Special session: Hot topics: Statistical test methods

International audienceThe process of testing Integrated Circuits involves a huge amount of data: electrical circuit measurements, information from wafer process monitors, spatial location of the dies, wafer lot numbers, etc. In addition, the relationships between faults, process variations and circuit performance are likely to be very complex and non-linear. Test (and its extension to diagnosis) should be considered as a challenging highly dimensional multivariate problem.Advanced statistical data processing offers a powerful set of tools, borrowed from the fields of data mining, machine learning or artificial intelligence, to get the most out of this data. Indeed, these mathematical tools have opened a number of novel and interesting research lines within the field of IC testing.In this special session, prominent researchers in this field will share their views on this topic and present some of their last findings. The first talk will discuss the interest of likelihood prevalence in random fault simulation. The second talk will show how statistical data analysis can help diagnosing test efficiency. The third talk will deal with the reliability of Alternate Test of AMS-RF circuits. The fourth and last talk will address the idea of mining the test data for improving design manufacturing and even test itself

A Holistic Methodology for System Margining and Jitter Tolerance Optimization in Post-Silicon Validation

The optimization of receiver analog circuitry in modern high-speed input/output (HSIO) links is a very time consuming post-silicon validation process. Current industrial practices are based on exhaustive enumeration methods to improve either the system margins or the jitter tolerance compliance test. In this paper, these two requirements are addressed in a holistic optimization-based approach. We propose an innovative objective function based on these two metrics. Our method employs Kriging to build a surrogate model based on system margining and jitter tolerance measurements. The proposed method is able to deliver optimal system margins and guarantee jitter tolerance compliance while substantially decreasing the typical post-Si validation time

High-Speed Links Receiver Optimization in Post-Silicon Validation Exploiting Broyden-based Input Space Mapping

One of the major challenges in high-speed input/output (HSIO) links electrical validation is the physical layer (PHY) tuning process. Equalization techniques are employed to cancel any undesired effect. Typical industrial practices require massive lab measurements, making the equalization process very time consuming. In this paper, we exploit the Broyden-based input space mapping (SM) algorithm to efficiently optimize the PHY tuning receiver (Rx) equalizer settings for a SATA Gen 3 channel topology. We use a good-enough surrogate model as the coarse model, and an industrial post-silicon validation physical platform as the fine model. A map between the coarse and the fine model Rx equalizer settings is implicitly built, yielding an accelerated SM-based optimization of the PHY tuning process

BioScript: programming safe chemistry on laboratories-on-a-chip

This paper introduces BioScript, a domain-specific language (DSL) for programmable biochemistry which executes on emerging microfluidic platforms. The goal of this research is to provide a simple, intuitive, and type-safe DSL that is accessible to life science practitioners. The novel feature of the language is its syntax, which aims to optimize human readability; the technical contributions of the paper include the BioScript type system and relevant portions of its compiler. The type system ensures that certain types of errors, specific to biochemistry, do not occur, including the interaction of chemicals that may be unsafe. The compiler includes novel optimizations that place biochemical operations to execute concurrently on a spatial 2D array platform on the granularity of a control flow graph, as opposed to individual basic blocks. Results are obtained using both a cycle-accurate microfluidic simulator and a software interface to a real-world platform

Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs

The most recent generations of graphics processing units (GPUs) boost the execution of convolutional operations required by machine learning applications by resorting to specialized and efficient in-chip accelerators (Tensor Core Units or TCUs) that operate on matrix multiplication tiles. Unfortunately, modern cutting-edge semiconductor technologies are increasingly prone to hardware defects, and the trend to highly stress TCUs during the execution of safety-critical and high-performance computing (HPC) applications increases the likelihood of TCUs producing different kinds of failures. In fact, the intrinsic resiliency to hardware faults of arithmetic units plays a crucial role in safety-critical applications using GPUs (e.g., in automotive, space, and autonomous robotics). Recently, new arithmetic formats have been proposed, particularly those suited to neural network execution. However, the reliability characterization of TCUs supporting different arithmetic formats was still lacking. In this work, we quantitatively assessed the impact of hardware faults in TCU structures while employing two distinct formats (floating-point and posit) and using two different configurations (16 and 32 bits) to represent real numbers. For the experimental evaluation, we resorted to an architectural description of a TCU core (PyOpenTCU) and performed 120 fault simulation campaigns, injecting around 200,000 faults per campaign and requiring around 32 days of computation. Our results demonstrate that the posit format of TCUs is less affected by faults than the floating-point one (by up to three orders of magnitude for 16 bits and up to twenty orders for 32 bits). We also identified the most sensible fault locations (i.e., those that produce the largest errors), thus paving the way to adopting smart hardening solutions

Shore-based Voyage Planning

The objective of the thesis was to describe the voyage planning process and factors that influence it to see how the process could be adapted for being performed shoreside. The thesis is a qualitative study written from the voyage planning officer’s point of view concentrating on the appraisal and planning stages. Regulatory framework was defined using IMO and British Admiralty publications. Carnival Corporation’s SMS policies and Holland America Line’s voyage planning routines were used as examples of the process. As there is not much research available on voyage planning and new developing technologies, interviews and internet sources were used. The amount of work put into a voyage plan varies greatly depending on a ship type and trade area, but generally it is a time-consuming process, partly because the information needs to be gathered from multiple sources and is not always easily available. The concept of e-navigation is aimed to improve connectivity between different systems and stakeholders allowing new types of services and information dissemination across the industry enabling the navigators to receive relevant information in time and often automatically with no need to request the information separately. Also automated ship-to-ship information exchange will become possible. AI-aided planning software and government provided passage plans can be of assistance in the voyage planning officer’s work, but their scope is still quite limited. In the future when the technology develops, and especially if all information can be accessed from a single window, time spent on appraisal and planning stages will decrease considerably and most of the process could be done shoreside leaving the officers on board more time for other tasks. Autonomous vessels and augmented reality are the future, and as the technology develops shore-based voyage planning will become more common

Post-silicon Receiver Equalization Metamodeling by Artificial Neural Networks

As microprocessor design scales to the 10 nm technology and beyond, traditional pre- and post-silicon validation techniques are unsuitable to get a full system functional coverage. Physical complexity and extreme technology process variations severely limits the effectiveness and reliability of pre-silicon validation techniques. This scenario imposes the need of sophisticated post-silicon validation approaches to consider complex electromagnetic phenomena and large manufacturing fluctuations observed in actual physical platforms. One of the major challenges in electrical validation of high-speed input/output (HSIO) links in modern computer platforms lies in the physical layer (PHY) tuning process, where equalization techniques are used to cancel undesired effects induced by the channels. Current industrial practices for PHY tuning in HSIO links are very time consuming since they require massive lab measurements. An alternative is to use machine learning techniques to model the PHY, and then perform equalization using the resultant surrogate model. In this paper, a metamodeling approach based on neural networks is proposed to efficiently simulate the effects of a receiver equalizer PHY tuning settings. We use several design of experiments techniques to find a neural model capable of approximating the real system behavior without requiring a large amount of actual measurements. We evaluate the models performance by comparing with measured responses on a real server HSIO link

A Holistic Formulation for System Margining and Jitter Tolerance Optimization in Industrial Post-Silicon Validation

There is an increasingly higher number of mixed-signal circuits within microprocessors and systems on chip (SoC). A significant portion of them corresponds to high-speed input/output (HSIO) links. Post-silicon validation of HSIO links can be critical for making a product release qualification decision under aggressive launch schedules. The optimization of receiver analog circuitry in modern HSIO links is a very time consuming post-silicon validation process. Current industrial practices are based on exhaustive enumeration methods to improve either the system margins or the jitter tolerance compliance test. In this paper, these two requirements are addressed in a holistic optimization-based approach. We propose a novel objective function based on these two metrics. Our method employs Kriging to build a surrogate model based on system margining and jitter tolerance measurements. The proposed method, tested with three different realistic server HSIO links, is able to deliver optimal system margins and guarantee jitter tolerance compliance while substantially decreasing the typical post-silicon validation time.ITESO, A.C