, at the system level of abstraction, to reduce the impact of the variations and increase the parametric yield. At the circuit level, the impact of the supply and threshold voltage variations on the parametric yield is discussed. Here, a design centering methodology is proposed to maximize the parametric yield and optimize the power-performance trade-off under variations. In addition, the scaling trend in the yield loss is studied. Also, some considerations for design centering in the current and future CMOS technologies are explored. The investigation, at the circuit level, suggests that the operating temperature significantly affects the parametric yield. In addition, the yield is very sensitive to the magnitude of the variations in supply and threshold voltage. Therefore, the spatial variations in process and environmental variations make it necessary to analyze the yield at a higher granularity. Here, temperature and voltage variations are mapped across the chip to accurately estimate the yield loss at the system level. At the system level, initially the impact of process-induced temperature variations on the power grid design is analyzed. Also, an efficient verification method is provided that ensures the robustness of the power grid in the presence of variations. Then, a statistical analysis of the timing yield is conducted, by taking into account both the process and environmental variations. By considering the statistical profile of the temperature and supply voltage, the process variations are mapped to the delay variations across a die. This ensures an accurate estimation of the timing yield. In addition, a method is proposed to accurately estimate the power yield considering process-induced temperature and supply voltage variations. This helps check the robustness of the circuits early in the design process. Lastly, design solutions are presented to reduce the power consumption and increase the timing yield under the variations. In the first solution, a guideline for floorplaning optimization in the presence of temperature variations is offered. Non-uniformity in the thermal profiles of integrated circuits is an issue that impacts the parametric yield and threatens chip reliability. Therefore, the correlation between the total power consumption and the temperature variations across a chip is examined. As a result, floorplanning guidelines are proposed that uses the correlation to efficiently optimize the chip's total power and takes into account the thermal uniformity. The second design solution provides an optimization methodology for assigning the power supply pads across the chip for maximizing the timing yield. A mixed-integer nonlinear programming (MINLP) optimization problem, subject to voltage drop and current constraint, is efficiently solved to find the optimum number and location of the pads

Variability-Aware VLSI Design Automation For Nanoscale Technologies

As technology scaling enters the nanometer regime, design of large scale ICs gets more challenging due to shrinking feature sizes and increasing design complexity. Aggressive scaling causes significant degradation in reliability, increased susceptibility to fabrication and environmental randomness and increased dynamic and leakage power dissipation. In this work, we investigate these scaling issues in large scale integrated systems. This dissertation proposes to develop variability-aware design methodologies by proposing design analysis, design-time optimization, post-silicon tunability and runtime-adaptivity based optimization techniques for handling variability. We discuss our research in the area of variability-aware analysis, specifically focusing on the problem of statistical timing analysis. The first technique presents the concept of error budgeting that achieves significant runtime speedups during statistical timing analysis. The second work presents a general framework for non-linear non-Gaussian statistical timing analysis considering correlations. Further, we present our work on design-time optimization schemes that are applicable during physical synthesis. Firstly, we present a buffer insertion technique that considers wire-length uncertainty and proposes algorithms to perform probabilistic buffer insertion. Secondly, we present a stochastic optimization framework based on Monte-Carlo technique considering fabrication variability. This optimization framework can be applied to problems that can be modeled as linear programs without without imposing any assumptions on the nature of the variability. Subsequently, we present our work on post-silicon tunability based design optimization. This work presents a design management framework that can be used to balance the effort spent on pre-silicon (through gate sizing) and post-silicon optimization (through tunable clock-tree buffers) while maximizing the yield gains. Lastly, we present our work on variability-aware runtime optimization techniques. We look at the problem of runtime supply voltage scaling for dynamic power optimization, and propose a framework to consider the impact of variability on the reliability of such designs. We propose a probabilistic design synthesis technique where reliability of the design is a primary optimization metric

Reliability in the face of variability in nanometer embedded memories

In this thesis, we have investigated the impact of parametric variations on the behaviour of one performance-critical processor structure - embedded memories. As variations manifest as a spread in power and performance, as a first step, we propose a novel modeling methodology that helps evaluate the impact of circuit-level optimizations on architecture-level design choices. Choices made at the design-stage ensure conflicting requirements from higher-levels are decoupled. We then complement such design-time optimizations with a runtime mechanism that takes advantage of adaptive body-biasing to lower power whilst improving performance in the presence of variability. Our proposal uses a novel fully-digital variation tracking hardware using embedded DRAM (eDRAM) cells to monitor run-time changes in cache latency and leakage. A special fine-grain body-bias generator uses the measurements to generate an optimal body-bias that is needed to meet the required yield targets. A novel variation-tolerant and soft-error hardened eDRAM cell is also proposed as an alternate candidate for replacing existing SRAM-based designs in latency critical memory structures. In the ultra low-power domain where reliable operation is limited by the minimum voltage of operation (Vddmin), we analyse the impact of failures on cache functional margin and functional yield. Towards this end, we have developed a fully automated tool (INFORMER) capable of estimating memory-wide metrics such as power, performance and yield accurately and rapidly. Using the developed tool, we then evaluate the #effectiveness of a new class of hybrid techniques in improving cache yield through failure prevention and correction. Having a holistic perspective of memory-wide metrics helps us arrive at design-choices optimized simultaneously for multiple metrics needed for maintaining lifetime requirements

Optimization Schemes for Variability-Driven VLSI Design Automation

Today's IC design is facing several challenges due to increasing circuit complexity and decreasing feature size, as it pushes to extend Moore's law into nano-scale dimensions. Apart from the challenges that arise directly as a result of feature scaling (e.g., increasing leakage power, reliability issues), imperfections in the manufacturing process have recently turned into a major design hurdle, due to the variations they cause in the device and interconnect parameters from their target values. From an IC design automation perspective, a shift in paradigm, from deterministic to probabilistic, is needed to handle the unpredictable nature of these fabrication variations. In such a probabilistic paradigm, the varying circuit parameters such as leakage power or delay should be accurately modeled, and their correlations due to common sources of variations or physical location on the chip should be well captured. Moreover, variability-driven (probabilistic) design automation needs to efficiently generate a high quality solution. A particular challenge in variability-driven design automation is to define optimality measures among candidate solutions, which allow for inferior solutions to be removed from the solution space thus reducing the run-time complexity. In this dissertation, the superiority probability is introduced as such an optimality measure, and two methods are proposed to compute this probability: an accurate Conditional Monte Carlo simulation method, and an efficient moment-matching approximation method. The effectiveness of using the superiority probability is shown in the context of two important design automation applications: 1) the buffer insertion problem, 2) the dual-Vth leakage optimization problem. Another important task in variability-driven design automation is to develop optimization techniques that can provably generate the optimal solution in an efficient way. In this dissertation, the application of the gate sizing problem is explored to optimally reduce the loss due to fabrication variations in the presence of a timing constraint. The presented formulation, in contrast with the existing variability-driven approaches which are all based on heuristics, is provably optimal. Moreover, unlike existing approaches, it is independent of any assumption on the source and nature of variations

Cross-Layer Approaches for an Aging-Aware Design of Nanoscale Microprocessors

Thanks to aggressive scaling of transistor dimensions, computers have revolutionized our life. However, the increasing unreliability of devices fabricated in nanoscale technologies emerged as a major threat for the future success of computers. In particular, accelerated transistor aging is of great importance, as it reduces the lifetime of digital systems. This thesis addresses this challenge by proposing new methods to model, analyze and mitigate aging at microarchitecture-level and above

Programmable stochastic processors

As traditional approaches for reducing power in microprocessors are being exhausted, extreme power challenges call for unconventional approaches to power reduction. Recent research has shown substantial promise for application-specific stochastic computing, i.e., computing that exploits application error tolerance to enable careful relaxation of correctness guarantees provided by hardware in order to reduce power. This dissertation explores the feasibility, challenges, and potential benefits of stochastic computing in the context of programmable general purpose processors. Specifically, the dissertation describes design-level techniques that minimize the power of a processor for a non-zero error rate or allow a processor to fail gracefully when operated over a range of non-zero error rates. It presents microarchitectural design principles that allow a processor to trade off reliability and energy more efficiently to minimize energy when exploiting error resilience. It demonstrates the benefit of using compiler optimizations that optimize a binary to enable more energy savings when operating at a non-zero error rate. It also demonstrates significant benefits for a programmable stochastic processor prototype that improves energy efficiency by carefully relaxing correctness and exposing errors in applications running on a commodity processor. This dissertation on programmable stochastic processors conclusively shows that the architecture and design of processors and applications should be approached differently in scenarios where errors are allowed to be exposed from the hardware to higher levels of the compute stack. Significant energy benefits are demonstrated for design-, architecture-, compiler-, and application-level optimizations for general purpose programmable stochastic processors

ULTRA ENERGY-EFFICIENT SUB-/NEAR-THRESHOLD COMPUTING: PLATFORM AND METHODOLOGY

Ph.DDOCTOR OF PHILOSOPH

Energy-aware synthesis for networks on chip architectures

The Network on Chip (NoC) paradigm was introduced as a scalable communication infrastructure for future System-on-Chip applications. Designing application specific customized communication architectures is critical for obtaining low power, high performance solutions. Two significant design automation problems are the creation of an optimized configuration, given application requirement the implementation of this on-chip network. Automating the design of on-chip networks requires models for estimating area and energy, algorithms to effectively explore the design space and network component libraries and tools to generate the hardware description. Chip architects are faced with managing a wide range of customization options for individual components, routers and topology. As energy is of paramount importance, the effectiveness of any custom NoC generation approach lies in the availability of good energy models to effectively explore the design space. This thesis describes a complete NoC synthesis flow, called NoCGEN, for creating energy-efficient custom NoC architectures. Three major automation problems are addressed: custom topology generation, energy modeling and generation. An iterative algorithm is proposed to generate application specific point-to-point and packet-switched networks. The algorithm explores the design space for efficient topologies using characterized models and a system-level floorplanner for evaluating placement and wire-energy. Prior to our contribution, building an energy model required careful analysis of transistor or gate implementations. To alleviate the burden, an automated linear regression-based methodology is proposed to rapidly extract energy models for many router designs. The resulting models are cycle accurate with low-complexity and found to be within 10% of gate-level energy simulations, and execute several orders of magnitude faster than gate-level simulations. A hardware description of the custom topology is generated using a parameterizable library and custom HDL generator. Fully reusable and scalable network components (switches, crossbars, arbiters, routing algorithms) are described using a template approach and are used to compose arbitrary topologies. A methodology for building and composing routers and topologies using a template engine is described. The entire flow is implemented as several demonstrable extensible tools with powerful visualization functionality. Several experiments are performed to demonstrate the design space exploration capabilities and compare it against a competing min-cut topology generation algorithm