Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

Wireless System on Virtual Platform Evaluation

The most common way to develop System-on-Chip's (SoC) today is to utilize hardware design on a Field programmable gate array (FPGA). By utilizing the hardware on an FPGA, the opportunity to verify the hardware and start software design before implementing the final solution on silicon is possible. However, using an FPGA as a reference model for a final design gives a slightly imprecise estimation regarding required hardware such as memory and bus sizes. Trying to counteract this weakness, specific Electronic System-Level (ESL) Design tools has been developed in order to simplify production and increase capabilities to analyze and optimize during the developing phase. ARM SoC Designer is such a tool which provides a virtual environment for simulation of integrated SoC’s to simulate whole systems at a cycle accurate level. This Master's Thesis intend to evaluate ARM SoC Designer aspects and validity as an alternative to an FPGA when implementing and verifying a larger SoC system. To provide a thorough assessment of ARM SoC Designer, a cycle accurate model of the digital signal processing system of a general NB-IoT system was to be built and verified. Results shown, reveal that an implementation in ARM SoC Designer can be a valid representation of a preexisting wireless NB-IoT system currently developed on an FPGA board. Also that SoC Designer adds some very useful functionalities to traditional SoC development techniques but not without some significant flaws.With rising complexity and highly competitive market of integrated circuits, new techniques to develop embedded systems are always needed in order to secure the quality and to streamline the production of circuits. The tool ARM SoC Designer tries to accomplish this through adjusting traditional System-on-Chip development by adding debugging and troubleshooting capabilities not present in current design techniques. The question is, will the use of SoC Designer help? A System-on-Chip (SoC) is an especially designed chip that combines required electronic circuits of different components onto a single integrated chip, usually not bigger than a thumbnail. By directly building a chip containing all desired components instead of assemble multiple chips together makes it possible to manufacture the chips as small as possible and at the same time make them faster and more energy efficient than before. But the tininess of a SoC and the numerous amount components it is going to contain makes it also to a very complex system with a long and expensive developing process, where faults and errors are very hard to find and eliminate. The procedure of designing and developing SoC have been almost the same for a very long time. But with the rising demands on chips with more capacity in less area puts a lot of pressure on the manufacturers in the industry. Therefore manufacturers and developers have been starting to look for better design tools to increase the possibility to analyze and optimize during development. One of these tools are ARM SoC Designer which provides a virtual environment for simulation of integrated SoC's with the promise of great debugging and verifying capabilities. ARM SoC Designer are able to do this by allowing the user to simulate the process step by step and to easily modify system parameters. In order to evaluate ARM SoC Designer, a virtual model of an existing wireless system was built, tested and verified in the virtual environment. Different tests to analyze performance, accuracy, and debug- and troubleshooting capabilities were constructed and performed. With results showing great promise in categories accuracy and debugging, but left some things to be desired with performance and usability. This thesis can confirm that ARM SoC Designer does deliver an accurate representation of a SoC and that the verification capabilities are extremely helpful during implementation and testing. But, at the current performance in combination with a less good user experience, a steep learning curve and scarce documentation makes it difficult to recommend during a daily development basis. However, ARM SoC Designer shows a lot of promise if the usability can be enhanced slightly and performance be improved upon to such an extent that downtime of simulations won't be the majority of time consumed during usage

Testability considerations for implementing an embedded memory subsystem

textThere are a number of testability considerations for VLSI design, but test coverage, test time, accuracy of test patterns and correctness of design information for DFD (Design for debug) are the most important ones in design with embedded memories. The goal of DFT (Design-for-Test) is to achieve zero defects. When it comes to the memory subsystem in SOCs (system on chips), many flavors of memory BIST (built-in self test) are able to get high test coverage in a memory, but often, no proper attention is given to the memory interface logic (shadow logic). Functional testing and BIST are the most prevalent tests for this logic, but functional testing is impractical for complicated SOC designs. As a result, industry has widely used at-speed scan testing to detect delay induced defects. Compared with functional testing, scan-based testing for delay faults reduces overall pattern generation complexity and cost by enhancing both controllability and observability of flip-flops. However, without proper modeling of memory, Xs are generated from memories. Also, when the design has chip compression logic, the number of ATPG patterns is increased significantly due to Xs from memories. In this dissertation, a register based testing method and X prevention logic are presented to tackle these problems. An important design stage for scan based testing with memory subsystems is the step to create a gate level model and verify with this model. The flow needs to provide a robust ATPG netlist model. Most industry standard CAD tools used to analyze fault coverage and generate test vectors require gate level models. However, custom embedded memories are typically designed using a transistor-level flow, there is a need for an abstraction step to generate the gate models, which must be equivalent to the actual design (transistor level). The contribution of the research is a framework to verify that the gate level representation of custom designs is equivalent to the transistor-level design. Compared to basic stuck-at fault testing, the number of patterns for at-speed testing is much larger than for basic stuck-at fault testing. So reducing test and data volume are important. In this desertion, a new scan reordering method is introduced to reduce test data with an optimal routing solution. With in depth understanding of embedded memories and flows developed during the study of custom memory DFT, a custom embedded memory Bit Mapping method using a symbolic simulator is presented in the last chapter to achieve high yield for memories.Electrical and Computer Engineerin

Integration of a Digital Built-in Self-Test for On-Chip Memories

The ability of testing on-chip circuitry is extremely essential to ASIC implemen- tations today. However, providing functional tests and verification for on-chip (embedded) memories always poses a huge number of challenges to the designer. Therefore, a co-existing automated built-in self-test block with the Design Under Test (DUT) seems crucial to provide comprehensive, efficient and robust testing features. The target DUT of this thesis project is the state-of-the-arts Ultra Low Power (ULP) dual-port SRAMs designed in ASIC group of EIT department at Lund University. This thesis starts from system RTL modeling and verification from an earlier project, and then goes through ASIC design phase in 28 nm FD-SOI technology from ST-Microelectronics. All scripts during the ASIC design phase are developed in TCL. This design is implemented with multiple power domains (using CPF approach and introducing level-shifters at crossing-points between domains) and multiple clock sources in order to make it possible to perform various measurements with a high reliability on different flavours of a dual-port SRAM.This design is able to reduce dramatically the complexity of verification and measurement to integrated memories. This digital integrated circuit (IC) is developed as an application-specific IC (ASIC) chip for functional verification of integrated memories and measuring them in different aspects such as power consumption. The design is automated and capable of being reconfigured easily in terms of required actions and data for testing on-chip memories. Put it in other words, this design has automated and optimized the generation of what data to be stored on which location on memories as well as how they have been treated and interpreted later on. For instance, it refreshes and delivers different operation modes and working patterns to the entire test system in order to fully utilize integrated memories, of which such an automation is instructed by the stimuli to the chip. Besides, the pattern generation of the stimuli is implemented on MATLAB in an automated way. Due to constant advancements in chip manufacturing technology, more devices are squeezed into the same silicon area. Meaning that in order to monitor more internal signals introduced by the increased complexity of the circuits, more dedicated input/output ports (the physical interface between the chip internal signals and outside world) are required, that makes the chip bonding and testing in the future difficult and time-consuming. Additionally, memories usually have a bigger number of pins for signal reactions than other circuit blocks do, the method of dealing with so many pins should also be taken into account. Thus, a few techniques are adopted in this system to assist the designers deal with all mentioned issues. Once the ASIC chip has been fabricated (manufactured) and bonded, the on-chip memories can be tested directly on a printed circuit board in a simple and flexible way: Once test instruction input is loaded into the chip, the system starts to update the system settings and then to generate the internal configurations(parameters) so that all different operations, modes or instructions related to memory testing are automatically processed

Exploring the Mysteries of System-Level Test

System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.Comment: 7 pages, 2 figure

Validation and verification of the interconnection of hardware intellectual property blocks for FPGA-based packet processing systems

As networks become more versatile, the computational requirement for supporting additional functionality increases. The increasing demands of these networks can be met by Field Programmable Gate Arrays (FPGA), which are an increasingly popular technology for implementing packet processing systems. The fine-grained parallelism and density of these devices can be exploited to meet the computational requirements and implement complex systems on a single chip. However, the increasing complexity of FPGA-based systems makes them susceptible to errors and difficult to test and debug. To tackle the complexity of modern designs, system-level languages have been developed to provide abstractions suited to the domain of the target system. Unfortunately, the lack of formality in these languages can give rise to errors that are not caught until late in the design cycle. This thesis presents three techniques for verifying and validating FPGA-based packet processing systems described in a system-level description language. First, a type system is applied to the system description language to detect errors before implementation. Second, system-level transaction monitoring is used to observe high-level events on-chip following implementation. Third, the high-level information embodied in the system description language is exploited to allow the system to be automatically instrumented for on-chip monitoring. This thesis demonstrates that these techniques catch errors which are undetected by traditional verification and validation tools. The locations of faults are specified and errors are caught earlier in the design flow, which saves time by reducing synthesis iterations

Master of Science

thesisThis thesis designs, implements, and evaluates modular Open Core Protocol (OCP) interfaces for Intellectual Property (IP) cores and Network-on-Chip (NoC) that re- duces System-On-Chip (SoC) design time and enables research on di erent architectural sequencing control methods. To utilize the NoCs design time optimization feature at the boundaries, a standardized industry socket was required, which can address the SoC shorter time-to-market requirements, design issues, and also the subsequent reuse of developed IP cores. OCP is an open industry standard socket interface speci cation used in this research to enable the IP cores reusability across multiple SoC designs. This research work designs and implements clocked OCP interfaces between IP cores and On-Chip Network Fabric (NoC), in single- and multi- frequency clocked domains. The NoC interfaces between IP cores and on-chip network fabric are implemented using the standard network interface structure. It consists of back-end and front-end submodules corresponding to customized interfaces to IP cores or network fabric and OCP Master and Slave entities, respectively. A generic domain interface (DI) protocol is designed which acts as the bridge between back-end and front-end submodules for synchronization and data ow control. Clocked OCP interfaces are synthesized, placed and routed using IBM's 65nm process technology. The implemented designs are veri ed for OCP compliance using SOLV (Sonics OCP Library for Veri cation). Finally, this thesis reports the performance metrics such as design target frequency of operation, latency, area, energy per transaction, and maximum bandwidth across network on-chip for single- and multifrequency clocked designs

Securing IEEE P1687 On-chip Instrumentation Access Using PUF

As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip designs increases at an exponential rate. Such structures serve various purposes throughout the life-cycle of VLSI circuits, e.g. in post-silicon validation and debug, production test and diagnosis, as well as during in-field test and maintenance. Reliable access mechanisms for embedded instruments are therefore key to rapid chip development and secure system maintenance. Reconfigurable scan networks defined by IEEE Std. P1687 emerge as a scalable and cost-effective access medium for on-chip instrumentation. The accessibility offered by reconfigurable scan networks contradicts security and safety requirements for embedded instrumentation. Embedded instrumentation is an integral system component that remains functional throughout the lifetime of a chip. To prevent harmful activities, such as tampering with safety-critical systems, and reduce the risk of intellectual property infringement, the access to embedded instrumentation requires protection. This thesis provides a novel, Physical Unclonable Function (PUF) based secure access method for on-chip instruments which enhances the security of IJTAG network at low hardware cost and with less routing congestion

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies

This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis