Design of low OSR, high precision analog-to-digital converters

Advances in electronic systems have lead to the demand for high resolution, high bandwidth Analog-to-Digital Converters (ADCs). Oversampled ADCs are well- known for high accuracy applications since they benefit from noise shaping and they usually do not need highly accurate components. However, as a consequence of oversampling, they have limited signal bandwidth. The signal bandwidth (BW) of oversampled ADCs can be increased either by increasing the sampling rate or reducing the oversampling ratio (OSR). Reducing OSR is a more promising method for increasing the BW, since the sampling speed is usually limited by the technology. The advantageous properties (e.g. low in-band quantization, relaxed accuracy requirements of components) of oversampled ADCs are usually diminished at lower OSRs and preserving these properties requires complicated and power hungry architectures. In this thesis, different combinations of delta-sigma and pipelined ADCs are explored and new techniques for designing oversampled ADCs are proposed. A Hybrid Delta-Sigma/Pipelined (HDSP) ADC is presented. This ADC uses a pipelined ADC as the quantizer of a single-loop delta-sigma modulator and benefits from the aggressive quantization of the pipelined quantizer at low OSRs. A Noise-Shaped Pipelined ADC is proposed which exploits a delta-sigma modulator as the sub-ADC of a pipeline stage to reduce the sensitivity to the analog imperfection. Three prototype ADCs were fabricated in 0.18μm CMOS technology to verify the effectiveness of the proposed techniques. The performance of these architectures is among the best reported for high bandwidth oversampled ADCs.Keywords: Delta-Sigma, Loop Filter, Oversampled ADC, Gain Stage, Pipeline, Noise Shapin

Low-voltage Low-power Switched-Capacitor ?S Modulator Design

Ph.DDOCTOR OF PHILOSOPH

ダイナミック・アナログ回路を用いる高精度AD変換器の設計技術に関する研究

東京都市大学2018年度（平成30年

A 8 mW 72 dB Sigma Delta-modulator ADC with 2.4 MHz BW in 130 nm CMOS

A double-sampling sigma delta-ADC with bilinear integrators and a 7-level quantizer is presented. It achieves third order noise shaping with a second order modulator through quantization noise-coupling. The modulator is integrated in a 130 nm CMOS technology. For a clock frequency of 48 MHz and an oversampling ratio of 20 (2.4 MHz signal bandwidth), it achieves 72 dB DR and 68 dB SNR. The prototype consumes 8 mW from a 1.2 V voltage supply

Design of a wideband low-power continuous-time sigma-delta (ΣΔ) analog-to-digital converter (ADC) in 90nm CMOS technology

The growing trend in VLSI systems is to shift more signal processing functionality from analog to digital domain to reduce manufacturing cost and improve reliability. It has resulted in the demand for wideband high-resolution analog-to-digital converters (ADCs). There are many different techniques for doing analog-to-digital conversions. Oversampling ADC based on sigma-delta (ΣΔ) modulation is receiving a lot of attention due to its significantly relaxed matching requirements on analog components. Moreover, it does not need a steep roll-off anti-aliasing filter. A ΣΔ ADC can be implemented either as a discrete time system or a continuous time one. Nowadays growing interest is focused on the continuous-time ΣΔ ADC for its use in the wideband and low-power applications, such as medical imaging, portable ultrasound systems, wireless receivers, and test equipments. A continuous-time ΣΔ ADC offers some important advantages over its discrete-time counterpart, including higher sampling frequency, intrinsic anti-alias filtering, much relaxed sampling network requirements, and low-voltage implementation. Especially it has the potential in achieving low power consumption. This dissertation presents a novel fifth-order continuous-time ΣΔ ADC which is implemented in a 90nm CMOS technology with single 1.0-V power supply. To speed up design process, an improved direct design method is proposed and used to design the loop filter transfer function. To maximize the in-band gain provided by the loop filter, thus maximizing in-band noise suppression, the excess loop delay must be kept minimum. In this design, a very low latency 4-bit flash quantizer with digital-to-analog (DAC) trimming is utilized. DAC trimming technique is used to correct the quantizer offset error, which allows minimum-sized transistors to be used for fast and low-power operation. The modulator has sampling clock of 800MHz. It achieves a dynamic range (DR) of 75dB and a signal-to-noise-and-distortion ratio (SNDR) of 70dB over 25MHz input signal bandwidth with 16.4mW power dissipation. Our work is among the most improved published to date. It uses the lowest supply voltage and has the highest input signal bandwidth while dissipating the lowest power among the bandwidths exceeding 15MHz

Extended-Range Second-Order Incremental Sigma-Delta ADC

A single-stage two-steps Extended-Range Second-Order Incremental ADC in 0.13um CMOS technology is presented here which achieves a Signal-to-Noise and Distortion Ratio (SNDR) as large as 73 dB. The proposed architecture of Extended-Range ADC based on Second-order multi-bit CIFF Incremental ADC reuses the IADC structure for coarse (input signal) as well as fine (residue) quantization without need of employment of explicit second ADC thereby minimizing power consumption and area occupancy. With a clock frequency of 80 MHz, the complete ERADC achieves in extracted simulation a peak SNDR of 73 dB at a data rate of 3.2 MS/s (25 clock cycles per conversion).A single-stage two-steps Extended-Range Second-Order Incremental ADC in 0.13um CMOS technology is presented here which achieves a Signal-to-Noise and Distortion Ratio (SNDR) as large as 73 dB. The proposed architecture of Extended-Range ADC based on Second-order multi-bit CIFF Incremental ADC reuses the IADC structure for coarse (input signal) as well as fine (residue) quantization without need of employment of explicit second ADC thereby minimizing power consumption and area occupancy. With a clock frequency of 80 MHz, the complete ERADC achieves in extracted simulation a peak SNDR of 73 dB at a data rate of 3.2 MS/s (25 clock cycles per conversion)

Design techniques for low power ADCs

This dissertation presents an incremental analog-to-digital converter (ADC) with digital digital-to-analog converter (DAC) mismatch correction. A theoretical time-domain analysis technique was developed to predict the noise performance of the incremental ADC, and a new optimization technique was proposed to minimize the output noise. In the calibration mode, the incremental ADC itself is used to measure the mismatches of the internal multi-bit DAC. Three new calibration techniques, equation-solving calibration, inter-DAC mismatch calibration and modified “Sarhang-Nejad” calibration are proposed. To verify the above techniques, a test chip was designed and fabricated in 0.18 µm CMOS process. The chip can work in single-sampling or double-sampling mode. Chopping with a fractal sequence is used to eliminate 1/f noise. The calibration circuit was implemented to calibrate the multi-bit DAC mismatches the in single-sampling mode and inter-DAC mismatches in the double-sampling mode. Finally, two new design techniques for low-power ADCs, the two-step split-junction successive-approximation register (SAR) ADC and the hybrid cascaded ∆Σ ADC, are proposed