On the descriptional complexity of iterative arrays

The descriptional complexity of iterative arrays (lAs) is studied. Iterative arrays are a parallel computational model with a sequential processing of the input. It is shown that lAs when compared to deterministic finite automata or pushdown automata may provide savings in size which are not bounded by any recursive function, so-called non-recursive trade-offs. Additional non-recursive trade-offs are proven to exist between lAs working in linear time and lAs working in real time. Furthermore, the descriptional complexity of lAs is compared with cellular automata (CAs) and non-recursive trade-offs are proven between two restricted classes. Finally, it is shown that many decidability questions for lAs are undecidable and not semidecidable

A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Silicon compilation

Silicon compilation is a term used for many different purposes. In this paper we define silicon compilation as a mapping from some higher level description into layout. We define the basic issues in structural and behavioral silicon compilation and some possible solutions to those issues. Finally, we define the concept of an intelligent silicon compiler in which the compiler evaluates the quality of the generated design and attempts to improve it if it is not satisfactory

LSI/VLSI design for testability analysis and general approach

The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented

Balance testing and balance-testable design of logic circuits

We propose a low-cost method for testing logic circuits, termed balance testing, which is particularly suited to built-in self testing. Conceptually related to ones counting and syndrome testing, it detects faults by checking the difference between the number of ones and the number of zeros in the test response sequence. A key advantage of balance testing is that the testability of various fault types can be easily analyzed. We present a novel analysis technique which leads to necessary and sufficient conditions for the balance testability of the standard single stuck-line (SSL) faults. This analysis can be easily extended to multiple stuck-line and bridging faults. Balance testing also forms the basis for design for balance testability (DFBT), a systematic DFT technique that achieves full coverage of SSL faults. It places the unit under test in a low-cost framework circuit that guarantees complete balance testability. Unlike most existing DFT techniques, DFBT requires only one additional control input and no redesign of the underlying circuit is necessary. We present experimental results on applying balance testing to the ISCAS 85 benchmark circuits, which show that very high fault coverage is obtained for large circuits even with reduced deterministic test sets. This coverage can always be made 100% either by adding tests or applying DFBT.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43016/1/10836_2004_Article_BF00136077.pd

Autonomous spacecraft maintenance study group

A plan to incorporate autonomous spacecraft maintenance (ASM) capabilities into Air Force spacecraft by 1989 is outlined. It includes the successful operation of the spacecraft without ground operator intervention for extended periods of time. Mechanisms, along with a fault tolerant data processing system (including a nonvolatile backup memory) and an autonomous navigation capability, are needed to replace the routine servicing that is presently performed by the ground system. The state of the art fault handling capabilities of various spacecraft and computers are described, and a set conceptual design requirements needed to achieve ASM is established. Implementations for near term technology development needed for an ASM proof of concept demonstration by 1985, and a research agenda addressing long range academic research for an advanced ASM system for 1990s are established

Efficient VLSI fault simulation

AbstractLet C be an acyclic Boolean circuit with n gates and ≤ n inputs. A circuit manufacture error may result in a “Stuck-at” (S-A) fault in a circuit identical to C except a gate v only outputs a fixed Boolean value. The S-A fault simulation problem for C is to determine all possible (S-A) faults which can be detected (i.e., faults circuit and C would give distinct outputs) by a given test pattern input.We consider the case where C is a tree (i.e., has fan-out 1.)We give a practical algorithm for fault simulation which simultaneously determines all detectable S-A faults for every gate in the circuit tree C. Our algorithm required only the evaluation of a circuit FS(C) which has ≤ 7n gates and has depth ≤ 3(d + 1), when d is the depth of C. Thus the sequential time of our algorithm is ≤ 7n, and the parallel time is ≤ 3(d + 1). Furthermore, FS(C) requires only a small constant factor more VLSI area than does the original circuit C.We also extend our results to get efficient methods for fault simulation of oblivious VLSI circuits with feedback lines

A study of arithmetic circuits and the effect of utilising Reed-Muller techniques

Reed-Muller algebraic techniques, as an alternative means in logic design, became more attractive recently, because of their compact representations of logic functions and yielding of easily testable circuits. It is claimed by some researchers that Reed-Muller algebraic techniques are particularly suitable for arithmetic circuits. In fact, no practical application in this field can be found in the open literature.This project investigates existing Reed-Muller algebraic techniques and explores their application in arithmetic circuits. The work described in this thesis is concerned with practical applications in arithmetic circuits, especially for minimizing logic circuits at the transistor level. These results are compared with those obtained using the conventional Boolean algebraic techniques. This work is also related to wider fields, from logic level design to layout level design in CMOS circuits, the current leading technology in VLSI. The emphasis is put on circuit level (transistor level) design. The results show that, although Boolean logic is believed to be a more general tool in logic design, it is not the best tool in all situations. Reed-Muller logic can generate good results which can't be easily obtained by using Boolean logic.F or testing purposes, a gate fault model is often used in the conventional implementation of Reed-Muller logic, which leads to Reed-Muller logic being restricted to using a small gate set. This usually leads to generating more complex circuits. When a cell fault model, which is more suitable for regular and iterative circuits, such as arithmetic circuits, is used instead of the gate fault model in Reed-Muller logic, a wider gate set can be employed to realize Reed-Muller functions. As a result, many circuits designed using Reed-Muller logic can be comparable to that designed using Boolean logic. This conclusion is demonstrated by testing many randomly generated functions.The main aim of this project is to develop arithmetic circuits for practical application. A number of practical arithmetic circuits are reported. The first one is a carry chain adder. Utilising the CMOS circuit characteristics, a simple and high speed carry chain is constructed to perform the carry operation. The proposed carry chain adder can be reconstructed to form a fast carry skip adder, and it is also found to be a good application for residue number adders. An algorithm for an on-line adder and its implementation are also developed. Another circuit is a parallel multiplier based on 5:3 counter. The simulations show that the proposed circuits are better than many previous designs, in terms of the number of transistors and speed. In addition, a 4:2 compressor for a carry free adder is investigated. It is shown that the two main schemes to construct the 4:2 compressor have a unified structure. A variant of the Baugh and Wooley algorithm is also studied and generalized in this work