343 research outputs found

    A robust 2.4 GHz time-of-arrival based ranging system with sub-meter accuracy: feasibility study and realization of low power CMOS receiver

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    Draadloze sensornetwerken worden meer en meer aangewend om verschillende soorten informatie te verzamelen. De locatie, waar deze informatie verzameld is, is een belangerijke eigenschap en voor sommige toepassingen, zoals het volgen van personen of goederen, zelfs de meest belangrijke en mogelijkmakende factor. Om de positie van een sensor te bepalen, is een technologie nodig die de afstand tot een gekend referentiepunt schat. Door verschillende afstandsmetingen te combineren, is het mogelijk de absolute locatie van de node te berekenen

    Analysis and Design of High-Speed A/D Converters in SiGe Technology

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    Mixed-signal systems play a key role in modern communications and electronics. The quality of A/D and D/A conversions deeply affects what we see and what we hear in the real world video and radio. This dissertation deals with high-speed ADCs: a 5-bit 500-MSPS ADC and an 8-bit 2-GSPS ADC. These units can be applied in flat panel display, image enhancement and in high-speed data link. To achieve the state-of-the-art performance, we employed a 0.13-μm/2.5-V 210-GHz (unity-gain frequency) BiCMOS SiGe process for all the implementations. The circuit building blocks, such as the Track-and-Hold circuit (T/H) and the comparator, required by an ADC not only benefit from SiGe's superior ultra-high frequency properties but also by its power drive capability. The T/H described here achieved a dynamic performance of 8-bit accuracy at 2-GHz Nyquist rate with an input full scale range of 1 Vp-p. The T/H consumed 13 mW of power. The unique 4-in/2-out comparator was made of fully differential emitter couple pairs in order to operate at such a high frequency. Cascaded cross-coupled amplifier core was employed to reduce Miller effect and to avoid collector-emitter breakdown of the HBTs. We utilized the comparator interpolation technique between the preamplifer stages and the latches to reduce the total power dissipated by the comparator array. In addition, we developed an innovative D/A conversion and analog subtraction approach necessary for two-step conversion by using a bipolar pre-distortion technique. This innovation enabled us to decrease the design complexity in the subranging process of a two-step ADC. The 5-bit interpolating ADC operated at 2-GSPS achieved a differential nonlinearity (DNL) of 0.114 LSB and an integral nonlinearity (INL) of 0.076 LSB. The effective number of bits (ENOBs) are 4.3 bits at low frequency and 4.1 bits near Nyquist rate. The power dissipation was reduced more than half to 66.14 mW, with comparator interpolation. The 8-bit two-step interpolating ADC operated at 500-MSPS. It achieved a DNL of 0.33 LSB and an INL of 0.40 LSB with a power consumption of 172 mW. The ENOBs are 7.5 bits at low frequency and 6.9 bits near Nyquist rate

    Design of Power Management Integrated Circuits and High-Performance ADCs

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    A battery-powered system has widely expanded its applications to implantable medical devices (IMDs) and portable electronic devices. Since portable devices or IMDs operate in the energy-constrained environment, their low-power operations in combination with efficiently sourcing energy to them are key problems to extend device life. This research proposes novel circuit techniques for two essential functions of a power receiving unit (PRU) in the energy-constrained environment, which are power management and signal processing. The first part of this dissertation discusses power management integrated circuits for a PRU. From a power management perspective, the most critical two circuit blocks are a front-end rectifier and a battery charger. The front-end CMOS active rectifier converts transmitted AC power into DC power. High power conversion efficiency (PCE) is required to reduce power loss during the power transfer, and high voltage conversion ratio (VCR) is required for the rectifier to enable low-voltage operations. The proposed 13.56-MHz CMOS active rectifier presents low-power circuit techniques for comparators and controllers to reduce increasing power loss of an active diode with offset/delay calibration. It is implemented with 5-V devices of a 0.35 µm CMOS process to support high voltage. A peak PCE of 89.0%, a peak VCR of 90.1%, and a maximum output power of 126.7 mW are measured for 200Ω loading. The linear battery charger stores the converted DC power into a battery. Since even small power saving can be enough to run the low-power PRU, a battery charger with low IvQ is desirable. The presented battery charger is based on a single amplifier for regulation and the charging phase transition from the constant-current (CC) phase to the constant-voltage (CV) phase. The proposed unified amplifier is based on stacked differential pairs which share the bias current. Its current-steering property removes multiple amplifiers for regulation and the CC-CV transition, and achieves high unity-gain loop bandwidth for fast regulation. The charger with the maximum charging current of 25 mA is implemented in 0.35 µm CMOS. A peak charger efficiency of 94% and average charger efficiency of 88% are achieved with an 80-mAh Li-ion polymer battery. The second part of this dissertation focuses on analog-to-digital converters (ADCs). From a signal processing perspective, an ADC is one of the most important circuit blocks in the PRU. Hence, an energy-efficient ADC is essential in the energy-constrained environment. A pipelined successive approximation register (SAR) ADC has good energy efficiency in a design space of moderate-to-high speeds and resolutions. Process-Voltage-Temperature variations of a dynamic amplifier in the pipelined-SAR ADC is a key design issue. This research presents two dynamic amplifier architectures for temperature compensation. One is based on a voltage-to-time converter (VTC) and a time-to-voltage converter (TVC), and the other is based on a temperature-dependent common-mode detector. The former amplifier is adopted in a 13-bit 10-50 MS/s subranging pipelined-SAR ADC fabricated in 0.13-µm CMOS. The ADC can operate under the power supply voltage of 0.8-1.2 V. Figure-of-Merits (FoMs) of 4-11.3 fJ/conversion-step are achieved. The latter amplifier is also implemented in 0.13-µm CMOS, consuming 0.11 mW at 50 MS/s. Its measured gain variation is 2.1% across the temperature range of -20°C to 85 °C

    Analog baseband circuits for sensor systems

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    This thesis is composed of six publications and an overview of the research topic, which also summarizes the work. The research presented in this thesis focuses on research into analog baseband circuits for sensor systems. The research is divided into three different topics: the integration of analog baseband circuits into a radio receiver for sensor applications; the integration of an ΔΣ modulator A/D converter into a GSM/WCDMA radio receiver for mobile phones, and the integration of algorithmic A/D converters for a capacitive micro-accelerometer interface. All the circuits are implemented using deep sub-micron CMOS technologies. The work summarizes the design of different blocks for sensor systems. The research into integrated analog baseband circuits for a radio receiver focuses on a circuit structures with a very low power dissipation and that can be implemented using only standard CMOS technologies. The research into integrated ΔΣ modulator A/D converter design for a GSM/WCDMA radio receiver for mobile phones focuses on the implications for analog circuit design emerging from using a very deep sub-micron CMOS process. Finally, in the research into algorithmic A/D converters for a capacitive microaccelerometer interface, new ways of achieving a good performance with low power dissipation, while also minimizing the silicon area of the integrated A/D converter are introduced

    Design and debugging of multi-step analog to digital converters

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    With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

    High resolution, process and temperature compensated phase shifter design using a self generated look up table

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    Phase resolution is one of the most important parameters in phased array RADAR determining the precision of antenna beam direction and side-lobe level. Especially, in tracking applications the antenna directivity should be high and side-lobe levels must be low in order to abstain from the signals of Jammers. Phase shifters (PS) set phase resolution and directivity; therefore, they are the key components for phased arrays. Among the PS topologies, vector sum type comes forward due to its significant advantage over the other design techniques, in terms of insertion loss, phase error, area and operation bandwidth. However, in design of vector sum type PS, phase and amplitude errors in vectors, and phase insertion of variable gain amplifiers degrades the phase resolution performance of the PS. In order to overcome these issues and improve bit resolution (reduced phase step size and lower phase error while covering 360° phase range), and improve the tolerance on process - temperature variations, the proposed solution in this thesis is the design of a calibration circuit consisting of Power detector (PD), Analog to Digital Converter (ADC) and a Digital Processing Unit (DPU). The main objective of the calibration loop is the generation of a Look up Table (LUT) for target frequency band and at operating temperature. With this technique, the first 7-bit Phase shifter is designed in SiGe- BiCMOS technology, which also has highest fractional bandwidth in literature

    Parametric analog signal amplification applied to nanoscale cmos wireless digital transceivers

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    Thesis presented in partial fulfillment of the requirements for the degree of Doctor of Philosophy in the subject of Electrical and Computer Engineering by the Universidade Nova de Lisboa,Faculdade de Ciências e TecnologiaSignal amplification is required in almost every analog electronic system. However noise is also present, thus imposing limits to the overall circuit performance, e.g., on the sensitivity of the radio transceiver. This drawback has triggered a major research on the field, which has been producing several solutions to achieve amplification with minimum added noise. During the Fifties, an interesting out of mainstream path was followed which was based on variable reactance instead of resistance based amplifiers. The principle of these parametric circuits permits to achieve low noise amplifiers since the controlled variations of pure reactance elements is intrinsically noiseless. The amplification is based on a mixing effect which enables energy transfer from an AC pump source to other related signal frequencies. While the first implementations of these type of amplifiers were already available at that time, the discrete-time version only became visible more recently. This discrete-time version is a promising technique since it is well adapted to the mainstream nanoscale CMOS technology. The technique itself is based on the principle of changing the surface potential of the MOS device while maintaining the transistor gate in a floating state. In order words, the voltage amplification is achieved by changing the capacitance value while maintaining the total charge unchanged during an amplification phase. Since a parametric amplifier is not intrinsically dependent on the transconductance of the MOS transistor, it does not directly suffer from the intrinsic transconductance MOS gain issues verified in nanoscale MOS technologies. As a consequence, open-loop and opamp free structures can further emerge with this additional contribution. This thesis is dedicated to the analysis of parametric amplification with special emphasis on the MOS discrete-time implementation. The use of the latter is supported on the presentation of several circuits where the MOS Parametric Amplifier cell is well suited: small gain amplifier, comparator, discrete-time mixer and filter, and ADC. Relatively to the latter, a high speed time-interleaved pipeline ADC prototype is implemented in a,standard 130 nm CMOS digital technology from United Microelectronics Corporation (UMC). The ADC is fully based on parametric MOS amplification which means that one could achieve a compact and MOS-only implementation. Furthermore, any high speed opamp has not been used in the signal path, being all the amplification steps implemented with open-loop parametric MOS amplifiers. To the author’s knowledge, this is first reported pipeline ADC that extensively used the parametric amplification concept.Fundação para a Ciência e Tecnologia through the projects SPEED, LEADER and IMPAC

    Nyquist-Rate Switched-Capacitor Analog-to-Digital Converters

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    The miniaturization and digitization of modern microelectronic systems have made Analog-to-Digital converters (ADC) key building components in many applications. Internet and entertainment technologies demand higher and higher performance from the hardware components in many communication and multimedia systems, but at the same time increased mobility demands less and less power consumption. Many applications, such as instrumentation, video, radar and communications, require very high accuracy and speed and with resolutions up to 16 bits and sampling rates in the 100s of MHz, pipelined ADCs are very suitable for such purposes. Resolutions above 10 bits often require very high power consumption and silicon area if no error correction technique is employed. Calibration relaxes the accuracy requirement of the individual building blocks of the ADC and enables power and area savings. Digital calibration is preferred over analog calibration due to higher robustness and accuracy. Furthermore, the microprocessors that process the digital information from the ADCs have constantly reduced cost and power consumption and improved performance due to technology scaling and innovative microprocessor architectures. The work in this dissertation presents a novel digital background calibration technique for high-speed, high-resolution pipelined ADCs. The technique is implemented in a 14 bit, 100 MS/s pipelined ADC fabricated in Taiwan Semiconductor Manufacturing Company (TSMC) 0.13µm Complementary Metal Oxide Semiconductor (CMOS) digital technology. The prototype ADC achieves better than 11.5 bits linearity at 100 MS/s and achieves a best-in-class figure of merit of 360 fJ/conversion-step. The core ADC has a power consumption of 105 mW and occupies an active area of 1.25 mm^2. The work in this dissertation also presents a low-power, 8-bit algorithmic ADC. This ADC reduces power consumption at system level by minimizing voltage reference generation and ADC input capacitance. This ADC is implemented in International Business Machines Corporation (IBM) 90nm digital CMOS technology and achieves around 7.5 bits linearity at 0.25 MS/s with a power consumption of 300 µW and an active area of 0.27 mm^2

    Design of a Cost-Efficient Reconfigurable Pipeline ADC

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    Power budget is very critical in the design of battery-powered implantable biomedical instruments. High speed, high resolution and low power usually cannot be achieved at the same time. Therefore, a tradeoff must be made to compromise every aspect of those features. As the main component of the bioinstrument, high conversion rate, high resolution ADC consumes most of the power. Fortunately, based on the operation modes of the bioinstrument, a reconfigurable ADC can be used to solve this problem. The reconfigurable ADC will operate at 10-bit 40 MSPS for the diagnosis mode and at 8-bit 2.5 MSPS for the monitor mode. The ADC will be completely turned off if no active signal comes from sensors or if an off command is received from the antenna. By turning off the sample hold stage and the first two stages of the pipeline ADC, a significant power saving is achieved. However, the reconfigurable ADC suffers from two drawbacks. First, the leakage signals through the extra off-state switches in the third stage degrade the performance of the data converter. This situation tends to be even worse for high speed and high-resolution applications. An interference elimination technique has been proposed in this work to solve this problem. Simulation results show a significant attenuation of the spurious tones. Moreover, the transistors in the OTA tend to operate in weak inversion region due to the scaling of the bias current. The transistor in subthreshold is very slow due to the small transit frequency. In order to get a better tradeoff between the transconductance efficiency and the transit frequency, reconfigurable OTAs and scalable bias technique are devised to adjust the operating point from weak inversion to moderate inversion. The figure of merit of the reconfigurable ADC is comparable to the previously published conventional pipeline ADCs. For the 10-bit, 40 MSPS mode, the ADC attains a 56.9 dB SNDR for 35.4 mW power consumption. For the 8-bit 2.5 MSPS mode, the ADC attains a 49.2 dB SNDR for 7.9 mW power consumption. The area for the core layout is 1.9 mm2 for a 0.35 micrometer process
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