Depth-dependent critical behavior in V2H

Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.Comment: 5 pages, 4 figure

Smart X-Ray Beam Position Monitor System Using Artificial Intelligence Methods for the Advanced Photon Source Insertion-Device Beamlines

At the Advanced Photon Source (APS), each insertion device (ID) beamline front-end has two XBPMs to monitor the X-ray beam position for both that vertical and horizontal directions. Performance challenges for a conventional photoemission type X-ray beam position monitor (XBPM) during operations are contamination of the signal from the neighboring bending magnet sources and the sensitivity of the XBPM to the insertion device (ID) gap variations. Problems are exacerbated because users change the ID gap during their operations, and hence the percentage level of the contamination in the front end XBPM signals varies. A smart XBPM system with a high speed digital signal processor has been built at the Advanced Photon Source for the ID beamline front ends. The new version of the software, which uses an artificial intelligence method, provides a self learning and self-calibration capability to the smart XBPM system. The structure of and recent test results with the system are presented in this paper

Microscale elastic strain evolution following damage in Ti-SiC composites

Fiber fractures are crucial in initiating damage zones that ultimately determine the strength and lifetime of fiber-reinforced metal matrix composites. The evolution of damage in a metal matrix composite (MMC) comprised of a row of unidirectional SiC fibers (32 vol pct) surrounded by a Ti matrix was examined, for the first time, using X-ray microdiffraction. Multiple strain maps including both phases were collected in situ under applied tensile stress. The elastic axial strains were then compared to predictions from a modified shear-lag model, which, unlike other shear-lag models, considers the elastic response of both constituents. The strains showed good correlation with the model. The results confirmed, for the first time, both the need and validity of this new model specifically developed for large scale multifracture simulations of MMCs. The results also provided unprecedented insight for the model, revealing the necessity of incorporating such factors as plasticity of the matrix, residual stress in the composite, and selection of the load sharing parameter