Energy-Efficient and Reliable Computing in Dark Silicon Era

Dark silicon denotes the phenomenon that, due to thermal and power constraints, the fraction of transistors that can operate at full frequency is decreasing in each technology generation. Moore’s law and Dennard scaling had been backed and coupled appropriately for five decades to bring commensurate exponential performance via single core and later muti-core design. However, recalculating Dennard scaling for recent small technology sizes shows that current ongoing multi-core growth is demanding exponential thermal design power to achieve linear performance increase. This process hits a power wall where raises the amount of dark or dim silicon on future multi/many-core chips more and more. Furthermore, from another perspective, by increasing the number of transistors on the area of a single chip and susceptibility to internal defects alongside aging phenomena, which also is exacerbated by high chip thermal density, monitoring and managing the chip reliability before and after its activation is becoming a necessity. The proposed approaches and experimental investigations in this thesis focus on two main tracks: 1) power awareness and 2) reliability awareness in dark silicon era, where later these two tracks will combine together. In the first track, the main goal is to increase the level of returns in terms of main important features in chip design, such as performance and throughput, while maximum power limit is honored. In fact, we show that by managing the power while having dark silicon, all the traditional benefits that could be achieved by proceeding in Moore’s law can be also achieved in the dark silicon era, however, with a lower amount. Via the track of reliability awareness in dark silicon era, we show that dark silicon can be considered as an opportunity to be exploited for different instances of benefits, namely life-time increase and online testing. We discuss how dark silicon can be exploited to guarantee the system lifetime to be above a certain target value and, furthermore, how dark silicon can be exploited to apply low cost non-intrusive online testing on the cores. After the demonstration of power and reliability awareness while having dark silicon, two approaches will be discussed as the case study where the power and reliability awareness are combined together. The first approach demonstrates how chip reliability can be used as a supplementary metric for power-reliability management. While the second approach provides a trade-off between workload performance and system reliability by simultaneously honoring the given power budget and target reliability

Tackling Choke Point Induced Performance Bottlenecks in a Near-Threshold GPGPU

Over the last decade, General Purpose Graphics Processing Units (GPGPUs) have garnered a substantial attention in the research community due to their extensive thread-level parallelism. GPGPUs provide a remarkable performance improvement over Central Processing Units (CPUs), for highly parallel applications. However, GPGPUs typically achieve this extensive thread-level parallelism at the cost of a large power consumption. Consequently, Near-Threshold Computing (NTC) provides a promising opportunity for designing energy-efficient GPGPUs (NTC-GPUs). However, NTC-GPUs suffer from a crucial Process Variation (PV)-inflicted performance bottleneck, which is called Choke Point. Choke Point is defined as one or small group of gates which is affected by PV. Choke Point is capable of varying the path-delay of circuit and causing different forms of timing violation. In this work, a cross-layer design technique is proposed to tackle the performance impediments caused by choke points in NTC-GPUs

Split Latency Allocator: Process Variation-Aware Register Access Latency Boost in a Near-Threshold Graphics Processing Unit

Over the last decade, Graphics Processing Units (GPUs) have been used extensively in gaming consoles, mobile phones, workstations and data centers, as they have exhibited immense performance improvement over CPUs, in graphics intensive applications. Due to their highly parallel architecture, general purpose GPUs (GPGPUs) have gained the foreground in applications where large data blocks can be processed in parallel. However, the performance improvement is constrained by a large power consumption. Likewise, Near Threshold Computing (NTC) has emerged as an energy-efficient design paradigm. Hence, operating GPUs at NTC seems like a plausible solution to counteract the high energy consumption. This work investigates the challenges associated with NTC operation of GPUs and proposes a low-power GPU design, Split Latency Allocator, to sustain the performance of GPGPU applications

Predicting Critical Warps in Near-Threshold GPGPU Applications Using a Dynamic Choke Point Analysis

General purpose graphics processing units (GP-GPU), owing to their enormous thread-level parallelism, can significantly improve the power consumption at the near-threshold (NTC) operating region, while offering close to a super-threshold performance. However, process variation (PV) can drastically reduce the GPU performance at NTC. In this work, choke points—a unique device-level characteristic of PV at NTC—that can exacerbate the warp criticality problem in GPUs have been explored. It is shown that the modern warp schedulers cannot tackle the choke point induced critical warps in an NTC GPU. Additionally, Choke Point Aware Warp Speculator, a circuit-architectural solution is proposed to dynamically predict the critical warps in GPUs, and accelerate them in their respective execution units. The best scheme achieves an average improvement of ∼39% in performance, and ∼31% in energy-efficiency, over one state-of-the-art warp scheduler, across 15 GPGPU applications, while incurring marginal hardware overheads

Toward Reliable, Secure, and Energy-Efficient Multi-Core System Design

Computer hardware researchers have perennially focussed on improving the performance of computers while stipulating the energy consumption under a strict budget. While several innovations over the years have led to high performance and energy efficient computers, more challenges have also emerged as a fallout. For example, smaller transistor devices in modern multi-core systems are afflicted with several reliability and security concerns, which were inconceivable even a decade ago. Tackling these bottlenecks happens to negatively impact the power and performance of the computers. This dissertation explores novel techniques to gracefully solve some of the pressing challenges of the modern computer design. Specifically, the proposed techniques improve the reliability of on-chip communication fabric under a high power supply noise, increase the energy-efficiency of low-power graphics processing units, and demonstrate an unprecedented security loophole of the low-power computing paradigm through rigorous hardware-based experiments

Thermal Management for Dependable On-Chip Systems

This thesis addresses the dependability issues in on-chip systems from a thermal perspective. This includes an explanation and analysis of models to show the relationship between dependability and tempature. Additionally, multiple novel methods for on-chip thermal management are introduced aiming to optimize thermal properties. Analysis of the methods is done through simulation and through infrared thermal camera measurements

Addressing Manufacturing Challenges in NoC-based ULSI Designs

Hernández Luz, C. (2012). Addressing Manufacturing Challenges in NoC-based ULSI Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/1669

Physics-Based Electromigration Modeling and Analysis and Optimization

Long-term reliability is a major concern in modern VLSI design. Literature has shown that reliability gets worse as technology advances. It is expected that the future VLSI systems would have shorter reliability-induced lifetime comparing with previous generations. Being one of the most serious reliability effects, electromigration (EM) is a physical phenomenon of the migration of metal atoms due to the momentum exchange between atoms and the conducting electrons. It can cause wire resistance change or open circuit and result in functional failure of the circuit. Power-ground networks are the most vulnerable part to EM effect among all the interconnect wires since the current flow on this part is the largest on the chip. With new generation oftechnology node and aggressive design strategies, more accurate and efficient EM models are required. However, traditional EM approaches are very conservative and cannot meet current aggressive design strategies. Besides circuit level, EM also need to be thoroughly studied in system level due to limited power and temperature budgets among cores on chip. This research focuses on developing physical level EM model for VLSI circuits and system level EM optimization for multi-core systems in order to overcome the aforementioned problems. Specifically, for physical level, we develop two EM immortality check methods and a power grid EM check method. Firstly, a voltage based EM immortality analysis has been developed. Immortality condition in nucleation phase can be determined fast and accurately for multi-segment interconnect wires. Secondly, a saturation volume based incubation phase immortality check method has been proposed. This method can further reduce the redundancy in VLSI circuit design by immortality check in multiphase. Furthermore, both immortality check methods are integrated into a new power grid EM check methodology (EMspice) as filter for EM analysis. These filters can accelerate the simulation by filtering out immortal trees so that we only need to do simulation on fewer trees that are mortal. Coupled EM simulation considering both hydrostatic stress and electronic current/voltage in the power grid network will be applied to these mortal trees. This tool can work seamlessly with commercial synthesis flow. Besides physical level reliability models, system level reliability optimization is also discussed in this research. A deep reinforcement learning based EM optimization has been proposed for multi-core system. Both long term reliability effect (hard error) and transient soft error are considered. Energy can be optimized with all the reliability and other constraints fast and accurately compared to existing reliability management techniques. Last but not least, a scheduling based reliability optimization method for multi-core systems has been proposed. NBTI, HCI and EM are considered jointly. Lifetime of the system can be improved significantly compared to traditional methods which mainly focus on utilization

More bang for your buck: Boosting performance with capped power consumption

Achieving faster performance without increasing power and energy consumption for computing systems is an outstanding challenge. This paper develops a novel resource allocation scheme for memory-bound applications running on High-Performance Computing (HPC) clusters, aiming to improve application performance without breaching peak power constraints and total energy consumption. Our scheme estimates how the number of processor cores and CPU frequency setting affects the application performance. It then uses the estimate to provide additional compute nodes to memory-bound applications if it is profitable to do so. We implement and apply our algorithm to 12 representative benchmarks from the NAS parallel benchmark and HPC Challenge (HPCC) benchmark suites and evaluate it on a representative HPC cluster. Experimental results show that our approach can effectively mitigate memory contention to improve application performance, and it achieves this without significantly increasing the peak power and overall energy consumption. Our approach obtains on average 12.69% performance improvement over the default resource allocation strategy, but uses 7.06% less total power, which translates into 17.77% energy savings

Software-based and regionally-oriented traffic management in Networks-on-Chip

Since the introduction of chip-multiprocessor systems, the number of integrated cores has been steady growing and workload applications have been adapted to exploit the increasing parallelism. This changed the importance of efficient on-chip communication significantly and the infrastructure has to keep step with these new requirements. The work at hand makes significant contributions to the state-of-the-art of the latest generation of such solutions, called Networks-on-Chip, to improve the performance, reliability, and flexible management of these on-chip infrastructures