Design, analysis and evaluation of sigma-delta based beamformers for medical ultrasound imaging applications

The inherent analogue nature of medical ultrasound signals in conjunction with the abundant merits provided by digital image acquisition, together with the increasing use of relatively simple front-end circuitries, have created considerable demand for single-bit beamformers in digital ultrasound imaging systems. Furthermore, the increasing need to design lightweight ultrasound systems with low power consumption and low noise, provide ample justification for development and innovation in the use of single-bit beamformers in ultrasound imaging systems. The overall aim of this research program is to investigate, establish, develop and confirm through a combination of theoretical analysis and detailed simulations, that utilize raw phantom data sets, suitable techniques for the design of simple-to-implement hardware efficient digital ultrasound beamformers to address the requirements for 3D scanners with large channel counts, as well as portable and lightweight ultrasound scanners for point-of-care applications and intravascular imaging systems. In addition, the stability boundaries of higher-order High-Pass (HP) and Band-Pass (BP) Σ−Δ modulators for single- and dual- sinusoidal inputs are determined using quasi-linear modeling together with the describing-function method, to more accurately model the modulator quantizer. The theoretical results are shown to be in good agreement with the simulation results for a variety of input amplitudes, bandwidths, and modulator orders. The proposed mathematical models of the quantizer will immensely help speed up the design of higher order HP and BP Σ−Δ modulators to be applicable for digital ultrasound beamformers. Finally, a user friendly design and performance evaluation tool for LP, BP and HP modulators is developed. This toolbox, which uses various design methodologies and covers an assortment of modulators topologies, is intended to accelerate the design process and evaluation of modulators. This design tool is further developed to enable the design, analysis and evaluation of beamformer structures including the noise analyses of the final B-scan images. Thus, this tool will allow researchers and practitioners to design and verify different reconstruction filters and analyze the results directly on the B-scan ultrasound images thereby saving considerable time and effort

Design of a Low Voltage Class AB Variable Gain Amplifier (VGA)

A variable gain amplifier (VGA) is one of the most significant component in many applications such as analog to digital converter (ADC). In communication receiver, VGA is typically employed in a feedback loop to realize an automatic gain control (AGC), to provide constant signal power to baseband analog-to-digital converter (ADC) for unpredictable received signal strengths. Gain range, power consumption and bandwidth of ADC are strongly influenced by the performance of operational amplifier. VGA is the key element for amplifying process in ADC. However, current class AB VGA is experiencing the limit of bandwidth, which is not suitable for high speed automatic gain control AGC. In order to overcome these limitations a high linearity and wide bandwidth of VGA is indispensable. The aim of this research is to get higher gain and larger bandwidth for VGA. In this research, a low cost, low power voltage and wide bandwidth class AB VGA is designed to mitigate this constraint. Superiority of the proposed VGA has been confirmed by circuit simulation using CEDEC 0.18-μm CMOS process with the help of tools from Mentor Graphics in designing a 100-MHz VGA under 1V supply voltage draining total static power consumption less than 125uW. The results show that the circuit is able to work with high linearity and wide bandwidth by varying Rf and Rs. Therefore, the frequency response (Gain) and the wide bandwidth of this class AB VGA is better than previously reported class AB VGA. Consequently, this modified class AB VGA is appropriate for high speed applications

Design of sigma-delta modulators for analog-to-digital conversion intensively using passive circuits

This thesis presents the analysis, design implementation and experimental evaluation of passiveactive discrete-time and continuous-time Sigma-Delta (ΣΔ) modulators (ΣΔMs) analog-todigital converters (ADCs). Two prototype circuits were manufactured. The first one, a discrete-time 2nd-order ΣΔM, was designed in a 130 nm CMOS technology. This prototype confirmed the validity of the ultra incomplete settling (UIS) concept used for implementing the passive integrators. This circuit, clocked at 100 MHz and consuming 298 μW, achieves DR/SNR/SNDR of 78.2/73.9/72.8 dB, respectively, for a signal bandwidth of 300 kHz. This results in a Walden FoMW of 139.3 fJ/conv.-step and Schreier FoMS of 168 dB. The final prototype circuit is a highly area and power efficient ΣΔM using a combination of a cascaded topology, a continuous-time RC loop filter and switched-capacitor feedback paths. The modulator requires only two low gain stages that are based on differential pairs. A systematic design methodology based on genetic algorithm, was used, which allowed decreasing the circuit’s sensitivity to the circuit components’ variations. This continuous-time, 2-1 MASH ΣΔM has been designed in a 65 nm CMOS technology and it occupies an area of just 0.027 mm2. Measurement results show that this modulator achieves a peak SNR/SNDR of 76/72.2 dB and DR of 77dB for an input signal bandwidth of 10 MHz, while dissipating 1.57 mW from a 1 V power supply voltage. The ΣΔM achieves a Walden FoMW of 23.6 fJ/level and a Schreier FoMS of 175 dB. The innovations proposed in this circuit result, both, in the reduction of the power consumption and of the chip size. To the best of the author’s knowledge the circuit achieves the lowest Walden FOMW for ΣΔMs operating at signal bandwidth from 5 MHz to 50 MHz reported to date

Programmable CMOS Analog-to-Digital Converter Design and Testability

In this work, a programmable second order oversampling CMOS delta-sigma analog-to-digital converter (ADC) design in 0.5µm n-well CMOS processes is presented for integration in sensor nodes for wireless sensor networks. The digital cascaded integrator comb (CIC) decimation filter is designed to operate at three different oversampling ratios of 16, 32 and 64 to give three different resolutions of 9, 12 and 14 bits, respectively which impact the power consumption of the sensor nodes. Since the major part of power consumed in the CIC decimator is by the integrators, an alternate design is introduced by inserting coder circuits and reusing the same integrators for different resolutions and oversampling ratios to reduce power consumption. The measured peak signal-to-noise ratio (SNR) for the designed second order delta-sigma modulator is 75.6dB at an oversampling ratio of 64, 62.3dB at an oversampling ratio of 32 and 45.3dB at an oversampling ratio of 16. The implementation of a built-in current sensor (BICS) which takes into account the increased background current of defect-free circuits and the effects of process variation on ΔIDDQ testing of CMOS data converters is also presented. The BICS uses frequency as the output for fault detection in CUT. A fault is detected when the output frequency deviates more than ±10% from the reference frequency. The output frequencies of the BICS for various model parameters are simulated to check for the effect of process variation on the frequency deviation. A design for on-chip testability of CMOS ADC by linear ramp histogram technique using synchronous counter as register in code detection unit (CDU) is also presented. A brief overview of the histogram technique, the formulae used to calculate the ADC parameters, the design implemented in 0.5µm n-well CMOS process, the results and effectiveness of the design are described. Registers in this design are replaced by 6T-SRAM cells and a hardware optimized on-chip testability of CMOS ADC by linear ramp histogram technique using 6T-SRAM as register in CDU is presented. The on-chip linear ramp histogram technique can be seamlessly combined with ΔIDDQ technique for improved testability, increased fault coverage and reliable operation

A SigmaDelta modulator for digital hearing instruments using 0.18 mum CMOS technology.

This thesis develops the design methodology for a low-voltage low-power SigmaDelta Modulator, realized using a switched op-amp technique that can be used in a hearing instrument. Switched op-amp implementation allows scaling down the design to the latest CMOS technology. A single-loop second-order SigmaDelta Modulator topology is chosen. The modulator circuit features reduced complexity, area reduction and low conversion energy. The modulator has a sampling rate of 8.2 MHz with an over-sampling ratio (OSR) of 256 to provide an audio bandwidth of 16 kHz. The modulator is implemented in a 0.18 mum digital CMOS technology with metal-to-metal sandwich structure capacitors. The modulator operates with a supply voltage of 1.8 V. The active area is 0.403 mm2. The modulator achieves a 98 dB signal-to-noise-and-distortion ratio (SNDR) and a 100 dB dynamic range (DR) at a Nyquist conversion rate of 32 kHz and consumes 1321 muW with a joule/conversion figure of merit equal to 161 x 10-12 J/s. The design methodology is developed through the extensive use of simulation tools. The behaviour simulation is carried out using Matlab/SIMULINK while circuits are simulated with Hspice using the Cadence design tools. Full-custom layout for the analog and the digital circuits is performed using the Cadence design tool. Post-processing simulation of the extracted modulator with parasitic verifies that results meet the requirements. The design has been sent to CMC for fabrication. Source: Masters Abstracts International, Volume: 43-03, page: 0947. Adviser: W. C. Miller. Thesis (M.A.Sc.)--University of Windsor (Canada), 2004

Design and Analysis of a Low-Power 8-Bit 500 KS/S SAR ADC for Bio-Medical Implant Devices

This thesis project involves the design and analysis of an 8-bit Successive Approximation Register (SAR) Analog to Digital Convertor (ADC), designed for low- power applications such as bio-medical implants. The sampling rate for this ADC is 500 KS/s. The power consumption for the whole SAR ADC system was measured to be 2.1 uW. The novelty of this project is the proposal of an extremely energy efficient comparator architecture. The result is the design of a final ADC with reasonable sampling speed, accuracy and low power consumption. In this project, all the different subsystems have been designed at the transistor level with 45 nm CMOS technology. The logical circuit was designed using Verilog language. It was then synthesized and integrated in the overall system

Design of low OSR, high precision analog-to-digital converters

Advances in electronic systems have lead to the demand for high resolution, high bandwidth Analog-to-Digital Converters (ADCs). Oversampled ADCs are well- known for high accuracy applications since they benefit from noise shaping and they usually do not need highly accurate components. However, as a consequence of oversampling, they have limited signal bandwidth. The signal bandwidth (BW) of oversampled ADCs can be increased either by increasing the sampling rate or reducing the oversampling ratio (OSR). Reducing OSR is a more promising method for increasing the BW, since the sampling speed is usually limited by the technology. The advantageous properties (e.g. low in-band quantization, relaxed accuracy requirements of components) of oversampled ADCs are usually diminished at lower OSRs and preserving these properties requires complicated and power hungry architectures. In this thesis, different combinations of delta-sigma and pipelined ADCs are explored and new techniques for designing oversampled ADCs are proposed. A Hybrid Delta-Sigma/Pipelined (HDSP) ADC is presented. This ADC uses a pipelined ADC as the quantizer of a single-loop delta-sigma modulator and benefits from the aggressive quantization of the pipelined quantizer at low OSRs. A Noise-Shaped Pipelined ADC is proposed which exploits a delta-sigma modulator as the sub-ADC of a pipeline stage to reduce the sensitivity to the analog imperfection. Three prototype ADCs were fabricated in 0.18μm CMOS technology to verify the effectiveness of the proposed techniques. The performance of these architectures is among the best reported for high bandwidth oversampled ADCs.Keywords: Delta-Sigma, Loop Filter, Oversampled ADC, Gain Stage, Pipeline, Noise Shapin

Time-encoding analog-to-digital converters : bridging the analog gap to advanced digital CMOS? Part 2: architectures and circuits

The scaling of CMOS technology deep into the nanometer range has created challenges for the design of highperformance analog ICs: they remain large in area and power consumption in spite of process scaling. Analog circuits based on time encoding [1], [2], where the signal information is encoded in the waveform transitions instead of its amplitude, have been developed to overcome these issues. While part one of this overview article [3] presented the basic principles of time encoding, this follow-up article describes and compares the main time-encoding architectures for analog-to-digital converters (ADCs) and discusses the corresponding design challenges of the circuit blocks. The focus is on structures that avoid, as much as possible, the use of traditional analog blocks like operational amplifiers (opamps) or comparators but instead use digital circuitry, ring oscillators, flip-flops, counters, an so on. Our overview of the state of the art will show that these circuits can achieve excellent performance. The obvious benefit of this highly digital approach to realizing analog functionality is that the resulting circuits are small in area and more compatible with CMOS process scaling. The approach also allows for the easy integration of these analog functions in systems on chip operating at "digital" supply voltages as low as 1V and lower. A large part of the design process can also be embedded in a standard digital synthesis flow