44 research outputs found

    Mo/Si multilayer-coated amplitude division beam splitters for XUV radiation sources

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    Amplitude-division beam splitters for XUV radiation sources have been developed and extensively characterized. Mo/Si multilayer coatings were deposited on 50 nm-thick SiN membranes. By changing the multilayer structure (periodicity, number of bilayers, etc.) the intensity of the reflected and transmitted beams were optimized for selected incident radiation parameters (wavelength, incident angle). The developed optical elements were characterized by means of XUV reflectometry and transmission measurements, atomic force microscopy and optical interferometry. Special attention was paid to the spatial homogeneity of the optical response and reflected beam wavefront distortions. Here the results of the characterization are presented and improvements required for advanced applications at XUV free-electron lasers are identified. A flatness as low as 4 nm r.m.s. on 3 × 3 mm beam splitters and 22 nm r.m.s. on 10 × 10 mm beam splitters has been obtained. The high-spatial-frequency surface roughness was about 0.7-1 nm r.m.s. The middle-spatial-frequency roughness was in the range 0.2-0.8 nm r.m.s. The reflection and transmission of the beam splitters were found to be very homogeneous, with a deviation of less than 2% across the full optical element

    Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO3_3/SrTiO3_3 Superlattice from Soft- and Hard- X-ray Standing-Wave Angle-Resolved Photoemission

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    LaNiO3_3 (LNO) is an intriguing member of the rare-earth nickelates in exhibiting a metal-insulator transition for a critical film thickness of about 4 unit cells [Son et al., Appl. Phys. Lett. 96, 062114 (2010)]; however, such thin films also show a transition to a metallic state in superlattices with SrTiO3_3 (STO) [Son et al., Appl. Phys. Lett. 97, 202109 (2010)]. In order to better understand this transition, we have studied a strained LNO/STO superlattice with 10 repeats of [4 unit-cell LNO/3 unit-cell STO] grown on an (LaAlO3_3)0.3_{0.3}(Sr2_2AlTaO6_6)0.7_{0.7} substrate using soft x-ray standing-wave-excited angle-resolved photoemission (SWARPES), together with soft- and hard- x-ray photoemission measurements of core levels and densities-of-states valence spectra. The experimental results are compared with state-of-the-art density functional theory (DFT) calculations of band structures and densities of states. Using core-level rocking curves and x-ray optical modeling to assess the position of the standing wave, SWARPES measurements are carried out for various incidence angles and used to determine interface-specific changes in momentum-resolved electronic structure. We further show that the momentum-resolved behavior of the Ni 3d eg and t2g states near the Fermi level, as well as those at the bottom of the valence bands, is very similar to recently published SWARPES results for a related La0.7_{0.7}Sr0.3_{0.3}MnO3_3/SrTiO3_3 superlattice that was studied using the same technique (Gray et al., Europhysics Letters 104, 17004 (2013)), which further validates this experimental approach and our conclusions. Our conclusions are also supported in several ways by comparison to DFT calculations for the parent materials and the superlattice, including layer-resolved density-of-states results

    A Model for the Stray Light Contamination of the UVCS Instrument on SOHO

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    We present a detailed model of stray-light suppression in the spectrometer channels of the Ultraviolet Coronagraph Spectrometer (UVCS) on the SOHO spacecraft. The control of diffracted and scattered stray light from the bright solar disk is one of the most important tasks of a coronagraph. We compute the fractions of light that diffract past the UVCS external occulter and non-specularly pass into the spectrometer slit. The diffracted component of the stray light depends on the finite aperture of the primary mirror and on its figure. The amount of non-specular scattering depends mainly on the micro-roughness of the mirror. For reasonable choices of these quantities, the modeled stray-light fraction agrees well with measurements of stray light made both in the laboratory and during the UVCS mission. The models were constructed for the bright H I Lyman alpha emission line, but they are applicable to other spectral lines as well.Comment: 19 pages, 5 figures, Solar Physics, in pres

    Characterization of large area avalanche photodiodes in X-ray and VUV-light detection

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    The present manuscript summarizes novel studies on the application of large area avalanche photodiodes (LAAPDs) to the detection of X-rays and vacuum ultraviolet (VUV) light. The operational characteristics of four different LAAPDs manufactured by Advanced Photonix Inc., with active areas of 80 and 200 mm^2 were investigated for X-ray detection at room temperature. The best energy resolution was found to be in the 10-18% range for 5.9 keV X-rays. The LAAPD, being compact, simple to operate and with high counting rate capability (up to about 10^5/s), proved to be useful in several applications, such as low-energy X-ray detection, where they can reach better performance than proportional counters. Since X-rays are used as reference in light measurements, the gain non-linearity between 5.9 keV X-rays and light pulses was investigated. The gain ratio between X-rays and VUV light decreases with gain, reaching 10 and 6% variations for VUV light produced in argon (~128 nm) and xenon (~172 nm), respectively, for a gain 200, while for visible light (~635 nm) the variation is lower than 1%. The effect of temperature on the LAAPD performance was investigated. Relative gain variations of about -5% per Celsius degree were observed for the highest gains. The excess noise factor was found to be independent on temperature, being between 1.8 and 2.3 for gains from 50 to 300. The energy resolution is better for decreasing temperatures due mainly to the dark current. LAAPDs were tested under intense magnetic fields up to 5 T, being insensitive when used in X-ray and visible-light detection, while for VUV light a significant amplitude reduction was observed at 5 T.Comment: 25 pages, 40 figures, submitted to JINS

    Characterization of large area avalanche photodiodes in X-ray and VUV-light detection

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    The present manuscript summarizes novel studies on the application of large area avalanche photodiodes (LAAPDs) to the detection of X-rays and vacuum ultraviolet (VUV) light. The operational characteristics of four different LAAPDs manufactured by Advanced Photonix Inc., with active areas of 80 and 200 mm^2 were investigated for X-ray detection at room temperature. The best energy resolution was found to be in the 10-18% range for 5.9 keV X-rays. The LAAPD, being compact, simple to operate and with high counting rate capability (up to about 10^5/s), proved to be useful in several applications, such as low-energy X-ray detection, where they can reach better performance than proportional counters. Since X-rays are used as reference in light measurements, the gain non-linearity between 5.9 keV X-rays and light pulses was investigated. The gain ratio between X-rays and VUV light decreases with gain, reaching 10 and 6% variations for VUV light produced in argon (~128 nm) and xenon (~172 nm), respectively, for a gain 200, while for visible light (~635 nm) the variation is lower than 1%. The effect of temperature on the LAAPD performance was investigated. Relative gain variations of about -5% per Celsius degree were observed for the highest gains. The excess noise factor was found to be independent on temperature, being between 1.8 and 2.3 for gains from 50 to 300. The energy resolution is better for decreasing temperatures due mainly to the dark current. LAAPDs were tested under intense magnetic fields up to 5 T, being insensitive when used in X-ray and visible-light detection, while for VUV light a significant amplitude reduction was observed at 5 T.Comment: 25 pages, 40 figures, submitted to JINS

    Characterization of large area avalanche photodiodes in X-ray and VUV-light detection

    Get PDF
    The present manuscript summarizes novel studies on the application of large area avalanche photodiodes (LAAPDs) to the detection of X-rays and vacuum ultraviolet (VUV) light. The operational characteristics of four different LAAPDs manufactured by Advanced Photonix Inc., with active areas of 80 and 200 mm^2 were investigated for X-ray detection at room temperature. The best energy resolution was found to be in the 10-18% range for 5.9 keV X-rays. The LAAPD, being compact, simple to operate and with high counting rate capability (up to about 10^5/s), proved to be useful in several applications, such as low-energy X-ray detection, where they can reach better performance than proportional counters. Since X-rays are used as reference in light measurements, the gain non-linearity between 5.9 keV X-rays and light pulses was investigated. The gain ratio between X-rays and VUV light decreases with gain, reaching 10 and 6% variations for VUV light produced in argon (~128 nm) and xenon (~172 nm), respectively, for a gain 200, while for visible light (~635 nm) the variation is lower than 1%. The effect of temperature on the LAAPD performance was investigated. Relative gain variations of about -5% per Celsius degree were observed for the highest gains. The excess noise factor was found to be independent on temperature, being between 1.8 and 2.3 for gains from 50 to 300. The energy resolution is better for decreasing temperatures due mainly to the dark current. LAAPDs were tested under intense magnetic fields up to 5 T, being insensitive when used in X-ray and visible-light detection, while for VUV light a significant amplitude reduction was observed at 5 T.Comment: 25 pages, 40 figures, submitted to JINS
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