The Direct Summation of Totally Self-Checking Checkers

A new technique for reducing the complexity of designing Totally Self-Checking (TSC) checkers for m-out-of-n codes is presented. The method is based on the partitioning of the input variables into r classes, then partitioning the code groups generated into Z output partitions. Comparison with earlier results reveals improvements in design simplicity and logic and testing complexity. This thesis also presents a new method of TSC checker design where a j-level m1/n1 code and a k-level m2/n2 code TSC checker are directly summed to form a max [j,k]-level (m1 + m2) / (n1 + n2) TSC checker. A library of m/n code TSC checkers can then be used as building blocks for other m/n code TSC checkers

On Fault Tolerance Methods for Networks-on-Chip

Technology scaling has proceeded into dimensions in which the reliability of manufactured devices is becoming endangered. The reliability decrease is a consequence of physical limitations, relative increase of variations, and decreasing noise margins, among others. A promising solution for bringing the reliability of circuits back to a desired level is the use of design methods which introduce tolerance against possible faults in an integrated circuit. This thesis studies and presents fault tolerance methods for network-onchip (NoC) which is a design paradigm targeted for very large systems-onchip. In a NoC resources, such as processors and memories, are connected to a communication network; comparable to the Internet. Fault tolerance in such a system can be achieved at many abstraction levels. The thesis studies the origin of faults in modern technologies and explains the classification to transient, intermittent and permanent faults. A survey of fault tolerance methods is presented to demonstrate the diversity of available methods. Networks-on-chip are approached by exploring their main design choices: the selection of a topology, routing protocol, and flow control method. Fault tolerance methods for NoCs are studied at different layers of the OSI reference model. The data link layer provides a reliable communication link over a physical channel. Error control coding is an efficient fault tolerance method especially against transient faults at this abstraction level. Error control coding methods suitable for on-chip communication are studied and their implementations presented. Error control coding loses its effectiveness in the presence of intermittent and permanent faults. Therefore, other solutions against them are presented. The introduction of spare wires and split transmissions are shown to provide good tolerance against intermittent and permanent errors and their combination to error control coding is illustrated. At the network layer positioned above the data link layer, fault tolerance can be achieved with the design of fault tolerant network topologies and routing algorithms. Both of these approaches are presented in the thesis together with realizations in the both categories. The thesis concludes that an optimal fault tolerance solution contains carefully co-designed elements from different abstraction levelsSiirretty Doriast

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

LSI/VLSI design for testability analysis and general approach

The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented

Concurrent error detection

Concurrent error detection (CED) is the detection of errors or faults in a circuit or data path concurrent with normal operation of that circuit. The general approach for CED is to calculate a check symbol for the inputs to the circuit under operation, predict the check symbol that will result for the output of the circuit for those inputs, and compare the predicted check symbol to the one that is actually calculated for the output. If the predicted and actual check symbols are different, an error or fault has been detected. The alternative to this check symbol prediction is to use a second copy of the circuit under operation and compare the results of the two circuits. For some classes of circuits the prediction of the output check symbol can require less circuitry than a second copy of the circuit being tested. Four examples of these types of circuits are examined in this dissertation: Arithmetic Logic Units (ALUs), array multipliers, self-synchronous scrambler-descrambler pairs with their intervening data path, and switch fabrics. Faults in integrated circuits tend to produce unidirectional errors. Unidirectional errors are those in which all of the errors are in the same direction (e.g., 0 to 1 errors) within the block of data covered by a given check symbol. For this reason, codes that are optimized for unidirectional errors are the focus of investigation for most of the applications. In particular, the Bose-Lin codes are examined for those applications where unidirectional errors are expected to be typical. In order to examine the performance of the Bose-Lin codes in one of these applications, it was necessary to determine the theoretical performance for Bose- Lin codes for error rates beyond what had been previously studied. This analysis of Bose-Lin codes with large numbers of "burst" errors also included a further generalization of the codes

Robust design of deep-submicron digital circuits

Avec l'augmentation de la probabilité de fautes dans les circuits numériques, les systèmes développés pour les environnements critiques comme les centrales nucléaires, les avions et les applications spatiales doivent être certifies selon des normes industrielles. Cette thèse est un résultat d'une cooperation CIFRE entre l'entreprise Électricité de France (EDF) R&D et Télécom Paristech. EDF est l'un des plus gros producteurs d'énergie au monde et possède de nombreuses centrales nucléaires. Les systèmes de contrôle-commande utilisé dans les centrales sont basés sur des dispositifs électroniques, qui doivent être certifiés selon des normes industrielles comme la CEI 62566, la CEI 60987 et la CEI 61513 à cause de la criticité de l'environnement nucléaire. En particulier, l'utilisation des dispositifs programmables comme les FPGAs peut être considérée comme un défi du fait que la fonctionnalité du dispositif est définie par le concepteur seulement après sa conception physique. Le travail présenté dans ce mémoire porte sur la conception de nouvelles méthodes d'analyse de la fiabilité aussi bien que des méthodes d'amélioration de la fiabilité d'un circuit numérique.The design of circuits to operate at critical environments, such as those used in control-command systems at nuclear power plants, is becoming a great challenge with the technology scaling. These circuits have to pass through a number of tests and analysis procedures in order to be qualified to operate. In case of nuclear power plants, safety is considered as a very high priority constraint, and circuits designed to operate under such critical environment must be in accordance with several technical standards such as the IEC 62566, the IEC 60987, and the IEC 61513. In such standards, reliability is treated as a main consideration, and methods to analyze and improve the circuit reliability are highly required. The present dissertation introduces some methods to analyze and to improve the reliability of circuits in order to facilitate their qualification according to the aforementioned technical standards. Concerning reliability analysis, we first present a fault-injection based tool used to assess the reliability of digital circuits. Next, we introduce a method to evaluate the reliability of circuits taking into account the ability of a given application to tolerate errors. Concerning reliability improvement techniques, first two different strategies to selectively harden a circuit are proposed. Finally, a method to automatically partition a TMR design based on a given reliability requirement is introduced.PARIS-Télécom ParisTech (751132302) / SudocSudocFranceF

Delegating computation reliably : paradigms and constructions

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009.Cataloged from PDF version of thesis.Includes bibliographical references (p. 285-297).In an emerging computing paradigm, computational capabilities, from processing power to storage capacities, are offered to users over communication networks as a service. This new paradigm holds enormous promise for increasing the utility of computationally weak devices. A natural approach is for weak devices to delegate expensive tasks, such as storing a large file or running a complex computation, to more powerful entities (say servers) connected to the same network. While the delegation approach seems promising, it raises an immediate concern: when and how can a weak device verify that a computational task was completed correctly? This practically motivated question touches on foundational questions in cryptography and complexity theory. The focus of this thesis is verifying the correctness of delegated computations. We construct efficient protocols (interactive proofs) for delegating computational tasks. In particular, we present: e A protocol for delegating any computation, where the work needed to verify the correctness of the output is linear in the input length, polynomial in the computation's depth, and only poly-logarithmic in the computation's size. The space needed for verification is only logarithmic in the computation size. Thus, for any computation of polynomial size and poly-logarithmic depth (the rich complexity class N/C), the work required to verify the correctness of the output is only quasi-linear in the input length. The work required to prove the output's correctness is only polynomial in the original computation's size. This protocol also has applications to constructing one-round arguments for delegating computation, and efficient zero-knowledge proofs. * A general transformation, reducing the parallel running time (or computation depth) of the verifier in protocols for delegating computation (interactive proofs) to be constant. Next, we explore the power of the delegation paradigm in settings where mutually distrustful parties interact. In particular, we consider the settings of checking the correctness of computer programs and of designing error-correcting codes. We show: * A new methodology for checking the correctness of programs (program checking), in which work is delegated from the program checker to the untrusted program being checked. Using this methodology we obtain program checkers for an entire complexity class (the class of N/C¹-computations that are WNC-hard), and for a slew of specific functions such as matrix multiplication, inversion, determinant and rank, as well as graph functions such as connectivity, perfect matching and bounded-degree graph isomorphism. * A methodology for designing error-correcting codes with efficient decoding procedures, in which work is delegated from the decoder to the encoder. We use this methodology to obtain constant-depth (AC⁰) locally decodable and locally-list decodable codes. We also show that the parameters of these codes are optimal (up to polynomial factors) for constant-depth decoding.by Guy N. Rothblum.Ph.D

NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours