Predicting risk among non-respondents in prospective studies

Potential non-response bias was investigated in a follow-up study of 2,011 chronically disabled patients. 82.5% and 73.3% of the study subjects responded to self-administered mail questionnaires respectively at 6-month and 1-year follow-up. Information on employment status, the outcome of interest, of approximately 90% of the non-respondents was obtained from indirect sources. Employment rate was lower among the non-respondents than the respondents. Non-response was associated with age, social class, previous employment record, and the type of disability; but none of these characteristics were associated with the outcome. Out of the five known independent risk factors for unemployment, only one (incompletion of rehabilitation course) was associated with non-response. The employment rate among the respondents was also assessed according to the delay in response, that is the number of reminders sent to achieve response. The outcome among- the late respondents was similar to that among the nonrespondents. These data suggest that (a) risk estimates may be biased even when the response rate is greater than 80%, (b) the prevalence of risk factors among non-respondents may not indicate the presence or the degree of non-response bias, but (c) reliable estimates can be obtained from extrapolations of the rates among the respondents according to the delay in response.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/42663/1/10654_2004_Article_BF00152716.pd

Measurements of L-shell x-ray production cross sections of W, Pt, and Au by 10-30-keV electrons

We present results from measurements of Lα x-ray production cross sections of the elements W, Pt, and Au by impact of electrons with energies in the range 10–30 keV. The cross sections were obtained by measuring Lα x-ray intensities emitted from very thin films of the studied elements deposited on thick carbon substrates. The directional and energy spreading of the electron beam within the active film and the x-ray enhancement due to electron backscattering from the substrate were accounted for by means of Monte Carlo simulation. Recorded x-ray intensities were converted to absolute x-ray production cross sections by using two different methods; the first employs measured values of the sample thickness and the number of incident electrons and estimated detector efficiencies; the second is based on a comparison between measured and calculated bremsstrahlung intensities. Experimental data are compared with the results of simple analytical formulas of common use in practical electron probe microanalysis, with calculated cross sections obtained from the distorted-wave Born approximation and with other experimental data available in the literature

Bayesian estimation of a multilevel IRT model using gibbs sampling

Bayes estimates, Gibbs sampler, item response theory (IRT), Markov chain Monte Carlo, multilevel model, two-parameter normal ogive model,

Bayesian modeling of measurement error in predictor variables using item response theory

classical test theory, Gibbs sampler, item response theory, hierarchical linear models, Markov Chain Monte Carlo, measurement error, multilevel model, multilevel IRT, two-parameter normal ogive model,