INTEND AND PROPOSE THE HIGH SPEED LFSR CIRCUIT USING SST METHOD

Linear feedback shift register (LFSR) is an important component of the cyclic redundancy check (CRC) operations and BCH encoders. This thesis presents a mathematical proof of existence of a linear transformation to transform LFSR circuits into equivalent state space formulations. This transformation achieves a full speed-up compared to the serial architecture at the cost of an increase in hardware overhead. This method applies to all irreducible polynomials used in CRC operations and BCH encoders. A new formulation is proposed to modify the LFSR into the form of an CRC filter. We propose a novel high speed parallel LFSR architecture based on parallel Infinite Impulse Response (CRC) filter design, pipelining and retiming algorithms. The advantage of proposed approach over the previous architectures is that it has both feedforward and feedback paths. We further propose to apply combined parallel and pipelining techniques to eliminate the fanout effect in long generator polynomials. The proposed scheme can be applied to any generator polynomial, i.e., any LFSR in general. A comparison between the proposed and previous architectures shows that the proposed parallel architecture achieves the same critical path as that of previous designs with a reduced hardware cost

A Guideline on Pseudorandom Number Generation (PRNG) in the IoT

Random numbers are an essential input to many functions on the Internet of Things (IoT). Common use cases of randomness range from low-level packet transmission to advanced algorithms of artificial intelligence as well as security and trust, which heavily rely on unpredictable random sources. In the constrained IoT, though, unpredictable random sources are a challenging desire due to limited resources, deterministic real-time operations, and frequent lack of a user interface. In this paper, we revisit the generation of randomness from the perspective of an IoT operating system (OS) that needs to support general purpose or crypto-secure random numbers. We analyse the potential attack surface, derive common requirements, and discuss the potentials and shortcomings of current IoT OSs. A systematic evaluation of current IoT hardware components and popular software generators based on well-established test suits and on experiments for measuring performance give rise to a set of clear recommendations on how to build such a random subsystem and which generators to use.Comment: 43 pages, 11 figures, 11 table

An innovative two-stage data compression scheme using adaptive block merging technique

Test data has increased enormously owing to the rising on-chip complexity of integrated circuits. It further increases the test data transportation time and tester memory. The non-correlated test bits increase the issue of the test power. This paper presents a two-stage block merging based test data minimization scheme which reduces the test bits, test time and test power. A test data is partitioned into blocks of fixed sizes which are compressed using two-stage encoding technique. In stage one, successive blocks are merged to retain a representative block. In stage two, the retained pattern block is further encoding based on the existence of ten different subcases between the sub-block formed by splitting the retained pattern block into two halves. Non-compatible blocks are also split into two sub-blocks and tried for encoded using lesser bits. Decompression architecture to retrieve the original test data is presented. Simulation results obtained corresponding to different ISCAS′89 benchmarks circuits reflect its effectiveness in achieving better compression

Efficient verification/testing of system-on-chip through fault grading and analog behavioral modeling

textThis dissertation presents several cost-effective production test solutions using fault grading and mixed-signal design verification cases enabled by analog behavioral modeling. Although the latest System-on-Chip (SOC) is getting denser, faster, and more complex, the manufacturing technology is dominated by subtle defects that are introduced by small-scale technology. Thus, SOC requires more mature testing strategies. By performing various types of testing, better quality SoC can be manufactured, but test resources are too limited to accommodate all those tests. To create the most efficient production test flow, any redundant or ineffective tests need to be removed or minimized. Chapter 3 proposes new method of test data volume reduction by combining the nonlinear property of feedback shift register (FSR) and dictionary coding. Instead of using the nonlinear FSR for actual hardware implementation, the expanded test set by nonlinear expansion is used as the one-column test sets and provides big reduction ratio for the test data volume. The experimental results show the combined method reduced the total test data volume and increased the fault coverage. Due to the increased number of test patterns, total test time is increased. Chapter 4 addresses a whole process of functional fault grading. Fault grading has always been a ”desire-to-have” flow because it can bring up significant value for cost saving and yield analysis. However, it is very hard to perform the fault grading on the complex large scale SOC. A commercial tool called Z01X is used as a fault grading platform, and whole fault grading process is coordinated and each detailed execution is performed. Simulation- based functional fault grading identifies the quality of the given functional tests against the static faults and transition delay faults. With the structural tests and functional tests, functional fault grading can indicate the way to achieve the same test coverage by spending minimal test time. Compared to the consumed time and resource for fault grading, the contribution to the test time saving might not be acceptable as very promising, but the fault grading data can be reused for yield analysis and test flow optimization. For the final production testing, confident decisions on the functional test selection can be made based on the fault grading results. Chapter 5 addresses the challenges of Package-on-Package (POP) testing. Because POP devices have pins on both the top and the bottom of the package, the increased test pins require more test channels to detect packaging defects. Boundary scan chain testing is used to detect those continuity defects by relying on leakage current from the power supply. This proposed test scheme does not require direct test channels on the top pins. Based on the counting algorithm, minimal numbers of test cycles are generated, and the test achieved full test coverage for any combinations of pin-to-pin shortage defects on the top pins of the POP package. The experimental results show about 10 times increased leakage current from the shorted defect. Also, it can be expanded to multi-site testing with less test channels for high-volume production. Fault grading is applied within different structural test categories in Chapter 6. Stuck-at faults can be considered as TDFs having infinite delay. Hence, the TDF Automatic Test Pattern Generation (ATPG) tests can detect both TDFs and stuck-at faults. By removing the stuck-at faults being detected by the given TDF ATPG tests, the tests that target stuck-at faults can be reduced, and the reduced stuck-at fault set results in fewer stuck-at ATPG patterns. The structural test time is reduced while keeping the same test coverage. This TDF grading is performed with the same ATPG tool used to generate the stuck-at and TDF ATPG tests. To expedite the mixed-signal design verification of complex SoC, analog behavioral modeling methods and strategies are addressed in Chapter 7 and case studies for detailed verification with actual mixed-signal design are ad- dressed in Chapter 8. Analog modeling effort can enhance verification quality for a mixed-signal design with less turnaround time, and it enables compatible integration of the mixed-signal design cores into the SoC. The modeling process may reveal any potential design errors or incorrect testbench setup, and it results in minimizing unnecessary debugging time for quality devices. Two mixed-signal design cases were verified by me using the analog models. A fully hierarchical digital-to-analog converter (DAC) model is implemented and silicon mismatches caused by process variation are modeled and inserted into the DAC model, and the calibration algorithm for the DAC is successfully verified by model-based simulation at the full DAC-level. When the mismatch amount is increased and exceeded the calibration capability of the DAC, the simulation results show the increased calibration error with some outliers. This verification method can identify the saturation range of the DAC and predict the yield of the devices from process variation. A phase-locked loop (PLL) design cases were also verified by me using the analog model. Both open-loop PLL model and closed-loop PLL model cases are presented. Quick bring-up of open-loop PLL model provides low simulation overhead for widely-used PLLs in the SOC and enables early starting of design verification for the upper-level design using the PLL generated clocks. Accurate closed-loop PLL model is implemented for DCO-based PLL design, and the mixed-simulation with analog models and schematic designs enables flexible analog verification. Only focused analog design block is set to the schematic design and the rest of the analog design is replaced by the analog model. Then, this scaled-down SPICE simulation is performed about 10 times to 100 times faster than full-scale SPICE simulation. The analog model of the focused block is compared with the scaled-down SPICE simulation result and the quality of the model is iteratively enhanced. Hence, the analog model enables both compatible integration and flexible analog design verification. This dissertation contributes to reduce test time and to enhance test quality, and helps to set up efficient production testing flows. Depending on the size and performance of CUT, proper testing schemes can maximize the efficiency of production testing. The topics covered in this dissertation can be used in optimizing the test flow and selecting the final production tests to achieve maximum test capability. In addition, the strategies and benefits of analog behavioral modeling techniques that I implemented are presented, and actual verification cases shows the effectiveness of analog modeling for better quality SoC products.Electrical and Computer Engineerin

Chaos Machine: Different Approach to the Application and Significance of Numbers

In this paper we describe a theoretical model of \underline{chaos machine}, which combines the benefits of hash function and pseudo-random function, forming flexible \textit{one-way} \underline{push-pull interface}. It presents the idea to create a universal tool (design pattern) with modular design and customizable parameters, that can be applied where \textit{randomness} and \textit{sensitiveness} is needed (random oracle), and where appropriate construction determines case of application and selection of parameters provides preferred properties and security level. Machine can be used to implement many cryptographic primitives, including cryptographic hashes, message authentication codes and pseudo-random number generators. Additionally, document includes sample implementation of chaos machine named Naive Czyzewski Generator, abbreviated NCG, that passes all the Dieharder, NIST and TestU01 test sets. Algorithm was designed and evaluated to be a cryptographically strong, inasmuch as indistinguishable from a uniform random function. The generator was developed to work as cryptographically secure pseudo-random number generator, collision resistance hash function or a cryptographic module. One can target a given period length by choosing the appropriate space parameter, i.e., for a given parameter $m$, algorithm is claimed to have period between $2^{8m}$ to $2^{16m}$

Public keys quality

Dissertação de mestrado em Matemática e ComputaçãoThe RSA cryptosystem, invented by Ron Rivest, Adi Shamir and Len Adleman ([Rivest et al., 1978]) is the most commonly used cryptosystem for providing privacy and ensuring authenticity of digital data. RSA is usually used in contexts where security of digital data is priority. RSA is used worldwide by web servers and browsers to secure web traffic, to ensure privacy and authenticity of e-mail, to secure remote login sessions and to provide secure electronic creditcard payment systems. Given its importance in the protection of digital data, vulnerabilities of RSA have been analysed by many researchers. The researches made so far led to a number of fascinating attacks. Although the attacks helped to improve the security of this cryptosystem, showing that securely implementing RSA is a nontrivial task, none of them was devastating. This master thesis discusses the RSA cryptosystem and some of its vulnerabilities as well as the description of some attacks, both recent and old, together with the description of the underlying mathematical tools they use. Although many types of attacks exist, in this master thesis only a few examples were analysed. The ultimate attack, based in the batch-GCD algorithm, was implemented and tested in the RSA keys produced by a certificated Hardware Security Modules Luna SA and the results were commented. The random and pseudorandom numbers are fundamental to many cryptographic applications, including the RSA cryptosystems. In fact, the produced keys must be generated in a specific random way. The National Institute of Standards and Technology, responsible entity for specifying safety standards, provides a package named "A Statistical Test Suit for Random and Pseudorandom Number Generators for Cryptography Applications" which was used in this work to test the randomness of the Luna SA generated numbers. All the statistical tests were tested in different bit sizes number and the results commented. The main purpose of this thesis is to study the previous subjects and create an applications capable to test the Luna SA generated numbers randomness, a well as evaluate the security of the RSA. This work was developed in partnership with University of Minho and Multicert.O RSA, criado por Ron Rivest, Adi Shamir e Len Adleman ([Rivest et al., 1978]) é o sistema criptográfico mais utilizado para providenciar segurança e assegurar a autenticação de dados utilizados no mundo digital. O RSA é usualmente usado em contextos onde a segurança é a grande prioridade. Hoje em dia, este sistema criptográfico é utilizado mundialmente por servidores web e por browsers, por forma a assegurar um tráfego seguro através da Internet. É o sistema criptográfico mais utilizado na autenticação de e-mails, nos inícios de sessões remotos, na utilização de pagamentos através de cartões multibanco, garantindo segurança na utilização destes serviços. Dada a importância que este sistema assume na proteção da informação digital, as suas vulnerabilidades têm sido alvo de várias investigações. Estas investigações resultaram em vários ataques ao RSA. Embora nenhum destes ataques seja efetivamente eficaz, todos contribuíram para um aumento da segurança do RSA, uma vez que as implementações de referência deste algoritmo passaram a precaver-se contra os ataques descobertos. Esta tese de mestrado aborda o sistema criptográfico RSA, discutindo algumas das suas vulnerabilidades, assim como alguns ataques efetuados a este sistema, estudando todos os métodos matemáticos por estes usados. Embora existam diversos ataques, apenas alguns serão abordados nesta tese de mestrado. O último ataque, baseado no algoritmo batch-GCD foi implementado e foram feitos testes em chaves RSA produzidas por um Hardware Security Module Luna SA certificado e os resultados obtidos foram discutidos. Os números aleatórios e pseudoaleatórios são fundamentais a todas as aplicações criptográficas, incluindo, portanto, o sistema criptográfico RSA. De facto, as chaves produzidas deverão ser geradas com alguma aleatoriedade intrínseca ao sistema. O Instituto Nacional de Standards e Tecnologia, entidade responsável pela especificação dos standards de segurança, disponibiliza um pacote de testes estatísticos, denominado por "A Statistical Test Suit for Random and Pseudorandom Number Generators for Cryptography Applications". Estes testes estatísticos foram aplicados a números gerados pelo Luna SA e os resultados foram, também, comentados. O objetivo desta tese de mestrado é desenvolver capacidade de compreensão sobre os assuntos descritos anteriormente e criar uma aplicação capaz de testar a aleatoriedade dos números gerados pelo Luna SA, assim como avaliar a segurança do sistema criptográfico RSA. Este foi um trabalho desenvolvido em parceria com a Universidade do Minho e com a Multicert

Digital Design of New Chaotic Ciphers for Ethernet Traffic

Durante los últimos años, ha habido un gran desarrollo en el campo de la criptografía, y muchos algoritmos de encriptado así como otras funciones criptográficas han sido propuestos.Sin embargo, a pesar de este desarrollo, hoy en día todavía existe un gran interés en crear nuevas primitivas criptográficas o mejorar las ya existentes. Algunas de las razones son las siguientes:• Primero, debido el desarrollo de las tecnologías de la comunicación, la cantidad de información que se transmite está constantemente incrementándose. En este contexto, existen numerosas aplicaciones que requieren encriptar una gran cantidad de datos en tiempo real o en un intervalo de tiempo muy reducido. Un ejemplo de ello puede ser el encriptado de videos de alta resolución en tiempo real. Desafortunadamente, la mayoría de los algoritmos de encriptado usados hoy en día no son capaces de encriptar una gran cantidad de datos a alta velocidad mientras mantienen altos estándares de seguridad.• Debido al gran aumento de la potencia de cálculo de los ordenadores, muchos algoritmos que tradicionalmente se consideraban seguros, actualmente pueden ser atacados por métodos de “fuerza bruta” en una cantidad de tiempo razonable. Por ejemplo, cuando el algoritmo de encriptado DES (Data Encryption Standard) fue lanzado por primera vez, el tamaño de la clave era sólo de 56 bits mientras que, hoy en día, el NIST (National Institute of Standards and Technology) recomienda que los algoritmos de encriptado simétricos tengan una clave de, al menos, 112 bits. Por otro lado, actualmente se está investigando y logrando avances significativos en el campo de la computación cuántica y se espera que, en el futuro, se desarrollen ordenadores cuánticos a gran escala. De ser así, se ha demostrado que algunos algoritmos que se usan actualmente como el RSA (Rivest Shamir Adleman) podrían ser atacados con éxito.• Junto al desarrollo en el campo de la criptografía, también ha habido un gran desarrollo en el campo del criptoanálisis. Por tanto, se están encontrando nuevas vulnerabilidades y proponiendo nuevos ataques constantemente. Por consiguiente, es necesario buscar nuevos algoritmos que sean robustos frente a todos los ataques conocidos para sustituir a los algoritmos en los que se han encontrado vulnerabilidades. En este aspecto, cabe destacar que algunos algoritmos como el RSA y ElGamal están basados en la suposición de que algunos problemas como la factorización del producto de dos números primos o el cálculo de logaritmos discretos son difíciles de resolver. Sin embargo, no se ha descartado que, en el futuro, se puedan desarrollar algoritmos que resuelvan estos problemas de manera rápida (en tiempo polinomial).• Idealmente, las claves usadas para encriptar los datos deberían ser generadas de manera aleatoria para ser completamente impredecibles. Dado que las secuencias generadas por generadores pseudoaleatorios, PRNGs (Pseudo Random Number Generators) son predecibles, son potencialmente vulnerables al criptoanálisis. Por tanto, las claves suelen ser generadas usando generadores de números aleatorios verdaderos, TRNGs (True Random Number Generators). Desafortunadamente, los TRNGs normalmente generan los bits a menor velocidad que los PRNGs y, además, las secuencias generadas suelen tener peores propiedades estadísticas, lo que hace necesario que pasen por una etapa de post-procesado. El usar un TRNG de baja calidad para generar claves, puede comprometer la seguridad de todo el sistema de encriptado, como ya ha ocurrido en algunas ocasiones. Por tanto, el diseño de nuevos TRNGs con buenas propiedades estadísticas es un tema de gran interés.En resumen, es claro que existen numerosas líneas de investigación en el ámbito de la criptografía de gran importancia. Dado que el campo de la criptografía es muy amplio, esta tesis se ha centra en tres líneas de investigación: el diseño de nuevos TRNGs, el diseño de nuevos cifradores de flujo caóticos rápidos y seguros y, finalmente, la implementación de nuevos criptosistemas para comunicaciones ópticas Gigabit Ethernet a velocidades de 1 Gbps y 10 Gbps. Dichos criptosistemas han estado basados en los algoritmos caóticos propuestos, pero se han adaptado para poder realizar el encriptado en la capa física, manteniendo el formato de la codificación. De esta forma, se ha logrado que estos sistemas sean capaces no sólo de encriptar los datos sino que, además, un atacante no pueda saber si se está produciendo una comunicación o no. Los principales aspectos cubiertos en esta tesis son los siguientes:• Estudio del estado del arte, incluyendo los algoritmos de encriptado que se usan actualmente. En esta parte se analizan los principales problemas que presentan los algoritmos de encriptado standard actuales y qué soluciones han sido propuestas. Este estudio es necesario para poder diseñar nuevos algoritmos que resuelvan estos problemas.• Propuesta de nuevos TRNGs adecuados para la generación de claves. Se exploran dos diferentes posibilidades: el uso del ruido generado por un acelerómetro MEMS (Microelectromechanical Systems) y el ruido generado por DNOs (Digital Nonlinear Oscillators). Ambos casos se analizan en detalle realizando varios análisis estadísticos a secuencias obtenidas a distintas frecuencias de muestreo. También se propone y se implementa un algoritmo de post-procesado simple para mejorar la aleatoriedad de las secuencias generadas. Finalmente, se discute la posibilidad de usar estos TRNGs como generadores de claves. • Se proponen nuevos algoritmos de encriptado que son rápidos, seguros y que pueden implementarse usando una cantidad reducida de recursos. De entre todas las posibilidades, esta tesis se centra en los sistemas caóticos ya que, gracias a sus propiedades intrínsecas como la ergodicidad o su comportamiento similar al comportamiento aleatorio, pueden ser una buena alternativa a los sistemas de encriptado clásicos. Para superar los problemas que surgen cuando estos sistemas son digitalizados, se proponen y estudian diversas estrategias: usar un sistema de multi-encriptado, cambiar los parámetros de control de los sistemas caóticos y perturbar las órbitas caóticas.• Se implementan los algoritmos propuestos. Para ello, se usa una FPGA Virtex 7. Las distintas implementaciones son analizadas y comparadas, teniendo en cuenta diversos aspectos tales como el consumo de potencia, uso de área, velocidad de encriptado y nivel de seguridad obtenido. Uno de estos diseños, se elige para ser implementado en un ASIC (Application Specific Integrate Circuit) usando una tecnología de 0,18 um. En cualquier caso, las soluciones propuestas pueden ser también implementadas en otras plataformas y otras tecnologías.• Finalmente, los algoritmos propuestos se adaptan y aplican a comunicaciones ópticas Gigabit Ethernet. En particular, se implementan criptosistemas que realizan el encriptado al nivel de la capa física para velocidades de 1 Gbps y 10 Gbps. Para realizar el encriptado en la capa física, los algoritmos propuestos en las secciones anteriores se adaptan para que preserven el formato de la codificación, 8b/10b en el caso de 1 Gb Ethernet y 64b/10b en el caso de 10 Gb Ethernet. En ambos casos, los criptosistemas se implementan en una FPGA Virtex 7 y se diseña un set experimental, que incluye dos módulos SFP (Small Form-factor Pluggable) capaces de transmitir a una velocidad de hasta 10.3125 Gbps sobre una fibra multimodo de 850 nm. Con este set experimental, se comprueba que los sistemas de encriptado funcionan correctamente y de manera síncrona. Además, se comprueba que el encriptado es bueno (pasa todos los test de seguridad) y que el patrón del tráfico de datos está oculto.<br /

Towards an embedded board-level tester: study of a configurable test processor

The demand for electronic systems with more features, higher performance, and less power consumption increases continuously. This is a real challenge for design and test engineers because they have to deal with electronic systems with ever-increasing complexity maintaining production and test costs low and meeting critical time to market deadlines. For a test engineer working at the board-level, this means that manufacturing defects must be detected as soon as possible and at a low cost. However, the use of classical test techniques for testing modern printed circuit boards is not sufficient, and in the worst case these techniques cannot be used at all. This is mainly due to modern packaging technologies, a high device density, and high operation frequencies of modern printed circuit boards. This leads to very long test times, low fault coverage, and high test costs. This dissertation addresses these issues and proposes an FPGA-based test approach for printed circuit boards. The concept is based on a configurable test processor that is temporarily implemented in the on-board FPGA and provides the corresponding mechanisms to communicate to external test equipment and co-processors implemented in the FPGA. This embedded test approach provides the flexibility to implement test functions either in the external test equipment or in the FPGA. In this manner, tests are executed at-speed increasing the fault coverage, test times are reduced, and the test system can be adapted automatically to the properties of the FPGA and devices located on the board. An essential part of the FPGA-based test approach deals with the development of a test processor. In this dissertation the required properties of the processor are discussed, and it is shown that the adaptation to the specific test scenario plays a very important role for the optimization. For this purpose, the test processor is equipped with configuration parameters at the instruction set architecture and microarchitecture level. Additionally, an automatic generation process for the test system and for the computation of some of the processor’s configuration parameters is proposed. The automatic generation process uses as input a model known as the device under test model (DUT-M). In order to evaluate the entire FPGA-based test approach and the viability of a processor for testing printed circuit boards, the developed test system is used to test interconnections to two different devices: a static random memory (SRAM) and a liquid crystal display (LCD). Experiments were conducted in order to determine the resource utilization of the processor and FPGA-based test system and to measure test time when different test functions are implemented in the external test equipment or the FPGA. It has been shown that the introduced approach is suitable to test printed circuit boards and that the test processor represents a realistic alternative for testing at board-level.Der Bedarf an elektronischen Systemen mit zusätzlichen Merkmalen, höherer Leistung und geringerem Energieverbrauch nimmt ständig zu. Dies stellt eine erhebliche Herausforderung für Entwicklungs- und Testingenieure dar, weil sie sich mit elektronischen Systemen mit einer steigenden Komplexität zu befassen haben. Außerdem müssen die Herstellungs- und Testkosten gering bleiben und die Produkteinführungsfristen so kurz wie möglich gehalten werden. Daraus folgt, dass ein Testingenieur, der auf Leiterplatten-Ebene arbeitet, die Herstellungsfehler so früh wie möglich entdecken und dabei möglichst niedrige Kosten verursachen soll. Allerdings sind die klassischen Testmethoden nicht in der Lage, die Anforderungen von modernen Leiterplatten zu erfüllen und im schlimmsten Fall können diese Testmethoden überhaupt nicht verwendet werden. Dies liegt vor allem an modernen Gehäuse-Technologien, der hohen Bauteildichte und den hohen Arbeitsfrequenzen von modernen Leiterplatten. Das führt zu sehr langen Testzeiten, geringer Testabdeckung und hohen Testkosten. Die Dissertation greift diese Problematik auf und liefert einen FPGA-basierten Testansatz für Leiterplatten. Das Konzept beruht auf einem konfigurierbaren Testprozessor, welcher im On-Board-FPGA temporär implementiert wird und die entsprechenden Mechanismen für die Kommunikation mit der externen Testeinrichtung und Co-Prozessoren im FPGA bereitstellt. Dadurch ist es möglich Testfunktionen flexibel entweder auf der externen Testeinrichtung oder auf dem FPGA zu implementieren. Auf diese Weise werden Tests at-speed ausgeführt, um die Testabdeckung zu erhöhen. Außerdem wird die Testzeit verkürzt und das Testsystem automatisch an die Eigenschaften des FPGAs und anderer Bauteile auf der Leiterplatte angepasst. Ein wesentlicher Teil des FPGA-basierten Testansatzes umfasst die Entwicklung eines Testprozessors. In dieser Dissertation wird über die benötigten Eigenschaften des Prozessors diskutiert und es wird gezeigt, dass die Anpassung des Prozessors an den spezifischen Testfall von großer Bedeutung für die Optimierung ist. Zu diesem Zweck wird der Prozessor mit Konfigurationsparametern auf der Befehlssatzarchitektur-Ebene und Mikroarchitektur-Ebene ausgerüstet. Außerdem wird ein automatischer Generierungsprozess für die Realisierung des Testsystems und für die Berechnung einer Untergruppe von Konfigurationsparametern des Prozessors vorgestellt. Der automatische Generierungsprozess benutzt als Eingangsinformation ein Modell des Prüflings (device under test model, DUT-M). Das entwickelte Testsystem wurde zum Testen von Leiterplatten für Verbindungen zwischen dem FPGA und zwei Bauteilen verwendet, um den FPGA-basierten Testansatz und die Durchführbarkeit des Testprozessors für das Testen auf Leiterplatte-Ebene zu evaluieren. Die zwei Bauteile sind ein Speicher mit direktem Zugriff (static random-access memory, SRAM) und eine Flüssigkristallanzeige (liquid crystal display, LCD). Die Experimente wurden durchgeführt, um den Ressourcenverbrauch des Prozessors und Testsystems festzustellen und um die Testzeit zu messen. Dies geschah durch die Implementierung von unterschiedlichen Testfunktionen auf der externen Testeinrichtung und dem FPGA. Dadurch konnte gezeigt werden, dass der FPGA-basierte Ansatz für das Testen von Leiterplatten geeignet ist und dass der Testprozessor eine realistische Alternative für das Testen auf Leiterplatten-Ebene ist