In-Fiber All-Optical Fractional Differentiator Using an Asymmetrical Moiré Fiber Grating

In this work, it is demonstrated numerically that an asymmetric Moiré fiber grating operated in reflection can provide the required spectral response to implement an all-optical fractional differentiator. In our case, the accumulated phase shift is not associated with a point phase shift, as when working with fiber Bragg gratings and long-period gratings with punctual defects, but is distributed all over the grating. The proposed device is supported by numerical simulations, and a dimensionless deviation factor is calculated to make quantitative analysis feasible. The performance of the proposed device is analyzed using numerical simulations by computing the fractional time derivatives of the complex field of an arbitrary transform-limited Gaussian pulse. A comparison with the performance given by theoretical differentiation is also presented

Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier

Recently, a phase evaluation method was proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase change introduced by the deformation is in the range [0,π) rad. This method is based on the evaluation of a correlation coefficient between two speckle interferograms generated by both deformation states of the object. In this paper, we present a novel technique to measure non-monotonous displacements in temporal speckle pattern interferometry using a correlation method without a temporal carrier. In this approach, the sign ambiguity is resolved automatically due to the introduction of a function that determines the correct sign of the displacement between two consecutive speckle interferograms. The rms phase errors introduced by the proposed method are determined using computer-simulated speckle interferograms. An application of the phase retrieval method to process experimental data is also presented.Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; ArgentinaFil: Galizzi, Gustavo Ernesto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; ArgentinaFil: Federico, Roque Alejandro. Instituto Nacional de Tecnología Industrial. Centro de Electrónica e Informática; ArgentinaFil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y de Sistemas. Universidad Nacional de Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y de Sistemas; Argentin

A novel approach for measuring nanometric displacements by correlating speckle interferograms

Recently, two phase evaluation methods were proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase changes introduced by the deformation are in the range [0, π) rad. However, one of these techniques requires separate recording of the intensities of the object and the reference beams which correspond to both the initial and the deformed interferograms. The other technique only works to measure out-of-plane displacements. In this paper, we present a novel approach that overcomes these limitations. The performance of the proposed method is analyzed using computer-simulated speckle interferograms and it is also compared with the results obtained with a phase-shifting technique. Finally, an application of the proposed phase method used to process experimental data is illustrated.Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; ArgentinaFil: Galizzi, Gustavo Ernesto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentin

Evaluation of coating adhesion using a radial speckle interferometer combined with a micro-indentation test

This paper presents a technique to investigate coating adhesion which combines a radial in-plane speckle interferometer and a micro-indentation test. The proposed technique is based on the measurement of the radial in-plane displacement field produced by a micro-indentation introduced on the coated surface of the specimen. Using steel specimens coated with a thin coating of epoxy paint and subjected to different adhesive conditions, it is demonstrated that digital speckle pattern interferometry can be successfully used to measure the small local deformations generated by a micro-indentation. An empirical model, which allows to quantify the adhesion of a given coated-substrate system by the proposed combined technique, is finally presented.Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; ArgentinaFil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y de Sistemas. Universidad Nacional de Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y de Sistemas; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentin

Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry

This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer.Fil: Tendela, Lucas Pedro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Universidad Nacional de Rosario; ArgentinaFil: Federico, Roque Alejandro. Instituto Nacional de Tecnologia Industrial; ArgentinaFil: Kaufmann, Guillermo Hector. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Instituto de Física de Rosario (i); Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Rosario. Centro Internacional Franco Argentino de Ciencias de la Información y Sistemas; Argentina. Universidad Nacional de Rosario; Argentin

In fiber all optical fractional differentiator using an asymmetrical moiré fiber grating

Abstract: In this work, it is demonstrated numerically that an asymmetric Moiré fiber grating operated in reflection can provide the required spectral response to implement an all-optical fractional differentiator. In our case, the accumulated phase shift is not associated with a point phase shift, as when working with fiber Bragg gratings and long-period gratings with punctual defects, but is distributed all over the grating. The proposed device is supported by numerical simulations, and a dimensionless deviation factor is calculated to make quantitative analysis feasible. The performance of the proposed device is analyzed using numerical simulations by computing the fractional time derivatives of the complex field of an arbitrary transform-limited Gaussian pulse. A comparison with the performance given by theoretical differentiation is also presented