ダイナミック・アナログ回路を用いる高精度AD変換器の設計技術に関する研究

東京都市大学2018年度（平成30年

Design techniques for low power ADCs

This dissertation presents an incremental analog-to-digital converter (ADC) with digital digital-to-analog converter (DAC) mismatch correction. A theoretical time-domain analysis technique was developed to predict the noise performance of the incremental ADC, and a new optimization technique was proposed to minimize the output noise. In the calibration mode, the incremental ADC itself is used to measure the mismatches of the internal multi-bit DAC. Three new calibration techniques, equation-solving calibration, inter-DAC mismatch calibration and modified “Sarhang-Nejad” calibration are proposed. To verify the above techniques, a test chip was designed and fabricated in 0.18 µm CMOS process. The chip can work in single-sampling or double-sampling mode. Chopping with a fractal sequence is used to eliminate 1/f noise. The calibration circuit was implemented to calibrate the multi-bit DAC mismatches the in single-sampling mode and inter-DAC mismatches in the double-sampling mode. Finally, two new design techniques for low-power ADCs, the two-step split-junction successive-approximation register (SAR) ADC and the hybrid cascaded ∆Σ ADC, are proposed

A Continuous-Time Delta-Sigma Modulator for Ultra-Low-Power Radios

The increasing need of digital signal processing for telecommunication and multimedia applications, implemented in complementary metal-oxide semiconductor (CMOS) technology, creates the necessity for high-resolution analog-to-digital converters (ADCs). Based on the sampling frequency, ADCs are of two types: Nyquist-rate converters and oversampling converters. Oversampling converters are preferred for low-bandwidth applications such as audio and instrumentation because they provide inherently high resolution when coupled with proper noise shaping. This allows to push noise out of signal band, thus increasing the signal-to-noise ratio (SNR). Continuous time delta-sigma ADCs are becoming more popular than discrete-time ADCs primarily because of inherent anti-aliasing filtering, reduced settling time and low-power consumption. In this thesis, a 2nd-order 4-bits continuous-time (CT) delta-sigma modulator (DSM) for radio applications is designed. It employs a 2nd-order loop filter with a single operational amplifier. Implemented in a 65-nanometer CMOS technology, the modulator runs on a 0.8-V supply and achieves a SNR of 70dB over a 500-kHz signal bandwidth. The modulator operates with an oversampling ratio (OSR) of 16 and a sampling frequency of 16MHz. In the first chapter the principles of ΔΣ modulators are analysed, introducing the differences between discrete-time (DT) modulators and continuous-time (CT) modulators. In the next chapter the techniques to design a ΔΣ modulators for ultra-low-power radios are presented. The third chapter talks over the design of the operational amplifier, which appears inside the loop filter. In the fourth chapter the performance of the complete ΔΣ modulator, which employs a flash quantizer, is shown. Finally, in the last chapter, a performance analysis is carried out replacing the flash quantizer with an asynchronous SAR quantizer. The analysis shows that a further reduction of the quantizer power consumption of about 40% is possible. The conjunction of this replacement with the power-saving technique implemented in the loop filter appears relevant

Digital Solutions for Analog Shortcomings in Delta-Sigma Analog-to-Digital Converters

Portable, high power efficiency communication devices is a growing market in the semiconductor industry. Analog-to-digital converters (ADC) are key interface that are used to digitize the sensed information. Recently, digital techniques have been proposed to improve analog building block power efficiency in sub-micron technologies. This research focuses on mixed signal approaches to improve the power efficiency of the noise shaping ADCs and mitigate analog inaccuracies such as non-linearity and mismatch. First, a novel continuous-time filtering delta-sigma ADC is proposed to save power and area. Digital techniques have been proposed to make the architecture more robust to out-of-band unwanted signals. A prototype was fabricated in a 65 nm CMOS technology achieving an SNDR of 72.4 dB operating at 250 MHz sampling frequency over 7 MHz bandwidth, with a power consumption of 16.3 mW. Next, A novel digital circuitry is proposed to improve the tolerance of a discrete-time delta sigma ADC to mismatch and enhance the resolution of an ADC in the presence of mismatch. A custom IC was fabricated in a 65 nm CMOS technology consuming 40.4 μA from a 1 V supply. It achieves 76.18 dB SNDR operating at 1.2 MHz sampling frequency and 25 kHz signal bandwidth

Power Efficient Architectures for High Accuracy Analog-to-Digital Converters

Incremental ADCs (IADCs) have found wide applications in sensor interface circuitry since, compared to ∆Σ ADCs, they provide low-latency high-accuracy conversion and easy multiplexing among multiple channels. On the other hand, continuous-time ∆Σ ADCs (CTDSM) have been receiving more and more attention as a power-efficient solution in targeting medium to high accuracy over wider range of signal bandwidth (tens of MHz). In this dissertation, novel configurations have been explored in both architectures for power-efficient and high-accuracy data conversion. First, a multi-step incremental ADC (IADC) using multi-slope extended counting technique is described. Only one active integrator is used in the three-step conversion cycle. The accuracy of the IADC is extended by having it configured as multi-slope ADCs in two additional steps. The proposed IADC uses the same circuitry as a first-order IADC (IADC1), but it exhibits as good efficiency as its second-order ∆Σ ADC counterpart. For the same accuracy, the conversion cycle is shortened by a factor of more than 2⁹ compared to the IADC1. Fabricated in 0.18-μm CMOS process, the prototype ADC occupies 0.5 mm². With a 642 kHz clock, it achieves SNDR of 52.2 dB in the first step. The SNDR is boosted to 79.8 dB in the second step, and to 96.8 dB in the third step, over a 1 kHz signal band. The power consumption is 35 µW from a 1.5 V power supply. This gives an excellent Schreier FoM of 174.6 dB. Secondly, a multi-step incremental ADC with extended binary counting is proposed. It achieves high accuracy by splitting one conversion cycle into two serial steps. During the first step, the ADC works as a first-order incremental ADC (IADC1). The second step reuses the single integrator and extends the accuracy to 16 bits by a two-capacitor SAR-assisted binary counting technique. For the same accuracy, the conversion cycle is shortened by a factor of more than 2⁸ as compared to the single-step IADC. Fabricated in 0.18-μm CMOS process, the SAR-assisted IADC achieves a peak SNR/SNDR/DR of 97.1/96.6/100.2 dB over a 1.2 kHz bandwidth, while dissipating 33.2 μW from a 1.5 V supply. This gives a Schreier FoM of 175.8 dB and Walden FoM of 0.25 pJ/conv.-step. Finally, the design of a continuous-time ∆Σ modulator (CTDSM) to be used in an ultrasound beamformer for biomedical imaging is described. To achieve better resolution, the prototype modulator operates at 1.2 GHz. It incorporates a digital excess loop delay (ELD) compensation to replace the active adder in front of the internal quantizer. A digitally controlled reference-switching matrix, combined with the data-weighted averaging (DWA) technique, results in a delay-free feedback path. A multi-bit FIR feedback DAC, along with its compensation path, is used to achieve lower clock jitter sensitivity and better loop filter linearity. The modulator achieves 79.4 dB dynamic range, 77.3 dB SNR and 74.3 dB SNDR over a 15 MHz signal bandwidth. Fabricated in a 65 nm CMOS process, the core modulator occupies an area of only 0.16 mm² and dissipates 6.96 mW from a 1 V supply. A 58.6 fJ/conversion-step figure of merit was achieved.Keywords: Incremental ADC, multi-step operation, instrumentation and measurement, sensor interface, analog-to-digital converter, extended counting, chopper stabilization, delta-sigma ADC, multi-slope ADCsKeywords: Incremental ADC, multi-step operation, instrumentation and measurement, sensor interface, analog-to-digital converter, extended counting, chopper stabilization, delta-sigma ADC, multi-slope ADC

Design techniques for low noise and high speed A/D converters

Analog-to-digital (A/D) conversion is a process that bridges the real analog world to digital signal processing. It takes a continuous-time, continuous amplitude signal as its input and outputs a discrete-time, discrete-amplitude signal. The resolution and sampling rate of an A/D converter vary depending on the application. Recently, there has been a growing demand for broadband (>1 MHz), high-resolution (>14bits) A/D converters. Applications that demand such converters include asymmetric digital subscriber line (ADSL) modems, cellular systems, high accuracy instrumentation, and medical imaging systems. This thesis suggests some design techniques for such high resolution and high sampling rate A/D converters. As the A/D converter performance keeps on increasing it becomes increasingly difficult for the input driver to settle to required accuracy within the sampling time. This is because of the use of larger sampling capacitor (increased resolution) and a decrease in sampling time (higher speed). So there is an increasing trend to have a driver integrated onchip along with A/D converter. The first contribution of this thesis is to present a new precharge scheme which enables integrating the input buffer with A/D converter in standard CMOS process. The buffer also uses a novel multi-path common mode feedback scheme to stabilize the common mode loop at high speeds. Another major problem in achieving very high Signal to Noise and Distortion Ratio (SNDR) is the capacitor mismatch in Digital to Analog Converters (DAC) inherent in the A/D converters. The mismatch between the capacitor causes harmonic distortion, which may not be acceptable. The analysis of Dynamic Element Matching (DEM) technique as applicable to broadband data-converters is presented and a novel second order notch-DEM is introduced. In this thesis we present a method to calibrate the DAC. We also show that a combination of digital error correction and dynamic element matching is optimal in terms of test time or calibration time. Even if we are using dynamic element matching techniques, it is still critical to get the best matching of unit elements possible in a given technology. The matching obtained may be limited either by random variations in the unit capacitor or by gradient effects. In this thesis we present layout techniques for capacitor arrays, and the matching results obtained in measurement from a test-chip are presented. Thus we present various design techniques for high speed and low noise A/D converters in this thesis. The techniques described are quite general and can be applied to most of the types of A/D converters

Design techniques for wideband low-power Delta-Sigma analog-to-digital converters

Delta-Sigma (ΔΣ) analog-to-digital converters (ADCs) are traditionally used in high quality audio systems, instrumentation and measurement (I&M) and biomedical devices. With the continued downscaling of CMOS technology, they are becoming popular in wideband applications such as wireless and wired communication systems,high-definition television and radar systems. There are two general realizations of a ΔΣ modulator. One is based on the discrete-time (DT) switched-capacitor (SC) circuitry and the other employs continuous-time (CT) circuitry. Compared to a CT structure, the DT ΔΣ ADC is easier to analyze and design, is more robust to process variations and jitter noise, and is more flexible in the multi-mode applications. On the other hand, the CT ΔΣ ADC does not suffer from the strict settling accuracy requirement for the loop filter and thus can achieve lower power dissipation and higher sampling frequency than its DT counterpart. In this thesis, both DT and CT ΔΣ ADCs are investigated. Several design innovations, in both system-level and circuit-level, are proposed to achieve lower power consumption and wider signal bandwidth. For DT ΔΣ ADCs, a new dynamic-biasing scheme is proposed to reduce opamp bias current and the associated signal-dependent harmonic distortion is minimized by using the low-distortion architecture. The technique was verified in a 2.5MHz BW and 13bit dynamic range DT ΔΣ ADC. In addition, a second-order noise coupling technique is presented to save two integrators for the loop filter, and to achieve low power dissipation. Also, a direct-charge-transfer (DCT) technique is suggested to reduce the speed requirements of the adder, which is also preferable in wideband low-power applications. For CT ΔΣ ADCs, a wideband low power CT 2-2 MASH has been designed. High linearity performance was achieved by using a modified low-distortion technique, and the modulator achieves higher noise-shaping ability than the single stage structure due to the inter-stage gain. Also, the quantization noise leakage due to analog circuit non-idealities can be adaptively compensated by a designed digital calibration filter. Using a 90nm process, simulation of the modulator predicts a 12bit resolution within 20MHz BW and consumes only 25mW for analog circuitry. In addition, the noise-coupling technique is investigated and proposed for the design of CT ΔΣ ADCs and it is promising to achieve low power dissipation for wideband applications. Finally, the application of noise-coupling technique is extended and introduced to high-accuracy incremental data converters. Low power dissipation can be expected

A 90.5dB DR 1MHz BW Hybrid Two Step ADC with CT Incremental and SAR ADCs

The sensors in real time data processing IoT devices require high resolution and sub-MHz data converters, usually implemented as Incremental ADCs due to the advantages of oversampling technique and low latency. In discrete time incremental (IDT) ADCs, the sampling switch non-linearity, charge injection degrade the resolution, and power hungry OPAMPs are demanded to provide fast and accurate settling for the switch-capacitor circuits. While the continuous time incremental (ICT) ADCs overcome these issues by removing the sampling switches and it also relax the OPAMPs settling accuracy to save power. A hybrid architecture of ICT ADC and SAR two step ADC is proposed to achieve high resolution at low oversampling ratio (OSR). The first ICT ADCs enable higher resolution, faster conversion speed with lower power consumption. The residual error of the ICT ADC is extracted at the last integrator output and transfers to the 2nd SAR for further conversion. In this architecture, only the mismatch between the cascade of integrators (CoIs) and decimation filter transfer functions causes 1st stage quantization noise leakage which can be solved by increasing opamp parameters instead of increasing the digital decimation filter complexity. In addition, the overall SQNR is independent of the first ICT ADC’s NTF, which gives more freedom to trade-off between the loop stability and DAC errors. A 4bits DRZ DAC with data weighted averaging (DWA) technique is adopted to reduce the clock jitter of DAC, mitigate ISI error and static mismatch errors. Based on this architecture, a 16b resolution, 1MHz signal bandwidth hybrid two step ADC is designed and measurement results are demonstrated. Important sub circuits are introduced and analyzed in detail to get the target resolution. The ADC is fabricated in AKM 180nm CMOS process with 1.8V supply voltage, it achieves a DR of 90.5dB, and SNR/SFDR/SNDR of 82.5dB/85dB/80.5dB over 1MHz BW sampled at 64MHz