9 research outputs found
Early Dependability Analysis of FPGA-Based Space Applications Using Formal Verification
SRAM-based FPGAs are increasingly attractive in the aerospace industry for their field programmability and low cost. Unfortunately, they suffer from cosmic radiation induced Single Event Effects (SEEs). In safety-critical applications, the dependability of the design is a prime concern since failures may have catastrophic consequences. Hence, an early analysis of dependability of such safety-critical applications will enable designers to develop systems that meet high dependability requirements, such as the DO-254 standard. In this thesis, we propose a high-level dependability and performability analysis methodology based on probabilistic model checking. Compared to the pen-and-pencil and discrete-event simulation approach, our methodology is more accurate due to the use of an automated formal verification technique. Moreover, compared to fault injection or beam testing, analysis at early design stages can guide designers to build more reliable designs reducing the overall cost and effort. The proposed methodology can perform three different types of analysis: evaluation of available design options, optimization of scrub intervals while satisfying its design assurance level requirements, and optimal partitioning of Triple-Modular Redundant (TMR) Systems. Such analysis can also guide designers to adopt proper mitigation technique(s), such as rescheduling, TMR, TMR with less frequent scrubs, or even can help to decide the number of TMR partitions for a given scrub intervals.
Starting from a high-level description of a system, based on the preferred analysis, a Markov model or Markov (reward) model is constructed from the extracted Control Data Flow Graph (CDFG) and the failure/mitigation parameters for the targeted FPGA. Such modeling and exhaustive analysis elaborated using a probabilistic model checking technique can capture all the failures and repairs possible (according to some general model) in the system within the radiation environment. To illustrate the applicability of the proposed approach, we present our quantitative analysis obtained from DSP benchmark circuits
Dependability modeling and optimization of triple modular redundancy partitioning for SRAM-based FPGAs
SRAM-based FPGAs are popular in the aerospace industry for their field
programmability and low cost. However, they suffer from cosmic
radiation-induced Single Event Upsets (SEUs). Triple Modular Redundancy (TMR)
is a well-known technique to mitigate SEUs in FPGAs that is often used with
another SEU mitigation technique known as configuration scrubbing. Traditional
TMR provides protection against a single fault at a time, while partitioned TMR
provides improved reliability and availability. In this paper, we present a
methodology to analyze TMR partitioning at early design stage using
probabilistic model checking. The proposed formal model can capture both single
and multiple-cell upset scenarios, regardless of any assumption of equal
partition sizes. Starting with a high-level description of a design, a Markov
model is constructed from the Data Flow Graph (DFG) using a specified number of
partitions, a component characterization library and a user defined scrub rate.
Such a model and exhaustive analysis captures all the considered failures and
repairs possible in the system within the radiation environment. Various
reliability and availability properties are then verified automatically using
the PRISM model checker exploring the relationship between the scrub frequency
and the number of TMR partitions required to meet the design requirements.
Also, the reported results show that based on a known voter failure rate, it is
possible to find an optimal number of partitions at early design stages using
our proposed method.Comment: Published in Reliability Engineering & System Safety Volume 182,
February 2019, Pages 107-11
Resilience of an embedded architecture using hardware redundancy
In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound.
Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures.
In this work we study the concepts of fault tolerance and dependability and
extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators
Error Detection and Diagnosis for System-on-Chip in Space Applications
Tesis por compendio de publicacionesLos componentes electrónicos comerciales, comúnmente llamados componentes
Commercial-Off-The-Shelf (COTS) están presentes en multitud de dispositivos habituales
en nuestro día a día. Particularmente, el uso de microprocesadores y sistemas en chip (SoC)
altamente integrados ha favorecido la aparición de dispositivos electrónicos cada vez más
inteligentes que sostienen el estilo de vida y el avance de la sociedad moderna. Su uso se
ha generalizado incluso en aquellos sistemas que se consideran críticos para la seguridad,
como vehículos, aviones, armamento, dispositivos médicos, implantes o centrales eléctricas.
En cualquiera de ellos, un fallo podría tener graves consecuencias humanas o económicas.
Sin embargo, todos los sistemas electrónicos conviven constantemente con factores internos
y externos que pueden provocar fallos en su funcionamiento. La capacidad de un sistema
para funcionar correctamente en presencia de fallos se denomina tolerancia a fallos, y es
un requisito en el diseño y operación de sistemas críticos.
Los vehículos espaciales como satélites o naves espaciales también hacen uso de
microprocesadores para operar de forma autónoma o semi autónoma durante su vida útil,
con la dificultad añadida de que no pueden ser reparados en órbita, por lo que se consideran
sistemas críticos. Además, las duras condiciones existentes en el espacio, y en particular
los efectos de la radiación, suponen un gran desafío para el correcto funcionamiento de los
dispositivos electrónicos. Concretamente, los fallos transitorios provocados por radiación
(conocidos como soft errors) tienen el potencial de ser una de las mayores amenazas para
la fiabilidad de un sistema en el espacio.
Las misiones espaciales de gran envergadura, típicamente financiadas públicamente
como en el caso de la NASA o la Agencia Espacial Europea (ESA), han tenido
históricamente como requisito evitar el riesgo a toda costa por encima de cualquier
restricción de coste o plazo. Por ello, la selección de componentes resistentes a la radiación
(rad-hard) específicamente diseñados para su uso en el espacio ha sido la metodología
imperante en el paradigma que hoy podemos denominar industria espacial tradicional, u
Old Space. Sin embargo, los componentes rad-hard tienen habitualmente un coste mucho
más alto y unas prestaciones mucho menores que otros componentes COTS equivalentes.
De hecho, los componentes COTS ya han sido utilizados satisfactoriamente en misiones
de la NASA o la ESA cuando las prestaciones requeridas por la misión no podían ser
cubiertas por ningún componente rad-hard existente.
En los últimos años, el acceso al espacio se está facilitando debido en gran parte a la
entrada de empresas privadas en la industria espacial. Estas empresas no siempre buscan
evitar el riesgo a toda costa, sino que deben perseguir una rentabilidad económica, por
lo que hacen un balance entre riesgo, coste y plazo mediante gestión del riesgo en un
paradigma denominado Nuevo Espacio o New Space. Estas empresas a menudo están
interesadas en entregar servicios basados en el espacio con las máximas prestaciones y el mayor beneficio posibles, para lo cual los componentes rad-hard son menos atractivos
debido a su mayor coste y menores prestaciones que los componentes COTS existentes.
Sin embargo, los componentes COTS no han sido específicamente diseñados para su uso
en el espacio y típicamente no incluyen técnicas específicas para evitar que los efectos de
la radiación afecten su funcionamiento. Los componentes COTS se comercializan tal cual
son, y habitualmente no es posible modificarlos para mejorar su resistencia a la radiación.
Además, los elevados niveles de integración de los sistemas en chip (SoC) complejos
de altas prestaciones dificultan su observación y la aplicación de técnicas de tolerancia
a fallos. Este problema es especialmente relevante en el caso de los microprocesadores.
Por tanto, existe un gran interés en el desarrollo de técnicas que permitan conocer y
mejorar el comportamiento de los microprocesadores COTS bajo radiación sin modificar
su arquitectura y sin interferir en su funcionamiento para facilitar su uso en el espacio y
con ello maximizar las prestaciones de las misiones espaciales presentes y futuras.
En esta Tesis se han desarrollado técnicas novedosas para detectar, diagnosticar y
mitigar los errores producidos por radiación en microprocesadores y sistemas en chip
(SoC) comerciales, utilizando la interfaz de traza como punto de observación. La interfaz de
traza es un recurso habitual en los microprocesadores modernos, principalmente enfocado
a soportar las tareas de desarrollo y depuración del software durante la fase de diseño. Sin
embargo, una vez el desarrollo ha concluido, la interfaz de traza típicamente no se utiliza
durante la fase operativa del sistema, por lo que puede ser reutilizada sin coste. La interfaz
de traza constituye un punto de conexión viable para observar el comportamiento de un
microprocesador de forma no intrusiva y sin interferir en su funcionamiento.
Como resultado de esta Tesis se ha desarrollado un módulo IP capaz de recabar
y decodificar la información de traza de un microprocesador COTS moderno de altas
prestaciones. El IP es altamente configurable y personalizable para adaptarse a diferentes
aplicaciones y tipos de procesadores. Ha sido diseñado y validado utilizando el dispositivo
Zynq-7000 de Xilinx como plataforma de desarrollo, que constituye un dispositivo COTS
de interés en la industria espacial. Este dispositivo incluye un procesador ARM Cortex-A9
de doble núcleo, que es representativo del conjunto de microprocesadores hard-core
modernos de altas prestaciones. El IP resultante es compatible con la tecnología ARM
CoreSight, que proporciona acceso a información de traza en los microprocesadores ARM.
El IP incorpora técnicas para detectar errores en el flujo de ejecución y en los datos de la
aplicación ejecutada utilizando la información de traza, en tiempo real y con muy baja
latencia. El IP se ha validado en campañas de inyección de fallos y también en radiación con
protones y neutrones en instalaciones especializadas. También se ha combinado con otras
técnicas de tolerancia a fallos para construir técnicas híbridas de mitigación de errores.
Los resultados experimentales obtenidos demuestran su alta capacidad de detección y
potencialidad en el diagnóstico de errores producidos por radiación.
El resultado de esta Tesis, desarrollada en el marco de un Doctorado Industrial entre
la Universidad Carlos III de Madrid (UC3M) y la empresa Arquimea, se ha transferido satisfactoriamente al entorno empresarial en forma de un proyecto financiado por la
Agencia Espacial Europea para continuar su desarrollo y posterior explotación.Commercial electronic components, also known as Commercial-Off-The-Shelf (COTS),
are present in a wide variety of devices commonly used in our daily life. Particularly, the
use of microprocessors and highly integrated System-on-Chip (SoC) devices has fostered
the advent of increasingly intelligent electronic devices which sustain the lifestyles and the
progress of modern society. Microprocessors are present even in safety-critical systems,
such as vehicles, planes, weapons, medical devices, implants, or power plants. In any of
these cases, a fault could involve severe human or economic consequences. However, every
electronic system deals continuously with internal and external factors that could provoke
faults in its operation. The capacity of a system to operate correctly in presence of faults
is known as fault-tolerance, and it becomes a requirement in the design and operation of
critical systems.
Space vehicles such as satellites or spacecraft also incorporate microprocessors to
operate autonomously or semi-autonomously during their service life, with the additional
difficulty that they cannot be repaired once in-orbit, so they are considered critical systems.
In addition, the harsh conditions in space, and specifically radiation effects, involve a big
challenge for the correct operation of electronic devices. In particular, radiation-induced
soft errors have the potential to become one of the major risks for the reliability of systems
in space.
Large space missions, typically publicly funded as in the case of NASA or European
Space Agency (ESA), have followed historically the requirement to avoid the risk at any
expense, regardless of any cost or schedule restriction. Because of that, the selection of
radiation-resistant components (known as rad-hard) specifically designed to be used in
space has been the dominant methodology in the paradigm of traditional space industry,
also known as “Old Space”. However, rad-hard components have commonly a much higher
associated cost and much lower performance that other equivalent COTS devices. In fact,
COTS components have already been used successfully by NASA and ESA in missions
that requested such high performance that could not be satisfied by any available rad-hard
component.
In the recent years, the access to space is being facilitated in part due to the irruption
of private companies in the space industry. Such companies do not always seek to avoid
the risk at any cost, but they must pursue profitability, so they perform a trade-off between
risk, cost, and schedule through risk management in a paradigm known as “New Space”.
Private companies are often interested in deliver space-based services with the maximum
performance and maximum benefit as possible. With such objective, rad-hard components
are less attractive than COTS due to their higher cost and lower performance.
However, COTS components have not been specifically designed to be used in space
and typically they do not include specific techniques to avoid or mitigate the radiation effects in their operation. COTS components are commercialized “as is”, so it is not
possible to modify them to improve their susceptibility to radiation effects. Moreover,
the high levels of integration of complex, high-performance SoC devices hinder their
observability and the application of fault-tolerance techniques. This problem is especially
relevant in the case of microprocessors. Thus, there is a growing interest in the development
of techniques allowing to understand and improve the behavior of COTS microprocessors
under radiation without modifying their architecture and without interfering with their
operation. Such techniques may facilitate the use of COTS components in space and
maximize the performance of present and future space missions.
In this Thesis, novel techniques have been developed to detect, diagnose, and
mitigate radiation-induced errors in COTS microprocessors and SoCs using the trace
interface as an observation point. The trace interface is a resource commonly found
in modern microprocessors, mainly intended to support software development and
debugging activities during the design phase. However, it is commonly left unused
during the operational phase of the system, so it can be reused with no cost. The trace
interface constitutes a feasible connection point to observe microprocessor behavior in a
non-intrusive manner and without disturbing processor operation.
As a result of this Thesis, an IP module has been developed capable to gather and
decode the trace information of a modern, high-end, COTS microprocessor. The IP is highly
configurable and customizable to support different applications and processor types. The
IP has been designed and validated using the Xilinx Zynq-7000 device as a development
platform, which is an interesting COTS device for the space industry. This device features a
dual-core ARM Cortex-A9 processor, which is a good representative of modern, high-end,
hard-core microprocessors. The resulting IP is compatible with the ARM CoreSight
technology, which enables access to trace information in ARM microprocessors. The IP is
able to detect errors in the execution flow of the microprocessor and in the application data
using trace information, in real time and with very low latency. The IP has been validated
in fault injection campaigns and also under proton and neutron irradiation campaigns in
specialized facilities. It has also been combined with other fault-tolerance techniques
to build hybrid error mitigation approaches. Experimental results demonstrate its high
detection capabilities and high potential for the diagnosis of radiation-induced errors.
The result of this Thesis, developed in the framework of an Industrial Ph.D. between the
University Carlos III of Madrid (UC3M) and the company Arquimea, has been successfully
transferred to the company business as a project sponsored by European Space Agency to
continue its development and subsequent commercialization.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidenta: María Luisa López Vallejo.- Secretario: Enrique San Millán Heredia.- Vocal: Luigi Di Lill
Maintenance of Smart Buildings using Fault Trees
Timely maintenance is an important means of increasing system dependability
and life span. Fault Maintenance trees (FMTs) are an innovative framework
incorporating both maintenance strategies and degradation models and serve as a
good planning platform for balancing total costs (operational and maintenance)
with dependability of a system. In this work, we apply the FMT formalism to a
{Smart Building} application and propose a framework that efficiently encodes
the FMT into Continuous Time Markov Chains. This allows us to obtain system
dependability metrics such as system reliability and mean time to failure, as
well as costs of maintenance and failures over time, for different maintenance
policies. We illustrate the pertinence of our approach by evaluating various
dependability metrics and maintenance strategies of a Heating, Ventilation and
Air-Conditioning system.Comment: arXiv admin note: substantial text overlap with arXiv:1801.0426
Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs
SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect
the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are
commonly used in the analysis of faults in digital devices. By keeping this accurate
fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology..
In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system
for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer
and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results
obtained by similar experiments in which we considered the stuck-at fault model, instead
of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between
fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%
Formal analysis of SEU mitigation for early dependability and performability analysis of FPGA-based space applications
SRAM-based FPGAs are increasingly popular in the aerospace industry due to
their field programmability and low cost. However, they suffer from cosmic
radiation induced Single Event Upsets (SEUs). In safety-critical applications,
the dependability of the design is a prime concern since failures may have
catastrophic consequences. An early analysis of the relationship between
dependability metrics, performability-area trade-off, and different mitigation
techniques for such applications can reduce the design effort while increasing
the design confidence. This paper introduces a novel methodology based on
probabilistic model checking, for the analysis of the reliability,
availability, safety and performance-area tradeoffs of safety-critical systems
for early design decisions. Starting from the high-level description of a
system, a Markov reward model is constructed from the Control Data Flow Graph
(CDFG) and a component characterization library targeting FPGAs. The proposed
model and exhaustive analysis capture all the failure states (based on the
fault detection coverage) and repairs possible in the system. We present
quantitative results based on an FIR filter circuit to illustrate the
applicability of the proposed approach and to demonstrate that a wide range of
useful dependability and performability properties can be analyzed using the
proposed methodology. The modeling results show the relationship between
different mitigation techniques and fault detection coverage, exposing their
direct impact on the design for early decisions.Comment: Accepted version for publication in the Journal of Applied Science,
Elsevie
Design Development Test and Evaluation (DDT and E) Considerations for Safe and Reliable Human Rated Spacecraft Systems
A team directed by the NASA Engineering and Safety Center (NESC) collected methodologies for how best to develop safe and reliable human rated systems and how to identify the drivers that provide the basis for assessing safety and reliability. The team also identified techniques, methodologies, and best practices to assure that NASA can develop safe and reliable human rated systems. The results are drawn from a wide variety of resources, from experts involved with the space program since its inception to the best-practices espoused in contemporary engineering doctrine. This report focuses on safety and reliability considerations and does not duplicate or update any existing references. Neither does it intend to replace existing standards and policy