Statistical Yield Analysis and Design for Nanometer VLSI

Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, the building blocks of integrated circuits, are prone to significant variations that directly impact the performance and power consumption of the fabricated devices, severely impacting the manufacturing yield. However, the large number of the transistors on a single chip adds even more challenges for the analysis of the variation effects, a critical task in diagnosing the cause of failure and designing for yield. Reliable and efficient statistical analysis methodologies in various design phases are key to predict the yield before entering such an expensive fabrication process. In this thesis, the impacts of process variations are examined at three different levels: device, circuit, and micro-architecture. The variation models are provided for each level of abstraction, and new methodologies are proposed for efficient statistical analysis and design under variation. At the circuit level, the variability analysis of three crucial sub-blocks of today's system-on-chips, namely, digital circuits, memory cells, and analog blocks, are targeted. The accurate and efficient yield analysis of circuits is recognized as an extremely challenging task within the electronic design automation community. The large scale of the digital circuits, the extremely high yield requirement for memory cells, and the time-consuming analog circuit simulation are major concerns in the development of any statistical analysis technique. In this thesis, several sampling-based methods have been proposed for these three types of circuits to significantly improve the run-time of the traditional Monte Carlo method, without compromising accuracy. The proposed sampling-based yield analysis methods benefit from the very appealing feature of the MC method, that is, the capability to consider any complex circuit model. However, through the use and engineering of advanced variance reduction and sampling methods, ultra-fast yield estimation solutions are provided for different types of VLSI circuits. Such methods include control variate, importance sampling, correlation-controlled Latin Hypercube Sampling, and Quasi Monte Carlo. At the device level, a methodology is proposed which introduces a variation-aware design perspective for designing MOS devices in aggressively scaled geometries. The method introduces a yield measure at the device level which targets the saturation and leakage currents of an MOS transistor. A statistical method is developed to optimize the advanced doping profiles and geometry features of a device for achieving a maximum device-level yield. Finally, a statistical thermal analysis framework is proposed. It accounts for the process and thermal variations simultaneously, at the micro-architectural level. The analyzer is developed, based on the fact that the process variations lead to uncertain leakage power sources, so that the thermal profile, itself, would have a probabilistic nature. Therefore, by a co-process-thermal-leakage analysis, a more reliable full-chip statistical leakage power yield is calculated

Designing Approximate Computing Circuits with Scalable and Systematic Data-Driven Techniques

Semiconductor feature size has been shrinking significantly in the past decades. This decreasing trend of feature size leads to faster processing speed as well as lower area and power consumption. Among these attributes, power consumption has emerged as the primary concern in the design of integrated circuits in recent years due to the rapid increasing demand of energy efficient Internet of Things (IoT) devices. As a result, low power design approaches for digital circuits have become of great attractive in the past few years. To this end, approximate computing in hardware design has emerged as a promising design technique. It provides design opportunities to improve timing and energy efficiency by relaxing computing quality. This technique is feasible because of the error-resiliency of many emerging resource-hungry computational applications such as multimedia processing and machine learning. Thus, it is reasonable to utilize this characteristic to trade an acceptable amount of computing quality for energy saving. In the literature, most prior works on approximate circuit design focus on using manual design strategies to redesign fundamental computational blocks such as adders and multipliers. However, the manual design techniques are not suitable for system level hardware due to much higher design complexity. In order to tackle this challenge, we focus on designing scalable, systematic and general design methodologies that are applicable on any circuits. In this paper, we present two novel approximate circuit design methods based on machine learning techniques. Both methods skip the complicated manual analysis steps and primarily look at the given input-error pattern to generate approximate circuits. Our first work presents a framework for designing compensation block, an essential component in many approximate circuits, based on feature selection. Our second work further extends and optimizes this framework and integrates data-driven consideration into the design. Several case studies on fixed-width multipliers and other approximate circuits are presented to demonstrate the effectiveness of the proposed design methods. The experimental results show that both of the proposed methods are able to automatically and efficiently design low-error approximate circuits

Accelerating Reconfigurable Financial Computing

This thesis proposes novel approaches to the design, optimisation, and management of reconfigurable computer accelerators for financial computing. There are three contributions. First, we propose novel reconfigurable designs for derivative pricing using both Monte-Carlo and quadrature methods. Such designs involve exploring techniques such as control variate optimisation for Monte-Carlo, and multi-dimensional analysis for quadrature methods. Significant speedups and energy savings are achieved using our Field-Programmable Gate Array (FPGA) designs over both Central Processing Unit (CPU) and Graphical Processing Unit (GPU) designs. Second, we propose a framework for distributing computing tasks on multi-accelerator heterogeneous clusters. In this framework, different computational devices including FPGAs, GPUs and CPUs work collaboratively on the same financial problem based on a dynamic scheduling policy. The trade-off in speed and in energy consumption of different accelerator allocations is investigated. Third, we propose a mixed precision methodology for optimising Monte-Carlo designs, and a reduced precision methodology for optimising quadrature designs. These methodologies enable us to optimise throughput of reconfigurable designs by using datapaths with minimised precision, while maintaining the same accuracy of the results as in the original designs

RAD-FS - Inherent and Embedded SCA-Security in Ultra-Low Power IoTs

High-performance and energy-efficient encryption engines have become crucial components in modern System-On-Chip (SoC) architectures across multiple platforms, including servers, desktops, mobile devices, and IoT edge devices. Alas, the secure operation of cryptographic engines faces a significant obstacle caused by information leakage through various side-channels. Adversaries can exploit statistical analysis techniques on measured (e.g.,) power and timing signatures generated during (e.g.,) encryption process to extract secret material. Countermeasures against such side-channel attacks often impose substantial power, area, and performance overheads. Consequently, designing side-channel secure encryption engines becomes a critical challenge when ensuring high-performance and energy-efficient operations. In this paper we will suggest a novel technique for low cost, high impact, easily scalable protection based on Adaptive Dynamic Voltage and Frequency Scaling (A-DVFS) capabilities in ultra-low-power (ULP) sub-threshold chips. We review the improvement of using integrated voltage regulators and DVFS, normally used for efficient power management, towards increasing side-channel resistance of encryption engines; Pushing known prior-art in the topic to ULP-regime. The hardware measurements were performed on PLS15 test-chip fabricated in ULP 40nm process going down from nominal voltage to 580 mV power-supply. Various results and detailed analysis is presented to demonstrate the impact of power management circuits on side-channel security, performance-impact and comparison to prior-art. Importantly, we highlight security sensitivities DVFS embeds in terms of software side-channels such as timing, and their mitigation with our proposed technique, successfully masking the time signature introduced by DVFS

Information-theoretic analysis of MIMO channel sounding

The large majority of commercially available multiple-input multiple-output (MIMO) radio channel measurement devices (sounders) is based on time-division multiplexed switching (TDMS) of a single transmit/receive radio-frequency chain into the elements of a transmit/receive antenna array. While being cost-effective, such a solution can cause significant measurement errors due to phase noise and frequency offset in the local oscillators. In this paper, we systematically analyze the resulting errors and show that, in practice, overestimation of channel capacity by several hundred percent can occur. Overestimation is caused by phase noise (and to a lesser extent frequency offset) leading to an increase of the MIMO channel rank. Our analysis furthermore reveals that the impact of phase errors is, in general, most pronounced if the physical channel has low rank (typical for line-of-sight or poor scattering scenarios). The extreme case of a rank-1 physical channel is analyzed in detail. Finally, we present measurement results obtained from a commercially employed TDMS-based MIMO channel sounder. In the light of the findings of this paper, the results obtained through MIMO channel measurement campaigns using TDMS-based channel sounders should be interpreted with great care.Comment: 99 pages, 14 figures, submitted to IEEE Transactions on Information Theor

Optimization Schemes for Variability-Driven VLSI Design Automation

Today's IC design is facing several challenges due to increasing circuit complexity and decreasing feature size, as it pushes to extend Moore's law into nano-scale dimensions. Apart from the challenges that arise directly as a result of feature scaling (e.g., increasing leakage power, reliability issues), imperfections in the manufacturing process have recently turned into a major design hurdle, due to the variations they cause in the device and interconnect parameters from their target values. From an IC design automation perspective, a shift in paradigm, from deterministic to probabilistic, is needed to handle the unpredictable nature of these fabrication variations. In such a probabilistic paradigm, the varying circuit parameters such as leakage power or delay should be accurately modeled, and their correlations due to common sources of variations or physical location on the chip should be well captured. Moreover, variability-driven (probabilistic) design automation needs to efficiently generate a high quality solution. A particular challenge in variability-driven design automation is to define optimality measures among candidate solutions, which allow for inferior solutions to be removed from the solution space thus reducing the run-time complexity. In this dissertation, the superiority probability is introduced as such an optimality measure, and two methods are proposed to compute this probability: an accurate Conditional Monte Carlo simulation method, and an efficient moment-matching approximation method. The effectiveness of using the superiority probability is shown in the context of two important design automation applications: 1) the buffer insertion problem, 2) the dual-Vth leakage optimization problem. Another important task in variability-driven design automation is to develop optimization techniques that can provably generate the optimal solution in an efficient way. In this dissertation, the application of the gate sizing problem is explored to optimally reduce the loss due to fabrication variations in the presence of a timing constraint. The presented formulation, in contrast with the existing variability-driven approaches which are all based on heuristics, is provably optimal. Moreover, unlike existing approaches, it is independent of any assumption on the source and nature of variations

LeakyOhm: Secret Bits Extraction using Impedance Analysis

The threats of physical side-channel attacks and their countermeasures have been widely researched. Most physical side-channel attacks rely on the unavoidable influence of computation or storage on current consumption or voltage drop on a chip. Such data-dependent influence can be exploited by, for instance, power or electromagnetic analysis. In this work, we introduce a novel non-invasive physical side-channel attack, which exploits the data-dependent changes in the impedance of the chip. Our attack relies on the fact that the temporarily stored contents in registers alter the physical characteristics of the circuit, which results in changes in the die's impedance. To sense such impedance variations, we deploy a well-known RF/microwave method called scattering parameter analysis, in which we inject sine wave signals with high frequencies into the system's power distribution network (PDN) and measure the echo of the signals. We demonstrate that according to the content bits and physical location of a register, the reflected signal is modulated differently at various frequency points enabling the simultaneous and independent probing of individual registers. Such side-channel leakage challenges the $t$-probing security model assumption used in masking, which is a prominent side-channel countermeasure. To validate our claims, we mount non-profiled and profiled impedance analysis attacks on hardware implementations of unprotected and high-order masked AES. We show that in the case of the profiled attack, only a single trace is required to recover the secret key. Finally, we discuss how a specific class of hiding countermeasures might be effective against impedance leakage

Circuit Design

Circuit Design = Science + Art! Designers need a skilled "gut feeling" about circuits and related analytical techniques, plus creativity, to solve all problems and to adhere to the specifications, the written and the unwritten ones. You must anticipate a large number of influences, like temperature effects, supply voltages changes, offset voltages, layout parasitics, and numerous kinds of technology variations to end up with a circuit that works. This is challenging for analog, custom-digital, mixed-signal or RF circuits, and often researching new design methods in relevant journals, conference proceedings and design tools unfortunately gives the impression that just a "wild bunch" of "advanced techniques" exist. On the other hand, state-of-the-art tools nowadays indeed offer a good cockpit to steer the design flow, which include clever statistical methods and optimization techniques.Actually, this almost presents a second breakthrough, like the introduction of circuit simulators 40 years ago! Users can now conveniently analyse all the problems (discover, quantify, verify), and even exploit them, for example for optimization purposes. Most designers are caught up on everyday problems, so we fit that "wild bunch" into a systematic approach for variation-aware design, a designer's field guide and more. That is where this book can help! Circuit Design: Anticipate, Analyze, Exploit Variations starts with best-practise manual methods and links them tightly to up-to-date automation algorithms. We provide many tractable examples and explain key techniques you have to know. We then enable you to select and setup suitable methods for each design task - knowing their prerequisites, advantages and, as too often overlooked, their limitations as well. The good thing with computers is that you yourself can often verify amazing things with little effort, and you can use software not only to your direct advantage in solving a specific problem, but also for becoming a better skilled, more experienced engineer. Unfortunately, EDA design environments are not good at all to learn about advanced numerics. So with this book we also provide two apps for learning about statistic and optimization directly with circuit-related examples, and in real-time so without the long simulation times. This helps to develop a healthy statistical gut feeling for circuit design. The book is written for engineers, students in engineering and CAD / methodology experts. Readers should have some background in standard design techniques like entering a design in a schematic capture and simulating it, and also know about major technology aspects

Application of advanced technology to space automation

Automated operations in space provide the key to optimized mission design and data acquisition at minimum cost for the future. The results of this study strongly accentuate this statement and should provide further incentive for immediate development of specific automtion technology as defined herein. Essential automation technology requirements were identified for future programs. The study was undertaken to address the future role of automation in the space program, the potential benefits to be derived, and the technology efforts that should be directed toward obtaining these benefits