Nanoscale roughness and morphology affect the IsoElectric Point of titania surfaces

We report on the systematic investigation of the role of surface nanoscale roughness and morphology on the charging behaviour of nanostructured titania (TiO2) surfaces in aqueous solutions. IsoElectric Points (IEPs) of surfaces have been characterized by direct measurement of the electrostatic double layer interactions between titania surfaces and the micrometer-sized spherical silica probe of an atomic force microscope in NaCl aqueous electrolyte. The use of a colloidal probe provides well-defined interaction geometry and allows effectively probing the overall effect of nanoscale morphology. By using supersonic cluster beam deposition to fabricate nanostructured titania films, we achieved a quantitative control over the surface morphological parameters. We performed a systematical exploration of the electrical double layer properties in different interaction regimes characterized by different ratios of characteristic nanometric lengths of the system: the surface rms roughness Rq, the correlation length {\xi} and the Debye length {\lambda}D. We observed a remarkable reduction by several pH units of IEP on rough nanostructured surfaces, with respect to flat crystalline rutile TiO2. In order to explain the observed behavior of IEP, we consider the roughness-induced self-overlap of the electrical double layers as a potential source of deviation from the trend expected for flat surfaces.Comment: 63 pages, including 7 figures and Supporting Informatio

Feature Extraction Technique of PCA for Face Recognition With Accuracy Enhancement

Face recognition is a very complex task in the area of image processing and computer vision. This becomes important because it applies on many real life applications like Security, identification, crowd surveillance, Video surveillance etc. This paper is proposed the PCA based Face recognition. PCA is a holistic based Statistical method which is used to extract the feature from face image and to decrease the large dimensionality of the data to the smaller dimensionality of feature space, then classification is done using Euclidian distance classifier to recognize the face. The proposed method is worked on Yale Database and evaluate under varying conditions like Illumination variant for Center, Left and Right, Different Facial Expression like Happy, Sad, Normal, Wink , Surprised and Sleepy , Wearing spectacles and without it for Frontal Face View. The proposed work demonstrates the recognition rate for given Dataset

Carbon Nanotube Interconnects for End-of-Roadmap Semiconductor Technology Nodes

Advances in semiconductor technology due to aggressive downward scaling of on-chip feature sizes have led to rapid rises in resistivity and current density of interconnect conductors. As a result, current interconnect materials, Cu and W, are subject to performance and reliability constraints approaching or exceeding their physical limits. Therefore, alternative materials such as nanocarbons, metal silicides, and Ag nanowires are actively considered as potential replacements to meet such constraints. Among nanocarbons, carbon nanotube (CNT) is among the leading replacement candidate for on-chip interconnect vias due to its high aspect-ratio nanostructure and superior currentcarrying capacity to those of Cu, W, and other potential candidates. However, contact resistance of CNT with metal is a major bottleneck in device functionalization. To meet the challenge posed by contact resistance, several techniques are designed and implemented. First, the via fabrication and CNT growth processes are developed to increase the CNT packing density inside via and to ensure no CNT growth on via sidewalls. CNT vias with cross-sections down to 40 nm 40 nm are fabricated, which have linewidths similar to those used for on-chip interconnects in current integrated circuit manufacturing technology nodes. Then the via top contact is metallized to increase the total CNT area interfacing with the contact metal and to improve the contact quality and reproducibility. Current-voltage characteristics of individual fabricated CNT vias are measured using a nanoprober and contact resistance is extracted with a first-reported contact resistance extraction scheme for 40 nm linewidth. Based on results for 40 nm and 60 nm top-contact metallized CNT vias, we demonstrate that not only are their current-carrying capacities two orders of magnitude higher than their Cu and W counterparts, they are enhanced by reduced via resistance due to contact engineering. While the current-carrying capacities well exceed those projected for end-of-roadmap technology nodes, the via resistances remain a challenge to replace Cu and W, though our results suggest that further innovations in contact engineering could begin to overcome such challenge

Thickness Dependent Structural, Magnetic and Transport Properties of of Cu / Co Thin Film and Multilayer Structures

Structural, magnetic and transport properties of electron beam evaporated Co/Cu thin film and multilayer structures (MLS) having different layer thicknesses have been characterized using XRD, MOKE and resistivity techniques. The structural studies show different crystal structures for different sub-layer thicknesses. The Co (300 Ǻ) single layer film is amorphous, while Cu (300 Ǻ) film is microcrystalline in nature. The particle size is found to decrease as the number of interfaces increase. The corresponding magnetic and resistivity measurements show an increase in saturation field and resistivity. However, coercivity decreases with decrease in particle size. The results conclude that these properties are greatly influenced by various micro structural parameters such as layer thickness, number of bilayers and the quality of interfaces formed under different growth conditions

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Ultrasound beam simulations in inhomogeneous tissue geometries using the hybrid angular spectrum method

pre-printThe angular spectrum method is a fast, accurate and computationally efficient method for modeling wave propagation. However, the traditional angular spectrum method assumes that the region of propagation has homogenous properties. In this paper, the angular spectrum method is extended to calculate ultrasound wave propagation in inhomogeneous tissue geometries, important for clinical efficacy, patient safety, and treatment reliability in MR-guided focused ultrasound surgery. The inhomogeneous tissue region to be modeled is segmented into voxels, each voxel having a unique speed of sound, attenuation coefficient, and density. The pressure pattern in the 3-D model is calculated by alternating between the space domain and the spatial-frequency domain for each plane of voxels in the model. The new technique was compared with the finite-difference time-domain technique for a model containing attenuation, refraction, and reflection and for a segmented human breast model; although yielding essentially the same pattern, it results in a reduction in calculation times of at least two orders of magnitude