306 research outputs found
Ultrafast carrier relaxation in GaN, In_(0.05)Ga_(0.95)N and an In_(0.05)Ga_(0.95)/In_(0.15)Ga_(0.85)N Multiple Quantum Well
Room temperature, wavelength non-degenerate ultrafast pump/probe measurements
were performed on GaN and InGaN epilayers and an InGaN multiple quantum well
structure. Carrier relaxation dynamics were investigated as a function of
excitation wavelength and intensity. Spectrally-resolved sub-picosecond
relaxation due to carrier redistribution and QW capture was found to depend
sensitively on the wavelength of pump excitation. Moreover, for pump
intensities above a threshold of 100 microJ/cm2, all samples demonstrated an
additional emission feature arising from stimulated emission (SE). SE is
evidenced as accelerated relaxation (< 10 ps) in the pump-probe data,
fundamentally altering the re-distribution of carriers. Once SE and carrier
redistribution is completed, a slower relaxation of up to 1 ns for GaN and
InGaN epilayers, and 660 ps for the MQW sample, indicates carrier recombination
through spontaneous emission.Comment: submitted to Phys. Rev.
Effects of macroscopic polarization in III-V nitride multi-quantum-wells
Huge built-in electric fields have been predicted to exist in wurtzite III-V
nitrides thin films and multilayers. Such fields originate from heterointerface
discontinuities of the macroscopic bulk polarization of the nitrides. Here we
discuss the background theory, the role of spontaneous polarization in this
context, and the practical implications of built-in polarization fields in
nitride nanostructures. To support our arguments, we present detailed
self-consistent tight-binding simulations of typical nitride QW structures in
which polarization effects are dominant.Comment: 11 pages, 9 figures, uses revtex/epsf. submitted to PR
Self-regulated charge transfer and band tilt in nm-scale polar GaN films
To date, the generic polarization of Bernardini, Fiorentini and Vanderbilt
(PBFV) has been widely used to address the issue of polarity in III-V nitride
semiconductors, but improvements in nitride materials and the performance of
optoelectronic devices have been limited. The current first-principles
calculation for the electronic structures of nm-scale [0001] GaN films show
that the internal electric fields and the band tilt of these films are in
opposite direction to those predicted by PBFV. Additionally, it is determined
that an intrinsic self-regulated charge transfer across the film limits the
electrostatic potential difference across the film, which renders the local
conduction band energy minimum (at the Ga-terminated surface) approximately
equal to the local valence band energy maximum (at the N-terminated surface).
This effect is found to occur in films thicker than ~4nm
Oxygen photo-adsorption related quenching of photoluminescence in group-III nitride nanocolumns
GaN and InGaN nanocolumns of various compositions are studied by room-temperature photoluminescence (PL) under different ambient conditions. GaN nanocolumns exhibit a reversible quenching upon exposure to air under constant UV excitation, following a t−1/2 time dependence and resulting in a total reduction of intensity by 85–90%, as compared to PL measured in vacuum, with no spectral change. This effect is not observed when exposing the samples to pure nitrogen. We attribute this effect to photoabsorption and photodesorption of oxygen that modifies the surface potential bending. InGaN nanocolumns, under the same experimental conditions do not show the same quenching features: The high-energy part of the broad PL line is not modified by exposure to air, whereas a lower-energy part, which does quench by 80–90%, can now be distinguished. We discuss the different behaviors in terms of carrier localization and possible composition or strain gradients in the InGaN nanocolumns
Electron-phonon renormalization of the absorption edge of the cuprous halides
Compared to most tetrahedral semiconductors, the temperature dependence of
the absorption edges of the cuprous halides (CuCl, CuBr, CuI) is very small.
CuCl and CuBr show a small increase of the gap with increasing
temperature, with a change in the slope of vs. at around 150 K: above
this temperature, the variation of with becomes even smaller. This
unusual behavior has been clarified for CuCl by measurements of the low
temperature gap vs. the isotopic masses of both constituents, yielding an
anomalous negative shift with increasing copper mass. Here we report the
isotope effects of Cu and Br on the gap of CuBr, and that of Cu on the gap of
CuI. The measured isotope effects allow us to understand the corresponding
temperature dependences, which we also report, to our knowledge for the first
time, in the case of CuI. These results enable us to develop a more
quantitative understanding of the phenomena mentioned for the three halides,
and to interpret other anomalies reported for the temperature dependence of the
absorption gap in copper and silver chalcogenides; similarities to the behavior
observed for the copper chalcopyrites are also pointed out.Comment: 14 pages, 5 figures, submitted to Phys. Rev.
Anisotropic optical gain in m-plane InxGa1-xN/GaN multiple quantum well laser diode wafers fabricated on the low defect density freestanding GaN substrates
Room temperature continuous–wave green lasing from an InGaN microdisk on silicon
Optically pumped green lasing with an ultra low threshold has been achieved using an InGaN/GaN based micro-disk with an undercut structure on silicon substrates. The micro-disks with a diameter of around 1 μm were fabricated by means of a combination of a cost-effective silica micro-sphere approach, dry-etching and subsequent chemical etching. The combination of these techniques both minimises the roughness of the sidewalls of the micro-disks and also produces excellent circular geometry. Utilizing this fabrication process, lasing has been achieved at room temperature under optical pumping from a continuous-wave laser diode. The threshold for lasing is as low as 1 kW/cm2. Time–resolved micro photoluminescence (PL) and confocal PL measurements have been performed in order to further confirm the lasing action in whispering gallery modes and also investigate the excitonic recombination dynamics of the lasing
Electrically pumped continuous-wave III–V quantum dot lasers on silicon
Reliable, efficient electrically pumped silicon-based lasers would enable full integration of photonic and electronic circuits, but have previously only been realized by wafer bonding. Here, we demonstrate continuous-wave InAs/GaAs quantum dot lasers directly grown on silicon substrates with a low threshold current density of 62.5 A cm–2, a room-temperature output power exceeding 105 mW and operation up to 120 °C. Over 3,100 h of continuous-wave operating data have been collected, giving an extrapolated mean time to failure of over 100,158 h. The realization of high-performance quantum dot lasers on silicon is due to the achievement of a low density of threading dislocations on the order of 105 cm−2 in the III–V epilayers by combining a nucleation layer and dislocation filter layers with in situ thermal annealing. These results are a major advance towards reliable and cost-effective silicon-based photonic–electronic integration
Improvements in quantum efficiency of excitonic emissions in ZnO epilayers by the elimination of point defects
科研費報告書収録論文(課題番号:18350092/研究代表者:大友明/高効率酸化亜鉛系青色・紫外発光素子の開発
Segregation of In to dislocations in InGaN.
Dislocations are one-dimensional topological defects that occur frequently in functional thin film materials and that are known to degrade the performance of InxGa1-xN-based optoelectronic devices. Here, we show that large local deviations in alloy composition and atomic structure are expected to occur in and around dislocation cores in InxGa(1-x)N alloy thin films. We present energy-dispersive X-ray spectroscopy data supporting this result. The methods presented here are also widely applicable for predicting composition fluctuations associated with strain fields in other inorganic functional material thin films.This work was funded in part by the Cambridge Commonwealth trust, St. John’s College and
the EPSRC. SKR is funded through the Cambridge-India Partnership Fund and Indian Institute
of Technology Bombay via a scholarship. MAM acknowledges support from the Royal Society
through a University Research Fellowship. Additional support was provided by the EPSRC
through the UK National Facility for Aberration-Corrected STEM (SuperSTEM). The Titan 80-
200kV ChemiSTEMTM was funded through HM Government (UK) and is associated with the
capabilities of the University of Manchester Nuclear Manufacturing (NUMAN) capabilities. SJH
acknowledges funding from the Defence Treat Reduction Agency (DTRA) USA (grant number
HDTRA1-12-1-0013).This is the accepted manuscript. The final version is available at http://pubs.acs.org/doi/abs/10.1021/nl5036513
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