OPTIMAL AREA AND PERFORMANCE MAPPING OF K-LUT BASED FPGAS

FPGA circuits are increasingly used in many fields: for rapid prototyping of new products (including fast ASIC implementation), for logic emulation, for producing a small number of a device, or if a device should be reconfigurable in use (reconfigurable computing). Determining if an arbitrary, given wide, function can be implemented by a programmable logic block, unfortunately, it is generally, a very difficult problem. This problem is called the Boolean matching problem. This paper introduces a new implemented algorithm able to map, both for area and performance, combinational networks using k-LUT based FPGAs.k-LUT based FPGAs, combinational circuits, performance-driven mapping.

Speeding-up model-based fault injection of deep-submicron CMOS fault models through dynamic and partially reconfigurable FPGAS

Actualmente, las tecnologías CMOS submicrónicas son básicas para el desarrollo de los modernos sistemas basados en computadores, cuyo uso simplifica enormemente nuestra vida diaria en una gran variedad de entornos, como el gobierno, comercio y banca electrónicos, y el transporte terrestre y aeroespacial. La continua reducción del tamaño de los transistores ha permitido reducir su consumo y aumentar su frecuencia de funcionamiento, obteniendo por ello un mayor rendimiento global. Sin embargo, estas mismas características que mejoran el rendimiento del sistema, afectan negativamente a su confiabilidad. El uso de transistores de tamaño reducido, bajo consumo y alta velocidad, está incrementando la diversidad de fallos que pueden afectar al sistema y su probabilidad de aparición. Por lo tanto, existe un gran interés en desarrollar nuevas y eficientes técnicas para evaluar la confiabilidad, en presencia de fallos, de sistemas fabricados mediante tecnologías submicrónicas. Este problema puede abordarse por medio de la introducción deliberada de fallos en el sistema, técnica conocida como inyección de fallos. En este contexto, la inyección basada en modelos resulta muy interesante, ya que permite evaluar la confiabilidad del sistema en las primeras etapas de su ciclo de desarrollo, reduciendo por tanto el coste asociado a la corrección de errores. Sin embargo, el tiempo de simulación de modelos grandes y complejos imposibilita su aplicación en un gran número de ocasiones. Esta tesis se centra en el uso de dispositivos lógicos programables de tipo FPGA (Field-Programmable Gate Arrays) para acelerar los experimentos de inyección de fallos basados en simulación por medio de su implementación en hardware reconfigurable. Para ello, se extiende la investigación existente en inyección de fallos basada en FPGA en dos direcciones distintas: i) se realiza un estudio de las tecnologías submicrónicas existentes para obtener un conjunto representativo de modelos de fallos transitoriosAndrés Martínez, DD. (2007). Speeding-up model-based fault injection of deep-submicron CMOS fault models through dynamic and partially reconfigurable FPGAS [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/1943Palanci

A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs

Radiation sources exist in different kinds of environments where electronic devices often operate. Correct device operation is usually affected negatively by radiation. The radiation resultant effect manifests in several forms depending on the operating environment of the device like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). CMOS circuits and Floating gate MOS circuits suffer from an increase in the delay and the leakage current due to TID effect. This may damage the proper operation of the integrated circuit. Exhaustive testing is needed for devices operating in harsh conditions like space and military applications to ensure correct operations in the worst circumstances. The use of worst case test vectors (WCTVs) for testing is strongly recommended by MIL-STD-883, method 1019, which is the standard describing the procedure for testing electronic devices under radiation. However, the difficulty of generating these test vectors hinders their use in radiation testing. Testing digital circuits in the industry is usually done nowadays using design for testability (DFT) techniques as they are very mature and can be relied on. DFT techniques include, but not limited to, ad-hoc technique, built-in self test (BIST), muxed D scan, clocked scan and enhanced scan. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Despite all these recommendations for DFT, radiation testing has not benefited from this reliable technology yet. Also, with the big variation in the DFT techniques, choosing the right technique is the bottleneck to achieve the best results for TID testing. In this thesis, a comprehensive comparison between different DFT techniques for TID testing of flash-based FPGAs is made to help designers choose the best suitable DFT technique depending on their application. The comparison includes muxed D scan technique, clocked scan technique and enhanced scan technique. The comparison is done using ISCAS-89 benchmarks circuits. Points of comparisons include FPGA resources utilization, difficulty of designs bring-up, added delay by DFT logic and robust testable paths in each technique

Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques

Electronic devices often operate in harsh environments which contain a variation of radiation sources. Radiation may cause different kinds of damage to proper operation of the devices. Their sources can be found in terrestrial environments, or in extra-terrestrial environments like in space, or in man-made radiation sources like nuclear reactors, biomedical devices and high energy particles physics experiments equipment. Depending on the operation environment of the device, the radiation resultant effect manifests in several forms like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). TID effect causes an increase in the delay and the leakage current of CMOS circuits which may damage the proper operation of the integrated circuit. To ensure proper operation of these devices under radiation, thorough testing must be made especially in critical applications like space and military applications. Although the standard which describes the procedure for testing electronic devices under radiation emphasizes the use of worst case test vectors (WCTVs), they are never used in radiation testing due to the difficulty of generating these vectors for circuits under test. For decades, design for testability (DFT) has been the best choice for test engineers to test digital circuits in industry. It has become a very mature technology that can be relied on. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Surprisingly, however, radiation testing has not yet made use of this reliable technology. In this thesis, a novel methodology is proposed to extend the usage of DFT to generate WCTVs for delay failure in Flash based field programmable gate arrays (FPGAs) exposed to total ionizing dose (TID). The methodology is validated using MicroSemi ProASIC3 FPGA and cobalt 60 facility

Programmable flexible cores for SoC applications

Tese de mestrado. Engenharia Electrotécnica e de Computadores. Faculdade de Engenharia. Universidade do Porto. 200

A Micro Power Hardware Fabric for Embedded Computing

Field Programmable Gate Arrays (FPGAs) mitigate many of the problemsencountered with the development of ASICs by offering flexibility, faster time-to-market, and amortized NRE costs, among other benefits. While FPGAs are increasingly being used for complex computational applications such as signal and image processing, networking, and cryptology, they are far from ideal for these tasks due to relatively high power consumption and silicon usage overheads compared to direct ASIC implementation. A reconfigurable device that exhibits ASIC-like power characteristics and FPGA-like costs and tool support is desirable to fill this void. In this research, a parameterized, reconfigurable fabric model named as domain specific fabric (DSF) is developed that exhibits ASIC-like power characteristics for Digital Signal Processing (DSP) style applications. Using this model, the impact of varying different design parameters on power and performance has been studied. Different optimization techniques like local search and simulated annealing are used to determine the appropriate interconnect for a specific set of applications. A design space exploration tool has been developed to automate and generate a tailored architectural instance of the fabric.The fabric has been synthesized on 160 nm cell-based ASIC fabrication process from OKI and 130 nm from IBM. A detailed power-performance analysis has been completed using signal and image processing benchmarks from the MediaBench benchmark suite and elsewhere with comparisons to other hardware and software implementations. The optimized fabric implemented using the 130 nm process yields energy within 3X of a direct ASIC implementation, 330X better than a Virtex-II Pro FPGA and 2016X better than an Intel XScale processor

P4-compatible High-level Synthesis of Low Latency 100 Gb/s Streaming Packet Parsers in FPGAs

Packet parsing is a key step in SDN-aware devices. Packet parsers in SDN networks need to be both reconfigurable and fast, to support the evolving network protocols and the increasing multi-gigabit data rates. The combination of packet processing languages with FPGAs seems to be the perfect match for these requirements. In this work, we develop an open-source FPGA-based configurable architecture for arbitrary packet parsing to be used in SDN networks. We generate low latency and high-speed streaming packet parsers directly from a packet processing program. Our architecture is pipelined and entirely modeled using templated C++ classes. The pipeline layout is derived from a parser graph that corresponds a P4 code after a series of graph transformation rounds. The RTL code is generated from the C++ description using Xilinx Vivado HLS and synthesized with Xilinx Vivado. Our architecture achieves 100 Gb/s data rate in a Xilinx Virtex-7 FPGA while reducing the latency by 45% and the LUT usage by 40% compared to the state-of-the-art.Comment: Accepted for publication at the 26th ACM/SIGDA International Symposium on Field-Programmable Gate Arrays February 25 - 27, 2018 Monterey Marriott Hotel, Monterey, California, 7 pages, 7 figures, 1 tabl

Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations